Abstract:
A non-volatile memory device (103) suitable to be programmed in a sequential mode is proposed. The device includes a plurality of blocks of memory cells (121) each one for storing a word, each block being identified by an address, means (124) for loading an input address at the beginning of a programming procedure and means (136,142) for setting an internal address to the input address; the device further includes means (127) for loading a predetermined number of input words in succession, means (130-133) for latching a page consisting of the predetermined number of input words, means (145-157) for executing a programming operation including writing the page in the blocks identified by consecutive addresses starting from the internal address, and means (139,142) for incrementing the internal address of the predetermined number in response to the completion of the programming operation.
Abstract:
A non-volatile memory device (103) suitable to be programmed in a sequential mode is proposed. The device includes a plurality of blocks of memory cells (121) each one for storing a word, each block being identified by an address, means (124) for loading an input address at the beginning of a programming procedure and means (136,142) for setting an internal address to the input address; the device further includes means (127) for loading a predetermined number of input words in succession, means (130-133) for latching a page consisting of the predetermined number of input words, means (145-157) for executing a programming operation including writing the page in the blocks identified by consecutive addresses starting from the internal address, and means (139,142) for incrementing the internal address of the predetermined number in response to the completion of the programming operation.
Abstract:
Described herein is a device (20) for timing random reading of a memory device with a data access time (T A ), in which reading is performed by means of a succession of consecutive operations, the timing device (20) being designed to generate, for each operation, a corresponding timing signal (PS(i)) such as to cause, whatever the operating condition of the memory device, the corresponding operation to last for a time equal to a respective fixed duration (T F (i)), which is determined so as to guarantee completion of the operation in the worst operating condition of the memory device within the fixed duration (T F (i)); the sum of the fixed durations (T F (i)) being equal to the data access time (T A ) of the memory device.
Abstract:
In a memory device (1; 30) having an array (2) of memory cells (3), a column decoder (9) is configured to address the memory cells (3), and a charge-pump supply circuit (6; 32) generates a boosted supply voltage (V b ; V yr ) for the column decoder (9). A connecting stage (22) is arranged between the supply circuit (6; 32) and the column decoder (9); the connecting stage (22) switches between a high-impedance state and a low-impedance state, and is configured to switch into the high-impedance state in given operating conditions of the memory device (1; 30), in particular during a reading step.