SELECTIVE STEP COVERAGE FOR MICRO-FABRICATED STRUCTURES
    2.
    发明申请
    SELECTIVE STEP COVERAGE FOR MICRO-FABRICATED STRUCTURES 审中-公开
    微结构的选择步骤覆盖

    公开(公告)号:US20160246010A1

    公开(公告)日:2016-08-25

    申请号:US15047032

    申请日:2016-02-18

    Abstract: A shadow mask having two or more levels of openings enables selective step coverage of micro-fabricated structures within a micro-optical bench device. The shadow mask includes a first opening within a top surface of the shadow mask and a second opening within the bottom surface of the shadow mask. The second opening is aligned with the first opening and has a second width less than a first width of the first opening. An overlap between the first opening and the second opening forms a hole within the shadow mask through which selective coating of micro-fabricated structures within the micro-optical bench device may occur.

    Abstract translation: 具有两个或多个开口级别的荫罩使得可以在微型光学台装置内的微结构的选择性阶梯覆盖。 荫罩包括在荫罩的顶表面内的第一开口和荫罩的底表面内的第二开口。 第二开口与第一开口对准并且具有小于第一开口的第一宽度的第二宽度。 第一开口和第二开口之间的重叠在荫罩内形成一个孔,通过该孔可以发生微光学工作台装置内的微结构的选择性涂层。

    Increased spectrometer field of view

    公开(公告)号:US11385100B2

    公开(公告)日:2022-07-12

    申请号:US16931237

    申请日:2020-07-16

    Abstract: Aspects relate to mechanisms for increasing the field of view of a spectrometer. An optical device may be configured to simultaneously couple light from different locations (spots) on a sample to the spectrometer to effectively increase the spectrometer field of view. The optical device can include a beam combiner and at least one reflector to reflect light beams from respective spots on the sample towards the beam combiner. The beam combiner can combine the received light beams from the different spots to produce a combined light beam that may be input to the spectrometer.

    ON-LINE COMPENSATION OF INSTRUMENTAL RESPONSE DRIFT IN MINIATURIZED SPECTROMETERS

    公开(公告)号:US20230152216A1

    公开(公告)日:2023-05-18

    申请号:US17989317

    申请日:2022-11-17

    CPC classification number: G01N21/31 G01N2201/0231 G01N2201/1211

    Abstract: Aspects relate to on-line compensation of instrumental drifts in miniaturized spectrometers due to variations in environmental conditions and due to other sources of instrumental drift. The spectrometer may include a light modulator, a detector, and a processor. The spectrometer may further include a sensor configured to obtain a value of a condition contributing to instrumental drifts in the spectrometer. The processor may be configured to extract a set of correction parameters from a correction matrix associating a plurality of sets of correction parameters with sensor values based on the value and to apply the set of correction parameters to an output of the detector to produce a corrected spectrum of a sample under test. The correction matrix may be generated for the spectrometer or may be based on a global correction matrix fitted to the spectrometer.

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