Adjustable aperture device with integral aperture holes

    公开(公告)号:US09786400B2

    公开(公告)日:2017-10-10

    申请号:US13683645

    申请日:2012-11-21

    Inventor: Armin Steinke

    Abstract: An adjustable aperture device for an electromagnetic radiation detecting apparatus includes a position adjustment body configured for adjusting a position of a selected aperture hole of multiple selectable aperture holes, where electromagnetic radiation propagates through the selected aperture hole. The adjustable aperture device further includes a guide unit configured for guiding the position adjustment body along a predefined guide direction, and an aperture body defining the aperture holes and including multiple engagement sections, where the adjustment body is engagable in a selectable one of the engagement sections to thereby select the selected aperture hole. The adjustable aperture device further includes a pre-loading element configured for pre-loading the position adjustment body towards the aperture body, and a drive unit configured for driving the aperture body to move so that the position adjustment body is engaged in a respective one of the plurality of engagement sections.

    Optical module of micro spectrometer with tapered slit and slit structure thereof

    公开(公告)号:US09746616B2

    公开(公告)日:2017-08-29

    申请号:US13642828

    申请日:2010-04-29

    Applicant: Cheng-Hao Ko

    Inventor: Cheng-Hao Ko

    Abstract: An optical module of a micro spectrometer with tapered slit and slit structure thereof. The optical module includes an input section and a micro diffraction grating. The input section includes a slit structure, which receives a first optical signal and outputs a second optical signal travelling along a first optical path. The slit structure includes a substrate and a slit, which penetrates through the substrate and has a gradually reduced dimension from a first surface of the substrate to a second surface of the substrate. The micro diffraction grating, disposed on the first optical path, receives the second optical signal and separates the second optical signal into a plurality of spectrum components travelling along a second optical path. The optical module of the micro spectrometer with the tapered slit and slit structure thereof according to the embodiment of the invention can be manufactured in a mass-production manner using the semiconductor manufacturing processes, so that the cost can be decreased, and the slit can have a smooth surface, which avoids the negative effect on the incident light.

    FLUORESCENCE HYPERSPECTRAL MICROSCOPY SYSTEM FEATURING STRUCTURED ILLUMINATION AND PARALLEL RECORDING
    99.
    发明申请
    FLUORESCENCE HYPERSPECTRAL MICROSCOPY SYSTEM FEATURING STRUCTURED ILLUMINATION AND PARALLEL RECORDING 有权
    荧光超高效显微镜系统特征结构照明与平行记录

    公开(公告)号:US20160320305A1

    公开(公告)日:2016-11-03

    申请号:US14741629

    申请日:2015-06-17

    Abstract: A fluorescence hyperspectral microscopy system featuring structured illumination and parallel recording includes a light projection sub-system, a detection sub-system, and an electrical controller. The light projection sub-system includes a digital light processing (DLP) module for generating linear excitation light, a first lens set, an optical path allocation element, and an objective lens. The detection sub-system includes a second lens set, a frequency-dividing reflection element, a two-dimensional light detector, and a light collection element. With the detection sub-system performing detection in conjunction with the light projection sub-system, and the electrical controller controlling the DLP module, a two-dimensional moving platform, and the two-dimensional light detector, the fluorescence hyperspectral microscopy system provides increased resolution and can obtain accurate information in spatial and spectral dimensions and hence a four-dimensional hyperspectral image of the object under detection.

    Abstract translation: 具有结构照明和并行记录的荧光高光谱显微系统包括光投影子系统,检测子系统和电控制器。 光投影子系统包括用于产生线性激发光的数字光处理(DLP)模块,第一透镜组,光路分配元件和物镜。 检测子系统包括第二透镜组,分频反射元件,二维光检测器和光收集元件。 通过检测子系统与光投影子系统进行检测,控制DLP模块的电气控制器,二维移动平台和二维光检测器,荧光高光谱显微系统提供更高的分辨率 并且可以在空间和光谱维度上获得准确的信息,并因此获得被检测物体的四维高光谱图像。

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