Method to prevent damage to probe card
    103.
    发明申请
    Method to prevent damage to probe card 有权
    防止探针卡损坏的方法

    公开(公告)号:US20050225341A1

    公开(公告)日:2005-10-13

    申请号:US11138920

    申请日:2005-05-26

    Applicant: Phillip Byrd

    Inventor: Phillip Byrd

    Abstract: Probe cards are configured with protective circuitry suitable for use in electrical testing of semiconductor dice without damage to the probe cards. Protective fuses are provided in electrical communication with conductive traces and probe elements (e.g., probe needles) of a probe card. The fuses may be active or passive fuses and are preferably self-resetting, repairable, and/or replaceable. Typically, the fuses will be interposed in, or located adjacent to, conductive traces residing over a surface of the probe card. Methods of fabricating a probe card are provided, as well as various probe card configurations. A semiconductor die testing system using the probe card is also provided.

    Abstract translation: 探头卡配置有适用于半导体裸片电气测试的保护电路,而不会损坏探针卡。 提供保护性熔丝与探针卡的导电迹线和探针元件(例如探针)电连通。 保险丝可以是有源或被动保险丝,并且优选地是自复位,可修复和/或可更换的。 通常,保险丝将被置于位于探针卡的表面上方的导电迹线中或邻近其上。 提供制造探针卡的方法以及各种探针卡配置。 还提供了使用探针卡的半导体管芯测试系统。

    Method for making a dashboard subassembly in paticular a motor vehicle dashboard console
    104.
    发明授权
    Method for making a dashboard subassembly in paticular a motor vehicle dashboard console 失效
    在仪表板控制台中制作仪表板组件的方法

    公开(公告)号:US06949709B1

    公开(公告)日:2005-09-27

    申请号:US10019504

    申请日:2000-06-30

    Abstract: The invention concerns a method for making a dashboard subassembly comprising electrical and/or electronic components (1) connected to conductors (2) and attached to a rigid support (3). The invention is characterized in that it consists in: providing a flexible mat (4) provided with said conductors (2); mounting said components (1) on said mat (4), connected to said electrical conductors (2); rigidizing said mat (4) by overmoulding it with a material designed to form said support (3). The invention also concerns a dashboard subassembly, in particular a motor vehicle dashboard console, obtained by said method.

    Abstract translation: 本发明涉及一种用于制造仪表板子组件的方法,其包括连接到导体(2)并连接到刚性支撑件(3)的电和/或电子部件(1)。 本发明的特征在于:提供设置有所述导体(2)的柔性垫(4); 将所述部件(1)安装在所述垫(4)上,连接到所述电导体(2); 通过用设计成形成所述支撑件(3)的材料将其模制成硬化所述垫(4)。 本发明还涉及通过所述方法获得的仪表板子组件,特别是机动车辆仪表板控制台。

    Relay arrangement structure
    106.
    发明申请
    Relay arrangement structure 审中-公开
    继电器布置结构

    公开(公告)号:US20050159024A1

    公开(公告)日:2005-07-21

    申请号:US11037059

    申请日:2005-01-19

    Abstract: Two circuit boards 1′ and 3′ are disposed vertically, and the relays 2 and 4, provided respectively on the circuit boards, are arranged side by side in a vertical or a horizontal direction. Each of the circuit boards 1′ and 3′ include a bus bar circuit board, and terminals 7 of each relay 2, 4 are connected to bus bars 6, 13 of the corresponding bus bar circuit board. Part of the bus bars 6, 13 of each of the circuit boards 1′, 3′ project outwardly from the circuit board to provide terminal portions 6c, 13c for forming a connector. The bus bars 6 on the one circuit board 1′ and/or the bus bars 13 on the other circuit board 3′ are covered with respective insulating sub-boards 9 and 14 to be insulated respectively from the second relays 4 and the first relays 2.

    Abstract translation: 两个电路板1'和3'垂直设置,并且分别设置在电路板上的继电器2和4在垂直或水平方向上并排布置。 电路板1'和3'中的每一个包括母线电路板,并且每个继电器2,4的端子7连接到相应母线电路板的母线6,13。 每个电路板1',3'的汇流条6,13的一部分从电路板向外突出,以提供用于形成连接器的端子部分6c,13c。 一个电路板1'上的汇流条6和/或另一个电路板3'上的母线13被相应的绝缘子板9和14覆盖,以分别与第二继电器4和第一继电器2 。

    Apparatus to prevent damage to probe card
    108.
    发明授权
    Apparatus to prevent damage to probe card 有权
    防止探针卡损坏的装置

    公开(公告)号:US06897672B2

    公开(公告)日:2005-05-24

    申请号:US10327469

    申请日:2002-12-20

    Inventor: Phillip E. Byrd

    Abstract: Probe cards are configured with protective circuitry suitable for use in electrical testing of semiconductor dice without damage to the probe cards. Protective fuses are provided in electrical communication with conductive traces and probe elements (e.g., probe needles) of a probe card. The fuses may be active or passive fuses and are preferably self-resetting, repairable, and/or replaceable. Typically, the fuses will be interposed in, or located adjacent to, conductive traces residing over a surface of the probe card. Methods of fabricating a probe card are provided, as well as various probe card configurations. A semiconductor die testing system using the probe card is also provided.

    Abstract translation: 探头卡配置有适用于半导体裸片电气测试的保护电路,而不会损坏探针卡。 提供保护性熔丝与探针卡的导电迹线和探针元件(例如探针)电连通。 保险丝可以是有源或被动保险丝,并且优选地是自复位,可修复和/或可更换的。 通常,保险丝将被置于位于探针卡的表面上方的导电迹线中或邻近其上。 提供制造探针卡的方法以及各种探针卡配置。 还提供了使用探针卡的半导体管芯测试系统。

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