公开(公告)号：US20150124249A1

公开(公告)日：2015-05-07

申请号：US14407626

申请日：2012-06-15

Applicant: Naoharu Yanagawa

Inventor： Naoharu Yanagawa

IPC: G01J3/02

CPC classification number: G01J3/0254 ,  G01J1/08 ,  G01J2001/0481

Abstract: The light measurement apparatus according to the present invention includes: an integrating sphere; a reference calibration light source body holding unit that is arranged on the integrating sphere and to which a reference calibration light source body is attached; a test light source body holding unit that is arranged on the integrating sphere and to which a test light source body to be measured is attached; a light detection unit that is arranged on the integrating sphere and detects light from the reference calibration light source body and the test light source body; and a control unit that controls lighting of the reference calibration light source body and the test light source body, the light measurement apparatus being configured so that only either one of the reference calibration light source body and the test light source body is able to selectively emit light in the integrating sphere.

Abstract translation: 根据本发明的光测量装置包括：积分球; 参考校准光源体保持单元，其布置在所述积分球上并附着有基准校准光源体; 测试光源体保持单元，其布置在所述积分球上，并且附接有待测量的测试光源体; 光检测单元，布置在积分球上并检测来自基准校准光源体和测试光源体的光; 以及控制单元，其控制所述基准校准光源体和所述测试光源体的照明，所述光测量装置被配置为使得仅所述参考校准光源体和所述测试光源体中的任一个能够选择性地发射 光在积分球。

公开(公告)号：US20150029497A1

公开(公告)日：2015-01-29

申请号：US13953423

申请日：2013-07-29

Applicant: Ultratech, Inc.

Inventor： Sergeui Anikitchev ,  David Gaines

IPC: G01J1/04

CPC classification number: G01J1/0407 ,  G01J1/0414 ,  G01J1/0477 ,  G01J1/4257 ,  G01J2001/0481 ,  G01J2001/4261 ,  G02B5/04 ,  G02B27/108

Abstract: Systems and methods for measuring an intensity characteristic of a light beam are disclosed. The methods include directing the light beam into a prism assembly that includes a thin prism sandwiched by two transparent plates, and reflecting a portion of the light beam by total-internal-reflection surface to an integrating sphere while transmitting the remaining portion of the light beam through the two transparent plates to a beam dump. The method also includes detecting light captured by the integrating sphere and determining the intensity characteristic from the detected light.

Abstract translation: 公开了用于测量光束的强度特性的系统和方法。 所述方法包括将光束引导到棱镜组件中，该棱镜组件包括夹在两个透明板之间的薄棱镜，并且将一部分光束由全内反射表面反射到积分球，同时透射光束的剩余部分 通过两个透明板到一个光束转储。 该方法还包括检测由积分球捕获的光并根据检测到的光确定强度特性。

公开(公告)号：US20140021338A1

公开(公告)日：2014-01-23

申请号：US13670397

申请日：2012-11-06

Applicant: OTSUKA ELECTRONICS CO., LTD.

Inventor： Kazuaki OHKUBO ,  Hisashi SHIRAIWA

IPC: G02B17/00 ,  G01J1/04

CPC classification number: G02B17/00 ,  G01J1/0214 ,  G01J1/04 ,  G01J1/0407 ,  G01J1/0425 ,  G01J3/0218 ,  G01J3/0254 ,  G01J3/0262 ,  G01J3/505 ,  G01J2001/0481 ,  G01J2001/4252 ,  G02B5/08

Abstract: An optical characteristic measuring apparatus includes a hemispheric portion having a reflective surface on its inner wall, and a plane portion arranged to close an opening of the hemispheric portion and having a reflective surface on an inner-wall side of the hemispheric portion. The plane portion includes a first window occupying a range including a substantial center of curvature of the hemispheric portion for attaching a light source to the first window. At least one of the hemispheric portion and the plane portion includes a plurality of second windows arranged in accordance with a predetermined rule for extracting light from inside the hemispheric portion.

公开(公告)号：US08415639B2

公开(公告)日：2013-04-09

申请号：US13033612

申请日：2011-02-24

Applicant: Yoshihiro Osawa ,  Kazuaki Ohkubo

Inventor： Yoshihiro Osawa ,  Kazuaki Ohkubo

IPC: G01J1/58

CPC classification number: G01N21/645 ,  G01J1/58 ,  G01J3/0254 ,  G01J2001/0481 ,  G01J2001/4247 ,  G01N2021/6417 ,  G01N2021/6469 ,  G01N2201/0655

Abstract: A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.

Abstract translation: 量子效率测量方法包括以下步骤：在具有积分空间的积分器中的预定位置处设置样本; 向样品施加激发光并通过第二窗口测量积分空间中的光谱作为第一光谱; 配置激发光入射部分，使得在通过样品之后的激发光不在积分空间中反射; 将激发光施加到样品并通过第二窗口测量积分空间中的光谱作为第二光谱; 并且基于构成所述第一光谱的一部分并且对应于所述激发光的波长范围的分量以及构成所述第二光谱的一部分的分量并且对应于由所述第二光谱产生的光的波长范围而对应的光的波长范围来计算所述样本的量子效率 来自接收到的激发光的样品。

公开(公告)号：US20120229801A1

公开(公告)日：2012-09-13

申请号：US13511220

申请日：2010-02-02

Applicant: Seongchong Park ,  Dong Hoon Lee ,  Seung Nam Park

Inventor： Seongchong Park ,  Dong Hoon Lee ,  Seung Nam Park

IPC: G01J1/04

CPC classification number: G01J1/02 ,  G01J1/0295 ,  G01J2001/0481 ,  G01J2001/061 ,  G01J2001/4247

Abstract: Provided are an integrating sphere photometer and a measuring method of the same. The integrating sphere photometer includes an integrating sphere including a left hemisphere and a right hemisphere, a photometer disposed on the center surface of the right hemisphere, a photometer baffle disposed in front of the photometer to be spaced apart therefrom, a light source to be tested disposed at the center region of the integrating sphere to illuminate light to at least an illumination region of the left hemisphere, an auxiliary lamp part disposed in the vicinity of a contact region between the left hemisphere and the right hemisphere to illuminate light to the illumination region, and an auxiliary lamp baffle disposed around the auxiliary lamp part to prevent the light emitted from the light source to be tested from being directly illuminated to the auxiliary lamp part and also to prevent the light emitted from the auxiliary lamp part from being directly illuminated to the light source to be tested.

Abstract translation: 提供一种积分球光度计及其测量方法。 积分球形光度计包括包括左半球和右半球的积分球，设置在右半球的中心表面上的光度计，设置在光计前面以与之隔开的光度计挡板，待测光源 设置在积分球的中心区域，以将光照射到左半球的至少一个照明区域;辅助灯部分，设置在左半球和右半球之间的接触区域附近，以将光照射到照明区域 以及设置在辅助灯部分周围的辅助灯挡板，以防止从光源发射的光被直接照射到辅助灯部分，并且还防止从辅助灯部分发射的光被直接照射到 要测试的光源。

公开(公告)号：US08085398B2

公开(公告)日：2011-12-27

申请号：US12473888

申请日：2009-05-28

Applicant: Alexander S. Dyshkant ,  Vishnu Zutshi ,  Phillip Stone

Inventor： Alexander S. Dyshkant ,  Vishnu Zutshi ,  Phillip Stone

IPC: G01N21/00

CPC classification number: G01T1/2018 ,  G01J1/0422 ,  G01J2001/0481

Abstract: A concave cell for the collection of radiated light including a body with a concave surface and an unmodified flat surface opposite thereto, and a reflective surface coupled to the body across from the concave surface, said reflective surface including an opening and a photo detector operatively coupled thereto. A method of collecting light by reflecting light inside the concave cell, striking the light at the concave surface, scattering the light at the concave surface, and registering the scattered light with the photo detector. A method of increasing uniformity of light registered in a photo detector. A method of making a concave cell.

Abstract translation: 一种用于收集辐射光的凹槽，包括具有凹面的主体和与其相反的未修改的平面;以及反射表面，所述反射表面从所述凹表面连接到所述主体，所述反射表面包括开口和操作性耦合的光检测器 到此。 通过在凹槽内反射光来收集光的方法，将凹入表面上的光照射，将凹陷散射到光，并将散射光与光电检测器对准。 增加光检测器中的光的均匀性的方法。 制造凹槽的方法。

公开(公告)号：US20110226961A1

公开(公告)日：2011-09-22

申请号：US13033612

申请日：2011-02-24

Applicant: Yoshihiro OSAWA ,  Kazuaki Ohkubo

Inventor： Yoshihiro OSAWA ,  Kazuaki Ohkubo

IPC: G01J1/58

CPC classification number: G01N21/645 ,  G01J1/58 ,  G01J3/0254 ,  G01J2001/0481 ,  G01J2001/4247 ,  G01N2021/6417 ,  G01N2021/6469 ,  G01N2201/0655

Abstract: A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.

Abstract translation: 量子效率测量方法包括以下步骤：在具有积分空间的积分器中的预定位置处设置样本; 向样品施加激发光并通过第二窗口测量积分空间中的光谱作为第一光谱; 配置激发光入射部分，使得在通过样品之后的激发光不在积分空间中反射; 将激发光施加到样品并通过第二窗口测量积分空间中的光谱作为第二光谱; 并且基于构成所述第一光谱的一部分并且对应于所述激发光的波长范围的分量和构成所述第二光谱的一部分的分量并且对应于由所述第二光谱产生的光的波长范围对应的样品的量子效率 来自接收到的激发光的样品。

公开(公告)号：US07868287B2

公开(公告)日：2011-01-11

申请号：US11895955

申请日：2007-08-28

Applicant: Edward S. Fry ,  Joseph A. Musser ,  Jeffrey Katz ,  William C. Merka ,  George W. Kattawar ,  Zheng Lu

Inventor： Edward S. Fry ,  Joseph A. Musser ,  Jeffrey Katz ,  William C. Merka ,  George W. Kattawar ,  Zheng Lu

IPC: G01J1/00

CPC classification number: G02B5/021 ,  G01J1/04 ,  G01J1/0425 ,  G01J1/0474 ,  G01J2001/0481 ,  G02B5/0268 ,  G02B5/0284

Abstract: The invention relates an apparatus and method for forming a diffuse reflector. In one embodiment of the invention, a diffuse reflector is formed by exposing transmissive particles of a pre-determined purity to pressure and forming a material having desired diffuse reflective properties. The transmissive particles may further be thermally treated, such as by sintering, to form material having desired diffuse reflective properties. The treated transmissive particles may then be disposed in a vessel and define a cavity therein to form an integrated cavity diffuse reflector.

Abstract translation: 本发明涉及一种用于形成漫反射器的装置和方法。 在本发明的一个实施例中，通过将预定纯度的透射颗粒暴露于压力并形成具有期望的漫反射特性的材料来形成漫反射器。 透射颗粒可以进一步被热处理，例如通过烧结，以形成具有所需漫反射特性的材料。 经处理的透射颗粒然后可以设置在容器中并且在其中限定空腔以形成集成的腔漫反射器。

公开(公告)号：US07835057B2

公开(公告)日：2010-11-16

申请号：US12071682

申请日：2008-02-25

Applicant: Roy Kayser ,  Yu Song ,  Mitchell Wade MacDonald

Inventor： Roy Kayser ,  Yu Song ,  Mitchell Wade MacDonald

IPC: G02F1/03

CPC classification number: G01J1/02 ,  A61N5/062 ,  G01J1/0228 ,  G01J1/0271 ,  G01J1/08 ,  G01J1/32 ,  G01J1/42 ,  G01J2001/0481 ,  G01J2001/4252 ,  H05B33/086 ,  H05B33/0869

Abstract: In a method of calibrating a light delivery device (10) having a solid state light source (12), for example comprising LEDs of an LED array, and an intensity control unit (16) comprising LED array driver and a dimmer module for generating a control signal for controlling at least the intensity of the light source, the light source is temporarily connected by a light guide (24; 24, 26) to a radiometer (38) for detecting irradiance of the delivered light. The light delivery device has a memory (30) for storing control signal parameters and associated radiance levels. The light delivery device is calibrated by adjusting the control signal parameters, e.g. a PWM duty cycle of a control signal to each of a series of predetermined settings, obtaining from the radiometer a corresponding series of delivered light irradiance levels measured thereby, storing the irradiance levels and associated control signal parameters in memory, and applying a best fit algorithm to the irradiance measurements and control signal parameters. Thereafter, a desired irradiate level can be set by selecting the best fit control signal parameters, such as duty cycle of a PWM control or other parameters. Output intensity levels may be measured at the same time as the irradiance levels and used to compensate for light source output level changes when setting a desired irradiance level.

Abstract translation: 在校准具有固态光源（12）的光输送装置（10）的方法中，例如包括LED阵列的LED，以及包括LED阵列驱动器和调光器模块的强度控制单元（16），用于产生 控制信号，用于至少控制光源的强度，光源通过光导（24; 24,26）临时连接到辐射计（38），用于检测所传送的光的辐照度。 光输送装置具有用于存储控制信号参数和相关辐射水平的存储器（30）。 光输送装置通过调节控制信号参数来校准。 将控制信号的PWM占空比分配给一系列预定设置中的每一个，从辐射计获得由此测量的相应的一系列递送的光照度水平，将辐照度和相关联的控制信号参数存储在存储器中，以及应用最佳拟合算法 到辐照度测量和控制信号参数。 此后，可以通过选择最佳拟合控制信号参数（例如PWM控制的占空比或其他参数）来设置期望的照射水平。 输出强度水平可以与辐照度水平同时测量，并用于在设置期望的辐照度水平时补偿光源输出水平变化。

公开(公告)号：US20100271799A1

公开(公告)日：2010-10-28

申请号：US12837113

申请日：2010-07-15

Applicant: Douglas R. Jungwirth ,  Lynne C. Eigler

Inventor： Douglas R. Jungwirth ,  Lynne C. Eigler

IPC: F21V9/02 ,  F21V9/00

CPC classification number: G01J1/08 ,  F21S8/006 ,  F21V9/02 ,  F21V14/08 ,  G01J1/04 ,  G01J1/0422 ,  G01J1/0488 ,  G01J2001/0481 ,  G02B27/0983 ,  G02B27/0994

Abstract: An apparatus may have a light source configured to generate light, a reflector configured to collect the light and direct the light in a desired direction, a spectral filter assembly configured to receive the light from the reflector. The spectral filter assembly may have a stationary frame and a plurality of filter elements supported by the stationary frame. Filter elements of the plurality of filter elements may simultaneously filter a desired quantity of light within wavelength band to provide a filtered output light beam. A homogenizer may be configured to receive the filtered output light beam and produce a homogenized light beam having a substantially uniform irradiance distribution across a cross-section of the homogenized light beam.

Abstract translation: 设备可以具有被配置为产生光的光源，被配置为收集光并将光引导到期望方向的反射器;被配置为接收来自反射器的光的光谱滤光器组件。 光谱滤光器组件可以具有固定框架和由固定框架支撑的多个滤光元件。 多个滤波器元件的滤波器元件可以同时过滤波长带内的期望量的光以提供经滤波的输出光束。 均化器可以被配置为接收经滤波的输出光束并且产生在均匀化光束的横截面上具有基本均匀的辐照度分布的均质化光束。