Abstract:
In spectral detection for detecting the shape of repeating pattern structures uniformly formed on a surface of a test object, it is advantageous to use light having a wide wavelength range in a short wavelength region. However, it is not easy to realize a relatively simple optical system capable of spectral detection of light having a wide wavelength range in a short wavelength region, namely in ultraviolet region. The present invention provides an inspection apparatus for detecting pattern defects. The inspection apparatus includes a spectral detection optical system capable of spectral detection of light in a wavelength range from deep ultraviolet to near infrared. The spectral detection optical system includes a spatially partial mirror serving as a half mirror and a reflecting objective provided with an aperture stop for limiting the angle and direction of light to be applied to and reflected by a test object.
Abstract:
The present subject matter relates to methods of high-speed analysis of product samples. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward a plurality of optical detectors. Signals from the detectors are compared with a reference signal based on a portion of the illuminating light passing through a reference element to determine characteristics of the product under analysis. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.
Abstract:
Systems and methods for generating, projecting or correlating thermal spectra use digital micro-mirror devices (DMDs) to controllably modulate input radiation such as long wave infrared light. An optical system for creating an output spectrum based upon an input light suitably includes a grating configured receive the input light and to spread the input light by wavelength into an input spectrum. A digital micro-mirror device (DMD) is configured to receive the input spectrum and to controllably activate mirrors in the DMD corresponding to selected wavelengths of the input light. Portions of the input light having selected wavelengths can be extracted from remaining portions of the input light for the output spectrum. By selecting and activating only certain mirrors on the DMD, particular wavelengths of light in infrared or other spectra can be optically switched for any number of subsequent applications, including spectral projection, simulation of solar or other spectra, detection of chemical substances, or the like.
Abstract:
A system and method for optical spectroscopic measurements is described. One embodiment includes a measurement head for optical spectroscopic measurements, the measurement head comprising an illumination source configured to illuminate a sample, a collection optic configured to view the sample, and an internal reference, wherein the internal reference can be illuminated by the illumination source and viewed by the collection optic.
Abstract:
According to one embodiment of the present invention, a system for encoding an optical spectrum includes a dispersive element, a digital micromirror device (DMD) array, a detector, and a controller. The dispersive element receives light from a source and disperses the light to yield light components of different wavelengths. The digital micromirror device (DMD) array has micromirrors that modulate the light to encode an optical spectrum of the light. The detector detects the light that has been modulated. The controller generates an intensity versus time waveform representing the optical spectrum of the detected light.
Abstract:
The present invention is directed to systems and methods which utilize a cavity ring-down spectroscopy (CRDS) technique implemented for the measurements of vapor transmission rate. In one embodiment, the vapor content to be measured is contained within an optical cavity. Light is then injected into the cavity up to a threshold level and the delay time of the injected light is measured. When the wavelength of the injected light is resonant with an absorption feature of the vapor the decay time increases linearly as a function of vapor content. In this manner, vapor content causes a longer delay time and thus the amount of vapor passing through the film (film permeation rate) can be determined in real-time.
Abstract:
A spectrograph having multiple excitation wavelength ranges is disclosed. The spectrograph can include a wavelength switching mechanism to switch between different wavelength ranges in accordance with the wavelength of an incoming light signal. The wavelength switching mechanism can include multiple optical assemblies (or elements) corresponding to the different wavelength ranges for processing the incoming light signal. The mechanism can also include a switching component for switching the optical assemblies to align the appropriate assembly with the incoming light signal. Each optical assembly can include one or more transmission gratings to disperse the incoming light signal into multiple wavelengths within a particular wavelength range and a reflecting mirror proximate to the grating(s) to reflect the wavelengths of light back through the grating(s) to photodetectors for measuring to wavelengths to generate a light spectrum. The spectrograph can be used in Raman spectroscopy.
Abstract:
The present invention has been accomplished to provide an atomic absorption spectrophotometer capable of obtaining measurement data always in the state where the lowest detection limit performance is optimized, without depending on the frequency of the power supply. In a control program which runs on the microcomputer chip 42 mounted on the atomic absorption spectrophotometer 110, a plurality of lighting periods of the light sources 11 and 12 and extraction periods of the sampling data are memorized, whose lowest detection limit performance are optimized for the frequencies (50 Hz and 60 Hz) of the AC power source for driving the AC motor 22. In using the apparatus, by the control program, the frequency of the power source used in this apparatus is identified, the lighting period and sampling data extraction period corresponding to the identified frequency and the measurement mode that a user of the apparatus has previously set are selected from among a plurality of memorized values, and the appropriate lighting period is set to the hardware (PLD 43). Accordingly, without depending on the frequency, it is possible to obtain measurement data always in the state where the lowest detection limit performance is optimized.
Abstract:
Devices and methods for hyperspectral and multispectral imaging are discussed. In particular, Image Mapping Spectrometer systems, methods of use, and methods of manufacture are presented. Generally, an image mapping spectrometer comprises an image mapping field unit, a spectral separation unit, and a selective imager. Image mapping spectrometers may be used in spectral imaging of optical samples. In some embodiments, the image mapping field unit of an image mapping spectrometer may be manufactured with surface shaped diamond tools.
Abstract:
System, method, and apparatus for determining the composition of a sample of material. In one embodiment, the method pertains to the counting of photons that were inelastically scattered by the sample, and for minimizing the effects of fluorescent or phosphorescent photons. In yet another embodiment of the invention, a sample is illuminated by a repetitive pulse of monochromatic light, and the resultant scattered photons from the samples are collected and counted during a predetermined integration period. Yet other embodiments pertain to a low-cost, computer-controlled system for repetitively counting inelastically scattered photons so as to create a Raman histogram and a Raman spectrogram of the photons.