Three-demensional structure element and method of manufacturing the element, optical switch, and micro device
    121.
    发明申请
    Three-demensional structure element and method of manufacturing the element, optical switch, and micro device 有权
    三维结构元件和元件制造方法,光开关和微型器件

    公开(公告)号:US20050238282A1

    公开(公告)日:2005-10-27

    申请号:US10523267

    申请日:2003-07-31

    Applicant: Tohru Ishizuya

    Inventor: Tohru Ishizuya

    Abstract: A three-dimensional structure element having a plurality of three-dimensional structural bodies and capable of being uniformly formed without producing a dispersion in shape of the three-dimensional structural bodies, comprising a substrate (11) and the three-dimensional structural bodies (1) disposed in a predetermined effective area (20) on the substrate (11), the three-dimensional structural bodies (1) further comprising space parts formed in the clearances thereof from the substrate (11) by removing sacrificing layers, the substrate (11) further comprising a dummy area (21) having dummy structural bodies (33) so as to surround the effective area (20), the dummy structural body (33) further comprising space parts formed in the clearances thereof from the substrate (11) by removing the sacrificing layers, whereby since the dummy area (21) is heated merely to approx. the same temperature as the effective area (20) in an ashing process for removing the sacrificing layers to prevent a temperature distribution from occurring in the effective area (20).

    Abstract translation: 一种具有多个三维结构体并能够均匀形成而不产生三维结构体形状分散的三维结构元件,包括基底(11)和三维结构体(1) ),所述三维结构体(1)还包括通过去除牺牲层从所述基板(11)形成在其间隙中的空间部分,所述基板(11)被布置在所述基板(11)上的预定有效区域(20) )还包括具有虚拟结构体(33)以围绕所述有效区域(20)的虚拟区域(21),所述虚拟结构体(33)还包括通过所述基板(11)从所述基板(11)的间隙形成的空间部分, 去除牺牲层,由此由于虚拟区域(21)被加热到约 在用于去除牺牲层的灰化过程中与有效区域(20)相同的温度以防止在有效区域(20)中发生温度分布。

    Use of an organic dielectric as a sacrificial layer
    122.
    发明授权
    Use of an organic dielectric as a sacrificial layer 失效
    使用有机电介质作为牺牲层

    公开(公告)号:US06905613B2

    公开(公告)日:2005-06-14

    申请号:US09902116

    申请日:2001-07-10

    CPC classification number: B81C1/00476 B81C2201/0108

    Abstract: A method for using an organic dielectric as a sacrificial layer for forming suspended or otherwise spaced structures. The use of an organic dielectric has a number of advantages, including allowing use of an organic solvent or etch to remove the sacrificial layer. Organic solvents only remove organic materials, and thus do not affect or otherwise damage non-organic layers such as metal layers. This may reduce or eliminate the need for the rinsing and drying steps often associated with the use of acidic etchants such as Hydrofluoric Acid.

    Abstract translation: 一种使用有机电介质作为牺牲层的方法,用于形成悬浮或其他间隔结构。 有机电介质的使用具有许多优点,包括允许使用有机溶剂或蚀刻去除牺牲层。 有机溶剂仅除去有机物质,因此不会影响或以其他方式损坏金属层等非有机层。 这可以减少或消除通常与使用酸性蚀刻剂如氢氟酸相关的漂洗和干燥步骤的需要。

    Removal of MEMS sacrificial layers using supercritical fluid/chemical formulations
    123.
    发明申请
    Removal of MEMS sacrificial layers using supercritical fluid/chemical formulations 失效
    使用超临界流体/化学配方去除MEMS牺牲层

    公开(公告)号:US20050118813A1

    公开(公告)日:2005-06-02

    申请号:US10782355

    申请日:2004-02-19

    Abstract: A method and composition for removing silicon-containing sacrificial layers from Micro Electro Mechanical System (MEMS) and other semiconductor substrates having such sacrificial layers is described. The etching compositions include a supercritical fluid (SCF), an etchant species, a co-solvent, and optionally a surfactant. Such etching compositions overcome the intrinsic deficiency of SCFs as cleaning reagents, viz., the non-polar character of SCFs and their associated inability to solubilize polar species that must be removed from the semiconductor substrate. The resultant etched substrates experience lower incidents of stiction relative to substrates etched using conventional wet etching techniques.

    Abstract translation: 描述了用于从微机电系统(MEMS)和其它具有这种牺牲层的半导体衬底去除含硅牺牲层的方法和组合物。 蚀刻组合物包括超临界流体(SCF),蚀刻剂物质,共溶剂和任选的表面活性剂。 这样的蚀刻组合物克服了作为清洗剂的SCF的固有缺陷,即SCF的非极性特征以及它们不溶于必须从半导体衬底去除的极性物质。 所得到的蚀刻的衬底相对于使用常规湿蚀刻技术蚀刻的衬底的沉降事件较少。

    Packaging microelectromechanical systems
    124.
    发明申请
    Packaging microelectromechanical systems 审中-公开
    包装微机电系统

    公开(公告)号:US20030183916A1

    公开(公告)日:2003-10-02

    申请号:US10107624

    申请日:2002-03-27

    Abstract: A packaged microelectromechanical system may be formed in a hermetic cavity by forming the system on a semiconductor structure and covering the system with a thermally decomposing film. That film may then be covered by a sealing cover. Subsequently, the thermally decomposing material may be decomposed, forming a cavity, which can then be sealed to hermetically enclose the system.

    Abstract translation: 封装的微机电系统可以通过在半导体结构上形成系统并用热分解膜覆盖系统而形成在密封腔中。 然后该膜可以被密封盖覆盖。 随后,热分解材料可能被分解,形成空腔,然后将其密封以气密地封闭该系统。

    Multilayer resist structure, and method of manufacturing three-dimensional microstructure with use thereof
    126.
    发明授权

    公开(公告)号:US06455227B1

    公开(公告)日:2002-09-24

    申请号:US09473655

    申请日:1999-12-29

    Applicant: Masaki Hara

    Inventor: Masaki Hara

    Abstract: A multilayer resist structure is irradiated more than one time with ultraviolet rays through a photomask. Each time the structure is irradiated, ultraviolet rays of a little greater quantity of light than those used in the last irradiation are used. Also, with each exposure, a photomask which has a larger lightproof section than that used in the last irradiation is used. Next, the multilayer resist structure is developed, and the exposed area of each photoresist is removed with a developing solution. Also, in amorphous silicon layers, the areas under the removed photoresist are easily removed with the developing solution. A resist structure having desired steps is thus completed. Using the resist structure, a three-dimensional microstructure can be formed.

    Abstract translation: 通过光掩模用紫外线照射多层抗蚀剂结构多次。 每次照射结构时,使用比上次照射中使用的光量稍大的紫外线。 此外,对于每次曝光,使用具有比在最后照射中使用的遮光部分更大的遮光部分的光掩模。 接下来,显影多层抗蚀剂结构体,用显影液去除各光致抗蚀剂的露出面积。 此外,在非晶硅层中,去除的光致抗蚀剂下的区域容易用显影液除去。 因此完成了具有所需步骤的抗蚀剂结构。 使用抗蚀剂结构,可以形成三维微结构。

    Method of manufacturing a microstructure
    127.
    发明申请
    Method of manufacturing a microstructure 失效
    微结构制造方法

    公开(公告)号:US20020064957A1

    公开(公告)日:2002-05-30

    申请号:US09995956

    申请日:2001-11-29

    Inventor: Yong-seop Yoon

    CPC classification number: B81C1/00142 B81B2201/042 B81C2201/0108

    Abstract: A method of manufacturing a micromirror actuator includes forming a trench on a substrate by etching, laminating a film-type organic layer on the substrate to cover but not fill the trench so that the trench is maintained hollow, and depositing and patterning a metal layer on the film-type organic layer and removing the film-type organic layer. According to the method of manufacturing a micromirror actuator, a micromirror can be easily planarized by laminating the film-type organic layer on the substrate including the trench, which reduces the cost of manufacturing the micromirror actuator and increases a reflectivity of the micromirror actuator by increasing the flatness level of the micromirror so as to enhance an optical transmission efficiency.

    Abstract translation: 微镜致动器的制造方法包括通过蚀刻在衬底上形成沟槽,在衬底上层叠薄膜型有机层以覆盖但不填充沟槽,使得沟槽保持中空,并且将金属层沉积和图案化 膜型有机层,去除膜型有机层。 根据制造微反射镜致动器的方法,通过在包括沟槽的基板上层叠膜型有机层,可以容易地对微镜进行平面化,这降低了制造微镜驱动器的成本,并且通过增加微镜致动器的反射率 微镜的平坦度水平,以提高光传输效率。

    Method for fabricating locally reinforced metallic microfeature
    128.
    发明授权
    Method for fabricating locally reinforced metallic microfeature 有权
    制造局部强化金属微特征的方法

    公开(公告)号:US06362083B1

    公开(公告)日:2002-03-26

    申请号:US09449369

    申请日:1999-11-24

    Abstract: A method for fabricating a locally reinforced metallic microfeature on a substrate provided preferably with an electrical contacting or a driving circuit, and on an organic, patterned sacrificial layer, which is removed after the metallic microfeature is applied, is described. In fabricating the local reinforcement of the microfeature, at least one further organic layer, formed as a mask, is deposited, which is likewise removed following pattern delineation of the metallic layer.

    Abstract translation: 描述了一种用于在衬底上制造局部增强的金属微特征的方法,其优选地具有电接触或驱动电路,以及在施加金属微特征之后被去除的有机图案化牺牲层上。 在制造微特征的局部加强时,沉积形成为掩模的至少一个另外的有机层,其在金属层的图案描绘之后同样被去除。

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