公开(公告)号：US20190049300A1

公开(公告)日：2019-02-14

申请号：US16058927

申请日：2018-08-08

Applicant: Tian GU ,  Derek Matthew KITA ,  Juejun HU

Inventor： Tian GU ,  Derek Matthew KITA ,  Juejun HU

IPC: G01J3/44 ,  G01N21/65 ,  G01J3/453

CPC classification number: G01J3/44 ,  G01J3/0218 ,  G01J3/0259 ,  G01J3/0272 ,  G01J3/453 ,  G01J3/4532 ,  G01N21/65

Abstract: State-of-the-art portable Raman spectrometers use discrete free-space optical components that must be aligned well and that don't tolerate vibrations well. Conversely, the inventive spectrometers are made with monolithic photonic integration to fabricate some or all optical components on one or more planar substrates. Photonic integration enables dense integration of components, eliminates manual alignment and individual component assembly, and yields superior mechanical stability and resistance to shock or vibration. These features make inventive spectrometers especially suitable for use in high-performance portable or wearable sensors. They also yield significant performance advantages, including a large (e.g., 10,000-fold) increase in Raman scattering efficiency resulting from on-chip interaction of the tightly localized optical mode and the analyte and a large enhancement in spectral resolution and sensitivity resulting from the integration of an on-chip Fourier-transform spectrometer.

公开(公告)号：US20170363469A1

公开(公告)日：2017-12-21

申请号：US15623961

申请日：2017-06-15

Applicant: Si-Ware Systems

Inventor： Yasser M. Sabry ,  Diaa Abdel Maged Khalil ,  Mostafa Medhat ,  Hisham Haddara ,  Bassam Saadany ,  Khaled Hassan

IPC: G01J3/02 ,  G01J3/45

CPC classification number: G01J3/0208 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/0291 ,  G01J3/26 ,  G01J3/45 ,  G01J3/4532

Abstract: Aspects of the disclosure relate to an integrated spectral unit including a micro-electro-mechanical systems (MEMS) interferometer fabricated within a first substrate and a light redirecting structure integrated on a second substrate, where the second substrate is coupled to the first substrate. The light redirecting structure includes at least one mirror for receiving an input light beam propagating in an out-of-plane direction with respect to the first substrate and redirecting the input light beam to an in-plane direction with respect to the first substrate towards the MEMS interferometer.

公开(公告)号：US09784681B2

公开(公告)日：2017-10-10

申请号：US14890530

申请日：2014-05-13

Applicant: THE GENERAL HOSPITAL CORPORATION

Inventor： Johannes F. de Boer ,  Mattijs De Groot

IPC: G01N21/64 ,  G01J3/453 ,  G01J3/02 ,  G01J3/433 ,  G01J3/44 ,  G01N21/47

CPC classification number: G01N21/6458 ,  G01J3/0218 ,  G01J3/433 ,  G01J3/4406 ,  G01J3/453 ,  G01J3/4532 ,  G01J3/4537 ,  G01N21/4795 ,  G01N21/6486 ,  G01N2021/6463 ,  G01N2021/6484

Abstract: Systems and methods according to exemplary embodiments of the present disclosure can be provided that can efficiently detect the amplitude and phase of a spectral modulation. Such exemplary scheme can be combined with self-interference fluorescence to facilitate a highly sensitive depth localization of self-interfering radiation generated within a sample. The exemplary system and method can facilitate a scan-free depth sensitivity within the focal depth range for microscopy, endoscopy and nanoscopy.

公开(公告)号：US09778105B2

公开(公告)日：2017-10-03

申请号：US14518588

申请日：2014-10-20

Applicant: WAYNE STATE UNIVERSITY

Inventor： Gregory W. Auner ,  Changhe Huang ,  Christopher M. Thrush ,  Michelle Brusatori

IPC: G01J3/28 ,  G01J3/02 ,  G02B5/18 ,  G01J3/18 ,  G01J3/44 ,  G01J3/453 ,  G01J3/45

CPC classification number: G01J3/021 ,  G01J3/18 ,  G01J3/44 ,  G01J3/4412 ,  G01J3/45 ,  G01J3/4531 ,  G01J3/4532 ,  G02B5/1861

Abstract: An apparatus for performing Raman spectral analysis of a sample is described, comprising a coherent light source, an first optical chain to direct the coherent light to impinge on the sample, a second optical chain to direct the scattered light onto a diffraction grating, and a third optical chain to direct the diffracted light onto detection array. The diffraction grating is a stairstep with a metalized surface, and a plurality of metalized stripes on a flat surface is disposed in a direction orthogonal to the long dimension of the stairsteps. The region between the flat surface and the stairstep is transparent. The zeroth-order fringe is selected by a slit and directed onto camera. The resultant interferogram is Fourier transformed to produce a representation of the Raman spectrum.

公开(公告)号：US20170261307A1

公开(公告)日：2017-09-14

申请号：US15447054

申请日：2017-03-01

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： KENJI NARUMI ,  TERUHIRO SHIONO ,  SEIJI NISHIWAKI

IPC: G01B9/02 ,  G01B11/24 ,  G01B11/06

CPC classification number: G01B11/2441 ,  G01B9/02051 ,  G01J3/4532 ,  H01L27/14621 ,  H01L27/14623 ,  H01L27/14625

Abstract: A photodetection device comprises: an image sensor that includes first pixels, second pixels, third pixels, and fourth pixels; an interference element that includes first incident regions and second incident regions; and an optical system that causes light in a first wavelength band to be incident on the first incident regions and causes light in a second wavelength band different from the first wavelength band to be incident on the second incident regions. The interference element causes first interference of part of the light in the first wavelength band incident on two first incident regions that are included in the first incident regions. The interference element also causes second interference of part of the light in the second wavelength band incident on two second incident regions.

公开(公告)号：US09696208B2

公开(公告)日：2017-07-04

申请号：US14895739

申请日：2014-06-06

Applicant: Universite de Technologie de Troyes

Inventor： Yassine Hadjar ,  Mikael Renault ,  Aurélien Bruyant ,  Sylvain Blaize

IPC: G01B9/02 ,  G01J3/453 ,  G01N21/552

CPC classification number: G01J3/453 ,  G01J3/4532 ,  G01J2003/4538 ,  G01N21/553

Abstract: An interferometric device: includes a separator, for separating a collimated beam (F0) into first (F1) and second (F2) incident beams; at least one transducer; and a transparent optical system, including at least three planar diopters (D1, D2, D3). The the transducer is based on plasmon resonance and in contact with the diopter (D1); the diopter (D2) has a network of nanostructures; the optical system and the separator being configured such that the beam (F1) and the beam (F2) undergo total internal reflection on the diopter (D1) and on the diopter (D3), respectively, prior to interfering on the diopter (D2) by total internal reflection and to forming an interferogram in which the central fringe is located at a convergence point (ZOPD).

公开(公告)号：US09658107B2

公开(公告)日：2017-05-23

申请号：US15130876

申请日：2016-04-15

Applicant: Si-Ware Systems

Inventor： Momen Anwar ,  Mostafa Medhat ,  Bassem Mortada ,  Ahmed Othman El Shater ,  Mina Gad Seif ,  Muhammed Nagy ,  Bassam A. Saadany ,  Amr N. Hafez

IPC: G01B9/02 ,  G01J3/453 ,  G02B26/08 ,  G01J3/45 ,  G01B7/06

CPC classification number: G01J3/4532 ,  G01B7/08 ,  G01B9/02068 ,  G01B9/02071 ,  G01B2290/35 ,  G01J3/45 ,  G01J3/4535 ,  G02B26/0841

Abstract: A Micro-Electro-Mechanical System (MEMS) apparatus provides for self-calibration of mirror positioning of a moveable mirror of an interferometer. At least one mirror in the MEMS apparatus includes a non-planar surface. The moveable mirror is coupled to a MEMS actuator having a variable capacitance. The MEMS apparatus includes a capacitive sensing circuit for determining the capacitance of the MEMS actuator at multiple reference positions of the moveable mirror corresponding to a center burst and one or more secondary bursts of an interferogram produced by the interferometer based on the non-planar surface. A calibration module uses the actuator capacitances at the reference positions to compensate for any drift in the capacitive sensing circuit.

公开(公告)号：US09513165B2

公开(公告)日：2016-12-06

申请号：US14431573

申请日：2013-09-25

Applicant: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

Inventor： Ichiro Ishimaru

IPC: G01J3/26 ,  A61B5/145 ,  A61B5/1455 ,  G01J3/453 ,  G01N21/359 ,  G01N21/47 ,  G01N21/49 ,  G01J3/02 ,  A61B5/00 ,  G01J3/45 ,  G01N21/35 ,  G01J3/12

CPC classification number: G01J3/26 ,  A61B5/14532 ,  A61B5/14546 ,  A61B5/1455 ,  A61B5/7257 ,  A61B2562/0238 ,  F04C2270/0421 ,  G01J3/0205 ,  G01J3/0213 ,  G01J3/45 ,  G01J3/4532 ,  G01J3/4535 ,  G01J2003/1213 ,  G01N21/359 ,  G01N21/4738 ,  G01N21/49 ,  G01N2021/3595

Abstract: A spectroscopic measurement device includes a dark filter that is arranged on an optical path between an imaging optical system and a light detection unit and includes a plurality of regions having different transmittances, the filter being configured such that a fixed reflected measurement light and a movable reflected measurement light that are guided to a same point by the imaging optical system and form interference light are transmitted through a same region; and an arithmetic processing unit that obtains an interferogram of the measurement light at a transmittance corresponding to each of two or more regions from a detection signal of each pixel of a light detection unit when a movable reflection unit is moved, and obtains a spectrum of the measurement light based on the interferogram.

Abstract translation: 光谱测量装置包括配置在成像光学系统和光检测单元之间的光路上的暗滤波器，并且包括具有不同透射率的多个区域，所述滤光器被配置为使得固定的反射测量光和可移动的反射 通过成像光学系统被引导到同一点并形成干涉光的测量光通过相同的区域传输; 以及算术处理单元，当可移动反射单元移动时，从光检测单元的每个像素的检测信号中获得与两个或更多个区域中的每一个相对应的透射率的测量光的干涉图，并获得 基于干涉图的测量光。

公开(公告)号：US09474476B2

公开(公告)日：2016-10-25

申请号：US14380643

申请日：2013-02-27

Applicant: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

Inventor： Ichiro Ishimaru

IPC: G01J3/02 ,  A61B5/1455 ,  G01N21/45 ,  G01N21/49 ,  A61B5/145 ,  G01J3/453 ,  G01B9/02 ,  G01N21/25 ,  G01N21/95 ,  G01J3/10 ,  G01J3/18 ,  A61B5/00 ,  G01N21/359

CPC classification number: A61B5/1455 ,  A61B5/14532 ,  A61B5/6887 ,  A61B5/7257 ,  A61B2562/0233 ,  G01B9/02041 ,  G01B9/02049 ,  G01B9/0207 ,  G01J3/0205 ,  G01J3/0229 ,  G01J3/0256 ,  G01J3/0272 ,  G01J3/10 ,  G01J3/18 ,  G01J3/4532 ,  G01J3/4535 ,  G01J2003/102 ,  G01J2003/4538 ,  G01N21/255 ,  G01N21/359 ,  G01N21/45 ,  G01N21/49 ,  G01N21/9501 ,  G01N2201/0612

Abstract: The present invention causes measurement light, emitted from an object and to be measured, to enter a fixed mirror and a movable mirror forming interfering light between the measurement light reflected by the fixed mirror and measurement light reflected by the movable mirror. Change to the intensity of the interference light of measurement light is obtained by moving the movable mirror unit, acquiring the interferogram of measurement light. Reference light of a narrow wavelength band included in a wavelength band of the measurement light enters the fixed mirror and the movable mirror, forming interference light of the reference light. The movable mirror is moved to correct the interferogram of measurement light, which is at the same wavelength as the reference light in the measurement light, and the reference light, and a spectrum of the measurement light is acquired based on the corrected interferogram.

Abstract translation: 本发明使得从物体发射并被测量的测量光进入固定反射镜和在由固定反射镜反射的测量光与可移动反射镜反射的测量光之间形成干涉光的可移动镜。 通过移动可动镜单元获得测量光的干涉光的强度的变化，获取测量光的干涉图。 包括在测量光的波长带中的窄波长带的参考光进入固定反射镜和可移动反射镜，形成参考光的干涉光。 移动可移动反射镜以校正与测量光中的参考光波长相同的测量光和参考光的干涉图，并且基于校正的干涉图获取测量光的光谱。

公开(公告)号：US20160231172A1

公开(公告)日：2016-08-11

申请号：US15130876

申请日：2016-04-15

Applicant: Si-Ware Systems

Inventor： Mostafa Medhat ,  Bassem Mortada ,  Ahmed Othman EI Shater ,  Muhammed Nagy ,  Mina Gad Seif ,  Bassam A. Saadany ,  Amr N. Hafez ,  Momen Anwar

IPC: G01J3/453 ,  G02B26/08

CPC classification number: G01J3/4532 ,  G01B7/08 ,  G01B9/02068 ,  G01B9/02071 ,  G01B2290/35 ,  G01J3/45 ,  G01J3/4535 ,  G02B26/0841

Abstract: A Micro-Electro-Mechanical System (MEMS) apparatus provides for self-calibration of mirror positioning of a moveable mirror of an interferometer. At least one mirror in the MEMS apparatus includes a non-planar surface. The moveable mirror is coupled to a MEMS actuator having a variable capacitance. The MEMS apparatus includes a capacitive sensing circuit for determining the capacitance of the MEMS actuator at multiple reference positions of the moveable mirror corresponding to a center burst and one or more secondary bursts of an interferogram produced by the interferometer based on the non-planar surface. A calibration module uses the actuator capacitances at the reference positions to compensate for any drift in the capacitive sensing circuit.

Abstract translation: 微机电系统（MEMS）装置提供干涉仪可移动反射镜的镜像定位的自校准。 MEMS装置中的至少一个反射镜包括非平面表面。 可移动镜连接到具有可变电容的MEMS致动器。 MEMS装置包括电容感测电路，用于确定MEMS致动器在可移动镜的对应于中心脉冲串的多个参考位置处的电容，以及由干涉仪基于非平面表面产生的干涉图的一个或多个二次脉冲串。 校准模块使用参考位置处的致动器电容来补偿电容感测电路中的任何漂移。