公开(公告)号：US20100195090A1

公开(公告)日：2010-08-05

申请号：US12649867

申请日：2009-12-30

Applicant: Hideyuki Ohtake

Inventor： Hideyuki Ohtake

IPC: G01N21/55 ,  G01J3/00

CPC classification number: G01B11/0625

Abstract: A non-contacting type paint film thickness measuring device includes a paint film thickness measuring unit having a terahertz pulse light generating portion for generating a terahertz pulse light, a first optical system for collimating and focusing an incident terahertz pulse light that is the terahertz pulse light generated by the terahertz pulse light generating portion to an object whose paint film thickness is measured, a second optical system for receiving a terahertz echo pulse that is the incident terahertz pulse light collimated and focused to the object in the first optical system and reflected at the object, a pulse width shortening portion for shortening a pulse width of the terahertz echo pulse, and a detecting portion for detecting electric field amplitude-time resolved waveform of the terahertz echo pulse whose pulse width is shortened by the pulse width shortening portion.

Abstract translation: 非接触式涂膜厚度测量装置包括具有用于产生太赫兹脉冲光的太赫兹脉冲光产生部分的涂膜厚度测量单元，用于准直和聚焦作为太赫兹脉冲光的入射太赫兹脉冲光的第一光学系统 由太赫兹脉冲光产生部分产生的紫外线脉冲光产生部分产生到测量漆膜厚度的物体;第二光学系统，用于接收作为入射的太赫兹脉冲光的太赫兹回波脉冲，其被准直并聚焦到第一光学系统中的物体并在 用于缩短太赫兹回波脉冲的脉冲宽度的脉冲宽度缩短部分和用于检测脉冲宽度被脉冲宽度缩短部分缩短的太赫兹回波脉冲的电场振幅 - 时间分辨波形的检测部分。

公开(公告)号：US07764371B2

公开(公告)日：2010-07-27

申请号：US11675155

申请日：2007-02-15

Applicant: Matthew P. Nelson ,  Jason H. Neiss ,  Patrick J. Treado

Inventor： Matthew P. Nelson ,  Jason H. Neiss ,  Patrick J. Treado

IPC: G01J3/00

CPC classification number: G01T1/20

Abstract: The disclosure relates generally to methods and apparatus for obtaining a super resolution image of a sample using a fiber array spectral translator system. In one embodiment includes collecting photons from a sample at a first end of a fiber array spectral translator; delivering the photons from a second end of the fiber array spectral translator into a multiple detector rows of a photon detector; interpolating between the multiple detector rows to thereby form interpolated rows; and arranging an output of the multiple detector rows and the interpolated rows so as to obtain a super resolution image of the sample.

Abstract translation: 本公开一般涉及使用光纤阵列频谱转换器系统获得样本的超分辨率图像的方法和装置。 在一个实施例中，包括在光纤阵列光谱转换器的第一端收集来自样品的光子; 将光子从光纤阵列频谱转换器的第二端传送到光子检测器的多个检测器行中; 在多个检测器行之间内插，从而形成内插行; 并且布置多个检测器行和内插行的输出，以便获得样本的超分辨率图像。

公开(公告)号：US07742892B2

公开(公告)日：2010-06-22

申请号：US11574575

申请日：2005-09-07

Applicant: Martin Fromme ,  Ulrich Glombitza

Inventor： Martin Fromme ,  Ulrich Glombitza

IPC: G01D18/00 ,  G01J3/00

CPC classification number: G01K11/32

Abstract: The object of the invention is to provide a method of calibrating an optical FMCW backscattering measurement system that improves the precision of the measurement. The problem is solved by a method comprising the steps of A. Converting said received sensor signal to a complex received electrical signal as a function of said modulation frequency fm, said complex received electrical signal being represented by a magnitude part and a phase angle part as a function of said modulation frequency fm; B. Performing a transformation of said received electrical signal to provide a backscattering signal as a function of location between said first and second ends of said sensor and beyond said second end; C. From said backscattering signal as a function of location determining characteristics of a curve representative of said backscattering signal beyond said second end; D. Correcting said magnitude part of said received electrical signal and said phase angle part of said received electrical signal in a predetermined dependence of said curve; and E. Repeating step B) on the basis of the corrected received electrical signal.

Abstract translation: 本发明的目的是提供一种校准光学FMCW后向散射测量系统的方法，其提高了测量的精度。 该问题通过一种方法解决，该方法包括以下步骤：A将所接收的传感器信号转换为作为所述调制频率f m的函数的复接收电信号，所述复接收电信号由幅度部分和相位角部分表示为 所述调制频率fm的函数; B.执行所述接收的电信号的变换，以提供作为所述传感器的所述第一和第二端之间并超出所述第二端的位置的函数的后向散射信号; C.根据所述后向散射信号作为代表所述后向散射信号超过所述第二端的曲线的位置确定特性的函数; D.以所述曲线的预定依赖性校正所述接收的电信号的所述幅度部分和所述接收的电信号的所述相位角部分; 和E.重复步骤B）基于经校正的接收电信号。

公开(公告)号：US20100149520A1

公开(公告)日：2010-06-17

申请号：US12635339

申请日：2009-12-10

Applicant: Hideyuki OHTAKE ,  Yuki ICHIKAWA

Inventor： Hideyuki OHTAKE ,  Yuki ICHIKAWA

IPC: G01N21/55 ,  G01J3/00

CPC classification number: G01B11/0633

Abstract: A non-contacting type paint film thickness measuring device includes a generating portion for generating a terahertz pulse light, a detecting portion for detecting the terahertz pulse light, a measured wave form in time-series obtaining portion for obtaining a measured wave form indicating an electric field intensity of a terahertz echo pulse light, and an intrinsic wave form in time-series obtaining portion, having an intrinsic electric field spectrum calculating portion and an intrinsic wave form in time-series calculating portion, for calculating an intrinsic wave form in time-series of an object.

Abstract translation: 非接触型涂膜厚度测量装置包括用于产生太赫兹脉冲光的产生部分，用于检测太赫兹脉冲光的检测部分，用于获得指示电力的测量波形的时间序列获得部分中的测量波形 在时间序列获取部分中具有太赫兹回波脉冲光的场强和本征波形，在时间序列计算部分中具有固有电场光谱计算部分和固有波形，用于计算时间序列获得部分中的固有波形， 系列的一个对象。

公开(公告)号：US20100149519A1

公开(公告)日：2010-06-17

申请号：US12481576

申请日：2009-06-10

Applicant: Mehrdad Toofan

Inventor： Mehrdad Toofan

IPC: G01J4/04 ,  G01J3/00 ,  G02B27/42

CPC classification number: G02B27/28 ,  A61B5/0059 ,  A61B5/14558 ,  G01N21/23

Abstract: A linearly polarized light is used to probe the detailed structure of a specimen. A reference light is also generated whose amplitude matches the amplitude of the diffracted light from the specimen. The reference light could either be generated from the light source itself as it is reflected off from a mirror through a light attenuator, or could as well be generated off from the reflected/transmitted light from/through the specimen passing through a light attenuator. The light from the specimen is retarded by a quarter-wave with respect to the reference light and the two lights are then passed through another polarizer/analyzer which allows the reference light and the diffracted light from the specimen to pass through while removing the background light. The diffracted light from the specimen, which carries the phase information of the underlying specimen's structure, is modulated by the reference light. The modulation is then recorded on an image sensor such as CCD. Should the specimen have any paramagnetic property, a magnetic gradient generator is employed to accentuate the image details further. The invention thus could be used to diagnosis a disease such as malaria due to paramagnetic and birefringence property of Hemozoin, the malaria pigment.

Abstract translation: 线偏振光用于探测样品的详细结构。 还产生参考光，其参数光的幅度与来自样本的衍射光的振幅相匹配。 参考光可以从光源本身产生，因为它通过光衰减器从反射镜反射，或者也可以通过来自/穿过光衰减器的样本的反射/透射光产生。 来自样品的光相对于参考光被延迟四分之一波长，然后两个光通过另一个偏振器/分析器，其允许参考光和来自样品的衍射光通过，同时去除背景光 。 来自标本的衍射光，其承载下面的标本结构的相位信息，由参考光调制。 然后将调制记录在诸如CCD的图像传感器上。 如果样品具有顺磁性，则使用磁梯度发生器进一步强化图像细节。 因此，本发明可用于诊断由于Hemozoin（疟疾色素）的顺磁性和双折射性质而引起的疟疾等疾病。

公开(公告)号：US20100123897A1

公开(公告)日：2010-05-20

申请号：US12568363

申请日：2009-09-28

Applicant: Ye Yang ,  Babs R. Soller ,  Olusola O. Soyemi ,  Michael A. Shear

Inventor： Ye Yang ,  Babs R. Soller ,  Olusola O. Soyemi ,  Michael A. Shear

IPC: G01J3/00 ,  G01N21/55

CPC classification number: G01N21/25 ,  A61B5/0075 ,  A61B5/14535 ,  A61B5/14539 ,  A61B5/14546 ,  A61B5/1455 ,  A61B5/14551 ,  A61B5/6824 ,  G01N21/274 ,  G01N21/359 ,  G01N21/49 ,  G01N21/55 ,  G01N21/59 ,  G01N2021/3155

Abstract: We disclose measurement systems and methods for measuring analytes in target regions of samples that also include features overlying the target regions. The systems include: (a) a light source; (b) a detection system; (c) a set of at least first, second, and third light ports which transmit light from the light source to a sample and receive and direct light reflected from the sample to the detection system, generating a first set of data including information corresponding to both an internal target within the sample and features overlying the internal target, and a second set of data including information corresponding to features overlying the internal target; and (d) a processor configured to remove information characteristic of the overlying features from the first set of data using the first and second sets of data to produce corrected information representing the internal target.

Abstract translation: 我们公开了测量系统和方法，用于测量样品目标区域中的分析物，还包括覆盖目标区域的特征。 系统包括：（a）光源; （b）检测系统; （c）一组至少第一，第二和第三光端口，其将来自光源的光透射到样品并且将从样品反射的光接收并引导到检测系统，生成第一组数据，其包括对应于 样本内的内部目标和覆盖内部目标的特征，以及包括对应于覆盖内部目标的特征的信息的第二组数据; 以及（d）处理器，被配置为使用所述第一和第二组数据从所述第一组数据中去除所述上覆特征的信息特征，以产生表示所述内部目标的校正信息。

公开(公告)号：US20100073674A1

公开(公告)日：2010-03-25

申请号：US12558773

申请日：2009-09-14

Applicant: Hirofumi Yoshida

Inventor： Hirofumi Yoshida

IPC: G01J3/00 ,  G01H9/00 ,  G06F19/00

CPC classification number: G01N21/4795 ,  A61B5/0073 ,  A61B5/0091 ,  A61B5/0097 ,  A61B5/4312 ,  G01N29/0672 ,  G01N29/2418

Abstract: A measurement apparatus includes a DOT measurement unit, an AOT measurement unit, and a controller configured to calculate at least one of an absorption characteristic and a scattering characteristic of a test region set in an test object by utilizing one of the DOT measurement unit and the AOT measurement unit, which one has a smaller measurement size.

Abstract translation: 测量装置包括DOT测量单元，AOT测量单元和被配置为通过利用DOT测量单元和DOT测量单元中的一个来计算测试对象中设置的测试区域的吸收特性和散射特性中的至少一个的控制器 AOT测量单位，其测量尺寸较小。

公开(公告)号：US20100073666A1

公开(公告)日：2010-03-25

申请号：US12594001

申请日：2008-03-27

Applicant: David L. Perkins ,  Robert P. Freese ,  John C. Blackburn ,  Jonathan H. James

Inventor： David L. Perkins ,  Robert P. Freese ,  John C. Blackburn ,  Jonathan H. James

IPC: G01J3/45 ,  G01J3/00

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0232 ,  G01J3/0235 ,  G01J3/0264 ,  G01J3/0291 ,  G01J3/42 ,  G01N21/31

Abstract: A method of using multivariate optical computing in real-time to collect instantaneous data about a process stream includes installing an optical analysis system proximate a process line, the process line being configured to move a material past a window of the optical analysis system; illuminating a portion of the material with a light from the optical analysis system; directing the light carrying information about the portion through at least one multivariate optical element in the optical analysis system to produce an instantaneous measurement result about the portion; and continuously averaging the instantaneous measurement result over a period of time to determine an overall measurement signal of the material.

Abstract translation: 使用多变量光学计算实时地收集关于过程流的瞬时数据的方法包括：在过程线附近安装光学分析系统，所述过程线被配置为移动材料经过光学分析系统的窗口; 用来自光学分析系统的光照射材料的一部分; 通过所述光学分析系统中的至少一个多变量光学元件引导关于所述部分的光传送信息，以产生关于该部分的瞬时测量结果; 并且在一段时间内连续平均瞬时测量结果以确定材料的总体测量信号。

公开(公告)号：US07682566B2

公开(公告)日：2010-03-23

申请号：US11333207

申请日：2006-01-18

Applicant: Hisashi Ohtsuka

Inventor： Hisashi Ohtsuka

IPC: G01N21/00 ,  G01N21/64 ,  G01N30/96 ,  G01N21/55 ,  G01J3/00 ,  C12M1/34

CPC classification number: G01N21/05 ,  G01N21/15 ,  G01N21/553

Abstract: A surface plasmon resonance assay apparatus is loaded with a sensor unit. A sensing surface of a thin film detects reaction of a sample. A dielectric prism is overlaid with the thin film to constitute an interface. A reflection angle upon occurrence of attenuated total reflection of the illuminating light is changeable according to reaction of the sample on the sensing surface. Protecting panels are disposed to face outer surfaces of the prism, for covering and protecting at least partially the outer surfaces. A first window in one of the protecting panels is positioned on a path of the illuminating light traveling for incidence on the interface, for passing the illuminating light. A second window in one remaining protecting panel is positioned on a path of the illuminating light traveling upon reflection by the interface, for passing the illuminating light.

Abstract translation: 表面等离子体共振测定装置装载有传感器单元。 薄膜的感测表面检测样品的反应。 介电棱镜与薄膜重叠以构成界面。 发生照射光的全反射衰减时的反射角可以根据检测面上的样品的反应而变化。 保护面板设置成面对棱镜的外表面，用于至少部分地覆盖和保护外表面。 一个保护面板中的第一窗口位于照射光的行进路径上，以便入射在界面上，用于通过照明光。 一个剩余的保护面板中的第二个窗口位于通过界面反射而行进的照明光的路径上，用于通过照明光。

公开(公告)号：US20100053599A1

公开(公告)日：2010-03-04

申请号：US12614281

申请日：2009-11-06

Applicant: Thomas D. Milster ,  Pramod Kumar Khulbe ,  Barry Gelernt

Inventor： Thomas D. Milster ,  Pramod Kumar Khulbe ,  Barry Gelernt

IPC: G01J3/12 ,  G01J3/00 ,  G01J3/44

CPC classification number: G01J3/10 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/024 ,  G01J3/2823 ,  G01J3/44 ,  G02B21/16

Abstract: Apparatuses and methods for performing spectroscopy and optical microscopy are disclosed. In at least one embodiment, a Raman spectrometer includes a vacuum ultraviolet light source configured to generate light having a wavelength within a window in the vacuum ultraviolet region of the electromagnetic spectrum within which a local minimum in the absorption coefficient of Oxygen occurs. The spectrometer also includes a lens device that receives a first portion of the generated light, directs at least some of the first portion of the generated light toward a target location, receives reflected light from the target location, and directs the reflected light toward a further location. The spectrometer further includes a dispersive device that receives at least some of the reflected light and outputs dispersed light produced based thereupon, and a camera module that is positioned at additional location, where the camera module receives at least some of the dispersed light.

Abstract translation: 公开了用于执行光谱和光学显微镜的装置和方法。 在至少一个实施例中，拉曼光谱仪包括真空紫外光源，其被配置为产生在电磁光谱的真空紫外区域内具有波长的光的光，其中发生氧吸收系数的局部最小值。 光谱仪还包括接收所产生的光的第一部分的透镜装置，将所产生的光的第一部分中的至少一部分导向目标位置，接收来自目标位置的反射光，并将反射光引向另一个 位置。 光谱仪还包括分散装置，其接收至少一些反射光并输出基于其产生的分散光;以及相机模块，其位于附加位置处，其中相机模块接收至少一些分散的光。