Abstract:
A non-contacting type paint film thickness measuring device includes a paint film thickness measuring unit having a terahertz pulse light generating portion for generating a terahertz pulse light, a first optical system for collimating and focusing an incident terahertz pulse light that is the terahertz pulse light generated by the terahertz pulse light generating portion to an object whose paint film thickness is measured, a second optical system for receiving a terahertz echo pulse that is the incident terahertz pulse light collimated and focused to the object in the first optical system and reflected at the object, a pulse width shortening portion for shortening a pulse width of the terahertz echo pulse, and a detecting portion for detecting electric field amplitude-time resolved waveform of the terahertz echo pulse whose pulse width is shortened by the pulse width shortening portion.
Abstract:
The disclosure relates generally to methods and apparatus for obtaining a super resolution image of a sample using a fiber array spectral translator system. In one embodiment includes collecting photons from a sample at a first end of a fiber array spectral translator; delivering the photons from a second end of the fiber array spectral translator into a multiple detector rows of a photon detector; interpolating between the multiple detector rows to thereby form interpolated rows; and arranging an output of the multiple detector rows and the interpolated rows so as to obtain a super resolution image of the sample.
Abstract:
The object of the invention is to provide a method of calibrating an optical FMCW backscattering measurement system that improves the precision of the measurement. The problem is solved by a method comprising the steps of A. Converting said received sensor signal to a complex received electrical signal as a function of said modulation frequency fm, said complex received electrical signal being represented by a magnitude part and a phase angle part as a function of said modulation frequency fm; B. Performing a transformation of said received electrical signal to provide a backscattering signal as a function of location between said first and second ends of said sensor and beyond said second end; C. From said backscattering signal as a function of location determining characteristics of a curve representative of said backscattering signal beyond said second end; D. Correcting said magnitude part of said received electrical signal and said phase angle part of said received electrical signal in a predetermined dependence of said curve; and E. Repeating step B) on the basis of the corrected received electrical signal.
Abstract:
A non-contacting type paint film thickness measuring device includes a generating portion for generating a terahertz pulse light, a detecting portion for detecting the terahertz pulse light, a measured wave form in time-series obtaining portion for obtaining a measured wave form indicating an electric field intensity of a terahertz echo pulse light, and an intrinsic wave form in time-series obtaining portion, having an intrinsic electric field spectrum calculating portion and an intrinsic wave form in time-series calculating portion, for calculating an intrinsic wave form in time-series of an object.
Abstract:
A linearly polarized light is used to probe the detailed structure of a specimen. A reference light is also generated whose amplitude matches the amplitude of the diffracted light from the specimen. The reference light could either be generated from the light source itself as it is reflected off from a mirror through a light attenuator, or could as well be generated off from the reflected/transmitted light from/through the specimen passing through a light attenuator. The light from the specimen is retarded by a quarter-wave with respect to the reference light and the two lights are then passed through another polarizer/analyzer which allows the reference light and the diffracted light from the specimen to pass through while removing the background light. The diffracted light from the specimen, which carries the phase information of the underlying specimen's structure, is modulated by the reference light. The modulation is then recorded on an image sensor such as CCD. Should the specimen have any paramagnetic property, a magnetic gradient generator is employed to accentuate the image details further. The invention thus could be used to diagnosis a disease such as malaria due to paramagnetic and birefringence property of Hemozoin, the malaria pigment.
Abstract:
We disclose measurement systems and methods for measuring analytes in target regions of samples that also include features overlying the target regions. The systems include: (a) a light source; (b) a detection system; (c) a set of at least first, second, and third light ports which transmit light from the light source to a sample and receive and direct light reflected from the sample to the detection system, generating a first set of data including information corresponding to both an internal target within the sample and features overlying the internal target, and a second set of data including information corresponding to features overlying the internal target; and (d) a processor configured to remove information characteristic of the overlying features from the first set of data using the first and second sets of data to produce corrected information representing the internal target.
Abstract:
A measurement apparatus includes a DOT measurement unit, an AOT measurement unit, and a controller configured to calculate at least one of an absorption characteristic and a scattering characteristic of a test region set in an test object by utilizing one of the DOT measurement unit and the AOT measurement unit, which one has a smaller measurement size.
Abstract:
A method of using multivariate optical computing in real-time to collect instantaneous data about a process stream includes installing an optical analysis system proximate a process line, the process line being configured to move a material past a window of the optical analysis system; illuminating a portion of the material with a light from the optical analysis system; directing the light carrying information about the portion through at least one multivariate optical element in the optical analysis system to produce an instantaneous measurement result about the portion; and continuously averaging the instantaneous measurement result over a period of time to determine an overall measurement signal of the material.
Abstract:
A surface plasmon resonance assay apparatus is loaded with a sensor unit. A sensing surface of a thin film detects reaction of a sample. A dielectric prism is overlaid with the thin film to constitute an interface. A reflection angle upon occurrence of attenuated total reflection of the illuminating light is changeable according to reaction of the sample on the sensing surface. Protecting panels are disposed to face outer surfaces of the prism, for covering and protecting at least partially the outer surfaces. A first window in one of the protecting panels is positioned on a path of the illuminating light traveling for incidence on the interface, for passing the illuminating light. A second window in one remaining protecting panel is positioned on a path of the illuminating light traveling upon reflection by the interface, for passing the illuminating light.
Abstract:
Apparatuses and methods for performing spectroscopy and optical microscopy are disclosed. In at least one embodiment, a Raman spectrometer includes a vacuum ultraviolet light source configured to generate light having a wavelength within a window in the vacuum ultraviolet region of the electromagnetic spectrum within which a local minimum in the absorption coefficient of Oxygen occurs. The spectrometer also includes a lens device that receives a first portion of the generated light, directs at least some of the first portion of the generated light toward a target location, receives reflected light from the target location, and directs the reflected light toward a further location. The spectrometer further includes a dispersive device that receives at least some of the reflected light and outputs dispersed light produced based thereupon, and a camera module that is positioned at additional location, where the camera module receives at least some of the dispersed light.