Polarimeter and method of determining a state of polarization of an incoming light beam

    公开(公告)号:US12038330B2

    公开(公告)日:2024-07-16

    申请号:US17617433

    申请日:2020-06-08

    CPC classification number: G01J4/04 G02B27/283

    Abstract: There is described a polarimeter generally having a substrate; a polarization splitter on the substrate polarization splitting an incoming light beam into light beams; an interferometry circuit on the substrate forming polarization components from the light beams, and output waveguides outputting the polarization components. The interferometer circuit having a first power splitter splitting one of the light beams into first and second phase-retardant waveguides; a second power splitter splitting another one of the light beams into third and fourth phase-retardant waveguides being asymmetric with respect to the first and second phase-retardant waveguides; a first polarization coupler coupling the first and third phase-retardant waveguides to one another; and a second first polarization coupler polarization coupling the second and fourth phase-retardant waveguides to one another, in which intensities of the polarization components and an interferometry pattern of the interferometry circuit are indicative of a state of polarization of the incoming light beam.

    OPTICAL ISOLATOR BASED ON VOLUME BRAGG GRATINGS

    公开(公告)号:US20240192420A1

    公开(公告)日:2024-06-13

    申请号:US18532380

    申请日:2023-12-07

    CPC classification number: G02B5/32 G01J4/04

    Abstract: An optical isolator may include one or more rotated volume Bragg gratings (r-VBGs) within a volume of a material having an input face, where each of the r-VBGs reflects along a reflection path portions of input light propagating along an incidence vector through the input face that satisfies a Bragg condition for one or more selected wavelengths and has a polarization orthogonal to a diffraction plane formed by the associated grating vector and the incidence vector, and where each of the r-VBGs transmits remaining portions of the input light as transmitted light along a transmission path. The isolator may also include one or more polarization-controlling optics located along the transmission path configured to modify a polarization of return light propagating back along the transmission path towards the one or more r-VBGs, where the one or more r-VBGs reflect portions of the return light that satisfy the Bragg condition.

    Circular dichroism measurement device and circular dichroism measurement method

    公开(公告)号:US11879833B2

    公开(公告)日:2024-01-23

    申请号:US17439480

    申请日:2019-07-17

    CPC classification number: G01N21/19 G01J4/04 G01N2021/216

    Abstract: A circular dichroism measurement device includes: a sample part having a sample; a PEM that modulates a polarization state of an incoming light to the sample part or an outgoing light from the sample part; a photo detector that detects a change in a light intensity of the outgoing light from the sample part; an amplifier that amplifies a detection signal from the photo detector; an A/D converter that converts the detection signal amplified by the amplifier to a digital signal; and a digital processing device that executes a signal processing to the digital signal from the A/D converter to acquire a measurement value of circular dichroism of the sample. The A/D converter is configured to convert the detection signal, that is amplified in a state of containing the AC component and the DC component of the light intensity that changes with the same frequency as the modulation frequency of PEM.

    Polarimeter with multiple independent tunable channels and method for material orientation imaging

    公开(公告)号:US11867891B2

    公开(公告)日:2024-01-09

    申请号:US16748463

    申请日:2020-01-21

    Abstract: A polarimeter and a method of analyzing and imaging microstructural material orientation of a sample are disclosed. The polarimeter, which is a partial Mueller-matrix polarimeter (pMMP), accesses multiple independent polarization channels by employing two independent polarization modulators configured to switch serially among multiple independent settings, wherein the combination of the settings of the first and second polarization modulators defines an independent polarization channel, and wherein an imaging detector produces a set of spatially registered images that are synchronized with the channels formed by the polarization modulators; and wherein a processor connected with a memory executes a classification algorithm stored in the memory that maps the set of images to one or more material orientation images by mapping the set of values for each detector pixel corresponding to the set of spatially registered images to a value of material orientation at each pixel coordinate using a machine-learning model, an electrodynamic model, or a combination thereof. The invention can thereby create material microstructural orientation images of diverse anisotropic materials, for instance polymer domains, fiber bundles or plys, and metallic crystalline grains.

    DEVICE AND A METHOD FOR POLARIZATION DEPENDENT IMAGING

    公开(公告)号:US20230392984A1

    公开(公告)日:2023-12-07

    申请号:US18203125

    申请日:2023-05-30

    Applicant: IMEC VZW

    Abstract: According to an aspect of the present inventive concept there is provided a device for polarization dependent imaging, comprising a detector comprising an array of light sensitive elements; a plurality of light propagating units, each comprising: a funnel element having a collecting end and a transmitting end, the funnel element being configured to collect light at the collecting end and propagate the light to the transmitting end; a waveguide having a receiving end and a distributing end, the waveguide being configured to receive the light from the transmitting end at the receiving end and propagate the light to the distributing end, wherein the waveguide is configured to propagate the light through the waveguide in dependence of polarization such that a distribution of the light at different locations of the distributing end is dependent on polarization of the light.

    Polarimetry camera for high fidelity surface characterization measurements

    公开(公告)号:US11796393B2

    公开(公告)日:2023-10-24

    申请号:US17126853

    申请日:2020-12-18

    CPC classification number: G01J4/04 G01N21/17 G01N2021/1772 G01N2021/5957

    Abstract: Systems and methods for providing a polarimetry camera operative to obtain high fidelity surface characterization measurements. A polarimetry camera may include an multi-twist retarder component that is operative selectively switch between two or more polarization filtering states, wherein in each polarization filtering state, the multi-twist retarder component only passes light having a particular polarization state or orientation (e.g., horizontal linear polarization, vertical linear polarization, 45 degree linear polarization, circular polarization) and reflects or absorbs light having other polarization states. The multi-twist retarder may also include one or more diffraction patterns that focus light. The polarimetry camera may capture images using a sensor array as the multi-twist retarder is switched between the at least two polarization filtering states, thereby capturing a sequence of polarization specific images that may be displayed or used to determine one or more Stokes parameters for a scene in real-time.

    CALIBRATING METHOD AND DEVICE FOR BROAD-BAND ACHROMATIC COMPOSITE WAVE PLATE AND CORRESPONDING MEASUREMENT SYSTEM

    公开(公告)号:US20180283951A1

    公开(公告)日:2018-10-04

    申请号:US15570557

    申请日:2016-04-14

    CPC classification number: G01J4/04 G01M11/02

    Abstract: The present disclosure discloses a calibrating method, apparatus, and corresponding measurement system for a composite waveplate. The calibrating method comprises: A. determining a first matrix characterizing the composite waveplate, the first matrix including at least one unknown number; B. determining a theoretical relationship between a light intensity and an alignment angle offset value of the composite waveplate based on the first matrix; and C. calibrating based on the theoretical relationship between a light intensity and an alignment angle offset value of the composite waveplate determined in step (B) and actually measured light intensity data to obtain a second matrix that may characterize the composite waveplate and does not contain the unknown number. The technical solution of the present disclosure may greatly reduce the amount of unknown numbers when calibrating a composite waveplate or a measuring system, thereby lowering the difficulty of calibration and improving the precision of calibration.

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