Abstract:
A resistor network has a substrate with top and side surfaces. Resistors are located on the side surfaces. Several side conductors are located on the side surface and are electrically connected to the resistors. Several top conductors are located on the top surface and are electrically connected to the side conductors. Each top conductor has a cavity. A solder sphere is partially located in the cavity and is electrically and mechanically connected to the top conductor by reflowed solder paste. A cover coat covers the side conductors and the resistors. The resistor network provides a high density of resistors per unit area.
Abstract:
An adhesion pad for adhering a semiconductor chip or a ball grid array module to a supporting substrate includes a stepped or tapered structure. The structure is composed of at least one solder wettable metal or alloy layer having solder deposited thereon. The stepped or tapered structure prevents a fatigue crack from propagating in the X-Y plane above the adhesion pad.
Abstract:
The specification describes a thermocompression bonding process using anisotropic conductive film (ACF) bonding material in which the bonding pads are shaped to prevent depletion of conductive particles in the bonding region during compression. The process is useful in bump technology for interconnecting component assemblies on substrates such as glass, printed wiring boards, etc. The shaped structure can be made using photodefinable polymer strips around the bonding pads where the strips are thicker than the bonding pad. Alternative approaches to shaping one or both of the mating conductive surfaces are disclosed.
Abstract:
A solder ball land metal structure of a ball grid array semiconductor package capable of obtaining a maximum contact area between a solder ball land metal element and a solder ball fused on the land metal element. A solder mask defined type land metal structure according to the present invention has a single etching hole at the central portion thereof or a plurality of etching holes at the outer portion thereof in order to obtain an increased contact area for a solder ball. Each etching hole extends from the upper surface of the land metal element to the upper surface of the BT substrate throughout the land metal element or extends from the upper surface of the land metal element to a depth corresponding to about half the thickness of the land metal element. Each etching hole serves as a locking hole for fixing the fused solder ball. Thus, it is effectively prevent the solder ball from being separated from the land metal element. A non-solder mask defined type land metal structure according to the present invention has a plurality of tooth-shaped radial extensions provided at a land metal element having a conventional structure. The extension are interposed between a BT substrate and a solder mask. By such a configuration, it is effectively prevent the solder ball and land metal element from being separated from the BT substrate.
Abstract:
An electronic structure is formed of alternating layers of a metal and a cured ceramic-polymer mixture. The ceramic-polymer mixture is prepared by mixing small ceramic particles into a flowable, curable polymer. The mixture is spread over a first metallic layer and, optionally, B-stage cured. Additional metallic layers and ceramic-polymer layers are added in alternating fashion. Metallic interconnects may be provided through overlying ceramic-polymer layers to a particular metallic layer. The resulting structure is heated to a moderate temperature to cure the polymer.
Abstract:
A digital system utilizing at least one semiconductor integrated circuit die having positive mechanical alignment is provided between substrates using micro-bump contacts by forming "detented" conductive bump contacts on one substrate having a concave end which receive and align the generally convex contour of bump contacts on the other substrate. Various configurations of concavities and convexities are described. Flux may be disposed in the concave end of the detented bump contact to promote formation of joints between the concave and convex bump contacts. Both bump contacts may be formed of reflowable material, such as solder, or one or the other of the contacts may be formed of a non-reflowable material which may also function as a standoff between the two substrates. Each substrate is provided with a plurality of bump contacts, and one substrate may be provided with a combination of convex and concave bump contacts corresponding to concave and convex bump contacts on the other substrate. The inventive technique is useful for joining die-to-die, die-to-substrate, or package-to-substrate in a digital system.
Abstract:
Disclosed is a bump formed on a pad which is provided on either a semiconductor chip or a package or a wiring substrate for input or output thereof, for making electric connection on the pad. The bump has: a projection projecting from the pad; a ball having conductivity and located above the pad; and a conductive bonding material for bonding the pad for and the ball, wherein creep strength of the ball is larger than strength of the conductive bonding material. With another conductive bonding material provided on the other pad of a wiring substrate or a package, the ball of the bump of the semiconductor chip or the package is placed close to another pad of the wiring substrate or package. The conductive bonding material of the other pad is heated and melted to connect the ball and the other pad of the wiring substrate or package by the conductive bonding material.
Abstract:
A multi-layer flexible circuit board has multiple thicker regions to which components are mounted and thinner, more flexible regions with fewer wiring layers through which the board can be bent about a line without bending thicker regions. Surface mount components such as QFP's and flip-chips are mounted on the front side, and surface mount and pin-in-hole components are mounted on the back side of the circuit board at the thick regions. Heat spreaders are laminated to the back sides of thicker regions. The thicker regions have windows in which wire bond chips are mounted on the heat spreader and wire bonded to the front side of the board. A thermally conductive adhesive or grease connects between the tops of the back side components and the bottoms of the cavities. The heat sinks are bolted together and/or to an enclosure frame to improve thermal performance.
Abstract:
A multilayered printed wiring board includes a plurality of inner layer circuits, ground layers, first insulating layers, a second insulating layer, a surface layer circuit, and a parts mounting pad. The inner layer circuits are arranged parallel to each other in a flat manner in at least one inner layer. The ground layers are formed on and under the inner layer circuits to sandwich the inner layer circuits. The first insulating layers are respectively formed between the ground layers and the inner layer circuits to insulate the inner layer circuits from each other and the inner layer circuits from the ground layers. The second insulating layer is formed at least on an uppermost one of the ground layers and serving as a surface layer. The surface layer circuit is selectively formed on the second insulating layer. The parts mounting pad is formed at a predetermined region on the second insulating layer, has a recessed portion for fitting a lead portion of a mounting part therein, and is connected to the surface layer circuit. A method of manufacturing this printed wiring board is also disclosed.
Abstract:
A flexible high density interconnect structure is provided by extending the high density interconnect structure beyond the solid substrate containing the chips interconnected thereby. During fabrication, the flexible portion of the high density interconnect structure is supported by a temporary interconnect support to facilitate fabrication of the structure in accordance with existing fabrication techniques. Subsequently, that temporary support structure may be removed or may remain in place if it sufficiently flexible to impart the desired degree of flexibility to that portion of the high density interconnect structure. Methods of fabrication are also disclosed.