公开(公告)号：US20110116086A1

公开(公告)日：2011-05-19

申请号：US13010643

申请日：2011-01-20

Applicant: Jason CHRISTIANSEN ,  Robert Pinard ,  Maciej P. Zerkowski ,  Gregory R. Tedeschi

Inventor： Jason CHRISTIANSEN ,  Robert Pinard ,  Maciej P. Zerkowski ,  Gregory R. Tedeschi

IPC: G01J1/10

CPC classification number: G01N21/6486 ,  G01N21/276 ,  G01N21/278 ,  G01N21/6458 ,  G01N2021/6439

Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

公开(公告)号：US20110102784A1

公开(公告)日：2011-05-05

申请号：US12812646

申请日：2009-01-24

Applicant: Mikael Lindstrand

Inventor： Mikael Lindstrand

IPC: G01J1/10

CPC classification number: G01N21/57 ,  G01N21/27 ,  H01L27/14601 ,  H04N5/361

Abstract: A method of obtaining high dynamic range, spectrally, spatially and angularly resolved radiance of a sample surface of a sample, such as a paper sheet, accomplished by an electromagnetic irradiator irradiating electromagnetic radiation of controlled spectral distribution onto a sample surface of a sample and, using an electromagnetic sensitive sensor to register the reflected spectral distribution. The spectral distribution of the intensity of the electromagnetic field is modeled to have been reflected by a plurality of spatially well defined part-surfaces of the sample surface of the sample. The electromagnetic sensitive sensor being well-defined in terms of the functional dependency between input radiation and output signal and the registering exposure time-period being selected individually for each individual sensor element, such as to compile an information volume that represents the registered high dynamic range spectrally resolved electromagnetic radiance as a function of the position of the part-surfaces within the sample surface of the sample and of the respective angle enforced on the sample while measuring.

Abstract translation: 一种获得样品（例如纸张）的样品表面的高动态范围，光谱，空间和角度解析辐射的方法，所述样品表面通过电磁辐照器照射受辐照的受控光谱分布到样品的样品表面上， 使用电磁敏感传感器来记录反射光谱分布。 对电磁场强度的光谱分布进行建模，以便被样品的样品表面的多个空间良好限定的部分表面反射。 电磁敏感传感器在输入辐射与输出信号之间的功能依赖性以及针对每个单独传感器元件单独选择的登记曝光时间周期方面被明确定义，例如编译表示注册的高动态范围的信息量 作为样品表面内的部分表面的位置以及在测量时在样品上施加的相应角度的函数的光谱解析电磁辐射度。

公开(公告)号：US20110090494A1

公开(公告)日：2011-04-21

申请号：US10670049

申请日：2003-09-24

Applicant: Thomas Nikita Krupenkine

Inventor： Thomas Nikita Krupenkine

IPC: G01J1/10

CPC classification number: G02B3/14

Abstract: A tunable microlens uses at least two layers of electrodes and a droplet of conducting liquid. Such a droplet, which forms the optics of the microlens, moves toward an electrode with a higher voltage relative to other electrodes in the microlens. When calibration of the microlens is desired, an equal and constant voltage is passed over the first layer of electrodes and a different, constant voltage is passed over the second layer of electrodes, which may, for example, be disposed in a star-like pattern. A driving force relative to each electrode in the second layer results and is proportional to the length of the circumference of the droplet that intersects with each of the electrodes. This driving force reaches equilbrium, and hence the droplet reaches its nominal centered position relative to the second layer of electrodes, when the length of intersection of the circumference of the droplet with each of the electrodes in the second layer is equal.

Abstract translation: 可调微透镜使用至少两层电极和一滴导电液体。 形成微透镜的光学器件的这样的液滴相对于微透镜中的其它电极朝向具有较高电压的电极移动。 当需要微透镜的校准时，在第一层电极上通过相等且恒定的电压，并且不同的恒定电压通过第二电极层，其可以例如以星形图案 。 相对于第二层中的每个电极的驱动力导致与每个电极相交的液滴的圆周长度成比例。 当液滴的圆周与第二层中的每个电极的相交的长度相等时，该驱动力达到平衡，因此液滴相对于第二层电极达到其标称中心位置。

公开(公告)号：US20110062309A1

公开(公告)日：2011-03-17

申请号：US12559160

申请日：2009-09-14

Applicant: Dawson Yee

Inventor： Dawson Yee

IPC: G01J1/20 ,  G01J1/10

CPC classification number: G01J1/02 ,  G01J1/0228 ,  G01J1/32

Abstract: Various embodiments related to monitoring for optical faults in an optical system are disclosed. For example, one disclosed embodiment provides, in an optical system comprising a light source, a light outlet, and an optical element disposed between the light source and the light outlet, a method of monitoring for optical system faults. The method includes detecting, via a light sensor directed toward an interface surface of the optical element closest to the light source, an intensity of light traveling from the interface surface of the optical element to the light sensor, and comparing an intensity of light detected to one or more threshold intensity values. The method further includes identifying an optical system fault condition based on comparing the intensity of light detected to one or more threshold values, and modifying operation of the optical system.

Abstract translation: 公开了与光学系统中的光学故障的监视相关的各种实施例。 例如，一个公开的实施例在包括光源，光出口和设置在光源和光出口之间的光学元件的光学系统中提供了一种监视光学系统故障的方法。 该方法包括通过指向最靠近光源的光学元件的界面的光传感器检测从光学元件的界面到光传感器的光强度，并将检测到的光的强度与 一个或多个阈值强度值。 该方法还包括基于将检测到的光的强度与一个或多个阈值进行比较并修改光学系统的操作来识别光学系统故障状况。

公开(公告)号：US20110032529A1

公开(公告)日：2011-02-10

申请号：US12849046

申请日：2010-08-03

Applicant: Xiaoke WAN ,  Jian Ge

Inventor： Xiaoke WAN ,  Jian Ge

IPC: G01J3/45 ,  G01J1/10

CPC classification number: G01J3/02 ,  G01B9/02051 ,  G01J3/0259 ,  G01J3/28 ,  G01J3/45 ,  G01J3/4531 ,  G01J3/4532 ,  G01J2003/2866

Abstract: Calibration of an arbitrary spectrometer can use a stable monolithic interferometer as a wavelength calibration standard. Light from a polychromatic light source is input to the monolithic interferometer where it undergoes interference based on the optical path difference (OPD) of the interferometer. The resulting wavelength-modulated output beam is analyzed by a reference spectrometer to generate reference data. The output beam from the interferometer can be provided to an arbitrary spectral instrument. Wavelength calibration of the arbitrary spectral instrument may then be performed based on a comparison of the spectral instrument output with the reference data. By appropriate choice of materials for the monolithic interferometer, a highly stable structure can be fabricated that has a wide field and/or is thermally compensated. Because the interferometer is stable, the one-time generated reference data can be used over an extended period of time without re-characterization.

Abstract translation: 任意光谱仪的校准可以使用稳定的单片干涉仪作为波长校准标准。 来自多色光源的光被输入到单片干涉仪，其中它基于干涉仪的光程差（OPD）而受到干扰。 所得到的波长调制输出光束由参考光谱仪分析以产生参考数据。 来自干涉仪的输出光束可以提供给任意的光谱仪器。 然后可以基于光谱仪器输出与参考数据的比较来执行任意光谱仪器的波长校准。 通过适当选择用于单片干涉仪的材料，可以制造具有宽场和/或热补偿的高度稳定的结构。 因为干涉仪是稳定的，所以一次性生成的参考数据可以在延长的时间段内被使用，而无需重新表征。

公开(公告)号：US20110001961A1

公开(公告)日：2011-01-06

申请号：US12866914

申请日：2009-02-20

Applicant: Jorge Escuin Garcia

Inventor： Jorge Escuin Garcia

IPC: G01J1/10

CPC classification number: G08B13/1445 ,  G08B13/1481 ,  G08B13/186

Abstract: The invention relates to a security sensor (10) comprising a sensing device (21), a coming optical fiber element and a going optical fiber element, the sensing device (21) comprising a housing that receives a first end of the coming element and a first end of the going element. It is characterized in that the first end of the coming element and the first end of the going element in the housing are not aligned, and in that when a light beam enters the housing through the first end of the coming element, at least part of said light beam is reflected within the housing and exits through the first end of the going element.

Abstract translation: 本发明涉及一种安全传感器（10），包括感测装置（21），即将来来的光纤元件和走向光纤元件，该感测装置（21）包括容纳即将到来的元件的第一端和 元素的第一个结束。 其特征在于，未来元件的第一端和壳体中的元件的第一端不对准，并且当光束通过未来元件的第一端进入壳体时，至少部分 所述光束在壳体内反射并且通过去除元件的第一端而离开。

公开(公告)号：US20100265324A1

公开(公告)日：2010-10-21

申请号：US12780054

申请日：2010-05-14

Applicant: John D. Spalding

Inventor： John D. Spalding

IPC: H04N7/18 ,  G01J1/10

CPC classification number: G01B11/08 ,  G01B11/2504

Abstract: An optical method and system for generating calibration data are provided. The calibration data is for use in calibrating a part inspection system. The method includes supporting a calibration device having a central axis and a plurality of regions which are rotationally symmetric about the axis. The method further includes scanning the device with an array of spaced planes of radiation so that the device occludes each of the planes of radiation at spaced locations along the central axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the device. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain calibration data for calibrating the system. The calibration data is capable of converting raw data to calibrated data.

Abstract translation: 提供了一种用于产生校准数据的光学方法和系统。 校准数据用于校准零件检查系统。 该方法包括支持具有中心轴和围绕轴旋转对称的多个区域的校准装置。 该方法还包括用间隔开的平面阵列扫描该装置，使得该装置沿着中心轴在间隔开的位置处封闭每个辐射平面，以产生辐射平面中不受阻碍的平面部分的对应阵列。 每个无障碍平面部分包含代表装置的相应几何尺寸的辐射量。 该方法还包括测量每个无障碍平面部分中存在的辐射量以获得测量信号。 该方法包括处理测量信号以获得用于校准系统的校准数据。 校准数据能够将原始数据转换为校准数据。

公开(公告)号：US20100253935A1

公开(公告)日：2010-10-07

申请号：US12754507

申请日：2010-04-05

Applicant: NICHOLAS B. MACKINNON ,  ULRICH STANGE

Inventor： NICHOLAS B. MACKINNON ,  ULRICH STANGE

IPC: G01J3/00 ,  G01J3/28 ,  G01J1/10

CPC classification number: G01J1/32 ,  G01J3/027 ,  G01J3/0286 ,  G01J3/10 ,  G01J3/12 ,  G01J3/26 ,  G01J3/2803 ,  G01J3/42 ,  G01J3/4406 ,  G01J2003/1282 ,  G01J2003/1286 ,  G01N21/31 ,  G01N21/39 ,  G01N2021/3155

Abstract: The apparatus and methods herein provide light sources and spectral measurement systems that can improve the quality of images and the ability of users to distinguish desired features when making spectroscopy measurements by providing methods and apparatus that can improve the dynamic range of data from spectral measurement systems.

Abstract translation: 本文提供的装置和方法提供光源和光谱测量系统，其可以通过提供可以改进来自光谱测量系统的数据的动态范围的方法和装置来提高图像的质量和用户区分所需特征的能力。

公开(公告)号：US20100225890A1

公开(公告)日：2010-09-09

申请号：US12564879

申请日：2009-09-22

Applicant: Satoshi NAGAI ,  Kazuya FUKUHARA

Inventor： Satoshi NAGAI ,  Kazuya FUKUHARA

IPC: G01J1/10 ,  G03B27/54

CPC classification number: G03B27/54 ,  G03F7/70591 ,  G03F7/70941

Abstract: A method for evaluating flare of an exposure tool has measuring a first reference integral exposure amount of illumination light emitted from the light source, and a unit reference integral exposure amount of illumination light emitted from the light source, the first reference integral exposure amount being required for the first evaluation pattern to be developed on the photosensitive film, the unit reference integral exposure amount being required for the first effective exposure region to be developed on the photosensitive film; calculating a first evaluation value by dividing the unit reference integral exposure amount by the first reference integral exposure amount; and evaluating a total flare amount of the illuminating optical system and the projecting optical system, using the first evaluation value.

Abstract translation: 用于评估曝光工具的光晕的方法具有测量从光源发射的照明光的第一参考积分曝光量和从光源发射的照明光的单位参考积分曝光量，需要第一参考积分曝光量 对于要在感光膜上显影的第一评估图案，要在感光膜上显影第一有效曝光区域所需的单位参考积分曝光量; 通过将单位参考积分曝光量除以第一参考积分曝光量来计算第一评估值; 以及使用所述第一评估值来评估所述照明光学系统和所述投影光学系统的总耀斑量。

公开(公告)号：US20100219333A1

公开(公告)日：2010-09-02

申请号：US12729614

申请日：2010-03-23

Applicant: Ute Resch-Genger ,  Dietmar Pfeifer ,  Christian Monte ,  Angelika Hoffmann ,  Pierre Nording ,  Bernhard Schönenberger ,  Katrin Hoffmann ,  Monika Spieles ,  Knut Rurack

Inventor： Ute Resch-Genger ,  Dietmar Pfeifer ,  Christian Monte ,  Angelika Hoffmann ,  Pierre Nording ,  Bernhard Schönenberger ,  Katrin Hoffmann ,  Monika Spieles ,  Knut Rurack

IPC: G01J1/58 ,  G12B13/00 ,  G01J1/10

CPC classification number: G01N21/278 ,  G01N21/64 ,  G01N2021/6417 ,  Y10T436/10 ,  Y10T436/108331

Abstract: The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(λ), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(λ) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm−1. According to the method of the invention, partial correction functions Fi(λ) are generated by forming the quotient of the measured fluorescence spectra Ji(λ) and the corresponding corrected fluorescence spectra Ii(λ), which are then combined to form a total correction function F(λ) for a broad spectral range. The combination factors αi are hereby computed by statistical averaging of consecutive partial correction functions Fi(λ) over only a predefined, limited overlap region λi/i+1±ΔλOL about the mutual crossover wavelength λi/i+1.

Abstract translation: 本发明涉及用于校准光致发光测量系统，特别是荧光测量系统的方法和试剂盒。 该试剂盒包括许多荧光标准品I及其校准和认证的荧光光谱Ii（λ），从而选择荧光标准品，以使其光谱校正的荧光光谱Ii（λ）覆盖高强度的宽光谱范围。 标准的特征在于它们的至少1400cm-1的带的宽半宽度FWHMi。 根据本发明的方法，通过形成测量的荧光光谱Ji（λ）和对应的校正荧光光谱Ii（λ）的商产生部分校正函数Fi（λ），然后将其组合以形成总校正 函数F（λ）用于宽光谱范围。 因此，通过仅关于相互交叉波长λi/ i + 1的预定义的有限重叠区域λi/ i + 1±＆Dgr;λOL的连续部分校正函数Fi（λ）的统计平均来计算组合因子αi。