Abstract:
The present invention has been accomplished to provide an atomic absorption spectrophotometer capable of obtaining measurement data always in the state where the lowest detection limit performance is optimized, without depending on the frequency of the power supply. In a control program which runs on the microcomputer chip 42 mounted on the atomic absorption spectrophotometer 110, a plurality of lighting periods of the light sources 11 and 12 and extraction periods of the sampling data are memorized, whose lowest detection limit performance are optimized for the frequencies (50 Hz and 60 Hz) of the AC power source for driving the AC motor 22. In using the apparatus, by the control program, the frequency of the power source used in this apparatus is identified, the lighting period and sampling data extraction period corresponding to the identified frequency and the measurement mode that a user of the apparatus has previously set are selected from among a plurality of memorized values, and the appropriate lighting period is set to the hardware (PLD 43). Accordingly, without depending on the frequency, it is possible to obtain measurement data always in the state where the lowest detection limit performance is optimized.
Abstract:
A radiation pulse, such as from a solar simulator, is spectrally analyzed over a selected sampling pulse that is shorter in duration than the radiation pulse and is timed to begin after the start of the radiation pulse. A deformable membrane mirror is controlled to function as a high speed shutter in the path of the radiation pulse. When not deformed, the mirror reflects the radiation pulse into an optical instrument, such as a spectroradiometer. A sampling pulse is generated for a selected time after the start of the radiation pulse and is applied to the mirror to ensure total reflection of the radiation pulse only for the duration of the sampling pulse. Controls are provided to adjust the start time and duration of the sampling pulse, and to adjust the sensitivity of sensing the start of the radiation pulse.
Abstract:
An inventive optical cell measurement apparatus comprises a light source (S) which emits light having a predetermined wavelength range, a first mirror (M1) which reflects the light emitted from the light source (S), a long light path gas cell (1) to which the light reflected on the first mirror (M1) is introduced, a second mirror (M2) which reflects light outputted from the long light path gas cell (1), a sensor (D) which detects the light reflected on the second mirror (M2), and optical elements (21,22) disposed in a light path extending from the light source (S) to the sensor (D) and each having a bifocal property with different focal lengths as measured in two directions (X,Y) perpendicular to the light path. With this arrangement, the aberration of spherical mirrors (6,7) disposed in the gas cell (1) is corrected, thereby preventing reduction of the transmittance of the gas cell (1).
Abstract:
In a substrate inspecting apparatus comprising a projecting section (4) in which light sources (8), (9) and (10) are provided for emitting colored lights of R, G and B in directions having different elevation angles, one or two color components which is/are greater than the mean value of the intensities of color components is/are extracted for an inspecting region including a soldered portion. Inclined surfaces adapted to the light sources (8), (9) and (10) are converted into monochromatic shaded images by the extraction processing. A boundary position between the inclined surfaces adapted to the light sources (8) and (9) are converted into one shaded image having a mixed color of red and green and the boundary position between the inclined surfaces adapted to the light sources (9) and (10) is converted into a different shaded image.
Abstract:
An optical system for determining an optical constant by measuring the absolute reflectance and the absolute transmittance of a substance by using an incoming side beam switching mirror for selectively switching the direction of a light from a light source to first or second converged light reflecting units. The first and second converged light reflecting units project the light from the beam switching mirror so as to be converged in an intersecting manner at the position of a sample holder that can be positioned to present a sample fitting hole or a through hole for measuring the reflectance/transmittance by providing the light to an exit side beam switching mirror and detector.
Abstract:
A modular dual-beam source, sample compartment and beam-combining system are provided when used with a monochromator and detector to form a spectrophotometer consisting of: (a) a source module where two ellipsoidal mirrors each produce an image of the light source, and (b) a reflecting sample-compartment module, wherein each side has two plane-mirrors, of the four plane mirrors, three are reference and one is the sample, or (c) a transmission sample-compartment module, wherein each side has two plane-mirrors, and a sample is placed between one pair of plane-mirrors, and (d) a beam-combining module wherein the source images are imaged by a second pair of ellipsoidal mirrors on a reflective chopper that combines the images at a single location that is imaged, external to the module, by another mirror, each module being kinematically located with respect to each other so the system remains optically aligned as modules are interchanged.
Abstract:
In an analytic spectrometer (50) having a central computer (9), permanently installed and exchangeable components (5), such as a radiation source, a detector, a beam splitter, a filter, external measurement probes and the like, each of which exhibiting a readable data carrier (7) with encoded data of parameters characterizing the respective component (5), the data media (7) can be written to and contains changeable time dependent data concerning the history and/or the actual properties of the corresponding component (5) for example length of operation, performance deterioration parameters or calibration curves of the component (5). These data can be continuously adjusted by the central computer (9) to the current state of the component (5) so that the data medium (7) connected to the component (5) can immediately supply information concerning the current actual properties of the component (5) when installing the component (5) in another spectrometer.
Abstract:
An optical transmission spectrometer for transmission measurements of absorbing and scattering samples includes light sources mounted parallel to each other in a holder. The beams of light eminating from the light sources are directed through a beam-combiner. The beam-combiner includes a first refractive surface at an angle of incidence of 45.degree.. The first refractive surface refracts light toward a common axis. The beam-combiner includes a second refractive surface parallel to the first refractive surface for refracting the beam of light along a common axis parallel to the original direction of the beam of light. The beam-combiner can include additional refractive surfaces for other beams of light to combine the beams of light into a primary beam. The includes a collimating tube extending along the common axis for baffling stray light and directing the primary beam through a sample. A second collimating tube is provided on the side of the sample opposite the first collimating tube for baffling stray light passing through the sample. The second collimating tube directs the primary beam to a detector package mounted in a holder, where the detector viewing area of the sample is limited to that of the primary beam.
Abstract:
A probe, for use with a spectrophotometer, which senses the reflectance of a sample remote from the spectrophotometer. The probe includes a housing having a probe portion positionable proximate the sample, and an integrating chamber disposed within the probe housing and having a radiation input port, a sample port for passing diffused radiation to the sample and returning reflected radiation from the sample, a reference port, and an exit port to receive radiation reflected from the sample through the sample port. The probe further includes a guide for directing radiation to the radiation input port from a radiation source, and an element, responsive to the exit port and the reference port, for selectively conveying reflected radiation from the sample and the wall of the integrating chamber in the probe to the remote spectrophotometer.
Abstract:
A spectrmeter radiation transmission system is disclosed which permits concurrent availability of numerous alternative accessory devices by conserving radiation throughput. Parabolic reflectors are used to provide alternating collimated and confocal segments of radiation, thereby largely eliminating the problem of vignetting (i.e., loss of radiation throughput due to beam size expansion). Modular enclosure elements are provided, inside which the radiation path travels between the parabolic reflectors.