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公开(公告)号:US20240119577A1
公开(公告)日:2024-04-11
申请号:US18276771
申请日:2022-07-20
Inventor: Feng Lei , Wujie Zhang, Henan , Xiaoyun Lv , Gian Zhang
CPC classification number: G06T7/0002 , G01N21/8851 , G02B21/18 , G02B21/365 , G06T7/521 , G01N2201/0633 , G01N2201/0636
Abstract: The present application discloses an ultra-micro defect detection apparatus and a detection method thereof. The apparatus includes an imaging module, a light source module, a filtering module, and a mounting platform; the imaging module further includes a camera, an imaging lens, and an objective lens; the camera, the imaging lens, and the objective lens are sequentially and vertically arranged from top to bottom; the light source module further includes a collimator, a light source generator, and a beam splitting mirror; the light source generator is connected to the beam splitting mirror, and the collimator is mounted between the light source generator and the beam splitting mirror; the filtering module further includes a spatial filter, and the spatial filter is mounted between the imaging lens and the objective lens.
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公开(公告)号:US20240102937A1
公开(公告)日:2024-03-28
申请号:US18372026
申请日:2023-09-22
Applicant: Gemological Institute of America, Inc. (GIA)
Inventor: Tsung-Han TSAI , Hiroshi TAKAHASHI , Mehdi TOOSI , Yong LIU
IPC: G01N21/88 , G01N21/958 , G06T7/00 , H04N23/95
CPC classification number: G01N21/8806 , G01N21/8851 , G01N21/958 , G06T7/0002 , H04N23/95 , G01N2021/8812 , G01N2021/8822 , G01N2021/8867 , G01N2201/0633 , G01N2201/0634 , G01N2201/105 , G01N2201/126 , G01N2201/127
Abstract: Systems and methods here may be used for a setup of image capturing of a gemstone, such as a diamonds that are of high clarity grades. The present embodiments can provide methods to capture a diamond surface and internal clarity features from a diamond table and through and of other facets. Systems and methods may be used to convert gemstone dimension information into azimuth, slope, and distance information and adjust the motorized stage accordingly for surface imaging. Further, a calibration method can consider the offsets between design and actual system alignment. A calibration process can be used to compensate the offsets. Further, an additional conversion can be derived to compensate the offset caused by the geometry of the gemstone. The methods can automatically capture surface reflection images on facets of the gemstone and internal features taken through facets of the gemstone.
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143.
公开(公告)号:US11892399B2
公开(公告)日:2024-02-06
申请号:US18101448
申请日:2023-01-25
Applicant: Nikira Labs Inc.
Inventor: Manish Gupta , Rupal Gupta
CPC classification number: G01N21/31 , G02B5/10 , G02B27/30 , G01N2201/0231 , G01N2201/0633 , G01N2201/0636 , G01N2201/06113
Abstract: An optical system for performing an absorption measurement of a medium sample includes a laser source configured to output a laser beam having a wavelength corresponding to an absorption region of interest; a ringdown cavity comprising a chamber configured to receive the medium sample, an input mirror at an input end, an output mirror at an output end, and an optical axis that extends through the centers of the input mirror and the output mirror; a coupling device configured to couple the laser beam through the input mirror into the chamber; and a detector optically coupled with the cavity, and configured to detect an intensity of light of the wavelength corresponding to the absorption region of interest that extends through the output mirror, wherein a cavity geometry of the cavity increases the re-entrant condition of the cavity relative to a conventional cavity comprised of two spherical mirrors.
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公开(公告)号:US20240027331A1
公开(公告)日:2024-01-25
申请号:US17938968
申请日:2022-09-07
Applicant: OPXION TECHNOLOGY INC.
Inventor: MENG-TSAN TSAI , FENG-YU CHANG , BO-HUEI HUANG
IPC: G01N21/31
CPC classification number: G01N21/31 , G01N2201/0221 , G01N2201/08 , G01N2201/0636 , G01N2201/0633
Abstract: A hand-held scanning probe is included in an optical scanning system. The hand-held scanning probe includes a housing and an optical component. The optical component includes a first lens, a reflector, a two-dimensional beam scanning mechanism, a splitter and a second lens. The first lens is used to receive a laser beam split by a fiber-coupled splitter and convert the laser beam into a form of collimated light. The reflector is used to refract the laser beam. The two-dimensional beam scanning mechanism provides the laser beam to a surface for two-dimensional scanning, producing a swing beam. The splitter is used to separate a scanning end beam returned from the test specimen from an illumination beam into two different light paths. The second lens is used to focus the swing beam at the test surface to form the scanning end beam for scanning. An optical scanning system is also provided.
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公开(公告)号:US11874219B2
公开(公告)日:2024-01-16
申请号:US17452989
申请日:2021-10-30
Applicant: Qingdao Agricultural University , Shandong Huijinhai Wisdom Agricultural Research Institute Co., Ltd. , Weifang Huijinhai Internet of Things Technology Co., Ltd.
Inventor: Bin Liang , Baogang Xu , Lianfa Xu
CPC classification number: G01N21/25 , G01F23/30 , G01N1/14 , G01N21/01 , G01N33/24 , G01N2033/245 , G01N2201/0633 , G01N2201/06113
Abstract: An in-situ detection device for detecting water and fertilizer content in a crop cultivation substrate and a detection method thereof are provided. The in-situ detection device includes a water and fertilizer in-situ collector and a spectrum analysis device. The water and fertilizer in-situ collector that is pre-buried in the cultivation substrate is used to collect water and fertilizer in the cultivation substrate in real time to obtain a measurement sample. The spectral analysis device is used to emit a laser with a specific wavelength to detect and analyze content of nitrogen, phosphorus, and potassium in the measurement sample collected by the water and fertilizer in-situ collector; and a continuous sampling system for continuously transporting the measurement sample is provided between the water and fertilizer in-situ collector and the spectrum analysis device.
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公开(公告)号:US20230417681A1
公开(公告)日:2023-12-28
申请号:US18107648
申请日:2023-02-09
Applicant: Samsung Display Co., Ltd.
Inventor: SUNGWOO JUNG , HYEONSUK GUAK , JAEWOO JUNG
CPC classification number: G01N21/95 , G01N21/8806 , G01N21/55 , G01N2201/0633
Abstract: An inspection system includes: a single light source part which irradiates an incident light to an inspection object; a main lens through which reflected light, reflected from an inspection object and including a first polarization component and a second polarization component, passes; a beam splitter which splits a reflected light passing through a main lens into a first split light and a second split light; a first polarizer including a first filter area which selectively passes a first polarization component therethrough; a second polarizer including a second filter area which selectively passes a second polarization component therethrough; and an image sensor which generates a first captured image for a first polarization component and a second captured image for a second polarization component.
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147.
公开(公告)号:US20230408413A1
公开(公告)日:2023-12-21
申请号:US18334186
申请日:2023-06-13
Applicant: Applied Materials, Inc.
Inventor: Viswanath BAVIGADDA , Shubhayan BHATTACHARYA , Tapashree ROY , Ankur KADAM , Kiran Rangaswamy AATRE , Suraj RENGARAJAN
CPC classification number: G01N21/6456 , G01N21/643 , G01N21/39 , G01N2021/399 , G01N2201/0633 , G01N2201/1235 , G01N21/94
Abstract: In one embodiment, an apparatus to identify chemical and spatial properties of nanoparticles in a semiconductor cleaning solution, comprises a broadband light source to provide an excitation beam; a focusing lens in a path of the excitation beam to form a focused excitation beam; a sample cell, the sample cell configured to hold a cleaning solution and one or more insoluble analytes-of-interest therein; a plurality of optical lens in the path of one or more fluorescence signals to focus the one or more fluorescence signals; and an imaging device, wherein the imaging device captures the one or more fluorescence signals to form a plurality of images that contain both spatial data and spectral data about the one or more insoluble analytes-of-interest.
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148.
公开(公告)号:US11828710B2
公开(公告)日:2023-11-28
申请号:US18103069
申请日:2023-01-30
Applicant: SamanTree Medical SA
Inventor: Bastien Rachet , Davor Kosanic , Etienne Shaffer
IPC: G02B21/00 , G01N21/77 , G02B21/26 , G02B21/34 , G02B21/36 , G01N21/64 , G01N33/483 , G02B21/16 , G02B21/24
CPC classification number: G01N21/77 , G01N21/6428 , G01N21/6458 , G01N33/4833 , G02B21/004 , G02B21/0032 , G02B21/0076 , G02B21/0088 , G02B21/16 , G02B21/26 , G02B21/34 , G02B21/361 , G01N2021/6439 , G01N2021/6463 , G01N2021/7786 , G01N2201/068 , G01N2201/0633 , G02B21/0012 , G02B21/0044 , G02B21/24
Abstract: The disclosed technology brings histopathology into the operating theatre, to enable real-time intra-operative digital pathology. The disclosed technology utilizes confocal imaging devices image, in the operating theatre, “optical slices” of fresh tissue—without the need to physically slice and otherwise process the resected tissue as required by frozen section analysis (FSA). The disclosed technology, in certain embodiments, includes a simple, operating-table-side digital histology scanner, with the capability of rapidly scanning all outer margins of a tissue sample (e.g., resection lump, removed tissue mass). Using point-scanning microscopy technology, the disclosed technology, in certain embodiments, precisely scans a thin “optical section” of the resected tissue, and sends the digital image to a pathologist rather than the real tissue, thereby providing the pathologist with the opportunity to analyze the tissue intra-operatively. Thus, the disclosed technology provides digital images with similar information content as FSA, but faster and without destroying the tissue sample itself.
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公开(公告)号:US11815462B2
公开(公告)日:2023-11-14
申请号:US17614396
申请日:2020-06-18
Applicant: National Research Council of Canada
Inventor: Paul Finnie , Jacques Lefebvre
CPC classification number: G01N21/65 , G01N2201/0633
Abstract: Devices and methods to perform Raman spectroscopy with a structured excitation profile to obtain a Raman excitation map. A device includes a broadband light source to emit a broadband light beam and excitation optics to disperse the broadband light beam to strike a sample as incident light according to a structured excitation profile. The device further includes analysis optics to collect scattered light scattered by the incident light striking the sample, block Rayleigh scatter from the collected scattered light in a manner complementary to the structured excitation profile, and direct Raman scatter from the collected scattered light to a sensor to generate a signal to form a Raman excitation map.
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公开(公告)号:US11802841B2
公开(公告)日:2023-10-31
申请号:US16970451
申请日:2018-02-27
Applicant: Hitachi High-Tech Corporation
Inventor: Yuji Takagi , Yuko Otani
IPC: G01N21/95 , G06T7/70 , G01N21/47 , G01N21/88 , G01N23/203 , G01N23/2251 , G06T7/00
CPC classification number: G01N21/9505 , G01N21/47 , G01N21/8851 , G01N23/203 , G01N23/2251 , G06T7/001 , G06T7/70 , G01N2021/8854 , G01N2021/8887 , G01N2201/0633 , G01N2223/045 , G01N2223/053 , G01N2223/07 , G01N2223/418 , G01N2223/507 , G01N2223/6116 , G01N2223/646 , G06T2207/10061 , G06T2207/30148
Abstract: The invention is to provide a defect detection device capable of using a compact optical system to detect a plurality of types of defects with high sensitivity and high speed. The defect detection device includes an irradiation system that irradiates light onto an object to be inspected; an optical system that forms scattered light produced by a light irradiation into an image; a microlens array disposed at an image plane of the optical system; an imaging element that is disposed at a position offset from the imaging plane of the optical system and that images light that passes through the microlens array; a mask image storage unit that stores a plurality of mask images generated for each type of defect or each defect direction; and a calculation unit that carries out mask processing on an image obtained from the imaging element using the plurality of mask images and carries out defect detection processing.
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