Abstract:
The present invention discloses a method and apparatus for measuring the temperature field on the surface of casting billet/slab, including: a thermal imager, an infrared radiation thermometer, a mechanical scanning unit, an image and data processing system; the thermal imager, the infrared radiation thermometer and the mechanical scanning unit are respectively connected to the image and data processing system; the infrared radiation thermometer is installed on the mechanical scanning unit and can measure the temperature of casting billet/slab surface by scanning; the thermal imager can measure the temperature of a certain area on the surface of casting billet/slab by thermal imaging. The present invention makes use of the combination of high-resolution thermal imager and scan-type infrared radiation thermometer, through the model-based filtering method, overcomes the influence of iron scales on the surface of casting billet/slab, and implements real-time stable measurement of surface temperature of casting billet/slab.
Abstract:
An apparatus and method for imaging incoming radiation. The apparatus includes a radiation shield unit having a cavity. A detector array is positioned at least partially within the cavity and has a planar surface with at least one infrared detector affixed on the detector array. A diffractive optical array is positioned within the cavity and is in thermal communication with the radiation shield unit. The diffractive optical array is configured to diffract and direct the spectral components of the incoming radiation onto the detector array. The apparatus is in an external environment having a predetermined ambient temperature. The radiation shield unit, diffractive optical array and detector array may be temperature-controlled to a temperature that is within a few degrees of the ambient temperature. The radiation shield unit, diffractive optical array and detector array may be temperature-controlled to cryogenic temperatures.
Abstract:
A motion detection system for detecting the presence of a moving object within a detection zone. A first sensor responsive to light in a first range of wavelengths in the detection zone is provided to generate a first output signal indicative of a first detected parameter of the light in the first range. A second sensor responsive to light in a second range of wavelengths in the detection zone is provided to generate a second output signal indicative of a second detected parameter of the light in the second range. The second range of wavelengths is different from the first range of wavelengths and the second sensor is disposed approximately to the first sensor. A processing component is provided to generate a variable threshold value for the first sensor based upon the second output signal indicative of a second detected parameter of the light in the second range and compare the first output signal with the variable threshold value. The processing component further generates an activating signal if the first output signal exceeds the threshold value.
Abstract:
An apparatus for use with automatic testing equipment for testing infrared sensors on integrated circuits is provided. The apparatus includes an infrared source, a heat mass, and an electronic frequency modulator. The infrared source is modulated according to a predetermined test frequency such that the infrared source emits an infrared test signal representative of a test temperature and corresponding to the temperature of the heat mass and the predetermined test frequency. A signal processor, electrically coupled to an integrated circuit having an infrared sensor, receives a sensed signal from the infrared sensor in response to the infrared test signal and uses the sensed signal according to the predetermined test frequency to determine a measured temperature.
Abstract:
The present invention discloses a method and apparatus for measuring the temperature field on the surface of casting billet/slab, including: a thermal imager, an infrared radiation thermometer, a mechanical scanning unit, an image and data processing system; the thermal imager, the infrared radiation thermometer and the mechanical scanning unit are respectively connected to the image and data processing system; the infrared radiation thermometer is installed on the mechanical scanning unit and can measure the temperature of casting billet/slab surface by scanning; the thermal imager can measure the temperature of a certain area on the surface of casting billet/slab by thermal imaging. The present invention makes use of the combination of high-resolution thermal imager and scan-type infrared radiation thermometer, through the model-based filtering method, overcomes the influence of iron scales on the surface of casting billet/slab, and implements real-time stable measurement of surface temperature of casting billet/slab.
Abstract:
The invention provides a sensor array having a plurality of sensor elements formed in a first substrate and having a plurality of die temperature sensors located thereabout. Each of the die temperature sensors are configured to provide an output related to the temperature of the die on which they are located, the sensor elements providing an output indicative of the intensity of radiation incident thereon.
Abstract:
An apparatus and method for imaging incoming radiation. The apparatus includes a radiation shield unit having a cavity. A detector array is positioned at least partially within the cavity and has a planar surface with at least one infrared detector affixed on the detector array. A diffractive optical array is positioned within the cavity and is in thermal communication with the radiation shield unit. The diffractive optical array is configured to diffract and direct the spectral components of the incoming radiation onto the detector array. The apparatus is in an external environment having a predetermined ambient temperature. The radiation shield unit, diffractive optical array and detector array may be temperature-controlled to a temperature that is within a few degrees of the ambient temperature. The radiation shield unit, diffractive optical array and detector array may be temperature-controlled to cryogenic temperatures.
Abstract:
A method of correlating thermal sensors data with temperature sensor data is disclosed. The method may include generating one or more temperature sensor data points and receiving the one or more temperature sensor data points at a remote location. The method may also include generating one or more thermal sensor data points or images and receiving the one or more thermal sensor data points or images at the remote location. Additionally, the method may include correlating the one or more thermal sensor data points or images based on the one or more temperature sensor data points and generating a notification when a temperature of one or more correlated thermal sensor data points or images fails to maintain a determined relationship with a preset limit in one or more locations other than the location of one or more temperature sensor data point.
Abstract:
A probe cover for an infrared electronic thermometer including a generally tubular body having open first and second ends. The body is sized and shaped to receive a probe of the infrared electronic thermometer into the body through the first end. The probe cover further includes a film closing the second end of the body. The film has a metallic region defining a blackbody portion for rapidly equilibrating to a temperature corresponding to the temperature of an object for viewing by a sensor of the electronic thermometer to measure the temperature of the object.
Abstract:
An infrared image sensing device is provided having a pixel structure in which an output level as a reference voltage of a reference-pixel element is close to that of a pixel element. A thermal-type infrared image sensing device including pixel elements, being two-dimensionally arranged on a semiconductor substrate, each having a detector for detecting temperature, an infrared-light absorber, supported above the detector apart therefrom through a connector thereon, for absorbing incident infrared light and converting the light into heat, and a support for supporting the detector apart from the semiconductor substrate, includes reference-pixel elements, arranged adjacent to and along a row of the pixel elements, each for generating a reference signal to be a reference for a signal generated by each of the pixel elements, each having a structure for shielding a detector from incident infrared light, in which the detectors of the pixel elements and the reference-pixel elements each are connected to the semiconductor substrate through the respective supports. According to such a configuration, the difference between output levels from the reference-pixel element and the pixel element due to self-heat generation accompanying an operation of reading pixel signals is not significantly generated, and therefore the output level from the reference-pixel element is to be an ideal reference voltage.