公开(公告)号：US20050157294A1

公开(公告)日：2005-07-21

申请号：US11040709

申请日：2005-01-20

Applicant: Mark Hopkins ,  Yashvinder Sabharwal ,  Cynthia Vernold

Inventor： Mark Hopkins ,  Yashvinder Sabharwal ,  Cynthia Vernold

IPC: G01J3/04 ,  G01J3/10 ,  G01J3/28 ,  G01J3/30 ,  G01J3/36 ,  G01N21/64 ,  G02B21/26

CPC classification number: G01N21/6458 ,  G01J3/0202 ,  G01J3/0229 ,  G01J3/0235 ,  G01J3/0237 ,  G01J3/024 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/10 ,  G01J3/2823 ,  G01J3/2889 ,  G01J3/36 ,  G01N2021/6423 ,  G01N2021/6463 ,  G01N2021/6471 ,  G01N2201/024 ,  G01N2201/10 ,  G01N2201/103 ,  G02B21/26

Abstract: A method and apparatus is disclosed for multi-mode spectral imaging. In one embodiment, the present invention comprises the steps of illuminating an object with a modified illumination profile, producing a reflected, transmitted or fluorescence image of the illuminated object, scanning the object, and re-imaging the reflected, transmitted or fluorescence light after modifying the light's optical state. The present invention preferably works in conjunction with other imaging systems to provide both high-spectral resolution images with lower temporal resolution and multiple image acquisition with high temporal resolution.

Abstract translation: 公开了用于多模式光谱成像的方法和装置。 在一个实施例中，本发明包括以下步骤：用修改的照明轮廓照亮物体，产生被照射物体的反射，透射或荧光图像，扫描物体，以及在修改之后对反射的，透射的或荧光进行重新成像 光的光学状态。 本发明优选与其他成像系统结合使用，以提供具有较低时间分辨率的高光谱分辨率图像和具有高时间分辨率的多个图像采集。

公开(公告)号：US20050099622A1

公开(公告)日：2005-05-12

申请号：US11019439

申请日：2004-12-21

Applicant: Stephen Caracci ,  Norman Fontaine ,  Eric Mozdy ,  Po Yuen

Inventor： Stephen Caracci ,  Norman Fontaine ,  Eric Mozdy ,  Po Yuen

IPC: G01N21/25 ,  G02B27/10 ,  G01J3/50

CPC classification number: G01N21/253 ,  G01N2201/04 ,  G01N2201/10 ,  G02B27/1086

Abstract: Optical interrogation systems and methods are described herein that are capable of measuring the angles (or changes in the angles) at which light reflects, transmits, scatters, or is emitted from an array of sensors or specimens that are distributed over a large area 2-dimensional array. In one embodiment of the present invention, the optical interrogation system has a far-field diffraction measurement configuration so it can simultaneously receive the light from sensors in all or a sub-section of a sensor array at a detector. In another embodiment of the present invention, the optical interrogation system incorporates an anamorphic optical receive system that enables parallel detection of angular responses from the sensors in the 2D array. In yet another embodiment of the present invention, the optical interrogation system incorporates an angular measurement system which measures the change in angular tilt of the sensor plane when the sensor array is moved or removed and then replaced in the measurement system. Several other embodiments of optical interrogation systems and methods are also described herein. A significant advantage of the present invention is that the system has no critical moving or scanning parts, which are frequently the source of measurement sensitivity limitations.

Abstract translation: 本文描述了光学询问系统和方法，其能够测量光从其分布在大面积上的传感器或样本阵列2反射，透射，散射或发射的角度（或角度变化） 维数组。 在本发明的一个实施例中，光学询问系统具有远场衍射测量配置，因此它可以在检测器处同时从传感器阵列的全部或子部分接收来自传感器的光。 在本发明的另一实施例中，光学询问系统包括变形光学接收系统，其能够并行地检测来自2D阵列中的传感器的角度响应。 在本发明的另一个实施例中，光学询问系统包括角度测量系统，该系统测量当传感器阵列移动或移除并随后在测量系统中被更换时传感器平面的角度倾斜度的变化。 本文还描述了光询问系统和方法的其他几个实施例。 本发明的显着优点是该系统没有关键的移动或扫描部件，其经常是测量灵敏度限制的来源。

公开(公告)号：US20040095615A1

公开(公告)日：2004-05-20

申请号：US10295084

申请日：2002-11-14

Inventor： Chung-Hua Tsai

IPC: G06K009/00 ,  C12M001/34

CPC classification number: G01N21/253 ,  G01N2201/10 ,  G01N2201/103

Abstract: A scanner includes a casing defining an interior space in which an optic module movable in a longitudinal direction by means of a first transmission system is mounted. A carrier is arranged inside the casing below the optic module and is selectively movable out of the casing by means of a second transmission system. A tray supports an array of cells arranged in rows and columns for each receiving and retaining a biological sample to be scanned. The tray is movably mounted on the carrier and movable with respect to the carrier in a transverse direction by a third transmission system. The optic module is movable with respect to the sample cells in a line-by-line manner in the longitudinal direction, the tray being movable with respect to the optic module in a line-by-line manner in the transverse direction for covering a two-dimensional area in which the article is located.

Abstract translation: 扫描器包括限定内部空间的壳体，其中通过第一传动系统安装可在纵向方向上移动的光学模块。 载体布置在光学模块下面的壳体的内部，并通过第二传输系统选择性地移出壳体。 托盘支持排列成行和列的单元阵列，用于每个接收和保留待扫描的生物样品。 托盘可移动地安装在托架上并且通过第三传动系统在横向方向上相对于托架可移动。 光学模块可相对于样品池在纵向上以一行方式移动，托盘可相对于光学模块在横向方向上以一行方式移动以覆盖两个 文章所在的维度区域。

公开(公告)号：US20030227618A1

公开(公告)日：2003-12-11

申请号：US10386973

申请日：2003-03-11

Applicant: Applied Materials Israel Ltd

Inventor： Daniel Some

IPC: G01N021/00

CPC classification number: G01N21/9501 ,  G01N2021/479 ,  G01N2021/8825 ,  G01N2021/95676 ,  G01N2201/10 ,  G01N2201/104

Abstract: An optical inspection system rapidly evaluates a substrate by illumination of an area of a substrate larger than a diffraction-limited spot using a coherent laser beam by breaking temporal or spatial coherence. Picosecond or femtosecond pulses from a modelocked laser source are split into a plurality of spatially separated beamlets that are temporally and/or frequency dispersed, and then focused onto a plurality of spots on the substrate. Adjacent spots, which can overlap by up to about 60-70 percent, are illuminated at different times, or at different frequencies, and do not produce mutually interfering coherence effects. Bright-field and dark-field detection schemes are used in various combinations in different embodiments of the system.

公开(公告)号：US20240319109A1

公开(公告)日：2024-09-26

申请号：US18679478

申请日：2024-05-31

Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.

Inventor： Chung-Pin Chou

IPC: G01N21/95 ,  G01B11/30 ,  H01L21/67

CPC classification number: G01N21/9505 ,  G01B11/303 ,  H01L21/67288 ,  G01N2201/06113 ,  G01N2201/066 ,  G01N2201/10

Abstract: Wafer inspection apparatuses and methods are described. The wafer inspection apparatus includes an optical module, at least one wafer holder for carrying a plurality of wafers, and a plurality of optical sensors. The optical module is configured to emit a plurality of light beams for simultaneously scanning the plurality of wafers carried by the at least one wafer holder. The plurality of optical sensors is configured to receive the light beams reflected by the plurality of wafers.

公开(公告)号：US11697969B2

公开(公告)日：2023-07-11

申请号：US17398845

申请日：2021-08-10

Applicant: Pioneer Natural Resources USA, Inc.

Inventor： Benjamin Richard Potash

IPC: E21B12/02 ,  G01N21/95 ,  G06T7/00 ,  G06T7/30 ,  G01N21/88 ,  E21B10/00 ,  G06F18/00 ,  B23Q17/09 ,  B23B49/00

CPC classification number: E21B12/02 ,  E21B10/00 ,  G01N21/8851 ,  G01N21/95 ,  G06F18/00 ,  G06T7/001 ,  G06T7/30 ,  B23B49/001 ,  B23B2260/144 ,  B23Q17/0995 ,  G01N2201/10 ,  G05B2219/37233 ,  G06T2207/10028 ,  G06T2207/20081 ,  G06T2207/20084 ,  G06T2207/30164

Abstract: A system for improving drill bit performance, having processors and memory storing instructions to obtain a wear report for a drill bit, wherein the wear report includes wear characteristics of the drill bit and drill operating parameters under which the drill bit was used; compare the wear characteristics of the drill bit to a threshold for acceptable drill bit wear; and adjust drill operating parameters based on the wear characteristics of the drill bit. The instructions to obtain the wear report for the drill bit include instructions to analyze images of the drill bit to identify wear characteristics; identify wear patterns based on the wear characteristics of the drill bit; identify probable drilling conditions based on the wear patterns; and generate the wear report for the drill bit based on the images of the drill bit, the wear characteristics of the drill bit, and the probable drilling conditions.

公开(公告)号：US20230160832A1

公开(公告)日：2023-05-25

申请号：US17997152

申请日：2021-05-20

Applicant: BSD ROBOTICS PTY LTD

Inventor： Andrew Stewart

IPC: G01N21/88 ,  G01N21/01 ,  G01N33/48 ,  G01N35/00

CPC classification number: G01N21/88 ,  G01N21/01 ,  G01N33/48 ,  G01N35/00732 ,  G01N2201/10 ,  G01N2035/00752 ,  G01N2201/0636 ,  G01N2201/121 ,  G01N2201/0693

Abstract: The present invention relates to a biological sample quality apparatus for determining the quality of a biological sample. The apparatus includes a sample receiver for receiving the biological sample. One or more light sources are provided for supplying light to the sample. An image sensor is provided for capturing an image of the lit sample. The apparatus also includes an image processor for image processing the captured image to determine the quality of the sample. Advantageously, image processing may be used to determine the quality of a sample for use in collection sites and screening laboratories so that acceptability can be determined prior to analyzing the sample. Determination that the sample is of sufficient quality (e.g. sufficient biomaterial) prior to analyzing saves wastage of laboratory time and expense of materials and chemicals. The apparatus may be in the form of desktop or hand-held portable variations.

公开(公告)号：US20190178776A1

公开(公告)日：2019-06-13

申请号：US15836297

申请日：2017-12-08

Applicant: Michael W. LeFevere ,  Raymond Slowik

Inventor： Michael W. LeFevere ,  Raymond Slowik

IPC: G01N15/06 ,  G01N21/88

CPC classification number: G01N15/0625 ,  B08B3/04 ,  G01N21/8422 ,  G01N21/8803 ,  G01N21/8851 ,  G01N2021/945 ,  G01N2201/10

Abstract: In at least one implementation, a blank washer inspection process includes the steps of: applying at least one test particle to a blank; washing the blank having the test particle thereon; inspecting the blank after it has been washed to identify any test particle on the blank; and comparing any test particle identified in the inspection step to a threshold. The threshold may relate to a control property of the test particle. In at least some implementations, the control property is the size of the particle and a maximum size may be set as a threshold. Other control properties may be used. Further the test particles may include detection properties to facilitate identifying test particles and distinguishing among test particles in different groups.

公开(公告)号：US20180313804A1

公开(公告)日：2018-11-01

申请号：US15817238

申请日：2017-11-19

Applicant: The Regents of the University of California

Inventor： Cristian ROGEL-CASTILLO ,  Alyson MITCHELL

IPC: G01N33/02 ,  G01N21/359 ,  G01N21/3563 ,  G01N21/95

CPC classification number: G01N33/025 ,  G01N21/3563 ,  G01N21/359 ,  G01N21/95 ,  G01N2021/8405 ,  G01N2021/8466 ,  G01N2201/10 ,  G01N2201/129

Abstract: Provided are methods and systems for efficiently and non-invasively identifying nuts (e.g., almonds) having concealed damage using near infrared scanning. The methods identify nuts having concealed damage with a certainty greater than 90% and an error rate that is less than 10%.

公开(公告)号：US20180240227A1

公开(公告)日：2018-08-23

申请号：US15441104

申请日：2017-02-23

Applicant: The Boeing Company

Inventor： Martin Szarski

IPC: G06T7/00 ,  G01N21/88 ,  G06T7/38 ,  G06T7/33 ,  G06T7/73 ,  H04N7/18 ,  B64F5/60 ,  G05D1/02

CPC classification number: G06T7/001 ,  B64F5/10 ,  B64F5/60 ,  G01N2201/0216 ,  G01N2201/10 ,  G05B19/41895 ,  G05B2219/45066 ,  G05D1/0246 ,  G05D2201/0207 ,  G06Q10/04 ,  G06Q50/04 ,  G06T7/0006 ,  G06T7/344 ,  G06T7/38 ,  G06T7/74 ,  G06T2207/30108 ,  G06T2207/30248 ,  H04N7/185 ,  Y02P90/285 ,  Y02P90/60

Abstract: A method and apparatus for establishing a pathway for performing an automated validation of a condition of assembly. A sensor system coupled to an automated guided vehicle is moved into test positions relative to the structure. Image data is generated at each test position, using the sensor system, to build test images. Each test image is registered to a computer model of the structure to form registered images that are added to a collection of registered images. An optimal set of positions that will allow an entirety of an area of interest to be captured using a fewest number of registered images from the collection of registered images is determined. A pathway is generated for moving the automated guided vehicle to each optimal position in a least amount of time. A computer file identifying the pathway is generated for use in performing the automated validation of the condition of assembly.