公开(公告)号：US09410986B2

公开(公告)日：2016-08-09

申请号：US14557879

申请日：2014-12-02

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Hao Wei ,  Chia-Nan Chou ,  Chih-Hao Ho

IPC: G01R1/04

CPC classification number: G01R1/0466

Abstract: A testing jig includes a substrate, a carrier provided on the substrate, two conductive members made of a conductive material, and a compensation member made of a conductive material. The substrate has a signal circuit and a grounding circuit thereon. The carrier has a base board made of an insulating material and a conductive circuit made of a conductive material provided thereon. The base board has a signal perforation aligning with the signal circuit, a grounding perforation aligning with the grounding circuit, and multiple compensation holes. The conductive members both have an end exposed out of the carrier, and are respectively fitted in the signal perforation and the grounding perforation to make another end thereof contact the signal circuit or the grounding circuit. The compensation member is fitted in one of the compensation holes to be electrically connected to the conductive member in the grounding perforation through the conductive circuit.

Abstract translation: 测试夹具包括衬底，设置在衬底上的载体，由导电材料制成的两个导电构件和由导电材料制成的补偿构件。 衬底上具有信号电路和接地电路。 载体具有由绝缘材料制成的基板和设置在其上的由导电材料制成的导电电路。 基板具有与信号电路对准的信号穿孔，与接地电路对准的接地穿孔，以及多个补偿孔。 导电构件都具有暴露在载体外的端部，并且分别装配在信号穿孔和接地穿孔中，以使另一端与信号电路或接地电路接触。 补偿部件安装在一个补偿孔中，以通过导电电路与接地穿孔中的导电部件电连接。

公开(公告)号：US20140103948A1

公开(公告)日：2014-04-17

申请号：US14133603

申请日：2013-12-18

Applicant: MPI CORPORATION

Inventor： Chao-Ching Huang ,  Chih-Hao Ho ,  Wei-Cheng Ku

IPC: G01R31/28 ,  G01R1/073

CPC classification number: G01R31/2887 ,  G01R1/07314 ,  G01R31/2889

Abstract: A probe card having a configurable structure for exchanging/swapping electronic components for impedance matching is provided. In the probe card, an applied force is exerted on the electronic component so as to make the electronic component electrically connected with at least one conductive contact pad of a supporting unit. The supporting unit is a circuit board or a space transformer. In order to facilitate the exchange or swap of the electronic component, the applied force can be removed. The probe card includes a pressing plate which can be moved between a pressing position and a non-pressing position. The pressing plate has a pressing surface which is contacted with the top end of the electronic component while the pressing plate is in the pressing position. Therefore, the applied force can be generated or removed by changing the positioning of the pressing plate.

Abstract translation: 提供具有用于交换/交换电子部件用于阻抗匹配的可配置结构的探针卡。 在探针卡中，施加的力施加在电子部件上，以使电子部件与支撑单元的至少一个导电接触垫电连接。 支持单元是电路板或空间变压器。 为了促进电子部件的交换或交换，可以移除施加的力。 探针卡包括能够在按压位置和非按压位置之间移动的按压板。 按压板具有在按压板处于按压位置时与电子部件的顶端接触的按压面。 因此，可以通过改变压板的定位来产生或去除施加的力。

公开(公告)号：US20240329083A1

公开(公告)日：2024-10-03

申请号：US18592773

申请日：2024-03-01

Applicant: MPI CORPORATION

Inventor： CHIA-NAN CHOU ,  Chung-Yen Huang ,  Wen-Chin Yang ,  Wen-Hung LO ,  Wei-Lwen Yeh ,  Chih-Hao Ho

IPC: G01R1/067 ,  G01R1/073

CPC classification number: G01R1/06772 ,  G01R1/0675 ,  G01R1/07314

Abstract: A position-adjustable probing device comprises a stationary probe comprising a first coaxial structure having a first needle core, a first dielectric layer, and a first exterior conductive layer, and a first and a second movable probes. The first movable probe arranged at a first side of the stationary probe comprises a ground needle core, and a first extending structure comprising a first planar structure electrically contacted with the stationary probe through a first movement, a first top surface and a first bottom surface. The second movable probe arranged at a second side of the stationary needle comprises a second coaxial structure comprising a second needle core, a second dielectric layer, and a second exterior conductive layer, and a second extending structure comprising a second planar structure electrically contacted with the stationary probe through a second movement, a second top surface, and a second bottom surface.

公开(公告)号：US09835651B2

公开(公告)日：2017-12-05

申请号：US14619597

申请日：2015-02-11

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Hao Wei ,  Jun-Liang Lai ,  Chih-Hao Ho

IPC: G01R1/067

CPC classification number: G01R1/06727 ,  G01R1/06772

Abstract: A high-frequency cantilever type probe card includes a base board, a probe base provided on the base board, two probes, and a capacitor having opposite ends electrically connected to the probes respectively. The probe base is made of an insulating material, and the probes are made of a conductive material. Each of the probes has an arm and a tip, wherein the arm is connected to the probe base, and the tip is adapted to contact a pad of a DUT. When the DUT generates a testing signal with a high frequency, and the testing signal is transmitted to one of the probes, the capacitor, and the other one of the probes in sequence, and then transmitted back to the DUT.

公开(公告)号：US09622348B2

公开(公告)日：2017-04-11

申请号：US14332269

申请日：2014-07-15

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Jun-Liang Lai ,  Chun-Chung Huang ,  Jing-Zhi Hung ,  Yung Nan Wu ,  Chih-Hao Ho

IPC: H05K1/11 ,  H05K1/02 ,  H05K3/42

CPC classification number: H05K1/116 ,  H05K1/0298 ,  H05K3/429 ,  H05K2201/09845

Abstract: A multilayer circuit board includes a plurality of stacked substrates, a plurality of first conductive lands, and a plurality of second conductive lands. A surface at a side of each of the substrates has an exposed portion which is not covered by the neighboring substrate, wherein each of the first conductive lands is respectively provided on each of the exposed portions. Each of the second conductive lands is provided on the exposed portion of the outermost substrate, wherein each of the substrates has a conductor pattern to be electrically connected to one of the first conductive lands and to one of the second conductive lands.

公开(公告)号：US20160305981A1

公开(公告)日：2016-10-20

申请号：US15098186

申请日：2016-04-13

Applicant: MPI Corporation

Inventor： Wei-Cheng Ku ,  Jun-Liang Lai ,  Chih-Hao Ho ,  Hao Wei

IPC: G01R1/073

CPC classification number: G01R31/2889 ,  G01R31/31924

Abstract: A probe card for transmitting power signals from a tester to two devices under test (DUTs) is provided, which includes two signal pins, two power conducting circuits, and at least a matching part. The signal pins are made of conductive materials, wherein one end of the signal pin contacts one of the DUTs. The two power conducting circuits are electrically connected to the two signal pins respectively to transmit the power signals to the DUTs. One of two ends of the power conducting circuits is connected to the signal pins; the other end of the power conducting circuits is electrically connected to the tester. The matching part is electrically connected to the power conducting circuit in parallel to lower a resistance of the power conducting circuit below a predetermined value, or to lower a percentage error of resistance of the power conducting circuit below a predetermined percentage error.

Abstract translation: 提供了用于从测试仪向两个待测器件（DUT）发送功率信号的探针卡，其中包括两个信号引脚，两个电源电路和至少一个匹配部分。 信号引脚由导电材料制成，其中信号引脚的一端接触DUT中的一个。 两个电源电路分别电连接到两个信号引脚以将功率信号传输到DUT。 电源电路的两端之一连接到信号引脚; 电源电路的另一端与测试器电连接。 匹配部分并联地电连接到电力传导电路，以将导电电路的电阻降低到预定值以下，或将导电电路的电阻百分比误差降低到预定百分比误​​差以下。