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    Apparatus and method for controlling the operating wavelength of a laser
    11.
    发明申请
    Apparatus and method for controlling the operating wavelength of a laser 审中-公开
    用于控制激光器的工作波长的装置和方法

    公开(公告)号：US20020181519A1

    公开(公告)日：2002-12-05

    申请号：US10189030

    申请日：2002-07-02

    Applicant: Altitun AB

    Inventor： Kennet Vilhelmsson ,  Bjorn Broberg ,  Robert Plastow

    IPC: H01S003/13

    CPC classification number: G01J9/0246 ,  G01J2009/0257 ,  H01S3/1305 ,  H01S5/06256 ,  H01S5/0687 ,  H01S5/1209

    Abstract: The present invention relates to an approach to locking the output wavelength of a laser that uses an etalon having non-parallel surfaces. Under this approach, the non-parallel etalon is formed from a readily available, low cost optical component, and may include an etalon with a wedged shape or with at least one curved surface. This approach offers significant advantages over the use of a planar etalon. It provides two degrees of freedom in alignment of the device, and so both the absolute wavelength and the spacing between the interference fringes can be independently adjusted. It also reduces the cost and difficulty of assembly, since it utilizes standard optical parts with wide tolerances. The invention may be used within a standard laser package. The invention also permits the laser to be tuned to a precise operating wavelength by setting various tuning signals according to values stored in memory.

    Abstract translation: 本发明涉及锁定使用具有非平行表面的标准具的激光器的输出波长的方法。 在这种方法下，非平行标准具由容易获得的低成本光学部件形成，并且可以包括具有楔形形状或至少一个弯曲表面的标准具。 这种方法比使用平面标准具提供了显着的优点。 它提供了器件对准的两个自由度，因此绝对波长和干涉条纹之间的间隔都可以独立调整。 它也降低了组装的成本和难度，因为它采用了宽公差的标准光学部件。 本发明可以在标准激光器封装内使用。 本发明还允许通过根据存储在存储器中的值设置各种调谐信号来将激光器调谐到精确的工作波长。

    Wavelength manager
    12.
    发明授权
    Wavelength manager 失效
    波长管理器

    公开(公告)号：US06078394A

    公开(公告)日：2000-06-20

    申请号：US12887

    申请日：1998-01-23

    Applicant: Nigel R Wood

    Inventor： Nigel R Wood

    IPC: G01J3/06 ,  G01J9/00 ,  G01J9/02 ,  G01J9/04 ,  H04B10/155 ,  G01B9/02

    CPC classification number: G01J9/04 ,  G01J9/02 ,  H04B10/506 ,  H04B10/572 ,  G01J2009/0257

    Abstract: Scanning based wavelength measurement systems which are suitable for both localised and distributed WDM, High Density WDM, and coherent systems are based around the use of a fixed cavity Fabry-Perot Etalon which when the output of a tuneable laser is passed through it produces a number of reference equispaced transmission maxima. These maxima are used in a Scanning Heterodyne or Scanning Filter based Spectrometer for detection of the wavelength position of the transmitter.

    Abstract translation: 适用于局部和分布式WDM，高密度WDM和相干系统的基于扫描的波长测量系统基于使用固定腔法布里 - 珀罗Etalon，当可调谐激光器的输出通过它时，产生数字 的参考等距传输最大值。 这些最大值用于基于扫描异步或扫描滤波器的光谱仪，用于检测发射机的波长位置。

    OPTICAL PRESSURE SENSOR
    16.
    发明申请
    OPTICAL PRESSURE SENSOR 有权
    光压传感器

    公开(公告)号：US20150020599A1

    公开(公告)日：2015-01-22

    申请号：US14385358

    申请日：2013-03-13

    Applicant: OXSENSIS LTD

    Inventor： Ralf-Dieter Pechstedt ,  Fabrice F.M. Maillaud

    IPC: G01L11/02

    CPC classification number: G01L11/02 ,  G01D3/028 ,  G01J3/0286 ,  G01J3/26 ,  G01J2009/0257 ,  G01L9/0079 ,  G01L9/0092 ,  G01L19/04 ,  G01L27/002

    Abstract: An optical pressure sensor is disclosed having a pressure sensing optical cavity. A temperature sensing optical cavity at the sensor head is used by an interrogator to correct a pressure signal for effects of temperature. The optical cavities may be, for example, Fabry Perot cavities in the sensor head.

    Abstract translation: 公开了一种具有压力感测光腔的光学压力传感器。 传感器头的温度感测光学腔由询问器使用，以校正温度影响的压力信号。 光学腔可以是例如传感头中的法布里珀罗腔。

    Light wavelength meter
    17.
    发明授权
    Light wavelength meter 有权
    光波长计

    公开(公告)号：US06858834B2

    公开(公告)日：2005-02-22

    申请号：US09798499

    申请日：2001-03-01

    Applicant: John C. Tsai

    Inventor： John C. Tsai

    IPC: G01J3/26 ,  G01J9/00 ,  G01J9/02 ,  H01S3/13 ,  H04B10/08 ,  H04B10/155 ,  G01J3/50 ,  H01J5/16 ,  H01J40/14

    CPC classification number: G01J9/00 ,  G01J3/26 ,  G01J2009/0257 ,  H01S3/13 ,  H04B10/07 ,  H04B10/503 ,  H04B10/572

    Abstract: A light wavelength meter (10) able to accept light into a light diverter (16) and impart to it a transverse displacement characteristic which can be detected in a light detection unit (20) connected to a processor (22). Optionally, a light diverger (18) may be provided to enhance angular resolution. The light diverter (16) and the light diverger (18) may either transmit or reflect the light. The light diverter (16) may particularly include a diffraction grating (116, 156), Fabry-Perot interferometer (216), multiple slit plate (316), or an acousto-optical unit (416).

    Abstract translation: 一种光波长计（10），其能够将光接收到光分路器（16）中并向其施加横向位移特性，其可以在连接到处理器（22）的光检测单元（20）中检测。 可选地，可以提供光发散器（18）以增强角度分辨率。 光分路器（16）和光分路器（18）可以传输或反射光。 光分路器（16）可以特别地包括衍射光栅（116,156），法布里 - 珀罗干涉仪（216），多个狭缝板（316）或声光单元（416）。

    Double etalon optical wavelength reference device
    18.
    发明申请
    Double etalon optical wavelength reference device 审中-公开
    双标准光波长参考装置

    公开(公告)号：US20040091002A1

    公开(公告)日：2004-05-13

    申请号：US10328711

    申请日：2002-12-23

    Inventor： Reich Watterson ,  Parviz Tayebati ,  Don McDaniel ,  Kevin McCallion

    IPC: H01S003/10

    CPC classification number: G01J9/0246 ,  G01J2009/0257 ,  H01S5/0078 ,  H01S5/0687 ,  H01S5/18366 ,  H01S5/18388

    Abstract: A compact wavelength monitoring and control assembly for a narrow band (i.e., laser) source is provided, comprising two narrow bandpass, wavelength selective transmission filter elements of Fabry-Perot structure through which two separate collimated beams from a laser source are directed onto two photodetectors. The spacing of the multiple transmission maxima for one etalon is chosen to match that of the desired set of frequencies to be used for locking purposes. The spacing of the transmission maxima for the second etalon is used, in combination with a dielectric filter, to generate a wavelength fiducial to denote an absolute frequency. The spacing of the second etalon is chosen to be much wider than the frequency grid etalon. A control circuit processes the simultaneously acquired signals from the two detectors as the laser wavelength is varied. The device functions as an optical wavelength discriminator in which the detectors convert optical energy to current (or voltage) for a feedback loop for controlling the laser source. Any one of a large number of discrete, predetermined wavelengths may be chosen for locking using the same device. The system is compact and may be packaged within the same temperature controlled laser assembly for maximum performance and minimum circuit board space requirements.

    Abstract translation: 提供了一种用于窄带（即激光）源的紧凑型波长监视和控制组件，其包括法布里 - 珀罗结构的两个窄带通波长选择性透射滤波器元件，来自激光源的两个分离的准直光束通过该组件被引导到两个光电检测器 。 选择一个标准具的多个传输最大值的间距以匹配要用于锁定目的的期望频率组的间隔。 与介质滤波器组合使用第二标准具的透射最大值的间隔以产生表示绝对频率的波长基准。 第二个标准具的间距被选择为比频率网格标准具宽得多。 当激光波长变化时，控制电路处理来自两个检测器的同时采集的信号。 该器件用作光学波长鉴别器，其中检测器将光能转换成用于控制激光源的反馈回路的电流（或电压）。 可以选择大量离散的预定波长中的任何一个用于使用相同的装置进行锁定。 该系统紧凑，可以封装在相同的温度控制激光器组件中，以实现最大的性能和最小的电路板空间要求。

    Light wavelength meter
    19.
    发明申请
    Light wavelength meter 有权
    光波长计

    公开(公告)号：US20020125405A1

    公开(公告)日：2002-09-12

    申请号：US09798499

    申请日：2001-03-01

    Inventor： John C. Tsai

    IPC: G01J001/20

    CPC classification number: G01J9/00 ,  G01J3/26 ,  G01J2009/0257 ,  H01S3/13 ,  H04B10/07 ,  H04B10/503 ,  H04B10/572

    Abstract: A light wavelength meter (10) able to accept light into a light diverter (16) and impart to it a transverse displacement characteristic which can be detected in a light detection unit (20) connected to a processor (22). Optionally, a light diverger (18) may be provided to enhance angular resolution. The light diverter (16) and the light diverger (18) may either transmit or reflect the light. The light diverter (16) may particularly include a diffraction grating (116, 156), Fabry-Perot interferometer (216), multiple slit plate (316), or an acousto-optical unit (416).

    Abstract translation: 一种光波长计（10），其能够将光接收到光分路器（16）中并向其施加横向位移特性，其可以在连接到处理器（22）的光检测单元（20）中检测。 可选地，可以提供光发散器（18）以增强角度分辨率。 光分路器（16）和光分路器（18）可以传输或反射光。 光分路器（16）可以特别地包括衍射光栅（116,156），法布里 - 珀罗干涉仪（216），多个狭缝板（316）或声光单元（416）。

    DEVICE AND METHOD FOR MEASURING WAVELENGTH FOR LASER DEVICE
    20.
    发明公开
    DEVICE AND METHOD FOR MEASURING WAVELENGTH FOR LASER DEVICE 审中-公开

    公开(公告)号：US20230144290A1

    公开(公告)日：2023-05-11

    申请号：US17915434

    申请日：2020-12-11

    Applicant: Beijing RSLaser Opto-Electronics Technology Co., Ltd.

    Inventor： Guangyi LIU ,  Rui JIANG ,  Xiaoquan HAN ,  Jiangshan ZHAO ,  Pengfei SHA ,  Qingqing YIN ,  Hua ZHANG

    IPC: G01J9/02

    CPC classification number: G01J9/0246 ,  G01J2009/0234 ,  G01J2009/0257

    Abstract: According to the present disclosure, there is provided a device (2) and a method for measuring a wavelength for a laser device. The device (2) for measuring a wavelength for a laser device includes: a first optical path assembly and a second optical path assembly. The first optical path assembly and the second optical path assembly constitute a laser wavelength measurement optical path. The second optical path assembly includes: an FP etalon assembly (11) and an optical classifier (13). The homogenized laser beam passes through the FP etalon assembly (11) to generate an interference fringe. The optical classifier (13) is arranged after the FP etalon assembly (11) in the laser wavelength measurement optical path, and configured to deflect the laser beam passing through the FP etalon assembly (11). The FP etalon assembly (11) allows two FP etalons (FP1, FP2) to share the same optical path for an interference imaging, and therefore a compact structure having a small volume, a simple design, and a high stability are achieved. In cooperation with the optical classifier (13), a precise measurement for a laser wavelength may be achieved, and at the same time a wavelength measurement range is large. It is suitable for an online measurement for a laser wavelength and a corresponding closed-loop control feedback.

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