Abstract:
A measuring-wavelength apparatus includes a beam splitter (2), a first optical sensor (6), a second optical sensor (7), a signal-attenuation component (5) and a processing unit (8). A measuring-wavelength method comprising: splitting an incoming light into a first beam and a second beam; transforming the first beam into a first output signal; attenuating the second beam by using a signal-attenuation component; transforming the attenuated second beam into a second output signal; calculating a difference between the first and the second output signals to achieve an optical loss of the light; and in view of the optical loss, looking up a reference table to obtain a wavelength of the light.
Abstract:
An optical power control system for a semiconductor source spectroscopy system controls power fluctuations in the tunable signal from the spectroscopy system and thus improves the noise performance of the system. This general solution has advantages relative to other systems that simply detect reference power levels during the scan and then correct the detected signal after interaction with the sample by reducing the requirements for coordinating the operation of the sample detectors and power or reference detectors. The spectroscopy system comprises a semiconductor source and a tunable filter. The combination of the semiconductor source and tunable signal illuminate a sample with a tunable signal, being tunable over a scan band. The power control system comprises an amplitude detector system for detecting the power of the tunable optical signal and power control system for regulating the amplitude of the tunable optical signal in response to its detected power.
Abstract:
A disc serving as a spatial radiation modulator has dispersed radiation filters thereon. Each filter has a transmittance or reflectance modulation function of the form sin2(m&thgr;+p&pgr;/4), where m is a positive integer and p has one of the four values 0, 1, 2, 3. A radiation beam including selected wavelength components is diffracted into an elongated image dispersed according to wavelength. Different wavelength components are focused onto different filters on the modulator and are encoded by correspond filters. Since the modulation functions of the filters are orthogonal to one another, it is possible to extract the amplitude of each wavelength component after it has been encoded or modulated by corresponding filter from the total detected signal during one measurement.
Abstract translation:用作空间辐射调制器的盘在其上具有分散的辐射滤波器。 每个滤波器具有形式为sin2(mtata + ppi / 4)的透射率或反射率调制函数,其中m是正整数,p具有四个值0,1,2,3中的一个。包括选择的波长分量 被衍射成根据波长分散的细长图像。 不同的波长分量聚焦在调制器上的不同滤波器上,并由相应的滤波器编码。 由于滤波器的调制功能彼此正交,因此可以在一次测量期间从总检测信号对相应的滤波器进行编码或调制之后提取每个波长分量的振幅。
Abstract:
Methods for wavelength determination of a monochromatic light beam are described. The methods involve a detector unit containing at least one pair of photo detectors. One of the detectors in each detector pair is covered with a variable attenuator and the other is not covered by the variable attenuator. The optical transmission coefficient of the variable attenuator is a monotonic function of wavelength. Under illumination of a monochromatic light, the photocurrents produced in the detectors with and without the variable attenuator are compared. The relative values of the photocurrents are used to determine the wavelength of the monochromatic light.
Abstract:
In an interferometer comprising a beam splitter made up of a parallel planar plate and translucent (that is, semi-reflecting) films formed on both sides thereof, and a pair of reverse reflectors disposed at predetermined distances from the two surfaces of the beam splitter, an incident beam is split into two beams by one of the translucent films, and the two beams are reflected by the reverse reflectors, thus interfering with each other at the other translucent film.
Abstract:
An apparatus for detecting an ultraviolet blocking material includes a light receiver configured to acquire detection light from a target object; a spectrum signal generator configured to generate spectrum signals based on the detection light; and a processor configured to: select a reference wavelength from a range from about 290 nm to about 400 nm, and detect an ultraviolet blocking material based on a first spectrum signal of a first wavelength less than the reference wavelength and a second spectrum signal of a second wavelength greater than the reference wavelength, the first spectrum signal and the second spectrum signal being generated by the spectrum signal generator.
Abstract:
Spectrum sensors can be continuously calibrated in a manufacturing environment employing a continuously moving platform that carries the spectrum sensors in combination with spatially separated light spectra illuminating a region of the platform. A plurality of spectrum sensors, each including multiple sensor pixels, can be placed on the platform. The spatially separated light spectra can be illuminated over an area of the platform. The plurality of spectrum sensors can be moved with the platform through a region of the spatially separated light spectrum. Each sensor pixel for each of the plurality of spectrum sensors can be calibrated based on response of each spectral channel during passage through the spatially separated light spectra. The entire spectra from a light source can be employed simultaneously to calibrate multiple spectrum sensors in the manufacturing environment.
Abstract:
An optoelectronic module operable to acquire distance data and spectral data includes an array of demodulation pixels and an array of spectral filters. The demodulation pixels can possess an intrinsic wavelength-dependent sensitivity, wherein the intrinsic wavelength-dependent sensitivity can be offset by an intensity balancing micro-lens array in some cases. In some cases, the intrinsic wavelength-dependent sensitivity can be offset by a combined filter array, while in other cases the intrinsic wavelength-dependent sensitivity can be offset by an intensity balancing filter array. Still in other cases, the demodulation pixels can be operable in such as to offset the intrinsic wavelength-dependent sensitivity.