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公开(公告)号：US09891176B2
公开(公告)日：2018-02-13
申请号：US15308001
申请日：2015-08-04
Applicant: MACHINE VISION LIGHTING INC.
Inventor： Shigeki Masumura
CPC classification number: G01N21/8806 , G01N2201/062 , G01N2201/0636 , G01N2201/0638 , G01N2201/068 , G02B27/02 , G02B27/144 , G02B27/30
Abstract: In the inspection lighting device, between a surface light source for emitting an inspection light and the inspection object, at least one shielding mask is disposed, and a lens is disposed on a side closer to the inspection object than the shielding mask such that the shielding mask is positioned across the focus position of this lens as a center. In an irradiation solid angle of the inspection light for the inspection object formed when the light emitted from the surface light source is irradiated on to the inspection object by the lens the shielding mask forms a dark area. So that, in accordance with a change in reflection, transmission, scattering occurring at a feature point on the inspection object, a shape, a size, a tilt of the irradiation solid angle of the inspection light can be changed.
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公开(公告)号：US09877368B2
公开(公告)日：2018-01-23
申请号：US15015810
申请日：2016-02-04
Applicant: SHIMADZU CORPORATION
Inventor： Yusuke Nagai , Keisuke Ogawa , Masato Watanabe , Kumiko Jingu , Masanori Fujiwara , Tomoyuki Yamazaki
CPC classification number: H05B33/0851 , G01N21/33 , G01N2201/0621 , G01N2201/0638 , G01N2201/0692 , G01N2201/0695
Abstract: Provided is an optical analyzer for performing a feedback control on the amount of light emitted from an LED as a light source, in which the configuration of an optical system is made simple and the degree of freedom in optical system arrangement is secured. An optical member 2 for focusing most of light while discharging part of the light as unfocused light is provided on an optical path from a light casting unit 1 to a sample cell 3. The optical member 2 can be achieved with a simple configuration, for example, two ball lenses spaced apart by a predetermined distance from each other. The light focused by the optical member 2 is cast as measurement light into the sample cell 3. Meanwhile, a second photodetector 5 is arranged at a position where the unfocused light reaches. The second photodetector 5 generates a detection signal in accordance with the amount of light that has entered the second photodetector 5 as monitored light, and a drive current to be supplied to an LED is controlled through a drive current controlling unit 6 and a current source 7 such that the amount of light is maintained at a fixed level.
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公开(公告)号：US09841378B2
公开(公告)日：2017-12-12
申请号：US14699755
申请日：2015-04-29
Applicant: BIO-RAD LABORATORIES, INC.
Inventor： Evan Thrush , Steve Swihart , Neeraj Bhatt
IPC: G01N21/64
CPC classification number: G01N21/6456 , G01N21/6486 , G01N2021/6439 , G01N2021/6471 , G01N2021/6482 , G01N2201/062 , G01N2201/0627 , G01N2201/0638 , G01N2201/12
Abstract: An imaging assembly and processing system that includes a sample platform having a target region which can hold a sample, where the sample can be marked with fluorescent or phosphorescent markers. The imaging assembly can have an excitation light module proximate to the sample platform that emits light to excite the markers, and a lens module positioned to receive emission light from excited markers in target region. At least one series filter assembly or interference filter can be arranged in front of, behind, or both in front of and behind the lens module. The assembly includes a light sensor and a processor and imaging module configured to process data captured by the light sensor. Images of the sample are generated based on the emission light from the sample that transmit through and are filtered by the lens assembly and series filter assembly or interference filter.
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公开(公告)号：US09816913B2
公开(公告)日：2017-11-14
申请号：US15231146
申请日：2016-08-08
Applicant: SONY CORPORATION
Inventor： Taichi Takeuchi , Shingo Imanishi
IPC: G01N15/02 , G01N15/14 , G01N21/53 , G01N21/21 , G01N21/49 , G01N21/47 , G01N21/64 , G01N15/10 , G01N15/00
CPC classification number: G01N15/1436 , G01N15/1429 , G01N15/1434 , G01N15/1459 , G01N21/21 , G01N21/47 , G01N21/49 , G01N21/53 , G01N21/645 , G01N2015/0065 , G01N2015/1006 , G01N2021/6478 , G01N2201/06113 , G01N2201/0638 , G01N2201/0683
Abstract: A microparticle measuring apparatus for highly accurately detecting the position of a microparticle flowing through a flow channel includes a light irradiation unit for irradiating a microparticle flowing through a flow channel with light, and a scattered light detection unit for detecting scattered light from the microparticle, including an objective lens for collecting light from the microparticle, a light splitting element for dividing the scattered light from the light collected by the objective lens, into first and second scattered light, a first scattered light detector for receiving an S-polarized light component, and an astigmatic element disposed between the light splitting element and the first scattered light detector, and making the first scattered light astigmatic. A relationship between a length L from a rear principal point of the objective lens to a front principal point of the astigmatic element, and a focal length f of the astigmatic element satisfies the following formula I. 1.5f≦L≦2.5f (I)
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公开(公告)号：US09599563B2
公开(公告)日：2017-03-21
申请号：US12503304
申请日：2009-07-15
Applicant: Jack Brass , Richard J. Doran , Donald L. Klipstein , Thomas M. Lemons , Bjarki Hallgrimson , Sarah Dobbin
Inventor： Jack Brass , Richard J. Doran , Donald L. Klipstein , Thomas M. Lemons , Bjarki Hallgrimson , Sarah Dobbin
CPC classification number: G01N21/6428 , G01N21/31 , G01N21/6402 , G01N21/6447 , G01N21/8803 , G01N2201/0221 , G01N2201/0612 , G01N2201/0621 , G01N2201/0627 , G01N2201/0638 , G01N2201/0693 , Y10S362/80
Abstract: An LED inspection lamp has plurality of LED sources for emitting electromagnetic radiation at different peak wavelengths for causing visible fluorescence in different leak detection dyes. A lens is associated with each LED. Radiation passing through lenses is superimposed in target area at target distance. Another LED inspection lamp has plurality of LEDs emitting electromagnetic radiation at a peak wavelength. A lens adaptor has lens housing for attachment to LED inspection lamp with a single LED for causing visible fluorescence, and a lens. Substantially all of the radiation from the LED passes through the lens and is focused in a target area at a target distance from the lenses. LED spot lights have a similar configuration. The LEDs may produce white light from distinct LEDs or from white LEDs. The light may be a flashlight or fixed spot light.
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Patent Agency Ranking
公开(公告)号：US20170067835A1
公开(公告)日：2017-03-09
申请号：US15308001
申请日：2015-08-04
Applicant: MACHINE VISION LIGHTING INC.
Inventor： Shigeki Masumura
CPC classification number: G01N21/8806 , G01N2201/062 , G01N2201/0636 , G01N2201/0638 , G01N2201/068 , G02B27/02 , G02B27/144 , G02B27/30
Abstract: In the inspection lighting device, between a surface light source for emitting an inspection light and the inspection object, at least one shielding mask is disposed, and a lens is disposed on a side closer to the inspection object than the shielding mask such that the shielding mask is positioned across the focus position of this lens as a center. In an irradiation solid angle of the inspection light for the inspection object formed when the light emitted from the surface light source is irradiated on to the inspection object by the lens the shielding mask forms a dark area. So that, in accordance with a change in reflection, transmission, scattering occurring at a feature point on the inspection object, a shape, a size, a tilt of the irradiation solid angle of the inspection light can be changed.
Abstract translation: 在检查照明装置中，在用于发射检查光的表面光源和检查对象之间，设置至少一个屏蔽掩模，并且在比屏蔽掩模更靠近检查对象的一侧设置透镜，使得屏蔽 面罩以该镜头的焦点位置为中心。 当通过透镜将从表面光源发射的光照射到检查对象时形成的用于检查对象的检查光的照射立体角成为暗区。 因此，根据在检查对象的特征点处发生的反射，透射，散射的变化，可以改变检查光的照射立体角的形状，尺寸，倾斜度。
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公开(公告)号：US09578220B2
公开(公告)日：2017-02-21
申请号：US14713755
申请日：2015-05-15
Applicant: PANASONIC HEALTHCARE HOLDINGS CO., LTD.
Inventor： Mikio Houjou , Atsushi Oda
CPC classification number: H04N5/2254 , A61B5/0033 , C12M41/36 , G01N21/01 , G01N21/13 , G01N2201/022 , G01N2201/062 , G01N2201/0638 , G02B21/0088 , G02B21/361 , G02B21/365 , H04N5/2256
Abstract: An observation device (1) is provided with: a general observation unit (10) for observing sample cells by observing an entire container (C) containing the cells and a culture solution; and a magnification observation unit (20) for magnifying a region within the container (C) and observing the cells, the general observation unit (10) and the magnification observation unit (20) each individually having lighting for illuminating the cells with light, and an optical system for observing the cells. The general observation unit (10) and the magnification observation unit (20) are thereby each provided with an individual optical system and lighting, making it possible to configure an appropriate observation unit for use both when the cells are observed by observing the entire container (C) and when a part within the container (C) is magnified and the cells are observed.
Abstract translation: 观察装置（1）具备：通过观察包含细胞的整个容器（C）和培养液观察样品池的一般观察单元（10） 以及用于放大容器（C）内的区域并观察细胞的放大观察单元（20），一般观察单元（10）和放大观察单元（20）各自具有用光照亮细胞的照明，以及 用于观察细胞的光学系统。 一般观察单元（10）和放大率观察单元（20）各自设置有单独的光学系统和照明，使得可以配置在通过观察整个容器观察细胞时使用的适当的观察单元（ C），并且当容器（C）中的一部分被放大并观察细胞时。
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18.发明申请MICROSCOPY SYSTEM, REFRACTIVE-INDEX CALCULATING METHOD, AND RECORDING MEDIUM 审中-公开显微系统，折射率计算方法和记录介质公开(公告)号：US20170017071A1
公开(公告)日：2017-01-19
申请号：US15205039
申请日：2016-07-08
Applicant: OLYMPUS CORPORATION
Inventor： Yoshihiro UE , Daisuke NISHIWAKI , Kenya OKAZAKI , Osamu ONO , Shingo SUZUKI
CPC classification number: G02B21/367 , G01N21/41 , G01N2201/06113 , G01N2201/0638 , G01N2201/0697 , G01N2201/12 , G02B21/02 , G02B21/24 , G06T11/206 , G06T11/60
Abstract: A microscopy system includes a microscope apparatus that has an objective and a correction device correcting for a spherical aberration, and a refractive index calculator that calculates a refractive index of a sample at a target position in the sample on the basis of a plurality of target set values each of which is a set value of the correction device and each of which corresponds to an amount of spherical aberration that occurs in the microscope apparatus when an observation target plane is situated at a different position in the sample in an optical-axis direction of the objective.
Abstract translation: 显微镜系统包括具有物镜的矫正装置和校正球面像差的校正装置，以及折射率计算器，其基于多个目标组计算样本中目标位置处的样本的折射率 其中每个值是校正装置的设定值，并且每个值对应于当观察目标平面位于样品中在光轴方向上的不同位置时在显微镜装置中发生的球面像差量 的目标。
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公开(公告)号：US20160340715A1
公开(公告)日：2016-11-24
申请号：US15162559
申请日：2016-05-23
Applicant: Stokes Bio Limited
Inventor： Mauro Aguanno , Damian Curtin , Damien King
CPC classification number: C12Q1/686 , G01N21/253 , G01N21/55 , G01N21/6452 , G01N21/6486 , G01N2201/0631 , G01N2201/0638
Abstract: Systems and methods are used to detect spectral and spatial information in a continuous flow PCR system. An incident beam of electromagnetic radiation is emitted using a laser. The incident beam is received from the laser and the incident beam is transformed into an incident line of electromagnetic radiation using a line generator. The incident line is received from the line generator using a tube array that includes one or more transparent tubes in fluid communication with one or more micro-channels. Reflected electromagnetic radiation is received from the tube array and the reflected electromagnetic radiation is focused using an imaging lens. The focused reflected electromagnetic radiation is received from the imaging lens and a spectral intensity is detected from the focused reflected electromagnetic radiation using a spectrograph. The focused reflected electromagnetic radiation is received from the imaging lens and a location of the spectral intensity is detected using an imager.
Abstract translation: 系统和方法用于检测连续流PCR系统中的光谱和空间信息。 使用激光发射入射的电磁辐射光束。 从激光器接收入射光束，并且使用线发生器将入射光束变换成电磁辐射的入射线。 使用管阵列从线发生器接收入射线，该管阵列包括与一个或多个微通道流体连通的一个或多个透明管。 从管阵列接收反射的电磁辐射，并且使用成像透镜聚焦反射的电磁辐射。 从成像透镜接收聚焦的反射电磁辐射，并且使用光谱仪从聚焦的反射电磁辐射检测光谱强度。 从成像透镜接收聚焦的反射电磁辐射，并使用成像器检测光谱强度的位置。
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公开(公告)号：US20160313258A1
公开(公告)日：2016-10-27
申请号：US15132323
申请日：2016-04-19
Applicant: CAMTEK LTD.
Inventor： Noam Gordon , Itay Cohen
CPC classification number: G01N21/9515 , G01N2201/0636 , G01N2201/0638 , G02B19/0023 , G02B19/0028 , G02B19/0047 , H04N5/2254 , H04N5/2256 , H04N5/3692
Abstract: An inspection system having an expanded angular coverage, the inspection system may include a line camera; a first curved mirror; a second curved mirror; a first focusing lens that is positioned between the first mirror and an object; a second focusing lens that is positioned between the second mirror and the object; a first light source that is configured to direct a first part of a first light beam towards the first curved mirror and a second part of the first light beam towards the first focusing lens; a second light source that is configured to direct a first part of a second light beam towards the second curved mirror and a second part of the second light beam towards the second focusing lens.
Abstract translation: 具有扩大的角度覆盖的检查系统，检查系统可以包括线路相机; 第一个曲面镜; 第二个曲面镜; 位于第一反射镜和物体之间的第一聚焦透镜; 位于第二反射镜和物体之间的第二聚焦透镜; 第一光源，其被配置为将第一光束的第一部分朝向第一弯曲镜引导，并且第一光束的第二部分朝向第一聚焦透镜; 第二光源，被配置为将第二光束的第一部分引向第二曲面镜，第二光束的第二部分朝向第二聚焦透镜。
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