公开(公告)号：US20170146458A1

公开(公告)日：2017-05-25

申请号：US15316568

申请日：2015-06-03

Applicant: Ludwig-Maximilians-Universität München

Inventor： Robert Alexander Huber ,  Sebastian Karpf ,  Matthias Eibl

IPC: G01N21/64 ,  G01N21/65

CPC classification number: G01N21/6456 ,  G01J3/0218 ,  G01J3/10 ,  G01J3/44 ,  G01J3/4406 ,  G01N21/6408 ,  G01N21/65 ,  G01N2021/6484 ,  G01N2201/06146 ,  G01N2201/0635 ,  G01N2201/105 ,  G01N2201/11 ,  G01N2201/12 ,  H01S3/06712 ,  H01S3/06754 ,  H01S3/094007 ,  H01S3/10015 ,  H01S3/1618 ,  H01S3/2316 ,  H01S3/302 ,  H01S2301/02

Abstract: Described is a system for inducing and detecting multi-photon processes, in particular multi-photon fluorescence or higher harmonic generation in a sample. The system comprises a dynamically-controllable light source, said dynamically-controllable light source comprising a first sub-light source, said first sub-light source being electrically controllable such as to generate controllable time-dependent intensity patterns of light having a first wavelength, and at least one optical amplifier, thereby allowing for active time-control of creation of multi-photon-excitation. The system further comprises a beam delivery unit for delivering light generated by said dynamically-controllable light source to a sample site, and a detector unit or detector assembly for detecting signals indicative of said multi-photon process, in particular multi-photon fluorescence signals or higher harmonics signals.

公开(公告)号：US20160245752A1

公开(公告)日：2016-08-25

申请号：US15142309

申请日：2016-04-29

Applicant: STERIS Inc. ,  INSTITUT NATIONAL D'OPTIQUE / NATIONAL OPTICS INSTITUTE

Inventor： Daniel Rochette ,  Pascal Gallant ,  Ozge Mermut ,  Francois Baribeau ,  Isabelle Noiseux ,  Isabelle Gosselin

IPC: G01N21/64

CPC classification number: G01N21/6428 ,  A61L2/28 ,  A61L2202/24 ,  G01N21/6486 ,  G01N21/94 ,  G01N2021/6417 ,  G01N2021/6439 ,  G01N2201/06113 ,  G01N2201/068 ,  G01N2201/0697 ,  G01N2201/10 ,  G01N2201/105

Abstract: A method for optical detection of residual soil on articles (such as medical instruments and equipment), after completion of a washing or a rinsing operation by a washer. A soil detection system provides an indication of soil on the articles by detecting luminescent radiation emanating from the soil in the presence of ambient light.

Abstract translation: 在清洗完成洗涤或漂洗操作之后，用光学检测物品（例如医疗仪器和设备）上的残留土壤的方法。 土壤检测系统通过在环境光的存在下检测从土壤发出的发光辐射来提供物品上的土壤的指示。

公开(公告)号：US09417056B2

公开(公告)日：2016-08-16

申请号：US14374054

申请日：2012-12-12

Applicant: FARO Technologies, Inc.

Inventor： Christoph Neundorf ,  Reinhard Becker

IPC: G01N11/14 ,  G01N21/47 ,  G02B26/10 ,  G01B11/14 ,  G01C15/00

CPC classification number: G01B11/14 ,  G01C15/002 ,  G01N21/47 ,  G01N2201/06113 ,  G01N2201/105 ,  G02B26/10

Abstract: A laser scanner device for optically scanning and measuring an environment includes a base, a measuring head which is rotatable relative to the base, and a mirror which is rotatably relative to the measuring head, wherein, in at least one operating mode, the laser scanner is mounted on a cart by a mounting device, the cart moves the base which is fixedly connected with the mounting device, the measuring head rests relative to the base, the mirror rotates, and the measuring head is locked with the mounting device by a locking mechanism.

Abstract translation: 一种用于光学扫描和测量环境的激光扫描仪装置包括基座，可相对于基座旋转的测量头和相对于测量头可旋转的反射镜，其中在至少一个操作模式中，激光扫描器 通过安装装置安装在推车上，推车移动与安装装置固定连接的基座，测量头相对于基座搁置，镜子旋转，测量头通过锁定与安装装置锁定 机制。

公开(公告)号：US20160139062A1

公开(公告)日：2016-05-19

申请号：US14899840

申请日：2013-06-25

Applicant: PRYSMIAN S.P.A.

Inventor： Antonio Faraldi ,  Gerardo Testa ,  Antonio Adigrat ,  Franco Cocchini

IPC: G01N21/954 ,  C03B37/025 ,  G01M11/08

CPC classification number: G01N21/954 ,  C03B37/025 ,  G01M11/088 ,  G01M11/37 ,  G01N2021/9548 ,  G01N2201/06113 ,  G01N2201/105

Abstract: A method for inspecting defects inside a rod-shaped transparent object by using a scanning beam of parallel light rays directed onto a rod-shaped transparent object orthogonally to the longitudinal axis of the object so that an inspection plane comprises an object's cross-section. The scanning beam is detected at an opposite side of the rod-shaped object that is interposed to intercept the parallel rays of the scanning beam. The electric output signal from the detector is processed to produce a first light intensity profile in a first scan direction, the light intensity profile comprising a shadow region delimited by first and second shadow edges, which is indicative of the outside diameter of the object across the inspection plane. The method comprises analysing the first light intensity profile to determine the presence or absence of a peak of positive intensity within the shadow region and, if an intensity peak is determined to be present, to determine the presence or absence of a region of depressed intensity within the intensity peak. If, as a result of analysing, an intensity peak within the shadow region is determined to be absent or a region of depressed intensity is determined to be present within the intensity peak, the presence of at least one structural defect within the object's cross-section is identified. In the preferred embodiments, the rod-shaped transparent object is a glass core rod for the production of a transmission optical fibre.

Abstract translation: 一种用于通过使用与物体的纵向轴线正交的杆状透明物体上的平行光线的扫描光束来检查棒状透明物体内的缺陷的方法，使得检查平面包括物体的横截面。 扫描光束在被插入以截取扫描光束的平行光线的棒状物体的相反侧被检测。 来自检测器的电输出信号被处理以在第一扫描方向上产生第一光强度分布，光强度分布包括由第一和第二阴影边界限定的阴影区域，该阴影区域指示物体的外直径 检查机。 该方法包括分析第一光强分布以确定阴影区域内正强度峰值的存在或不存在，以及如果确定强度峰值存在，则确定强度峰值存在或不存在 强度峰值。 如果作为分析的结果，确定阴影区域内的强度峰值被确定为不存在，或者确定强度峰值区域存在于强度峰值内，则在物体的横截面内存在至少一个结构缺陷 被识别。 在优选实施例中，棒状透明物体是用于制造透射光纤的玻璃芯棒。

公开(公告)号：US09110033B2

公开(公告)日：2015-08-18

申请号：US12570527

申请日：2009-09-30

Applicant: Richard E. Bills ,  Neil Judell ,  Klaus R. Freischlad ,  James P. McNiven

Inventor： Richard E. Bills ,  Neil Judell ,  Klaus R. Freischlad ,  James P. McNiven

IPC: G01N21/88 ,  G01N21/21 ,  G01N21/47 ,  G01N21/55 ,  G01N21/95 ,  G01N21/956 ,  G06T7/00

CPC classification number: G01N21/9501 ,  G01N21/21 ,  G01N21/47 ,  G01N21/4738 ,  G01N21/474 ,  G01N21/55 ,  G01N21/88 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/956 ,  G01N2021/4707 ,  G01N2021/4711 ,  G01N2021/4792 ,  G01N2021/556 ,  G01N2021/8809 ,  G01N2021/8848 ,  G01N2021/8864 ,  G01N2021/8877 ,  G01N2021/8896 ,  G01N2201/0612 ,  G01N2201/105 ,  G06T7/0004 ,  G06T2207/30148 ,  Y10T29/49826

Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features, in the front quartersphere, a light channel assembly for collecting light reflected from the surface of the workpiece, and a front collector and wing collectors for collecting light scattered from the surface, to greatly improve the measurement capabilities of the system. The light channel assembly has a switchable edge exclusion mask and a reflected light detection system for improved detection of the reflected light.

Abstract translation: 提供了表面检查系统，以及相关的部件和方法。 表面检查系统包括光束源子系统，光束扫描子系统，工件运动子系统，光学收集和检测子系统以及处理子系统。 光学收集和检测系统在前四分之一区域中具有用于收集从工件表面反射的光的光通道组件，以及用于收集从表面散射的光的前收集器和翼收集器，以大大提高测量能力 系统。 光通道组件具有可切换的边缘排除掩模和用于改进反射光检测的反射光检测系统。

公开(公告)号：US20150177141A1

公开(公告)日：2015-06-25

申请号：US14513386

申请日：2014-10-14

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yeong-bae YEO ,  Hyun-soo JANG

IPC: G01N21/59 ,  G01N21/75

CPC classification number: G01N21/59 ,  G01N21/75 ,  G01N2201/0612 ,  G01N2201/0621 ,  G01N2201/0696 ,  G01N2201/105 ,  G01N2201/121 ,  G01N2201/127

Abstract: An optical detection apparatus for measuring detection chambers of a specimen cartridge includes: a light source unit including light sources which are arranged along a scan line on which the detection chambers are aligned to be scanned, and configured to emit light rays to the detection chambers; and an optical detector configured to detect the light rays having passed through corresponding detection chambers disposed on the scan line. The light sources include main wavelength light sources which are used for measuring samples disposed in the detection chambers, and a sub-wavelength light source which is used for correcting a measuring error.

Abstract translation: 一种用于测量样本盒的检测室的光学检测装置，包括：光源单元，包括沿扫描线布置的光源，检测室对准扫描线，并且被配置为向检测室发射光线; 以及光检测器，被配置为检测通过设置在扫描线上的相应检测室的光线。 光源包括用于测量设置在检测室中的样品的主波长光源和用于校正测量误差的亚波长光源。

公开(公告)号：US09006687B2

公开(公告)日：2015-04-14

申请号：US14378674

申请日：2013-02-20

Applicant: Sharp Kabushiki Kaisha

Inventor： Yukio Watanabe

IPC: G01N21/64 ,  G02B13/18 ,  G02B21/00

CPC classification number: G01N21/645 ,  G01N21/6456 ,  G01N21/6486 ,  G01N2021/6471 ,  G01N2021/6478 ,  G01N2201/06113 ,  G01N2201/10 ,  G01N2201/103 ,  G01N2201/105 ,  G02B19/0028 ,  G02B19/0076 ,  G02B19/008 ,  G02B19/0085 ,  G02B21/0076 ,  G02B2207/113

Abstract: A first lens configured to convert light from the objective lens into parallel light includes a concave lens part having a concave curved face in a center portion of a flat face, and a convex lens part having a convex curved face around a flat face. Further, the first lens includes first and second regions configured to diverge light through the flat face and the concave curved face and a third region configured to collect light through the convex curved face and the concave curved face. When the sample is on a sample table and sealed in a two-dimensional electrophoresis substrate, light totally reflected by a side surface of the objective lens enters the second region. In contrast, when the sample is directly on the sample table, the light enters the third region.

Abstract translation: 第一透镜被配置为将来自物镜的光转换为平行光，包括在平面的中心部分具有凹曲面的凹透镜部分和在平坦表面周围具有凸曲面的凸透镜部分。 此外，第一透镜包括被配置为使光通过平面和凹曲面发散的第一和第二区域和被配置为通过凸曲面和凹曲面收集光的第三区域。 当样品在样品台上并密封在二维电泳基质中时，由物镜的侧表面全反射的光进入第二区域。 相反，当样品直接在样品台上时，光进入第三区域。

公开(公告)号：US20150036142A1

公开(公告)日：2015-02-05

申请号：US14516540

申请日：2014-10-16

Applicant: KLA-Tencor Corporation

Inventor： Daniel Kandel ,  Vladimir Levinski ,  Alexander Svizher ,  Joel Seligson ,  Andrew Hill ,  Ohad Bachar ,  Amnon Manassen ,  Yung-Ho Alex Chuang ,  Ilan Sela ,  Moshe Markowitz ,  Daria Negri ,  Efraim Rotem

IPC: G01N21/47 ,  G01N21/956 ,  G01N21/95 ,  G01B11/02

CPC classification number: G01N21/47 ,  G01B11/02 ,  G01B11/0641 ,  G01B2210/56 ,  G01N21/211 ,  G01N21/9501 ,  G01N21/956 ,  G01N2021/4792 ,  G01N2201/06113 ,  G01N2201/105 ,  G03F7/70625 ,  G03F7/70633

Abstract: Various metrology systems and methods are provided. One metrology system includes a light source configured to produce a diffraction-limited light beam, an apodizer configured to shape the light beam in the entrance pupil of illumination optics, and optical elements configured to direct the diffraction-limited light beam from the apodizer to an illumination spot on a grating target on a wafer and to collect scattered light from the grating target. The metrology system further includes a field stop and a detector configured to detect the scattered light that passes through the field stop. In addition, the metrology system includes a computer system configured to determine a characteristic of the grating target using output of the detector.

Abstract translation: 提供了各种计量系统和方法。 一个计量系统包括被配置为产生衍射受限光束的光源，被配置为使照明光学器件的入射光瞳中的光束成形的变迹器，以及被配置为将来自变迹器的衍射受限光束引导到 在晶片上的光栅目标上的照明点并且收集来自光栅目标的散射光。 测量系统还包括场停止器和检测器，其被配置为检测通过场停止器的散射光。 此外，计量系统包括被配置为使用检测器的输出来确定光栅目标的特性的计算机系统。

公开(公告)号：US20140376800A1

公开(公告)日：2014-12-25

申请号：US14483019

申请日：2014-09-10

Applicant: Amazon Technologies, Inc.

Inventor： Ted John Cooper ,  Omair Abdul Rahman

IPC: G09G3/00 ,  G01N21/88 ,  G06T7/00 ,  G01N21/95

CPC classification number: G09G3/006 ,  G01N21/8851 ,  G01N21/95 ,  G01N2201/105 ,  G06K9/00 ,  G06K9/68 ,  G06T7/0004 ,  G06T7/001 ,  G06T2207/10008 ,  G06T2207/10024 ,  G06T2207/10048 ,  G06T2207/30121 ,  G09G5/02 ,  G09G2330/10

Abstract: A method for analyzing displays is described. A processing device receives a first scanned image of a first display and determines a first characteristic of the first display by analyzing the first scanned image. The processing device also receives a second scanned image of a second display and determines a second characteristic of the second display by analyzing the second scanned image. The processing device compares the first characteristic and the second characteristic to determine a third characteristic of the second display.

Abstract translation: 描述用于分析显示器的方法。 处理装置接收第一显示器的第一扫描图像，并且通过分析第一扫描图像来确定第一显示器的第一特性。 处理装置还接收第二显示器的第二扫描图像，并且通过分析第二扫描图像来确定第二显示器的第二特性。 处理装置比较第一特性和第二特性以确定第二显示的第三特性。

公开(公告)号：US08867039B2

公开(公告)日：2014-10-21

申请号：US13908637

申请日：2013-06-03

Applicant: Steven Ruggiero ,  Carol Tanner

Inventor： Steven Ruggiero ,  Carol Tanner

IPC: G01N21/00 ,  G01N15/02 ,  G01N21/51 ,  G01N21/47 ,  G02B21/00 ,  G02B21/18

CPC classification number: G01N15/0205 ,  G01N21/00 ,  G01N21/31 ,  G01N21/39 ,  G01N21/4785 ,  G01N21/51 ,  G01N21/59 ,  G01N2015/0294 ,  G01N2021/4707 ,  G01N2201/06113 ,  G01N2201/105 ,  G02B21/0096 ,  G02B21/18

Abstract: Example methods and apparatus for obtaining suspended particle information are disclosed. A disclosed example method includes emitting light from a light source, dividing the light source into a first path and a second path, and directing the first path to a first container comprising a plurality of particles in a suspension material. The example method also includes directing the second path to a second container containing a suspension material devoid of particles, retrieving a first transmission value of the first path through the first container, and retrieving a second transmission value of the second path through the second container. The example method further includes directing the first and second paths to the second and first containers, respectively, retrieving a third transmission value of the first path a through the second container, retrieving a fourth transmission value of the second path through the first container, and calculating a ratio of the first and second transmission values to the third and fourth transmission values to determine an indication of transmissivity for a given wavelength.

Abstract translation: 公开了用于获得悬浮颗粒信息的示例性方法和装置。 所公开的示例性方法包括从光源发射光，将光源分成第一路径和第二路径，并将第一路径引导到包括悬置材料中的多个颗粒的第一容器。 示例性方法还包括将第二路径引导到第二容器，该第二容器包含没有颗粒的悬挂材料，检索通过第一容器的第一路径的第一传输值，以及检索通过第二容器的第二路径的第二传输值。 该示例方法还包括分别将第一和第二路径引导到第二和第一容器，检索通过第二容器的第一路径a的第三传输值，检索穿过第一容器的第二路径的第四传输值，以及 计算第一和第二传输值与第三和第四传输值的比率，以确定给定波长的透射率的指示。