Abstract:
A hyperspectral imaging system and a method are described herein for providing a hyperspectral image of an area of a remote object (e.g., scene of interest). In one aspect, the hyperspectral imaging system includes at least one optic, a rotatable disk (which has at least one spiral slit formed therein), a spectrometer, a two-dimensional image sensor, and a controller. In another aspect, the hyperspectral imaging system includes at least one optic, a rotatable disk (which has multiple straight slits formed therein), a spectrometer, a two-dimensional image sensor, and a controller. In yet another aspect, the hyperspectral imaging system includes at least one optic, a rotatable drum (which has a plurality of slits formed on the outer surface thereof and a fold mirror located therein), a spectrometer, a two-dimensional image sensor, and a controller.
Abstract:
The invention is an optical method and apparatus for measuring the temperature of semiconductor substrates in real-time, during thin film growth and wafer processing. Utilizing the nearly linear dependence of the interband optical absorption edge on temperature, the present method and apparatus result in highly accurate measurement of the absorption edge in diffuse reflectance and transmission geometry, in real time, with sufficient accuracy and sensitivity to enable closed loop temperature control of wafers during film growth and processing. The apparatus operates across a wide range of temperatures covering all of the required range for common semiconductor substrates.
Abstract:
A spectroscopic module 1 is provided with a spectroscopic unit 8 and a photodetector 9 in addition to a spectroscopic unit 4 and a photodetector 5 and thus can enhance its detection sensitivity for light in a wide wavelength range or different wavelength regions of light. A light-transmitting hole 5b and a light-absorbing layer 12 are disposed between light detecting portions 5a, 9a, while a reflection unit 7 is provided so as to oppose the layer 12 (i.e., region R), whereby the size can be kept from becoming larger. Ambient light La is absorbed by the layer 12. Any part of the light La transmitted through the region R in the layer 12 is reflected to the region R by the unit 7 formed so as to oppose the region R, whereby stray light can be inhibited from being caused by the incidence of the light La.
Abstract:
A spectrometer includes: an entrance aperture, a collimator, intended to produce, from a light source, a collimated input light (5), a plurality of gratings arranged in a 2-D matrix, a plurality of detectors, and an exit aperture.
Abstract:
A system detects a plant's exposure to trichloroethylene (TCE) through plant leaf imaging. White light impinging upon a plant's leaf interacts therewith to produce interacted light. A detector is positioned to detect at least one spectral band of the interacted light. A processor coupled to the detector performs comparisons between photonic energy of the interacted light at the one or more spectral bands thereof and reference data defining spectral responses indicative of leaf exposure to TCE. An output device coupled to the processor provides indications of the comparisons.
Abstract:
A technique for forming a two-dimensional electronic spectrum of a sample includes illuminating a line within a portion of the sample with four laser pulses; where along the entire line the difference in the arrival times between two of the laser pulses varies as a function of the position and the difference in the arrival times between the other two pulses is constant along the entire line. A spectroscopic analysis may then be performed on the resulting pulsed output signal from the illuminated line to produce a single-shot two dimensional electronic spectroscopy.
Abstract:
Disclosed herein are systems, methods, and non-transitory computer-readable storage media for progressive band selection for hyperspectral images. A system having module configured to control a processor to practice the method calculates a virtual dimensionality of a hyperspectral image having multiple bands to determine a quantity Q of how many bands are needed for a threshold level of information, ranks each band based on a statistical measure, selects Q bands from the multiple bands to generate a subset of bands based on the virtual dimensionality, and generates a reduced image based on the subset of bands. This approach can create reduced datasets of full hyperspectral images tailored for individual applications. The system uses a metric specific to a target application to rank the image bands, and then selects the most useful bands. The number of bands selected can be specified manually or calculated from the hyperspectral image's virtual dimensionality.
Abstract:
A compact field spectrograph is described that provides a resolution of 500 or more with no entrance aperture, providing for substantial gain in light throughput, ideal for viewing multiple distant objects with or without telescopic aid, and providing the ability to observe and distinguish a multiplex of objects simultaneously, even if in motion, with minimal or no mechanical tracking required. Spectra may be viewed directly with the unaided eye, or photographed with common consumer cameras.
Abstract:
Optical fibers are utilized to provide high efficiency, spatially resolved coupling of light from collection optics to an imaging spectrometer. In particular, a micro lens array may be utilized to couple light from multiple spatial locations into individual optical fibers. At the opposite end of the fiber bundle, the fibers are packed tightly together to send the light into an imaging spectrograph. The light that enters this spectrograph maintains its spatial separation, for instance, along the array dimension and is spectrally dispersed, for instance, along a dimension orthogonal to the array dimension. This spatially separated, wavelength resolved light can then be recorded on a two dimensional detector such as a CCD camera.
Abstract:
A method is presented for selecting the order in which parameters are evaluated for inclusion in a model of a film stack, which is by ranking them according to measurement precision. Further, a method is presented for determining which parameters are to be floated, set, or discarded from the model, which is by determining whether average chi-square and chi-square uniformity decreases or increases when the parameter is added to the model. In this manner, a model for the film stack can be quickly assembles with a high degree of accuracy.