公开(公告)号：US12212112B2

公开(公告)日：2025-01-28

申请号：US17546153

申请日：2021-12-09

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Tasuku Nakamura ,  Yasuhisa Inada

IPC: G01J3/02 ,  G01J3/10 ,  G01J3/427 ,  G01J3/433 ,  H01S3/00 ,  H01S3/086 ,  H01S3/10 ,  H01S3/23 ,  H01S5/00 ,  G01J3/42 ,  H01S3/13 ,  H01S5/10

Abstract: A dual optical frequency comb light-emitting device includes a first optical-frequency-comb laser source that includes a first laser resonator having a first optical path length, a second optical-frequency-comb laser source that includes a second laser resonator having a second optical path length different from the first optical path length, and an optical coupler that causes a first portion of first optical-frequency-comb laser light emitted from the first laser resonator to enter the second laser resonator. The first optical-frequency-comb laser source outputs a second portion of the first optical-frequency-comb laser light to an outside. The second optical-frequency-comb laser source outputs second optical-frequency-comb laser light emitted from the second laser resonator to the outside.

公开(公告)号：US20240377412A1

公开(公告)日：2024-11-14

申请号：US18782279

申请日：2024-07-24

Applicant: Regeneron Pharmaceuticals, Inc.

Inventor： Andria SKINNER ,  Natallia KULYBA

IPC: G01N33/68 ,  B01D15/34 ,  G01J3/427 ,  G01N21/27 ,  G01N21/31 ,  G01N21/33 ,  G01N30/02 ,  G01N30/88 ,  G16B5/00 ,  G16C20/30

Abstract: The present disclosure provides methods of assessing DAR of ADC products that provide advantages over known methods. Specifically, methods of the disclosure can be used in high-throughput applications and/or without having to dilute ADC samples during the assessment.

公开(公告)号：US11754844B2

公开(公告)日：2023-09-12

申请号：US17896516

申请日：2022-08-26

Applicant: Magic Leap, Inc.

Inventor： Nicole Elizabeth Samec ,  Nastasja U. Robaina ,  Adrian Kaehler ,  Mark Baerenrodt ,  Eric Baerenrodt ,  Christopher M. Harrises ,  Tammy Sherri Powers

IPC: G02B27/01 ,  G01J3/02 ,  G01J3/42 ,  A61B5/1455 ,  A61B5/11 ,  A61B5/00 ,  G06F3/03 ,  G01J3/10 ,  G06F3/01 ,  G01J3/28 ,  G01J3/427 ,  G01N21/359 ,  G01N33/483 ,  F21V8/00 ,  G02B27/00

CPC classification number: G02B27/0172 ,  A61B5/0075 ,  A61B5/1114 ,  A61B5/1121 ,  A61B5/14551 ,  A61B5/6803 ,  A61B5/743 ,  A61B5/744 ,  G01J3/0248 ,  G01J3/0256 ,  G01J3/0264 ,  G01J3/10 ,  G01J3/108 ,  G01J3/2823 ,  G01J3/42 ,  G01J3/427 ,  G01N21/359 ,  G01N33/483 ,  G02B6/0076 ,  G02B27/017 ,  G06F3/011 ,  G06F3/013 ,  G06F3/0304 ,  G01J2003/106 ,  G01J2003/2826 ,  G01J2003/425 ,  G02B27/0093 ,  G02B2027/014 ,  G02B2027/0125 ,  G02B2027/0138 ,  G02B2027/0187 ,  G06F3/012

Abstract: In some embodiments, a system comprises a head-mounted frame removably coupleable to the user's head; one or more light sources coupled to the head-mounted frame and configured to emit light with at least two different wavelengths toward a target object in an irradiation field of view of the light sources; one or more electromagnetic radiation detectors coupled to the head-mounted member and configured to receive light reflected after encountering the target object; and a controller operatively coupled to the one or more light sources and detectors and configured to determine and display an output indicating the identity or property of the target object as determined by the light properties measured by the detectors in relation to the light properties emitted by the light sources.

公开(公告)号：US11573172B2

公开(公告)日：2023-02-07

申请号：US16352351

申请日：2019-03-13

Applicant: FLIR Systems AB

Inventor： Tomas Lannestedt ,  Ulf Wallgren ,  Jonas Sandsten

IPC: G01N21/3504 ,  G01J3/427

Abstract: Systems and methods disclosed herein provide for detecting gas by: illuminating, with a controllable illuminator system, a scene with light including radiation within the infrared (IR) wavelength range; controlling the illuminator system to emit light at a first wavelength corresponding to a first absorption level of a gas and at a second wavelength corresponding to a second absorption level of a gas, such that an equal amount of radiant energy over a time period is emitted onto the scene for each of said first and second wavelengths; and capturing a first IR image of the scene being illuminated with light at said first wavelength and a second IR image of the scene illuminated with light at said second wavelength, and comparing said first and second IR images to determine whether a characteristic for at least one specific gas is represented in said first and/or second IR images.

公开(公告)号：US11467033B2

公开(公告)日：2022-10-11

申请号：US16986917

申请日：2020-08-06

Applicant: Endress+Hauser Conducta GmbH+Co. KG

Inventor： Frank Weber ,  Thilo Krätschmer ,  Felicia Seichter

IPC: G01J3/427 ,  G01N21/31

Abstract: The invention relates to a method for compensation for different sensitivities at different wavelengths in a spectrometric measuring system, including steps of calibrating the measuring system in a wavelength range with respect to one or more known reference standards, creating a wavelength-dependent compensation algorithm for linearization, and adjusting the measuring system using the compensation algorithm. The invention further discloses a corresponding measuring system.

公开(公告)号：US11366056B2

公开(公告)日：2022-06-21

申请号：US16589983

申请日：2019-10-01

Applicant: GE Precision Healthcare LLC

Inventor： Mika Harri Juhani Hietala

IPC: G01N21/35 ,  G01N21/31 ,  G01N33/497 ,  A61B5/08 ,  A61B5/097 ,  G02B5/20 ,  G01J3/02 ,  G01J3/42 ,  G01J3/36 ,  G01N21/3504 ,  A61B5/083 ,  G01J3/427 ,  A61N5/06 ,  G01J3/12

Abstract: A gas analyzer for measuring a respiratory gas component includes an emitter that emits two different wavelengths of infrared (IR) radiation in to a measurement chamber containing a respiratory gas, wherein the two different wavelengths include a first IR wavelength and a second IR wavelength. The gas analyzer further includes a first IR detector, a second IR detector, and a beam splitter. The beam splitter is configured to receive the two different wavelengths of radiation emitted by the emitter and to split the two wavelengths of radiation so as to reflect the first IR wavelength to the first IR detector and reflect the second IR wavelength to the second IR detector.

公开(公告)号：US20220128405A1

公开(公告)日：2022-04-28

申请号：US17422744

申请日：2020-01-08

Applicant: OBCHESTVO S OGRANICHENNOI OTVETSTV. "ESSENTOPTICS"

Inventor： Kanstantsin KRYVETSKI ,  Artsiom Fiadotka ,  Taras Lisouski

IPC: G01J3/02 ,  G01J3/427

Abstract: The invention relates to the field of optical instrumentation and is intended for use in analyses in industrial laboratories and for scientific research purposes in analytical studies of the spectral characteristics of various materials. The technical result is an increase in the quality and accuracy of angular dependence measurements and measurements of complex prisms. A spectrophotometer comprises a housing, a measuring compartment and a source of monochromatic radiation, where the following are installed: a radiation source, a monochromator, an assembly of polarizers, a mirror element, a measuring channel with an assembly of photodetectors with a lens, a reference channel with an assembly of photodetectors with a lens; a rotary object table, capable of providing a triple exposure of the specimens when carrying out measurements, with a hollow rotation shaft and with specimens; and devices for moving the assembly of the measuring channel of the photodetectors with a vertical rotation shaft.

公开(公告)号：US20220065772A1

公开(公告)日：2022-03-03

申请号：US17316453

申请日：2021-05-10

Applicant: Photothermal Spectroscopy Corp.

Inventor： Craig Prater ,  Kevin Kjoller ,  Roshan Shetty

IPC: G01N21/17 ,  G01J3/28 ,  G01J3/427 ,  G01J3/44 ,  G01N21/64 ,  G01N21/65

Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.

公开(公告)号：US11209370B2

公开(公告)日：2021-12-28

申请号：US16772954

申请日：2018-12-05

Applicant: ABB Schweiz AG

Inventor： Michael Ohora

IPC: G01N21/89 ,  G01J3/427 ,  G01N21/3559 ,  G01N21/86

Abstract: A web manufacturing supervision system for monitoring properties of a web being transported in a moving direction during a web manufacturing process, includes: a) a radiation source for illuminating a first spot on the web; b) a tunable first detector for capturing signal radiation emanating from the first spot within a signal wavelength band; the signal wavelength band being adjustable to one of at least a first wavelength band and a second wavelength band; c) a second detector for capturing reference radiation emanating from the first spot within a reference wavelength band; d) control means for alternatingly tuning the signal wavelength band to the first wavelength band and the second wavelength band and measuring the signal at both wavelength bands simultaneously.

公开(公告)号：US20210310867A1

公开(公告)日：2021-10-07

申请号：US17351067

申请日：2021-06-17

Applicant: Apple Inc.

Inventor： Trent D. Ridder ,  Mark Alan Arbore ,  Gary Shambat ,  Robert Chen ,  David I. Simon ,  Miikka M. Kangas

IPC: G01J3/427 ,  G01J3/10 ,  G01J3/28 ,  G01J3/42 ,  G01N21/35

Abstract: Methods and systems for measuring one or more properties of a sample are disclosed. The methods and systems can include multiplexing measurements of signals associated with a plurality of wavelengths without adding any signal independent noise and without increasing the total measurement time. One or more levels of encoding, where, in some examples, a level of encoding can be nested within one or more other levels of encoding. Multiplexing can include wavelength, position, and detector state multiplexing. In some examples, SNR can be enhanced by grouping together one or more signals based on one or more properties including, but not limited to, signal intensity, drift properties, optical power detected, wavelength, location within one or more components, material properties of the light sources, and electrical power. In some examples, the system can be configured for optimizing the conditions of each group individually based on the properties of a given group.