公开(公告)号：US5666201A

公开(公告)日：1997-09-09

申请号：US530892

申请日：1995-09-20

Applicant: Blaine D. Johs ,  Ping He ,  Steven E. Green ,  Shakil A. Pittal ,  John A. Woollam

Inventor： Blaine D. Johs ,  Ping He ,  Steven E. Green ,  Shakil A. Pittal ,  John A. Woollam

IPC: G01J3/28 ,  G01J3/36 ,  G01J3/447 ,  G01J4/00 ,  G01N21/21 ,  G01N21/47

CPC classification number: G01J3/36 ,  G01J3/447 ,  G01J4/00 ,  G01N21/211 ,  G01N21/4788 ,  G01J2003/2866 ,  G01J3/0289

Abstract: Disclosed is a dispersive optics system, in the context of ellipsometer or polarimeter and the like systems, which, in use, produces a plurality of "Orders" of essentially single wavelength beams of light from a polychromatic beam of light. In use the availability of more than one "Order" of essentially single wavelength beams of light allows simultaneous measurement of more essentially single wavelength beams of light than would be possible were only one "Order" of essentially single wavelength beams of light present. Filters are present to reduce the effects of stray light on detector elements and to allow separating the wavelengths in overlapping regions of adjacent Orders.

Abstract translation: 公开了一种分散光学系统，在椭偏仪或偏振计等系统的背景下，其在使用中产生基本上来自多色光束的单波长光束的多个“订单”。 在使用中，基本上单个波长光束的多于一个“顺序”的可用性允许同时测量更基本上单个波长光束的光，比仅存在基本上单个波长光束的“顺序”是可能的。 存在滤光器以减少杂散光对检测器元件的影响，并允许在相邻订单的重叠区域中分离波长。

公开(公告)号：US5659391A

公开(公告)日：1997-08-19

申请号：US592257

申请日：1996-01-26

Applicant: Arthur H. Carrieri

Inventor： Arthur H. Carrieri

IPC: G01J3/28 ,  G01J3/447 ,  G01S17/88 ,  G01B9/02

CPC classification number: G01J3/447 ,  G01J3/2823 ,  G01S17/88

Abstract: Apparatus for producing interferograms on array of light detectors is described in which light from a field of view is gathered by a concave Newtonian mirror, collimated by a Schwarzchild objective and directed along a first optical path having PEM's modulated so as to act like an interferometer between a pair of linear polarizers and a lens for imaging light passing through said polarizers onto the array. Scattergrams are produced on the array by a laser in a second optical path that includes a linear polarizer, a modulated PEM for producing light that is polarization modulated, optical elements for directing the circularly polarized light into the field of view of the Newtonian mirror, a modulator for causing the PEM's in the first optical path to elliptically polarize light and a device for extracting the first linear polarizer in the first optical path from that path. The distance between the apparatus and an area under examination is determined by turning on the laser, sinusoidally modulating the PEM in the second optical path, detecting the light modulated by that PEM so as to produce a first sinusoidal voltage, removing modulation from the PEM's in the first optical path and determining the phase difference of a second sinusoidal voltage produced by one light detector of the array and the first sinusoidal voltage.

Abstract translation: 描述了用于在光检测器阵列上产生干涉图的设备，其中来自视野的光通过凹形牛顿镜聚集，其由Schwarzchild物镜准直并且沿着具有PEM调制的第一光路被引导以便像干涉仪之间的作用 一对线性偏振器和用于将通过所述偏振器的光成像到阵列上的透镜。 在阵列上通过包括线性偏振器的第二光路中的激光产生散射图，用于产生被偏振调制的光的调制PEM，用于将圆偏振光引导到牛顿镜的视场中的光学元件， 调制器，用于使PEM在第一光路中椭圆偏振光，以及用于从该路径提取第一光路中的第一线性偏振器的装置。 通过打开激光器，对第二光路中的PEM进行正弦调制，检测由该PEM调制的光，从而产生第一正弦电压，去除PEM的调制，从而确定装置与被检查区域之间的距离 第一光路并且确定由阵列的一个光检测器和第一正弦电压产生的第二正弦电压的相位差。

公开(公告)号：US5612783A

公开(公告)日：1997-03-18

申请号：US409064

申请日：1995-03-23

Applicant: Allen G. Hirsh

Inventor： Allen G. Hirsh

IPC: G01N21/19 ,  G01J3/447

CPC classification number: G01N21/19

Abstract: An apparatus and method for modified intrinsic state spectral analysis determines a proportion of a plurality of intrinsic structures of an optically active molecule. A spectropolarimeter generates a plurality of intrinsic spectra. Each of the plurality of intrinsic spectra is an intrinsic state vector corresponding to a plurality of intrinsic molecular structures. The spectropolarimeter also generates a spectrum for a sample of the optically active molecule. The sample spectrum is a sample state vector of the optically active molecule. A controller determines a plurality of estimate state vectors based on a plurality of perturbed intrinsic state vectors. Each of the plurality of perturbed intrinsic state vectors corresponds to a perturbed intrinsic structure. An optimum proportion of the plurality of perturbed intrinsic state vectors corresponds to each estimate state vector. The plurality estimate state vectors are matched against the sample state vector to determine a best match estimate state vector. The optimum proportion of the best matched estimate state vector is the proportion of the perturbed intrinsic molecular structures in the sample of the optically active molecule.

Abstract translation: 用于修饰的固有光谱分析的装置和方法确定光学活性分子的多个本征结构的比例。 分光偏振计产生多个固有光谱。 多个固有光谱中的每一个是对应于多个固有分子结构的固有状态矢量。 分光偏振仪还产生光学活性分子样品的光谱。 样品光谱是光学活性分子的样品状态载体。 控制器基于多个扰动的固有状态向量来确定多个估计状态向量。 多个扰动的固有状态矢量中的每一个对应于扰动的本征结构。 多个扰动的固有状态矢量的最佳比例对应于每个估计状态向量。 将多个估计状态向量与样本状态向量进行匹配，以确定最佳匹配估计状态向量。 最佳匹配估计状态向量的最佳比例是光学活性分子样品中扰动的固有分子结构的比例。

公开(公告)号：US5045701A

公开(公告)日：1991-09-03

申请号：US413414

申请日：1989-09-27

Applicant: Dennis H. Goldstein ,  Russell A. Chipman

Inventor： Dennis H. Goldstein ,  Russell A. Chipman

IPC: G01J3/447 ,  G01J3/453 ,  G01N21/21 ,  G01N21/35

CPC classification number: G01J3/447 ,  G01J3/453 ,  G01N2021/218 ,  G01N2021/3595

Abstract: An infrared spectropolarimeter system for making spectroscopic measurements of electro-optic properties of materials over a large wavelength range in the infrared is described which comprises in combination a spectrometer having a sample region for receiving a sample for making spectroscopic measurements thereon and a source of light for providing a sample beam of selected wavelength for projection through the sample region, the sample region defined between a first focusing element for selectively focusing the sample beam within the sample region and a second focusing element for collimating the sample beam and providing an output beam for analysis, first and second polarizers between the focusing elements with the sample region therebetween for selectively polarizing the sample beam, first and second rotatable optical retarders between the polarizers with the sample region therebetween for selectively retarding one linear polarization component with respect to the orthogonal component of the sample beam, and a detector for analyzing the output beam.

Abstract translation: 描述了用于对在红外线中的大波长范围内的材料进行光学特性的光谱测量的红外分光偏光计系统，其包括具有用于接收用于在其上进行光谱测量的样品的样品区域的光谱仪和用于在其上进行光谱测量的光源 提供用于通过采样区域的投影的所选波长的采样光束，在用于选择性地聚焦采样区域内的采样光束的第一聚焦元件和用于准直采样光束的第二聚焦元件之间限定的采样区域，并提供用于分析的输出光束 在聚焦元件之间的第一和第二偏振器与其间的样品区域用于选择性地使样品光束偏振;偏振器之间的第一和第二可旋转光学延迟器，其间具有样品区域，用于相对于正交成分选择性地延迟一个线性偏振分量 t，以及用于分析输出光束的检测器。

公开(公告)号：US3822098A

公开(公告)日：1974-07-02

申请号：US35651173

申请日：1973-05-02

Applicant: MC DONNELL DOUGLAS CORP

Inventor： RUDDER C ,  DALTON W ,  LEADER J ,  OWSLEY D

IPC: G01J3/36 ,  G01J3/447 ,  G01J9/00 ,  G01N21/21 ,  G01N21/48 ,  G01J3/42

CPC classification number: G01N21/21 ,  G01J3/0243 ,  G01J3/36 ,  G01J3/447 ,  G01J9/00

Abstract: A multispectral sensor including associated detection apparatus which are able to detect and identify radiations scattered from an object or substance, and particularly depolarized as distinguished from polarized radiations, which depolarized radiations are due to volume scattering characteristics, not surface scattering characteristics, and which enable the object or substance to be uniquely identified as to its material composition, color, density and other similar inherent characteristics as distinguished from surface characteristics, physical location and physical orientation. The present multispectral sensor can use laser means as well as other means for generating illumination or radiation.

Abstract translation: 一种多光谱传感器，包括相关的检测装置，其能够检测和识别从物体或物质散射的辐射，并且特别是去偏振的偏振辐射区别于该偏振辐射，这是由于体积散射特性而不是表面散射特性， 物体或物质被独特地识别为与表面特性，物理位置和物理取向不同的其材料组成，颜色，密度和其它相似的固有特性。 本发明的多光谱传感器可以使用激光装置以及用于产生照明或辐射的其它装置。

公开(公告)号：US3784307A

公开(公告)日：1974-01-08

申请号：US3784307D

申请日：1970-11-16

Applicant: PHILIPS CORP

Inventor： JACKSON J ,  DONAT BRADSHAW R

IPC: G01J3/427 ,  G01J3/08 ,  G01J3/447 ,  G01N21/03 ,  G01N21/21 ,  G01N21/31 ,  G01N21/22

CPC classification number: G01N21/314 ,  G01N21/03 ,  G01N21/21

Abstract: A method and apparatus for monitoring the presence of water vapor in helium features providing two narrow infrared frequency band within and outside a water vapor absorption band, alternately projecting the two bands of infrared radiation into the helium by using the polarization properties of the infrared radiation, and subsequently detecting the two infrared bands and comparing their amplitudes. Besides providing an accurate and reliable measurement, the invention is compact and requires no moving mechanical parts.

Abstract translation: 一种用于监测氦特征中水蒸汽存在的方法和装置，其在水蒸汽吸收带内和外部提供两个窄红外频带，通过使用红外辐射的偏振特性将两个红外辐射带交替地投射到氦气中， 并随后检测两个红外波段并比较其幅度。 除了提供准确可靠的测量之外，本发明是紧凑的，不需要移动的机械部件。

公开(公告)号：US20250116605A1

公开(公告)日：2025-04-10

申请号：US18920791

申请日：2024-10-18

Applicant: NOVA LTD.

Inventor： Eyal Hollander ,  Gilad Barak ,  Elad Schleifer ,  Yonatan OREN ,  Amir Shayari

IPC: G01J3/447 ,  G01J3/02 ,  G01J3/10 ,  G01J3/44 ,  G01N21/65

Abstract: An optical measurement system, the optical measurement system comprises optics, wherein the optics include a collection path and an illumination path and an objective lens. The optics is configured to acquire Raman spectrums of one or more structural elements located at a measurement site of the sample while being set-up to apply one or more optics parameters that comprise an illumination angle out of a set of multiple illumination angles that correspond to a numerical aperture of the objective lens. Each of the one or more structural elements has a dimension that ranges between one tenth of nanometer to one hundred microns; an optical spectrometer; a Raman detector that is downstream to the optical spectrometer; and a control unit that is configured to determine an expected radiation pattern to be detected by the Raman detector when the optics are set-up to apply the one or more optics parameters.

公开(公告)号：US20250044558A1

公开(公告)日：2025-02-06

申请号：US18719222

申请日：2022-11-16

Applicant: THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES

Inventor： Xiangang LUO ,  Mingbo PU ,  Ting XIE ,  Fei ZHANG ,  Xiaoliang MA

IPC: G02B13/06 ,  G01J3/02 ,  G01J3/447 ,  G02B1/00 ,  G02B13/14

Abstract: An ultra-wide angle broadband polarization imaging system based on a metasurface, and a detection apparatus, the imaging system comprising a first lens (L1) having negative optical power, a linear polarizer (P1), a quarter wave plate (P2), a diaphragm (STO), a second lens (L2) having positive optical power, a third lens (L3) having positive optical power, and the metasurface (M), wherein an object side surface and an image side surface of the lens are planar or spherical; and the phase distribution required for the system in a broadband spectrum band is achieved by setting different rotation angles θ of a unit structure of the metasurface.

公开(公告)号：US20240410822A1

公开(公告)日：2024-12-12

申请号：US18808482

申请日：2024-08-19

Applicant: Apple Inc.

Inventor： Miikka M. Kangas ,  Mark Alan Arbore ,  David I. Simon ,  Michael J. Bishop ,  James W. Hillendahl ,  Robert Chen

IPC: G01N21/27 ,  G01J3/02 ,  G01J3/32 ,  G01J3/36 ,  G01J3/42 ,  G01J3/433 ,  G01J3/447 ,  G01N21/21 ,  G01N21/35 ,  G01N21/47 ,  G01N21/49

Abstract: This relates to systems and methods for measuring a concentration and type of substance in a sample at a sampling interface. The systems can include a light source, optics, one or more modulators, a reference, a detector, and a controller. The systems and methods disclosed can be capable of accounting for drift originating from the light source, one or more optics, and the detector by sharing one or more components between different measurement light paths. Additionally, the systems can be capable of differentiating between different types of drift and eliminating erroneous measurements due to stray light with the placement of one or more modulators between the light source and the sample or reference. Furthermore, the systems can be capable of detecting the substance along various locations and depths within the sample by mapping a detector pixel and a microoptics to the location and depth in the sample.

公开(公告)号：US20230384402A1

公开(公告)日：2023-11-30

申请号：US18208652

申请日：2023-06-12

Applicant: TAE TECHNOLOGIES, INC.

Inventor： Marcel Nations

IPC: G01R33/26 ,  G21B1/05 ,  G21B1/23 ,  G01J3/447

CPC classification number: G01R33/26 ,  G01J3/447 ,  G21B1/23 ,  G21B1/052

Abstract: Systems, devices and methods that facilitate non-intrusive measurement and validation of field-reversal of a core plasma by combining DFSS and blended Zeeman concepts (i.e., sub-Doppler circular dichroism spectroscopy).