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公开(公告)号:US09895715B2
公开(公告)日:2018-02-20
申请号:US14612784
申请日:2015-02-03
Applicant: ASM IP Holding B.V.
Inventor: Suvi P. Haukka , Raija H. Matero , Eva Tois , Antti Niskanen , Marko Tuominen , Hannu Huotari , Viljami J. Pore , Ivo Raaijmakers
IPC: C23C16/40 , B05D3/10 , C23C18/06 , C23C18/12 , C23C16/02 , C23C16/04 , C23C16/14 , C23C16/18 , C23C16/28
CPC classification number: B05D3/107 , C23C16/02 , C23C16/045 , C23C16/14 , C23C16/18 , C23C16/28 , C23C16/40 , C23C16/402 , C23C16/403 , C23C18/06 , C23C18/1208 , C23C18/1212 , C23C18/1216 , C23C18/122 , C23C18/1225 , C23C18/1245
Abstract: Methods are provided for selectively depositing a material on a first surface of a substrate relative to a second, different surface of the substrate. The selectively deposited material can be, for example, a metal, metal oxide, or dielectric material.
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公开(公告)号:US11975357B2
公开(公告)日:2024-05-07
申请号:US17547083
申请日:2021-12-09
Applicant: ASM IP HOLDING B.V.
Inventor: Suvi P. Haukka , Raija H. Matero , Eva Tois , Antti Niskanen , Marko Tuominen , Hannu Huotari , Viljami J. Pore , Ivo Raaijmakers
IPC: C23C16/06 , B05D3/10 , C23C16/02 , C23C16/04 , C23C16/14 , C23C16/18 , C23C16/28 , C23C16/40 , C23C18/06 , C23C18/12
CPC classification number: B05D3/107 , C23C16/02 , C23C16/045 , C23C16/14 , C23C16/18 , C23C16/28 , C23C16/40 , C23C16/402 , C23C16/403 , C23C18/06 , C23C18/1208 , C23C18/1212 , C23C18/1216 , C23C18/122 , C23C18/1225 , C23C18/1245
Abstract: Methods are provided for selectively depositing a material on a first surface of a substrate relative to a second, different surface of the substrate. The selectively deposited material can be, for example, a metal, metal oxide, or dielectric material.
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公开(公告)号:US20240141486A1
公开(公告)日:2024-05-02
申请号:US18410370
申请日:2024-01-11
Applicant: ASM IP Holding B.V.
Inventor: Hannu Huotari , Todd Robert Dunn , Michael Eugene Givens , Jereld Lee Winkler , Paul Ma , Eric Shero
IPC: C23C16/455 , C23C16/44 , C23C16/50 , C23C16/52
CPC classification number: C23C16/45512 , C23C16/4408 , C23C16/45527 , C23C16/45544 , C23C16/50 , C23C16/52
Abstract: Apparatus for mixing two or more gases prior to entering a reaction chamber, reactor systems including the apparatus, and methods of using the apparatus and systems are disclosed. The systems and methods as described herein can be used to, for example, pulse a mixture of two or more precursors to a reaction chamber.
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公开(公告)号:US20230249217A1
公开(公告)日:2023-08-10
申请号:US18300748
申请日:2023-04-14
Applicant: ASM IP HOLDING B.V.
Inventor: Viljami J. Pore , Marko Tuominen , Hannu Huotari
IPC: B05D1/00 , C23C16/455 , H10K71/16
CPC classification number: B05D1/60 , C23C16/45525 , H10K71/164
Abstract: Methods and apparatus for vapor deposition of an organic film are configured to vaporize an organic reactant at a first temperature, transport the vapor to a reaction chamber housing a substrate, and maintain the substrate at a lower temperature than the vaporization temperature. Alternating contact of the substrate with the organic reactant and a second reactant in a sequential deposition sequence can result in bottom-up filling of voids and trenches with organic film in a manner otherwise difficult to achieve.
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公开(公告)号:US20230101229A1
公开(公告)日:2023-03-30
申请号:US17953585
申请日:2022-09-27
Applicant: ASM IP Holding B.V.
Inventor: Hannu Huotari , Viljami Pore , Timothee Blanquart , René Henricus Jozef Vervuurt , Charles Dezelah , Giuseppe Alessio Verni , Ren-Jie Chang , Michael Givens , Eric James Shero
IPC: H01L21/768 , H01L21/67 , H01L21/02
Abstract: A multiple-layer method for forming material within a gap on a surface of a substrate is disclosed. An exemplary method includes forming a layer of first material overlying the substrate and forming a layer of second (e.g., initially flowable) material within a region of the first material to thereby at least partially fill the gap with material in a seamless and/or void less manner.
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公开(公告)号:US11446699B2
公开(公告)日:2022-09-20
申请号:US16877129
申请日:2020-05-18
Applicant: ASM IP Holding B.V.
Inventor: Viljami J. Pore , Marko Tuominen , Hannu Huotari
IPC: C23C16/455 , B05D1/00 , H01L51/00
Abstract: Methods and apparatus for vapor deposition of an organic film are configured to vaporize an organic reactant at a first temperature, transport the vapor to a reaction chamber housing a substrate, and maintain the substrate at a lower temperature than the vaporization temperature. Alternating contact of the substrate with the organic reactant and a second reactant in a sequential deposition sequence can result in bottom-up filling of voids and trenches with organic film in a manner otherwise difficult to achieve.
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公开(公告)号:US11365478B2
公开(公告)日:2022-06-21
申请号:US16565516
申请日:2019-09-10
Applicant: ASM IP Holding B.V.
Inventor: Hannu Huotari , Tom E. Blomberg
IPC: C23C16/44 , C23C16/455 , C23C16/52
Abstract: The present invention relates generally to methods and apparatus for the controlled growing of material on substrates. According to embodiments of the present invention, a precursor feed is controlled in order to provide an optimal pulse profile. This may be accomplished by splitting the feed into two paths. One of the paths is restricted in a continuous manner. The other path is restricted in a periodic manner. The output of the two paths converges at a point prior to entry of the reactor. Therefore, a single precursor source is able to fed precursor in to a reactor under two different conditions, one which can be seen as mimicking ALD conditions and one which can be seen as mimicking CVD conditions. This allows for an otherwise single mode reactor to be operated in a plurality of modes including one or more ALD/CVD combination modes. Additionally, the pulse profile of each pulse can be modified. The pulse profile can be modified to create a low or very low partial pressure pulse profile at the beginning of a pulse.
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公开(公告)号:US11362222B2
公开(公告)日:2022-06-14
申请号:US17087924
申请日:2020-11-03
Applicant: ASM IP HOLDING B.V.
Inventor: Tom E. Blomberg , Hannu Huotari
IPC: H01L31/0232 , H01L31/032 , H01L31/062 , H01L31/072 , C23C14/06 , C23C16/455 , C23C16/30 , H01L31/18 , H01L33/00 , H01L33/58 , C23C16/22
Abstract: Deposition processes are disclosed herein for depositing thin films comprising a dielectric transition metal compound phase and a conductive or semiconducting transition metal compound phase on a substrate in a reaction space. Deposition processes can include a plurality of super-cycles. Each super-cycle may include a dielectric transition metal compound sub-cycle and a reducing sub-cycle. The dielectric transition metal compound sub-cycle may include contacting the substrate with a dielectric transition metal compound. The reducing sub-cycle may include alternately and sequentially contacting the substrate with a reducing agent and a nitrogen reactant. The thin film may comprise a dielectric transition metal compound phase embedded in a conductive or semiconducting transition metal compound phase.
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公开(公告)号:US11047040B2
公开(公告)日:2021-06-29
申请号:US16594365
申请日:2019-10-07
Applicant: ASM IP Holding B.V.
Inventor: Suvi P. Haukka , Raija H. Matero , Eva Tois , Antti Niskanen , Marko Tuominen , Hannu Huotari , Viljami J. Pore
IPC: C23C16/04 , C23C16/455 , C23C16/02 , C23C16/06 , C23C16/40 , C23C16/30 , C23C16/56 , H01L21/285 , H01L21/768 , C23C16/18 , C23C16/22
Abstract: Methods are provided for dual selective deposition of a first material on a first surface of a substrate and a second material on a second, different surface of the same substrate. The selectively deposited materials may be, for example, metal, metal oxide, or dielectric materials.
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公开(公告)号:US10814349B2
公开(公告)日:2020-10-27
申请号:US16429750
申请日:2019-06-03
Applicant: ASM IP HOLDING B.V.
Inventor: Viljami J. Pore , Marko Tuominen , Hannu Huotari
Abstract: Methods and apparatus for vapor deposition of an organic film are configured to vaporize an organic reactant at a first temperature, transport the vapor to a reaction chamber housing a substrate, and maintain the substrate at a lower temperature than the vaporization temperature. Alternating contact of the substrate with the organic reactant and a second reactant in a sequential deposition sequence can result in bottom-up filling of voids and trenches with organic film in a manner otherwise difficult to achieve. Deposition reactors conducive to depositing organic films are provided.
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