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    TESTING DEVICE FOR LASER ILLUMINATION SYSTEMS
    25.
    发明申请
    TESTING DEVICE FOR LASER ILLUMINATION SYSTEMS 审中-公开

    公开(公告)号：US20170176249A1

    公开(公告)日：2017-06-22

    申请号：US14975889

    申请日：2015-12-21

    Applicant: APPLE INC.

    Inventor： Florian R. Fournier ,  Miodrag Scepanovic

    IPC: G01J1/42 ,  G02B5/02 ,  G02B27/42

    CPC classification number: G01J1/4257 ,  G01J1/0407 ,  G01J1/4228 ,  G02B5/021 ,  G02B27/4233

    Abstract: Apparatus and methods are described, including an apparatus for testing a light beam emitted by a light source. The apparatus includes a transparent substrate, a first face of the substrate being shaped to define a plurality of optical deflectors. At least one optical detector is positioned to face a second face of the substrate that is not opposite the first face. Each one of the deflectors is configured to deflect a portion of the light beam toward the detector, when the light beam is passed through the first face of the substrate. Other applications are also described.

    System for detection and imaging by spectral analysis in several wavelength bands
    26.
    发明授权
    System for detection and imaging by spectral analysis in several wavelength bands 有权

    公开(公告)号：US09683893B2

    公开(公告)日：2017-06-20

    申请号：US14778494

    申请日：2014-03-19

    Applicant: SAGEM DEFENSE SECURITE

    Inventor： Francois Dufresne De Virel ,  Marc Bousquet

    IPC: G01J3/36 ,  H04N5/33 ,  G01J1/04 ,  F41G3/14 ,  G01S3/781 ,  G01S3/784

    CPC classification number: G01J3/36 ,  F41G3/147 ,  G01J1/0407 ,  G01S3/781 ,  G01S3/784 ,  H04N5/33

    Abstract: The invention relates to a system for detection and infrared imaging by spectral analysis in several wavelength bands comprising: —an imaging sensor comprising a plurality of elementary sensors together forming a matrix sensitive surface; —an imaging optic adapted for forming on the sensitive surface of the imaging sensor, a first image of the scene to be analyzed in a first wavelength band, and at least one second image of the scene to be analyzed in a second wavelength band, characterized in that said detection and imaging system furthermore comprises an optical device consisting of a fixed optical plate adapted for shifting the first image with respect to the second image in the plane of the sensitive surface, the shift between the images being along a direction defined by a row, a column or a diagonal of elementary sensors, the shift distance being equal to the spacing of the elementary sensors of the matrix sensitive surface along this direction or to a multiple of this spacing.

    ANTIREFLECTION MEMBER AND ORIENTER APPARATUS
    29.
    发明申请
    ANTIREFLECTION MEMBER AND ORIENTER APPARATUS 审中-公开

    公开(公告)号：US20170117173A1

    公开(公告)日：2017-04-27

    申请号：US15041188

    申请日：2016-02-11

    Applicant: Kabushiki Kaisha Toshiba

    Inventor： Katsutoshi YAMAMOTO

    IPC: H01L21/68 ,  G01B11/14 ,  G01J1/04 ,  G02B1/11

    CPC classification number: H01L21/681 ,  G01B11/14 ,  G01J1/0407 ,  G02B1/10 ,  G02B1/11 ,  G02B5/22

    Abstract: According to one embodiment, there is provided an antireflection member including a first plate part, a second plate part, and a third plate part. The first plate part has a first end and a second end. The second end is arranged at a side opposite to the first end. The second plate part extends from a vicinity of the first end. A first notch part is arranged on the second plate part. The second plate part has an antireflection surface. The third plate part extends from a vicinity of the second end to be opposed to the second plate part A second notch part is arranged at a position corresponding to the first notch part on the third plate part. The third plate part has an antireflection surface directed to the antireflection surface of the second plate part.

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