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公开(公告)号:US10859491B2
公开(公告)日:2020-12-08
申请号:US16275948
申请日:2019-02-14
Applicant: Yokogawa Electric Corporation
Inventor: Kentaro Hazama , Junichi Matsuo , Nobuko Takekawa , Yuya Sugiyama
Abstract: A spectroscopic analysis apparatus includes a laser light source that emits laser light, of which wavelength changes, toward a reflector inside a probe, the probe being configured to be disposed in a flow passage of a measurement target fluid, a light receiver that receives the laser light reflected by the reflector, and a controller that analyzes the measurement target fluid using a result of reception acquired by the light receiver and controlling the laser light source. The controller controls the laser light source to perform at least one scan of the laser light, the controller controlling the laser light source such that a scanning time of the laser light is equal to or shorter than a light-receivable time of the laser, the scanning time being a time to scan the laser light emitted from the laser light source in a certain wavelength range, the light-receivable time being a time in which the laser light reflected by the reflector can be received by the light receiver.
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公开(公告)号:US20200271515A1
公开(公告)日:2020-08-27
申请号:US16870282
申请日:2020-05-08
Applicant: NOVATRANS GROUP SA
Inventor: John F. ROULSTON , Daniel MANDELIK
IPC: G01J3/10 , G01J3/433 , G01N21/3581 , G01J3/42
Abstract: A terahertz spectrometer includes: a terahertz-wave emitter and a terahertz receiver elements. The terahertz wave generated by means of generating beat frequency corresponding to the difference between two rapidly tunable continuous wave lasers. Having a difference in time between the interrogating signal and the reference signal at the receiver end side, which corresponds to intermediate frequency (IF), not centered around the baseband, i.e. zero Hertz. The offset step size of the intermediate frequency from zero Hertz is linearly correlated to the position of the interrogated object position.
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公开(公告)号:US10670521B2
公开(公告)日:2020-06-02
申请号:US15549507
申请日:2016-02-10
Inventor: Robert J H Hammond , Mario E Giardini , Stephen H Gillespie
IPC: C12Q1/00 , G01J3/02 , G01N21/47 , G01N21/51 , G01J3/433 , G01N15/06 , G01N21/03 , G01N21/53 , G01N15/02 , C12Q1/02 , C12Q1/06 , C12Q1/18 , G01N15/00 , G01N21/11 , G01N21/64
Abstract: A system for measuring a sample comprising: an integrating sphere light collector (12) for collecting light and containing the sample; a light source (24) for introducing light in the integrating sphere light collector (12), wherein the light source (24) is operable to output light with a known modulation, preferably by using a signal generator (26); a detector (22) for detecting scattered light in the integrating sphere light collector (12) and generating a signal indicative of the scattered light, and a lock-in amplifier (28) operable use the known light modulation and the signal generated by the detector (22) to provide an output for analysis.
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公开(公告)号:US10605662B2
公开(公告)日:2020-03-31
申请号:US16279181
申请日:2019-02-19
Applicant: Massachusetts Institute of Technology
Inventor: Thomas H. Jeys , William D. Herzog , Brian G. Saar , Alexander M. Stolyarov , Ryan Sullenberger , David Crompton , Shawn Michael Redmond
Abstract: A device, and corresponding method, can include a pump light source configured to irradiate a target specimen. The device can also include a sensor configured to observe a probe speckle pattern based on light from a probe light source reflected from the target specimen. The device further may include a correlator configured to determine a material property of the target specimen by analyzing changes in images of the probe speckle pattern as a function of the irradiation with the pump light source. Advantages of the device and method can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
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公开(公告)号:US20200049556A1
公开(公告)日:2020-02-13
申请号:US16399431
申请日:2019-04-30
Applicant: Picarro, Inc.
Inventor: Chris W. Rella , Hongbing Chen , Derek Gregory Fleck , John A. Hoffnagle , James Ian Lee , Gerald Thomas Sornsen , Sze Meng Tan
Abstract: Interleaved data acquisition in optical spectroscopy is used to provide interference correction for time-varying interference. Measurements at a reference frequency are used to provide an estimate of the interference. These reference measurements are interleaved with the remaining measurements in order to provide estimates of the interference vs. time at relevant times. The interference being corrected can be spectrally structured or unstructured.
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公开(公告)号:US20190301936A1
公开(公告)日:2019-10-03
申请号:US16293184
申请日:2019-03-05
Applicant: Rocco DiFoggio , Bernardo E. Pohl
Inventor: Rocco DiFoggio , Bernardo E. Pohl
Abstract: A method for performing a formation fluid test in a borehole penetrating a subsurface formation includes disposing a fluid tester in the borehole, extracting a sample of fluid from the subsurface formation using the fluid tester, and analyzing the sample using the fluid tester to provide test data for a process used to analyze the sample. The method also includes fitting an equation to the test data and calculating a ratio of a first derivative of the equation to a second derivative of the equation. The method further includes continuing to extract the sample from the subsurface formation in response to the ratio indicating a clean sample will be forthcoming and terminating the extracting of the sample from the subsurface formation in response to the ratio indicating a clean sample will not be forthcoming.
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公开(公告)号:US10386310B2
公开(公告)日:2019-08-20
申请号:US15507545
申请日:2015-08-28
Applicant: Aurora Solar Technologies (Canada) Inc.
Inventor: Stephen Warren Blaine
Abstract: A system and method of non-contact measurement of the dopant content of semiconductor material by reflecting infrared (IR) radiation off of the material into an integrating sphere to scatter the received radiation and passing portions of the radiation through band pass filters of differing wavelength ranges, comparing the level of energy passed through each filter and calculating the dopant content by referencing a correlation curve made up of known wafer dopant content for that system.
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公开(公告)号:US20190250038A1
公开(公告)日:2019-08-15
申请号:US16279181
申请日:2019-02-19
Applicant: Massachusetts Institute of Technology
Inventor: Thomas H. Jeys , William D. Herzog , Brian G. Saar , Alexander M. Stolyarov , Ryan Sullenberger , David Crompton , Shawn Michael Redmond
CPC classification number: G01J3/433 , G01J3/108 , G01J3/2823 , G01J3/447 , G01N21/1717 , G01N21/636 , G01N2021/1725
Abstract: A device, and corresponding method, can include a pump light source configured to irradiate a target specimen. The device can also include a sensor configured to observe a probe speckle pattern based on light from a probe light source reflected from the target specimen. The device further may include a correlator configured to determine a material property of the target specimen by analyzing changes in images of the probe speckle pattern as a function of the irradiation with the pump light source. Advantages of the device and method can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
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公开(公告)号:US10345235B2
公开(公告)日:2019-07-09
申请号:US13809569
申请日:2011-08-19
Applicant: Charles Charbel Harb , Thomas Gary Spence , Toby Kristian Boyson
Inventor: Charles Charbel Harb , Thomas Gary Spence , Toby Kristian Boyson
IPC: H03F1/26 , G01N21/59 , G01J3/42 , G01J3/45 , G01N21/31 , G06F17/00 , G01J3/433 , G01N21/39 , G01N21/35
Abstract: Systems and methods for analysing a time-domain signal are described. The method comprising: in a mixer (150), mixing the time-decay signal (115) with a local oscillator signal (122) generated by a local oscillator (120), resulting in a mixed signal from which a Fourier transformed time-decay signal is generated comprising a fundamental transformed time decay signal at the fundamental frequency of the local oscillator signal (122) and a plurality of transformed time-decay signals at a plurality of frequencies; and determining the magnitude of each of the transformed time-decay signals at the fundamental frequency and at a frequency other than the fundamental frequency.
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公开(公告)号:US10302563B2
公开(公告)日:2019-05-28
申请号:US14913296
申请日:2014-08-21
Applicant: Tokushima University
Inventor: Yoshihiro Deguchi , Takahiro Kamimoto
IPC: G01N21/61 , G01N21/3504 , G01J3/427 , G01N21/31 , G01N21/39 , G01J5/00 , G01J3/433 , G01J5/60 , G01K11/18 , G01K11/00
Abstract: A gas analyzing apparatus includes first and second laser sources that output first and second laser lights, a laser controller that controls the first and second laser sources to vary wavelengths of the first and second laser lights in the respective predetermined wavelength ranges, an optical multiplexer that multiplexes the first and second laser lights to transmit the multiplexed laser light to a target gas, an optical receiver that receives the laser light transmitted through the target gas, and an analyzer that analyzes a temperature and/or a concentration of the target gas based on an electric signal output from the optical receiver. While varying the wavelengths of the laser lights, the laser controller controls amplitudes of the first and second laser lights to differ from each other and varies intensities of the first and second laser lights in the opposite direction.
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