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公开(公告)号：US20230208101A1
公开(公告)日：2023-06-29
申请号：US17923514
申请日：2021-05-07
Applicant: UNIVERSITEIT GENT , IMEC VZW
Inventor： Bart KUYKEN , Kasper VAN GASSE
CPC classification number: H01S5/0657 , H01S5/3434 , H01S5/4006 , H01S5/042 , H01S5/0078 , H01S5/1025 , G01J3/10 , G01J3/45 , H01S5/3438 , G01J2003/102
Abstract: A photonic integrated circuit-based dual frequency comb source, an integrated system for dual comb spectroscopy and corresponding method are disclosed. The dual comb source includes, on a same substrate of the photonic integrated circuit, a first and second semiconductor integrated mode-locked laser, a master laser, and connection arrangement between the master laser and each of the first and second mode-locked laser. The master laser is configured for generating a lasing line for simultaneous optical injection-locking of the first and second mode-locked laser, the first and second mode-locked laser are configured for generating a first and second frequency comb respectively, and the connection arrangement is suitable for coherently transferring lasing light from the master laser to each mode-locked laser. The mode-locked lasers include a gain section and a saturable absorber section to provide mode-locking, and an extended optical cavity formed in the substrate.
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公开(公告)号：US11635613B2
公开(公告)日：2023-04-25
申请号：US16625685
申请日：2018-07-06
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Tatsuya Sugimoto , Tomofumi Suzuki , Kyosuke Kotani
Abstract: An optical device includes an elastic support portion which includes a torsion bar extending in a second direction perpendicular to a first direction and a nonlinearity relaxation spring connected between the torsion bar and a movable portion. The nonlinearity relaxation spring is configured so that a deformation amount of the nonlinearity relaxation spring around the second direction is smaller than a deformation amount of the torsion bar around the second direction and a deformation amount of the nonlinearity relaxation spring in a third direction perpendicular to the first direction and the second direction is larger than a deformation amount of the torsion bar in the third direction while the movable portion moves in the first direction. A first comb finger of a first comb electrode and a second comb finger of a second comb electrode which are adjacent to each other face each other in the second direction.
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公开(公告)号：US20230092539A1
公开(公告)日：2023-03-23
申请号：US17759518
申请日：2021-01-27
Applicant: Layer Metrics Inc.
Inventor： Dominic Murphy
Abstract: Spectroferometers and methods of use are provided. The spectroferometers includes an enclosure, one or more interferometer beam-splitting elements, and one or more spectrometer beam-dispersing elements. The one or more interferometer beam-splitting elements and the one or more spectrometer beam-dispersing elements are housed in the enclosure, share one or more radiation sensitive elements, which are arranged to generate a signal in response to incident electromagnetic radiation, and each generate one or more optical outputs. The one or more optical outputs are arranged such that respective optical axes intersect substantially in a plane of the one or more radiation sensitive elements.
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公开(公告)号：US20220390359A1
公开(公告)日：2022-12-08
申请号：US17830327
申请日：2022-06-01
Applicant: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC
Inventor： Peter Steinberg
Abstract: An embodiment of a microscope system is described that comprises a sample stage configured to position a sample; and a spectrometer comprising an interferometer configure to provide a light beam to the sample stage and one or more detectors configured to detect light spectra in response to the light beam, wherein the spectrometer sends a notification to the sample stage after a scan comprising an acceptable measure of quality has been acquired from the detected light spectra at a first location, and the sample stage is further configured to count the notifications and initiate movement of the sample stage to a second location when a count value reaches a pre-determined number.
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公开(公告)号：US20220364923A1
公开(公告)日：2022-11-17
申请号：US17622641
申请日：2020-06-19
Applicant: UNIVERSIDAD CARLOS III DE MADRID
Inventor： Pedro MARTÍN MATEOS , Cristina DE DIOS FERNÁNDEZ , Óscar Elías BONILLA MANRIQUE , Guillermo Andrés GUARNIZO HERREÑO
Abstract: A method for generating a illumination dual-comb signal that provides a low frequency train of interferograms (180) readable by a regular video-rate camera (160) comprising N pixels and a sampling frequency of V Hz to extract hyperspectral information (170), the method comprising providing a monochromatic signal, splitting the monochromatic signal in two split monochromatic signals, frequency shifting each monochromatic signal with an offset frequency below V 2 Hz , generating two frequency combs having a difference in repetition below V 2 Hz by a nonlinear modulation of the two split monochromatic signals, generate the illumination dual-comb signal, Illuminating a target and employing a video-rate camera (160) to read a low frequency train of interferograms (180) based on a reflected and/or transmitted signal of the illumination dual-comb signal and performing Fourier transformation of the low frequency train of interferograms (180) detected by each pixel from the N pixels to extract the hyperspectral information (170).
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Patent Agency Ranking
公开(公告)号：US11482830B2
公开(公告)日：2022-10-25
申请号：US17013965
申请日：2020-09-08
Applicant: VISUAL PHOTONICS EPITAXY CO., LTD.
Inventor： Chao-Hsing Huang , Yu-Chung Chin , Van-Truong Dai
Abstract: A measurement method for a vertical cavity surface emitting laser diode (VCSEL) and an epitaxial wafer test fixture are provided, especially the Fabry-Perot Etalon of the bottom-emitting VCSEL can be measured. When the Fabry-Perot Etalon of the bottom-emitting VCSEL is measured by a measurement apparatus, a light of the test light source of the measurement apparatus is incident from the substrate surface of the VCSEL epitaxial wafer such that the Fabry-Perot Etalon of the bottom-emitting VCSEL is acquired. Through the VCSEL epitaxial wafer test fixture, the bottom-emitting VCSEL can be directly measured by the existing measurement apparatus such that there is no need to change the optical design of the measurement apparatus, and it can prevent the VCSEL epitaxial wafer from being scratched or contaminated.
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公开(公告)号：US11480518B2
公开(公告)日：2022-10-25
申请号：US16702094
申请日：2019-12-03
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , David Grigg , Derek Decker
Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
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公开(公告)号：US20220333988A1
公开(公告)日：2022-10-20
申请号：US17847881
申请日：2022-06-23
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Masaki HIROSE , Katsumi SHIBAYAMA , Takashi KASAHARA , Toshimitsu KAWAI , Hiroki OYAMA
Abstract: A light detection device includes a Fabry-Perot interference filter provided with a light transmitting region on a predetermined line, a light detector disposed on one side with respect to the Fabry-Perot interference filter on the line, a package having an opening positioned on the other side with respect to the Fabry-Perot interference filter on the line, a light transmitting member provided in the package such that the opening is blocked, and a temperature control element having an endothermic region thermally connected to the Fabry-Perot interference filter and the light detector. The endothermic region is positioned on one side with respect to the light detector on the line.
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公开(公告)号：US11422029B1
公开(公告)日：2022-08-23
申请号：US17101509
申请日：2020-11-23
Applicant: Intelon Optics, Inc.
Inventor： Peng Shao , Paul Robert Parise , Kwangsup Shin , Maxwell Kotlarchyk
Abstract: Input light comprising an optical signal associated with a spectrum of at least a portion of the input light is received into an interferometer. Data comprising an image is provided using a detector array comprising detection elements. Output light is received from the interferometer into a set of one or more optical elements, which provide an optical interference pattern associated with an intensity of at least a portion of the output light that is distributed over a set of detection elements. Detection of the optical signal is stabilized based at least in part on the data using a control system comprising: a light-control module that controls a first feedback loop that stabilizes the portion of the output light; and/or a temperature-control module that controls a second feedback loop that stabilizes a temperature sensed by at least one temperature sensor within a thermal environment associated with the interferometer.
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30.发明申请公开(公告)号：US20220178751A1
公开(公告)日：2022-06-09
申请号：US17643157
申请日：2021-12-07
Applicant: California Institute of Technology
Inventor： Seyedeh Sona Hosseini
Abstract: Novel monolithic reflective spatial heterodyne spectrometers (SHS) interferometer systems are presented. Monolithic systems in accordance with the invention have a single supporting structure wherein input optics, output optics, a flat mirror, a roof mirror, and a symmetric grating are affixed. Embodiments of the invention contain only fixed parts, and the optics do not move in relation to the supporting structure. Embodiments of the present invention enables smaller, lighter, and more robust reflective SHS systems as compared to conventional interferometry. Additionally, embodiments of the present invention require less time and skill for construction and maintenance, and is a better economic option. Additional embodiments can include multiple interferometer systems in a single supporting structure.
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