Abstract:
In a spectroscopic ellipsometer, light emitted from a light source enters a measurement surface of a substrate through an optical system in a lighting part so as to incline to the measurement surface to be directed to a light receiving device, and ellipsometry is performed based on spectral intensity of reflected light reflected on the measurement surface, the spectral intensity being acquired by the light receiving device. In focusing of the spectroscopic ellipsometer, a focus position of the measurement surface is obtained based on a total light amount in a predetermined wavelength band of the reflected light, the total light amount being obtained by the light receiving device. In the spectroscopic ellipsometer, since the optical system for ellipsometry and the optical system for focusing are common, it is possible to eliminate influences of change of the optical systems by temperature change or the like and to achieve high accurate focusing.
Abstract:
In one embodiment, the present invention is directed to a multi-energy polarization imaging method consisting of a multi-fusion, dual-rotating retarder/multiple-energy complete Mueller matrix-based polarimeter and dual-energy capabilities. By subtracting polarimetric parameters such as degree of polarization, degree of linear polarization, degree of circular polarization, respectively, obtained with interrogation light beams of wavelengths λ1, and λ2, the system of the present invention can obtain, in one embodiment, enhanced imaging.
Abstract:
An optical method and system for measuring characteristics of a sample using a broadband metrology tool in a purge gas flow environment are disclosed. In the method a beam path for the metrology tool is purged with purge gas at a first flow rate. A surface of the sample is illuminated by a beam of source radiation having at least one wavelength component in a vacuum ultraviolet (VUV) range and/or at least one wavelength component in an ultraviolet-visible (UV-Vis) range. A flow rate of a purge gas is adjusted between the first flow rate for metrology measurements made when the source radiation is in the VUV spectral region and a second flow rate for metrology measurements made when the source radiation is in the UV-Vis spectral region. The system includes a light source, illumination optics, collection optics, detector, a purge gas source and a controller. The purge gas source is configured to supply a flow of purge gas to a beam path in the light source and/or illumination optics and/or sample and/or collection optics and/or detector. The controller is configured to control a flow rate of the purged gas flow in response to an output signal from the detector.
Abstract:
Device for controlling light radiation, which is excited in a specimen and/or which is backscattered and/or reflected and which contains one or more wavelengths, at a plurality of light outlets, wherein a separation of the light radiation into differently polarized components is carried out; and the components of the excitation radiation and/or detection radiation are affected in their polarization by means of a preferably birefringent, preferably acousto-optic or electro-optic medium, which changes the ordinary and extraordinary refractive index.
Abstract:
Method and arrangement for changing the spectral composition and/or intensity of illumination light and/or specimen light in an adjustable manner, wherein a spatial separation into radiation components of different polarization is carried out with a first polarizing device, a spectral, spatial splitting of at least one radiation component is carried out with first dispersion device, the polarization state of at least one part of the spectrally spatially split radiation component is changed, and a spatial separation and/or combination of radiation components of different polarization are/is carried out by a second polarizing device, wherein a spatial combination of radiation components which are changed and not changed with respect to their polarization state is advantageously carried out by a second dispersion device.
Abstract:
A high-sensitivity evaluation technique for optical anisotropy. An optical measurement/evaluation apparatus A has an optical pulse generator 1 which generates optical pulses, half mirror 3, first mirror 5, second mirror 7, third mirror 9, retroreflector 11, wave plate 15, lens 17, spectroscope 21, and controller (PC) 23. An optical pulse L1 emitted from the optical pulse generator 1 is separated into two pulsed lights L2 and L3 by the half mirror 3. The pulsed light L2 is reflected by the mirrors 5 and 7 (pulsed lights L4 and L5) and polarized light of the optical pulse is rotated by the half-wave phase plate 15 installed on a rotary stage 15a and is focused on a surface of a specimen S by the lens 17 (L8). The optical pulse L3 is reflected by the retroreflector 11 which returns light parallel to incident light and non-coaxially (L6), and reflected by the mirror 9. Then polarized light of the optical pulse is rotated by the half-wave phase plate 15 installed on the rotary stage 15a and is focused on the same position on the surface of the specimen S by the lens 17 through an optical path L7 different from L8 above. In so doing, the linearly polarized lights of the two optical pulses are directed at the specimen S by being aligned approximately parallel to each other and being rotated simultaneously. A phenomenon known as four-wave mixing occurs when a wave number k1 is given to the optical pulse L8 and a wave number k2 is given to the optical pulse L7. Presence of anisotropic changes due to uniaxial strain or the like in an isotropic thin film causes large anisotropy in the intensity of diffracted light (2k2−k1).
Abstract:
An optical apparatus in which multiplexed holograms are used to achieve wavelength selectivity and polarization manipulation is used to facilitate near-normal incidence of light on the holograms. The polarization manipulation allows light reflected from the holograms to be separated from the light incident on the holograms. In one application, the apparatus can be used to extract spectral lines of an analyte from radiation scattered from a sample.
Abstract:
A spectrometer generates Vibrational Circular Dichroism (VCD) measurements having an exceedingly high signal-to-noise ratio, as well as a greater wavelength range over which measurements may be accurately provided. This is achieved by utilizing reflective optics (preferably solely reflective optics, i.e., no refractive elements) to supply a concentrated and collimated input light beam to a sample within a sample cell, and similarly collecting the light output from the sample cell via reflective optics for supply to a detector.
Abstract:
A system for processing signals includes a receiver assembly for receiving a signal. The signal has a sample component with a sample electric field and a sample polarization, and has a reference component with a reference electric field and a reference polarization. The receiver assembly includes an analyzer for polarimetrically processing the signal, including differencing the signal to generate a difference electric field proportional to the difference of the sample and reference electric fields. By polarimetrically differencing the signal, the analyzer reduces the magnitude of the common-mode signal at the difference signal receiver. The receiver assembly includes an electric-field detector for measuring the difference electric field such that the reduction in common-mode amplitude decreases the noise equivalent power of the electric-field detector. One advantage of the present invention, then, is the reduction of noise equivalent power of the electric-field detector when measuring small variations in large electric fields.
Abstract:
A filter for use in a spectrometer to filter transmitted radiation and wherein the filter has a birefringent element responsive to an applied signal, a first polarizer for polarizing the radiation transmitted by a sample, a second polarizer for polarizing the radiation transmitted by the birefringent element, and wherein the birefringent element has a birefringent member having a first birefringence and the birefringent member being responsive to a force applied thereto to generate an additional second birefringence; and the filter having a driver for applying a force to the birefringent member in accordance with the applied signal, and the driver has a piezoelectric member coupled to the birefringent member on one end or at two opposite ends.