公开(公告)号：US09457229B2

公开(公告)日：2016-10-04

申请号：US14243575

申请日：2014-04-02

Applicant: Applejack 199 L.P.

Inventor： Jun Liang ,  Ann Koo ,  Nicolai Maltsev

IPC: G07F17/32 ,  G06F3/01 ,  A63F13/21 ,  A63F13/211 ,  A63F13/212 ,  A63F13/213 ,  A63B24/00 ,  A63B69/36 ,  G01P15/18 ,  A63B53/10

CPC classification number: A63B60/46 ,  A63B24/0003 ,  A63B24/0006 ,  A63B53/10 ,  A63B69/36 ,  A63B69/3632 ,  A63B2024/0009 ,  A63B2024/0012 ,  A63B2024/0015 ,  A63B2220/24 ,  A63B2220/34 ,  A63B2220/40 ,  A63B2220/44 ,  A63B2220/62 ,  A63B2220/806 ,  A63B2225/20 ,  A63B2225/50 ,  A63F13/21 ,  A63F13/211 ,  A63F13/212 ,  A63F13/213 ,  A63F2300/1012 ,  G01P15/18 ,  G06F3/011 ,  G07F17/3223

Abstract: A method of providing a sensor-based gaming system for an avatar to represent a player in a virtual environment includes wirelessly receiving a set of measurements describing attributes of the player. The method includes generating a player profile associated with the player and including an avatar depicting a virtual embodiment of the player in a virtual world. The method includes receiving sensor data from sensors. The sensor data describes a change in a real world position of the player. The method includes determining an estimate of a player movement. The method includes determining a difference between a screen position of the avatar in the virtual world and the real world position of the player in the real world. The method includes generating avatar image data representative of movement of the avatar corresponding to movement of the player.

Abstract translation: 为虚拟环境提供用于表示玩家的基于传感器的游戏系统的方法包括无线地接收描述玩家属性的一组测量。 该方法包括生成与玩家相关联的玩家简档，并且包括描绘虚拟世界中的玩家的虚拟实施例的头像。 该方法包括从传感器接收传感器数据。 传感器数据描述了玩家现实世界位置的变化。 该方法包括确定玩家运动的估计。 该方法包括确定虚拟世界中化身的屏幕位置与现实世界中的玩家的真实世界位置之间的差异。 该方法包括生成代表对应于玩家的移动的化身的运动的化身图像数据。

公开(公告)号：US20150343293A1

公开(公告)日：2015-12-03

申请号：US14654586

申请日：2013-12-20

Applicant: APPLEJACK 199 L.P.

Inventor： Ann KOO ,  Uwe RICHTER

IPC: A63B69/36 ,  G01P15/00

CPC classification number: A63B60/46 ,  A63B24/0003 ,  A63B53/10 ,  A63B69/36 ,  A63B69/3632 ,  A63B2024/0009 ,  A63B2024/0012 ,  A63B2024/0015 ,  A63B2220/24 ,  A63B2220/34 ,  A63B2220/40 ,  A63B2220/44 ,  A63B2220/62 ,  A63B2220/806 ,  A63B2225/20 ,  A63B2225/50 ,  A63F13/21 ,  A63F13/211 ,  A63F13/212 ,  A63F13/213 ,  G01P15/18 ,  G06F3/011 ,  G07F17/3223

Abstract: The invention relates to a measuring device for detecting a hitting movement of a hitting implement. The measuring device comprises at least one two-dimensional acceleration sensor for detecting a two-dimensional acceleration vector (xy). The measuring device comprises at least one one-dimensional acceleration sensor for detecting a one-dimensional acceleration vector (z). In addition, the measuring device comprises a first rotation angle sensor for detecting a first rotation angle of the two-dimensional acceleration vector (xy) about a z-axis.

Abstract translation: 本发明涉及一种用于检测打击工具的撞击运动的测量装置。 测量装置包括用于检测二维加速度矢量（xy）的至少一个二维加速度传感器。 测量装置包括用于检测一维加速度矢量（z）的至少一个一维加速度传感器。 此外，测量装置包括用于检测围绕z轴的二维加速度矢量（xy）的第一旋转角度的第一旋转角度传感器。

公开(公告)号：US11163144B2

公开(公告)日：2021-11-02

申请号：US17147393

申请日：2021-01-12

Applicant: APPLEJACK 199 L.P.

Inventor： Mihail Mihaylov ,  Wojciech J Walecki ,  Jae Ryu

IPC: G02B21/06 ,  H04N5/225 ,  G02B21/36 ,  G02B21/08 ,  H04N5/372

Abstract: The present subject matter includes a method of focusing of an optical imaging apparatus. The method comprises causing illumination of an object using an illuminating beam to thereby cause generation of a scattered beam. A first set of luminous parameters are derived from a first detected position of a luminous representation formed by the scattered beam from the object. The illumination-beam is focused upon the object by triggering a movement of the object along an optical-axis in a first direction, the first direction being based a numerical-representation of the first set of luminous parameters. A second set of luminous parameters are derived from a second detected position of the luminous-representation of the object, the second detected position being related to the first detected position and the movement of the object. The focusing of the illumination beam is ceased based at-least on a numerical-representation of the second set of luminous parameters.

公开(公告)号：US11112234B2

公开(公告)日：2021-09-07

申请号：US16741632

申请日：2020-01-13

Applicant: APPLEJACK 199 L.P.

Inventor： Wojciech J Walecki

IPC: G01B9/02 ,  G01B11/30 ,  G01B11/06

Abstract: The present subject matter at least provides an apparatus for inspecting a slab of material including a passivation layer. The apparatus includes a frequency-domain optical-coherence tomography (OCT) probe configured to irradiate the slab of material, and detect radiation reflected from the slab of material. The apparatus also includes a spectral-analysis module configured to analyze at least an interference pattern with respect to the OCT probe to thereby determine a thickness of the slab of the material. The apparatus also includes a thin-film gauge configure to determine a thickness of the passivation layer such that the determined thickness of the slab of material may be adjusted baes on the thickness of the passivation layer.

公开(公告)号：US11105611B2

公开(公告)日：2021-08-31

申请号：US15980375

申请日：2018-05-15

Applicant: APPLEJACK 199 L.P.

Inventor： Wojciech J Walecki ,  Wei-Chun Hung ,  Raphael Morency

IPC: G01B11/16 ,  G03F9/00 ,  G03F7/20

Abstract: A method and apparatus for non-contact measurement of stress in a thin-film deposited on a substrate is disclosed. The method may include positioning a substrate on a plurality of support-elements, the substrate having a thin-film deposited thereupon. A first-polynomial may be defined for representing a surface of the substrate that is in contact with the support elements. A second-polynomial may be determined based on an optimization determination of potential-energy acting upon the substrate. A finite-order polynomial may be created by calculating a product of the first and second polynomials to represent a shape of the surface of the substrate as a model of the surface. Thereafter, stress in the substrate may be determined based on fitting the model of the surface with a measured topographical data of the surface.

公开(公告)号：US20200149866A1

公开(公告)日：2020-05-14

申请号：US16741610

申请日：2020-01-13

Applicant: APPLEJACK 199 L.P.

Inventor： Wojciech J WALECKI

IPC: G01B9/02 ,  G01B11/06 ,  G01B11/30

Abstract: The present subject matter at least provides an apparatus for characterization of a slab of a material. The apparatus comprises two or more frequency-domain optical-coherence tomography (FD-OCT) probes configured for irradiating the slab of material, and detecting radiation reflected from the slab of material or transmitted there-through. Further, a centralized actuation-mechanism is connected to the OCT probes for simultaneously actuating elements in each of the OCT probes to cause a synchronized detection of the radiation from the slab of material. A spectral-analysis module is provided for analyzing at least an interference pattern with respect to each of the OCT probes to thereby determine at least one of thickness and topography of the slab of the material. Further, in some embodiments, the slab of material may include a passivation layer. The apparatus may be configured to determine a thickness of the passivation layer.

公开(公告)号：US20200049488A1

公开(公告)日：2020-02-13

申请号：US16165451

申请日：2018-10-19

Applicant: APPLEJACK 199 L.P.

Inventor： Wojciech Jan WALECKI

IPC: G01B11/06

Abstract: Operations related to error reduction in measurement of samples of materials may include operations in which a first distance measurement may be obtained between a first probe and a first surface of a sample at a first time mark. Additionally, the operations may include obtaining a second distance measurement between a second probe and a second surface of the sample at a second time mark. Operations may further include obtaining a third distance measurement between the first probe and the first surface of a sample at a third time mark, and determining a fourth distance measurement between the first probe and the first surface of the sample at the second time mark. In addition, the operations may include determining a thickness of the sample, including an error term due to vibration of the sample. The error term may be discounted from the thickness of the sample.

公开(公告)号：US10551163B2

公开(公告)日：2020-02-04

申请号：US16277582

申请日：2019-02-15

Applicant: APPLEJACK 199 L.P.

Inventor： Wojciech J Walecki

IPC: G01B9/02 ,  G01B11/30 ,  G01B11/06

Abstract: The present subject matter at-least provides an apparatus for characterization of a slab of a material. The apparatus comprises a plurality of frequency-domain optical-coherence tomography (FD-OCT) probes configured for irradiating the slab of material at at-least one location, and detecting radiation reflected from the slab of material or transmitted there-through. Further, a centralized actuation-mechanism is connected to the plurality of OCT probes for simultaneously actuating one or more elements in each of said OCT probes to at-least cause a synchronized detection of the radiation from the slab of material. A spectral-analysis module is provided for analyzing at least an interference pattern with respect to each of said OCT probes to thereby determine at least one of thickness and topography of the slab of the material.

公开(公告)号：US10535868B2

公开(公告)日：2020-01-14

申请号：US15333027

申请日：2016-10-24

Applicant: APPLEJACK 199 L.P.

Inventor： Wenming Li ,  Byunghoon Yoon ,  Ann Koo

IPC: C23C14/56 ,  C23C16/54 ,  C23C14/54 ,  C23C16/52 ,  C23C16/455 ,  H01M4/1395 ,  H01M4/134 ,  H01M10/04 ,  H01M10/052 ,  H01M10/0562 ,  H01M10/058 ,  H01M10/0585 ,  H01M4/04 ,  H01M10/0525 ,  H01M4/02

Abstract: A system and method of forming a thin film battery includes a substrate, a first current collector formed on the substrate, a cathode layer formed on a portion of the first current collector, a solid layer of electrolyte material formed on the cathode layer, a silicon-metal thin film anode layer formed on the solid layer of electrolyte material and a second current collector electrically coupled to the silicon-metal thin film anode layer. A method and a system for forming the thin film battery are also disclosed.

公开(公告)号：US10480925B2

公开(公告)日：2019-11-19

申请号：US16192626

申请日：2018-11-15

Applicant: Applejack 199 L.P.

Inventor： Wojciech Jan Walecki

IPC: G01B11/06 ,  G01B9/02 ,  G01B11/24

Abstract: A system for inspecting a slab of material may include an optical fiber, a broadband light source configured to emit light having wavelengths of 780-1800 nanometers over the optical fiber, a beam-forming assembly configured to receive the light over the optical fiber and direct the light toward a slab of material, the beam-forming assembly may be configured to maintain the position of one or more elements within the beam-forming assembly despite changes in environmental temperature; a computer-controlled etalon filter configured to receive the light over the optical fiber, filter the light, and direct the light over the optical fiber; and a computer-controlled spectrometer configured to receive the light over the optical fiber after the light has been filtered by the etalon filter and after the light has been reflected from or transmitted through the slab of material and spectrally analyze the light.