Abstract:
A system for measurement is provided. The system comprises a core optical module and a scanning interface module. The core optical module is configured to generate a light for generating signals for analyzing an object through the scanning interface module and detect a light including the signals from the object through the scanning interface module. The scanning interface module is changeable for each application and configured to connect with the core optical module by a light transferring unit to scan the object with the transferred light from the core optical module and to receive the light from the object to transfer to the core optical module.
Abstract:
There is provided a system (1) including a monitoring unit (50) that analyzes, using a sensor (51), components of a first gas which may include first components and a pre-separation unit (30) disposed upstream of the monitoring unit. The pre-separation unit includes: a first supply line (31) that supplies the first gas (35) to the monitoring unit; a second supply line (32) that supplies a second gas (36), which includes components obtained by removing the first components from the first gas using a first separator (40), to the monitoring unit; and an automatic valve station (38) that periodically switches between the first supply line and the second supply line to alternately supply the first gas and the second gas to the monitoring unit.
Abstract:
There is provided a system including a monitoring unit that analyzes, using a sensor, components of a first gas which may include first components and a pre-separation unit disposed upstream of the monitoring unit. The pre-separation unit includes: a first supply line that supplies the first gas to the monitoring unit; a second supply line that supplies a second gas, which includes components obtained by removing the first components from the first gas using a first separator, to the monitoring unit; and an automatic valve station that periodically switches between the first supply line and the second supply line to alternately supply the first gas and the second gas to the monitoring unit.
Abstract:
Methods and circuits for detecting an ion current in a mass spectrometer are described. A circuit and a method may involve converting, over a length of integration time, the ion current to a voltage ramp by an integrating circuit having a gain setting. The circuit and the method may also involve determining a slope of the voltage ramp. The circuit and the method may also involve determining a magnitude of the ion current based on the slope of the voltage ramp and the gain setting. The circuit and the method may further involves determining an out-of-range state based on the voltage ramp and adjusting the gain setting of the integrating circuit, or the length of integration time or both, in response to the determining of the out-of-range state.
Abstract:
A system for generating first data including content data includes an interface for outputting the content data, a conversion unit to convert an intensity change indicative of a detected chemical substance contained in data from a sensor into the content data. The sensor includes a mass spectrometric type sensor capable of controlling sensitivity, resolution or selectivity, and a hardware unit that is configured to carry out an analysis of the data with initial setting conditions designed for scanning in a first range using a test sample prepared in advance, change the setting conditions for the sensor for use with the conversion unit, based on the analysis carried out automatically and periodically, the setting conditions including at least one of a voltage for ionizing and a voltage for scanning a spectrum region for detecting a chemical substance requested by an application.
Abstract:
There is provided an analyzer including: an ionizer unit that ionizes molecules to be analyzed; a filter unit that selectively passes ions generated by the ionizer unit; and a detection unit that detects ions that have passed the filter unit. The detection unit includes a plurality of detection elements disposed in a matrix, and the analyzer further includes a first reconfiguration unit that switches between detection patterns including detection elements to be enabled for detection out of the plurality of detection elements. The ionizer unit includes a plurality of ion sources, and the analyzer further includes a driving control unit that switches the connections of the plurality of ion sources based on changes in characteristics of the ion sources.
Abstract:
An exchange membrane unit includes a first separation membrane, a first space that is connected to a second space via the first separation membrane, a first path that supplies a first fluid (carrier gas) to the first space and supplies chemical substances, which have passed through the first separation membrane from the second space into the first space and diffused, to an ion detector using the first fluid discharged from the first space, and a first ionizing unit provided in the first space. It is possible to provide a preprocessing system that produces little pollution and enables an ion detector to operate with high sensitivity. The present invention can be applied to FAIMS.
Abstract:
A system for measurement is provided. The system comprises a core optical module and a scanning interface module. The core optical module is configured to generate a light for generating signals for analyzing an object through the scanning interface module and detect a light including the signals from the object through the scanning interface module. The scanning interface module is changeable for each application and configured to connect with the core optical module by a light transferring unit to scan the object with the transferred light from the core optical module and to receive the light from the object to transfer to the core optical module.
Abstract:
There is provided an apparatus including a chip containing metal bodies capable of exciting localized surface plasmon resonance at a first surface, and an analyzer unit that performs a scan of the first surface of the chip, in a state where the first surface is in contact with a sample, with a laser in at least a one-dimensional direction and records scattered light, which has been enhanced at the first surface, in association with the scan. The chip includes a substrate, a first layer where concave and convex structures are repeatedly provided on the first surface of the substrate; and a second layer that contains the metal bodies and is provided via the first layer.
Abstract:
A gas analyzer apparatus includes: a sample chamber that is provided with a dielectric wall structure and into which a sample gas to be measured flows; a plasma generation mechanism for generating plasma inside the sample chamber, which has been depressurized, using an electric field and/or a magnetic field through the dielectric wall structure; a gas input apparatus configured to cause only the sample gas to flow from a process into the sample chamber; a first detector configured to detect components in the plasma by filtered ionized gas from the generated plasma; and a second detector configured to analyze light emission of ions in the plasma inside the sample chamber and output a second detection result that is to be synchronized with the first detection result of the first detector.