公开(公告)号：US08049897B2

公开(公告)日：2011-11-01

申请号：US12047844

申请日：2008-03-13

Applicant: Ryoichi Hirano ,  Riki Ogawa

Inventor： Ryoichi Hirano ,  Riki Ogawa

IPC: G01N21/55

CPC classification number: G01N21/95607 ,  G01N2021/95676 ,  G01N2201/0631

Abstract: A reticle defect inspection apparatus that suppresses deterioration of optical components resulting from luminescent spots generated by an integrator and can sustain a defect inspection with high precision for a long time is provided. The reticle defect inspection apparatus is a reticle defect inspection apparatus for inspecting for defects on a reticle using a pattern image obtained by irradiating the reticle on which a pattern is formed with light. And the apparatus includes an illuminating optical system for irradiating the reticle with an inspection light and a detecting optical system for detecting a pattern image of the reticle irradiated with the inspection light, wherein the illuminating optical system comprises an integrator for equalizing illumination distribution of the inspection light and a moving mechanism for enabling the integrator to slightly move in a direction perpendicular to an optical axis of the integrator.

Abstract translation: 提供了一种掩模版缺陷检查装置，其抑制由积分器产生的发光点导致的光学部件的劣化，并且能够长期高精度地进行缺陷检查。 掩模版缺陷检查装置是使用通过用光照射其上形成图案的掩模版获得的图案图像来检查掩模版上的缺陷的掩模版缺陷检查装置。 该装置包括用于用检查光照射标线的照明光学系统和用于检测用检查光照射的掩模版的图案图像的检测光学系统，其中照明光学系统包括用于均衡检查的照明分布的积分器 光和移动机构，用于使积分器能够在垂直于积分器的光轴的方向上稍微移动。

公开(公告)号：US4725148A

公开(公告)日：1988-02-16

申请号：US739319

申请日：1985-05-30

Applicant: Isao Endo ,  Teruyuki Nagamune ,  Ichiro Inoue ,  Kozo Inoue ,  Tadashi Nohira ,  Ikuzo Kagami ,  Tatsuya Iwakura

Inventor： Isao Endo ,  Teruyuki Nagamune ,  Ichiro Inoue ,  Kozo Inoue ,  Tadashi Nohira ,  Ikuzo Kagami ,  Tatsuya Iwakura

IPC: G01N21/59 ,  G01N21/53 ,  G01N21/85 ,  G01N21/84

CPC classification number: G01N21/8507 ,  G01N21/534 ,  G01N2201/0621 ,  G01N2201/0631 ,  G01N2201/064

Abstract: In a turbidimeter for measuring a turbidity of a test solution to be measured i.e. culture solution in a fermentation apparatus, a semiconductor laser diode and a semiconductor photodiode are integrally arranged in a detection portion of the turbidimeter in such a manner that a laser beam emitted from the semiconductor laser diode is made incident upon the semiconductor photodiode through the test solution. Moreover, a protection circuit for the semiconductor laser diode and the semiconductor photodiode is also arranged in the turbidimeter to cut off a current flowed therethrough when an environmental temperature becomes above a predetermined temperature. Therefore, the turbidimeter can be made small in size and light in weight, and the turbidity can be measured accurately over wide range.

Abstract translation: 在浊度计中，用于测量待测试的测试溶液的浊度，即发酵设备中的培养溶液，半导体激光二极管和半导体光电二极管一体地布置在浊度计的检测部分中，使得从 半导体激光二极管通过测试溶液入射到半导体光电二极管上。 此外，当环境温度高于预定温度时，用于半导体激光二极管和半导体光电二极管的保护电路也布置在浊度计中以截断流过其中的电流。 因此，可以使浊度计尺寸小，重量轻，并且可以在宽范围内精确地测量浊度。

公开(公告)号：US11921051B2

公开(公告)日：2024-03-05

申请号：US17670411

申请日：2022-02-11

Applicant: Gemological Institute of America, Inc. (GIA)

Inventor： Hiroshi Takahashi

IPC: G06T7/90 ,  G01N21/25 ,  G01N21/87 ,  G01N33/38 ,  G01N21/88

CPC classification number: G01N21/87 ,  G01N21/255 ,  G01N33/381 ,  G06T7/90 ,  G01N21/88 ,  G01N2201/061 ,  G01N2201/0631 ,  G01N2201/0634 ,  G01N2201/0638 ,  G01N2201/065

Abstract: Provided herein is an apparatus for assessing a color characteristic of a gemstone. The apparatus comprises an optically opaque platform for supporting a sample gemstone to be assessed, a daylight-approximating light source to provide uniform illumination to the gemstone, an image capturing component, and a telecentric lens positioned to provide an image of the illuminated gemstone to the image capturing component. Also provided are methods of color analysis based on images collected using such an apparatus.

公开(公告)号：US20240068947A1

公开(公告)日：2024-02-29

申请号：US18269557

申请日：2021-12-22

Applicant: INDIAN INSTITUTE OF SCIENCE

Inventor： Siva UMAPATHY ,  Sanchita SIL ,  Dipak KUMBHAR ,  Srividya KUMAR

IPC: G01N21/65

CPC classification number: G01N21/65 ,  G01N2201/06113 ,  G01N2201/0631

Abstract: The invention provides a method for homogenized coherent excitation of a sample for determining molecular structure. The method includes selecting a monochromatic coherent light, homogenizing the monochromatic coherent light; irradiating the sample with the homogenized monochromatic light; collecting the Raman scattered light to obtain a profile and analyzing the profile to obtain chemical specific signature of the sample. The invention also provides a method for obtaining two dimensional imaging of a sample using irradiation of large sample area by homogenized monochromatic light without compromise in spatial resolution. A system for homogenized coherent excitation of a sample for determining molecular structure is also provided.

公开(公告)号：US20240060900A1

公开(公告)日：2024-02-22

申请号：US18269558

申请日：2021-12-22

Applicant: INDIAN INSTITUTE OF SCIENCE

Inventor： Siva UMAPATHY ,  Sanchita SIL ,  Dipak KUMBHAR ,  R Vishnu KUMAR

IPC: G01N21/65 ,  G01J3/44

CPC classification number: G01N21/65 ,  G01J3/4412 ,  G01N2201/06113 ,  G01N2201/0631

Abstract: The method includes homogenizing a monochromatic coherent light source, irradiating the sample at plurality of points along all planes with the homogenized monochromatic light, collecting the molecular scattered light from all angles and planes to obtain a plurality of profile, resolving the plurality of profiles to obtain a molecular intensity maps, and reconstituting the intensity maps to obtain a three dimensional image of the sample. The system described is capable of obtaining molecular specific 3D morphology and profile of samples. The system described is capable of differentiating different chemicals or sample distribution throughout the 3D volume.

公开(公告)号：US20230160810A1

公开(公告)日：2023-05-25

申请号：US18158312

申请日：2023-01-23

Applicant: SCHOTT Schweiz AG

Inventor： Daniel Willmes ,  Igor Sosman

IPC: G01N21/21 ,  G01N21/01 ,  G01N21/25 ,  G01N21/958 ,  A61J1/05 ,  A61J1/14 ,  G01N21/90 ,  B65D1/02 ,  B65D71/06

CPC classification number: G01N21/21 ,  G01N21/01 ,  G01N21/25 ,  G01N21/958 ,  A61J1/05 ,  A61J1/1468 ,  G01N21/90 ,  B65D1/0207 ,  B65D71/06 ,  G01N2201/02 ,  G01N2201/0631 ,  G01N21/896

Abstract: Apparatuses and methods for inspecting a pharmaceutical cylindrical containers are provided. The apparatus includes a support device, a light emitting unit, and a light receiving unit. The support device supports the pharmaceutical cylindrical container and rotates the cylindrical pharmaceutical container around a longitudinal axis. The light emitting unit has a light source that illuminates the pharmaceutical cylindrical container with a detection beam while the support device rotates the pharmaceutical cylindrical container. The light receiving unit has a camera that acquires polarization information of the detection beam.

公开(公告)号：US20180195958A1

公开(公告)日：2018-07-12

申请号：US15879696

申请日：2018-01-25

Applicant: ChemoMetec A/S

Inventor： Søren Kjaerulff ,  Mette Elena Skinderso ,  Helle Frobose Sorensen ,  Frans Ejner Ravn ,  Martin Glensbjerg

IPC: G01N21/64 ,  G02B27/09

CPC classification number: G01N21/64 ,  G01N21/6458 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2021/6441 ,  G01N2021/6478 ,  G01N2201/0631 ,  G02B27/0905 ,  G02B27/0961

Abstract: According to an embodiment of the invention, an apparatus to detect fluorescence from a sample is disclosed. The apparatus comprises a sample plane onto which the sample is arranged, an excitation light unit including at least a light source to illuminate the sample, and a detection unit comprising at least a detector having at least 100,000 active detection elements to detect a fluorescence signal from the sample.

公开(公告)号：US20170343482A1

公开(公告)日：2017-11-30

申请号：US15606113

申请日：2017-05-26

Applicant: EyeC GmbH

Inventor： Ansgar KAUPP ,  Soeren SPRINGMANN ,  Dirk LUETJENS

IPC: G01N21/88 ,  G01N21/95

CPC classification number: G01N21/8806 ,  G01N21/8901 ,  G01N21/95 ,  G01N2021/845 ,  G01N2021/8627 ,  G01N2021/8663 ,  G01N2021/8812 ,  G01N2021/8816 ,  G01N2021/8825 ,  G01N2021/8962 ,  G01N2201/06153 ,  G01N2201/0631 ,  G01N2201/0634

Abstract: Reflective or embossed regions are supposed to be illuminated as uniformly as possible over the greatest possible angle range for optical inspection using in one aspect an apparatus for inspection having a passive lighting body spotlighted by a spotlight light source, which body illuminates a test region, as well as at least one optical sensor directed at the test region. The lighting body is configured to be partially transmissible, and the optical sensor is disposed, with reference to the test region, optically beyond the lighting body, detecting the test region through the lighting body, and/or the spotlight light source is directed at the lighting body and the lighting body extends continuously over at least 120° in a section plane that stands perpendicular to the surface of the flat items to be tested or inspected.

公开(公告)号：US20170248574A1

公开(公告)日：2017-08-31

申请号：US15594978

申请日：2017-05-15

Applicant: CELLOMICS, INC.

Inventor： Richik Niloy Ghosh ,  Dirk John VandenBerg, III ,  Keith Rao Heffley ,  Monica Jo Tomaszewski ,  Jeffrey Robert Haskins

IPC: G01N33/487 ,  G01N21/31 ,  G02B5/02 ,  G02B21/16 ,  G02B21/36 ,  G01N21/64 ,  G01N35/00

CPC classification number: G01N33/487 ,  F21Y2105/10 ,  F21Y2105/14 ,  G01N21/253 ,  G01N21/255 ,  G01N21/31 ,  G01N21/6428 ,  G01N21/6452 ,  G01N21/6458 ,  G01N21/6486 ,  G01N35/00029 ,  G01N2021/6439 ,  G01N2021/6491 ,  G01N2035/00158 ,  G01N2201/0627 ,  G01N2201/0631 ,  G01N2201/064 ,  G02B5/0278 ,  G02B5/0294 ,  G02B21/16 ,  G02B21/367

Abstract: A system and method that images biological samples and uses chromophores to analyze the imaged samples. The chromophore analysis can be done by itself or in conjunction with fluorophore analysis in High Content Imaging systems. To perform chromophore analysis the biological samples can be labeled with different chromophores and imaged using transmitted light that is at least partially absorbed by the chromophores. To also perform fluorophore analysis the samples can also be labeled with fluorophores that are excited by excitation light. The chromophore analysis and fluorophore analysis can be performed separately or concurrently using a High Content Imaging system. The system provides the expanded capability by illuminating the chromophore-labeled samples with transmitted light of different wavelengths and automatically detecting the images which represent the differential absorption of the colored lights by the sample.

公开(公告)号：US20160340715A1

公开(公告)日：2016-11-24

申请号：US15162559

申请日：2016-05-23

Applicant: Stokes Bio Limited

Inventor： Mauro Aguanno ,  Damian Curtin ,  Damien King

IPC: C12Q1/68 ,  G01N21/25 ,  G01N21/55

CPC classification number: C12Q1/686 ,  G01N21/253 ,  G01N21/55 ,  G01N21/6452 ,  G01N21/6486 ,  G01N2201/0631 ,  G01N2201/0638

Abstract: Systems and methods are used to detect spectral and spatial information in a continuous flow PCR system. An incident beam of electromagnetic radiation is emitted using a laser. The incident beam is received from the laser and the incident beam is transformed into an incident line of electromagnetic radiation using a line generator. The incident line is received from the line generator using a tube array that includes one or more transparent tubes in fluid communication with one or more micro-channels. Reflected electromagnetic radiation is received from the tube array and the reflected electromagnetic radiation is focused using an imaging lens. The focused reflected electromagnetic radiation is received from the imaging lens and a spectral intensity is detected from the focused reflected electromagnetic radiation using a spectrograph. The focused reflected electromagnetic radiation is received from the imaging lens and a location of the spectral intensity is detected using an imager.

Abstract translation: 系统和方法用于检测连续流PCR系统中的光谱和空间信息。 使用激光发射入射的电磁辐射光束。 从激光器接收入射光束，并且使用线发生器将入射光束变换成电磁辐射的入射线。 使用管阵列从线发生器接收入射线，该管阵列包括与一个或多个微通道流体连通的一个或多个透明管。 从管阵列接收反射的电磁辐射，并且使用成像透镜聚焦反射的电磁辐射。 从成像透镜接收聚焦的反射电磁辐射，并且使用光谱仪从聚焦的反射电磁辐射检测光谱强度。 从成像透镜接收聚焦的反射电磁辐射，并使用成像器检测光谱强度的位置。