Abstract:
A spectrophotometer including a light source (1) operative to emit a beam of light (15), an optical system for directing the light beam (15) to a sample (8) to be analyzed, and a detector (9) which detects the intensity of the light beam after the beam interacts with the sample (8). The light source (1) is operative to emit bursts of light separated by an interval during which no light is emitted. By way of example, a xenon tube may be used for that purpose. The spectrophotometer measures the intensity of the light beam generated by each burst of light after that beam interacts with the sample. Each such light beam may be divided into first and second parts (5 and 4) prior to interaction with the sample (8), and the optical system is arranged to direct the first part (5) to the sample (8) and to direct the second part (4) to a second detector (7) for conducting a reference measurement. A dark signal measurement may be conducted immediately before or after each burst of light.
Abstract:
A method and apparatus to analyze the aerial image of an optical system using a subwavelength slit. A slit configuration yields a higher signal-to-noise ratio than that achievable with a round aperture. The slit also allows the polarization of the aerial image to be analyzed. In an alternative embodiment a tunneling slit is used. The tunneling slit comprises an optically transparent ridge-like structure mounted to a substrate, the combined structure covered by a thin, planar metal film.
Abstract:
Light source 1 emits light composed of various wavelength components from an emission end 1a. An optical fiber 2 receives the light from one end portion 2a and emits the light from the other end portion 2b. A Czerny-Turner dispersion spectroscope is formed by this end portion 2b, concave mirrors 3 and 5, a diffraction grating 4, and an emission slit 6. A mask 9 restricts the aperture diameter, so as to remove light which has spread wider than the aperture diameter of the mask 9 from the light which has passed through the emission slit 6.
Abstract:
A high-precision spectrum separation apparatus enables to generate an output beam having a specific wavelength from a multi-wavelength input beam. The input beam is focused on a diffraction grating through a focusing lens to generate a number of diffracted component beams, of which a diffracted component beam having a specific wavelength is directed to an output slit, resulting in an output beam having well-defined spectral properties. When the output beam is required to have a band of wavelengths, the fixed focal distance of the focusing lens is shorter than is required to generate well-defined output beam, resulting that the diffracted component beam cannot be focused precisely on the output slit. In such a case, a flat glass plate is introduced between the focusing lens and the output slit to adjust the focal-point of the focusing lens so that the diffracted component beams are focused precisely on the output slit. An output beam having well-defined spectral properties is thus produced from the apparatus.
Abstract:
A method and apparatus to analyze the aerial image of an optical system using a subwavelength slit. A slit configuration yields a higher signal-to-noise ratio than that achievable with a round aperture. The slit also allows the polarization of the aerial image to be analyzed. In an alternative embodiment a tunneling slit is used. The tunneling slit comprises an optically transparent ridge-like structure mounted to a substrate, the combined structure covered by a thin, planar metal film.
Abstract:
A spectrometer slit switching mechanism includes a slit plate having a plurality of entrance slits and exit slits formed at prescribed positions, parallel support rods for supporting the slit plate so as to be movable along the support rods, a screw portion formed on at least one support rod for transmitting forced to the slit plate, and a driving motor for transmitting rotational energy to the support rod provided with the screw portion, wherein the entrance slits are arranged on a line that runs parallel to the direction of movement of the slit plate and the exit slits are arranged on a line that is both parallel to and spaced a prescribed distance from the line on which the entrance slits are arranged. In accordance with this structure, the driving motor is operated in the clockwise and counterclockwise directions to raise and lower the slit plate in order to align a desired entrance slit and exit slit with the light path of the spectrometer. Also, after the desired slits have been positioned and the driving motor is stopped, the slit plate is prevented from moving downwards by the engagement of the slit plate with the screw portion of the support rod, and this eliminates the need for an excitation current to be supplied to the driving motor.
Abstract:
An imaging spectrometer that includes a mask (214) that has an array of n rows (302) and n columns (304) of transmissive elements (306) for transmitting the light from a plurality of locations of an image and of opaque elements (308) for blocking light from a plurality of locations of the image. The transmissive and opaque elements are arranged in a Hadamard pattern having rows (and columns) that are different cyclic iterations of an m-sequence. A grating (110) disperses the transmitted light from the transmissive elements (306) in a linear spatial relationship in a predetermined relationship to the wavelength of the transmitted light. A detector array (406) has a plurality of detector elements (408) arranged in a row to receive the dispersed transmitted light from the grating (110). Each detector element (408) provides an intensity signal indicative of the intensity of the light impinging thereon. A computer (410) generates a spectrum matrix having elements indicative of the frequency spectrum of the plurality of locations of the image. The spectrum matrix is produced by matrix multiplication of an inverse mask pattern matrix and a data matrix. Each element of the mask pattern matrix is either a 0 for opaque elements (308) or a 1 for transmissive elements (306). The inverse mask pattern matrix is generated by replacing each 0 of the pattern by -1, taking the transpose, and multiplying by 2/(n+1). Each row of the data matrix represents data taken from the same location of the image and through a corresponding row of the mask (214).
Abstract:
A photometer having a plurality of input fibers to its optical entrance, at least one of which is for transmission of calibration light and at least one of which is for transmission of sample light. The exit ends of these fibers are aligned into a linear array, thereby producing an effective entrance slit for the optical entrance of the photometer. The fiber(s) for calibration light are positioned at the center of the linear array to avoid miscalibration due to photometer astigmatism.
Abstract:
An adjustable Echelle spectrometer arrangement which can be used in single- and multi-element analysis by the emission or absorption of optical radiation. To compensate all the manufacturing and setup errors, the only arrangements present are those to change the height of the entry slit arrangement above the base plate and to rotate the dispersion prism about a first axis, approximately parallel to its roof edge, and about a second axis, that is vertical thereto. This compensates for the effect of errors associated with component and setup parameters which results from greater tolerances, without impairing mechanical and thermal stability and imaging quality.
Abstract:
The invention relates to an optical sample illumination device for a spectroscopic ellipsometer of the rotating analyzer type. The image of the exit slit (F') of a monochromator is conjugated with a point (F'.sub.2) of a surface of a sample (E) by means of two spherical mirrors (M.sub.7 and M.sub.8). An astigmatism correction slit (F'.sub.15) is arranged in the proximity of the conjugate (F'.sub.1) of the exit slit(F') of the monochromator with respect to the spherical mirror (M.sub.7) and is arranged perpendicularly to this exit slit and to the optical path so that said correction slit is conjugated with the said point (F'.sub.2) through the spherical mirror (M.sub.8). A luminous spot without astigmatic errors is thus obtained.