公开(公告)号：US20130114073A1

公开(公告)日：2013-05-09

申请号：US13701399

申请日：2011-07-01

Applicant: Akihiro Namba ,  Fujio Onishi ,  Yasushi Terui

Inventor： Akihiro Namba ,  Fujio Onishi ,  Yasushi Terui

IPC: G01J1/44

CPC classification number: G01J1/44 ,  G01J1/10 ,  G01J1/42

Abstract: To enable measurement over a wide dynamic range from weak light quantity to strong light quantity in a light quantity detection device for detecting the light quantity, a detection signal from a photon counting light detector is A/D converted. When the A/D converted detection signal has a preset threshold value or more, the detection signal is transmitted as it is to a number-of-photons calculation circuit in a subsequent stage, and when the detection signal has the threshold value or less, threshold value processing for transmitting a preset reference value to the subsequent stage is performed. In the number-of-photons calculation circuit, the number of photons or the light quantity incident on the photon counting light detector is acquired from the dimension of an acquired detection signal waveform until the light quantity measurement ends.

Abstract translation: 为了在用于检测光量的光量检测装置中的弱光量到强光量的宽动态范围内进行测量，来自光子计数光检测器的检测信号被A / D转换。 当A / D转换的检测信号具有预设的阈值或更大时，检测信号被原样发送到下一级中的光子数计算电路，并且当检测信号具有阈值或更小时， 执行用于将预设参考值发送到后级的阈值处理。 在光子数计算电路中，从所获取的检测信号波形的尺寸获取入射到光子计数光检测器上的光子数或光量直到光量测量结束。

公开(公告)号：US08373854B2

公开(公告)日：2013-02-12

申请号：US12813389

申请日：2010-06-10

Applicant: J. Michael Phillips ,  Kevin S. Bodner ,  Aldrich N. K. Lau ,  Steven J. Boege ,  Mark F. Oldham ,  Donald R. Sandell ,  David H. Tracy

Inventor： J. Michael Phillips ,  Kevin S. Bodner ,  Aldrich N. K. Lau ,  Steven J. Boege ,  Mark F. Oldham ,  Donald R. Sandell ,  David H. Tracy

IPC: G01N1/10

CPC classification number: G01N21/278 ,  B82Y15/00 ,  G01J1/10 ,  G01N21/01 ,  G01N21/4785 ,  G01N21/6452 ,  G01N21/76 ,  G01N2201/06113 ,  G01N2201/0612 ,  G01N2201/062 ,  G01N2201/0691 ,  G01N2201/0697 ,  Y10S977/943 ,  Y10S977/949

Abstract: The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

Abstract translation: 本教导提供了用于检测和/或分析光的系统及其组件。 这些系统尤其可以包括在样品分析之前，期间和/或之后利用发光体（例如纳米晶体）用于校准，验证和/或监测光检测系统的光学参考标准。

公开(公告)号：US20120197599A1

公开(公告)日：2012-08-02

申请号：US13015996

申请日：2011-01-28

Applicant: Harry A. Seibel, II ,  Brian Collins ,  David Emerson

Inventor： Harry A. Seibel, II ,  Brian Collins ,  David Emerson

IPC: G06F15/00 ,  G01J3/28

CPC classification number: G01J3/0251 ,  G01J1/10 ,  G01J3/0254 ,  G01J3/027 ,  G01J3/465 ,  G01J3/505

Abstract: A method of determining lighting contributions of elements of a lighting component includes obtaining optical data representative of light output of the lighting component. Relative intensity data may be calculated from the optical data, and may indicate intensity differences in the light output of the lighting component as compared to that of a reference component. An optical property of an element of the lighting component is determined based on a comparison of the optical data with that of the reference component, where the reference component includes at least one reference element. Related systems and apparatus are also discussed.

Abstract translation: 确定照明部件的元件的照明贡献的方法包括获得表示照明部件的光输出的光学数据。 可以从光学数据计算相对强度数据，并且可以指示与参考部件相比较的照明部件的光输出中的强度差。 基于光学数据与参考部件的光学数据的比较来确定照明部件的元件的光学特性，其中参考部件包括至少一个参考元件。 还讨论了相关系统和装置。

公开(公告)号：US07898663B2

公开(公告)日：2011-03-01

申请号：US12285191

申请日：2008-09-30

Applicant: Bily Wang ,  Kuei-Pao Chen ,  Chih-Ming Wang

Inventor： Bily Wang ,  Kuei-Pao Chen ,  Chih-Ming Wang

IPC: G01J3/40 ,  G01B9/00

CPC classification number: G01J1/10 ,  G01J1/0271 ,  G01J1/04 ,  G01J1/0411 ,  G01J1/0422 ,  G01J1/08 ,  G01J2001/083 ,  G01M11/0264 ,  G02B19/0028 ,  G02B19/0066 ,  G02B27/0977 ,  G02B27/0994

Abstract: A uniform light generating system for testing an image-sensing device includes a light-generating unit, a light-transmitting unit, a light-diffusing unit, and a lens unit. The light-generating unit has a substrate and a plurality of light-emitting elements electrically disposed on the substrate. The light-transmitting unit has one side communicated with the light-generating unit for receiving and uniformizing light beams projected from the light-emitting elements. The light-diffusing unit has one side disposed on the other side of the light-transmitting unit for receiving and diffusing the light beams that have passed through the light-transmitting unit. The lens unit is disposed on the other side of the light-diffusing unit for transmitting the light beams that have passed through the light-diffusing unit to the image-sensing device.

Abstract translation: 用于测试图像感测装置的均匀光产生系统包括发光单元，光发射单元，光漫射单元和透镜单元。 光产生单元具有基板和电气设置在基板上的多个发光元件。 光发射单元具有与发光单元连通的用于接收并均匀化从发光元件投射的光束的一侧。 光漫射单元的一侧设置在透光单元的另一侧，用于接收并扩散已经通过光发射单元的光束。 透镜单元设置在光漫射单元的另一侧，用于将已经通过光漫射单元的光束传输到图像感测装置。

公开(公告)号：US20100020009A1

公开(公告)日：2010-01-28

申请号：US12522512

申请日：2008-10-16

Applicant: Takayuki Nakanishi

Inventor： Takayuki Nakanishi

IPC: G09G3/36

CPC classification number: G09G3/3406 ,  G01J1/0219 ,  G01J1/10 ,  G01J1/4204 ,  G01J1/46 ,  G02F1/13338 ,  G02F2001/13312 ,  G02F2001/13606 ,  G06F3/0412 ,  G06F3/042 ,  G09G2310/0237 ,  G09G2320/0633 ,  G09G2360/144

Abstract: A display device is provided including a photosensor PS that detects the ambient light amount of a display area, a comparator that compares the output of the photosensor PS with a predetermined reference value, and a backlight controller that controls the amount of light supplied to the display area depending on a comparison result by the comparator, a switch SW for controlling application of a precharge potential is connected to a metal that exists near the light-receiving part of the photosensor PS with the intermediary of an insulating film. The embodiment apparently decreases the parasitic capacitance of the detection element to thereby suppress the influence of the parasitic capacitance of the detection element itself at the time of light amount detection.

Abstract translation: 提供一种显示装置，包括检测显示区域的环境光量的光电传感器PS，将光电传感器PS的输出与预定参考值进行比较的比较器，以及控制提供给显示器的光量的背光控制器 区域取决于比较器的比较结果，用于控制预充电电位的施加的开关SW连接到存在于具有绝缘膜的光传感器PS的光接收部分附近的金属。 该实施方式明显地降低了检测元件的寄生电容，从而在光量检测时抑制了检测元件本身的寄生电容的影响。

公开(公告)号：US20090190124A1

公开(公告)日：2009-07-30

申请号：US12285191

申请日：2008-09-30

Applicant: Bily Wang ,  Kuei-Pao Chen ,  Chih-Ming Wang

Inventor： Bily Wang ,  Kuei-Pao Chen ,  Chih-Ming Wang

IPC: G01J1/10 ,  G02B27/40

CPC classification number: G01J1/10 ,  G01J1/0271 ,  G01J1/04 ,  G01J1/0411 ,  G01J1/0422 ,  G01J1/08 ,  G01J2001/083 ,  G01M11/0264 ,  G02B19/0028 ,  G02B19/0066 ,  G02B27/0977 ,  G02B27/0994

Abstract: A uniform light generating system for testing an image-sensing device includes a light-generating unit, a light-transmitting unit, a light-diffusing unit, and a lens unit. The light-generating unit has a substrate and a plurality of light-emitting elements electrically disposed on the substrate. The light-transmitting unit has one side communicated with the light-generating unit for receiving and uniformizing light beams projected from the light-emitting elements. The light-diffusing unit has one side disposed on the other side of the light-transmitting unit for receiving and diffusing the light beams that have passed through the light-transmitting unit. The lens unit is disposed on the other side of the light-diffusing unit for transmitting the light beams that have passed through the light-diffusing unit to the image-sensing device.

Abstract translation: 用于测试图像感测装置的均匀光产生系统包括发光单元，光发射单元，光漫射单元和透镜单元。 光产生单元具有基板和电气设置在基板上的多个发光元件。 光发射单元具有与发光单元连通的用于接收并均匀化从发光元件投射的光束的一侧。 光漫射单元的一侧设置在透光单元的另一侧，用于接收并扩散已经通过光发射单元的光束。 透镜单元设置在光漫射单元的另一侧，用于将已经通过光漫射单元的光束传输到图像感测装置。

公开(公告)号：US07243034B2

公开(公告)日：2007-07-10

申请号：US11190999

申请日：2005-07-28

Applicant: Masahiro Fujita ,  Yoji Shibata

Inventor： Masahiro Fujita ,  Yoji Shibata

IPC: G01R13/02

CPC classification number: G01J1/10 ,  G01J1/02 ,  G01J1/0219 ,  H01H19/005 ,  H01H25/06

Abstract: A sensor device according to the present invention has a detection mode for detecting an object W, a first setting mode for changing the output duration of an output signal, and a second setting mode for changing a light-emission period of light emitted to the object W. These modes are switchable by a mode selector switch 12. If a rotary control knob 15 is operated in the detection mode, a CPU 30 changes a setting of a threshold value in response to the operation of the rotary control knob 15 and displays the changed setting of the threshold value on a digital indicator 20. This makes it possible to accurately change settings through relatively simple operations. The rate of change may correspond to the speed of operation of the knob.

Abstract translation: 根据本发明的传感器装置具有用于检测物体W的检测模式，用于改变输出信号的输出持续时间的第一设定模式和用于改变发射到物体的光的发光周期的第二设定模式 这些模式可由模式选择器开关12切换。 如果旋转控制旋钮15在检测模式下操作，则CPU 30响应于旋转控制旋钮15的操作而改变阈值的设置，并且将改变的阈值设置显示在数字指示器20上。 这使得可以通过相对简单的操作来准确地改变设置。 变化率可以对应于旋钮的操作速度。

公开(公告)号：US20060212240A1

公开(公告)日：2006-09-21

申请号：US11190999

申请日：2005-07-28

Applicant: Masahiro Fujita ,  Yoji Shibata

Inventor： Masahiro Fujita ,  Yoji Shibata

IPC: G01R13/02

CPC classification number: G01J1/10 ,  G01J1/02 ,  G01J1/0219 ,  H01H19/005 ,  H01H25/06

Abstract: A sensor device according to the present invention has a detection mode for detecting an object W, a first setting mode for changing the output duration of an output signal, and a second setting mode for changing a light-emission period of light emitted to the object W. These modes are switchable by a mode selector switch 12. If a rotary control knob 15 is operated in the detection mode, a CPU 30 changes a setting of a threshold value in response to the operation of the rotary control knob 15 and displays the changed setting of the threshold value on a digital indicator 20. This makes it possible to accurately change settings through relatively simple operations. The rate of change may correspond to the speed of operation of the knob.

Abstract translation: 根据本发明的传感器装置具有用于检测物体W的检测模式，用于改变输出信号的输出持续时间的第一设定模式和用于改变发射到物体的光的发光周期的第二设定模式 这些模式可由模式选择器开关12切换。 如果旋转控制旋钮15在检测模式下操作，则CPU 30响应于旋转控制旋钮15的操作而改变阈值的设置，并且将改变的阈值设置显示在数字指示器20上。 这使得可以通过相对简单的操作来准确地改变设置。 变化率可以对应于旋钮的操作速度。

公开(公告)号：US5777675A

公开(公告)日：1998-07-07

申请号：US988334

申请日：1992-12-09

Applicant: Takashi Miida ,  Kazuhiro Kawajiri ,  Jun Hasegawa ,  Isao Taniguchi

Inventor： Takashi Miida ,  Kazuhiro Kawajiri ,  Jun Hasegawa ,  Isao Taniguchi

IPC: G02B7/34 ,  G01J1/10 ,  G01J1/16 ,  G01J1/44 ,  G03B7/28 ,  G03B13/36 ,  H04N5/235 ,  H04N5/232 ,  H04N5/335

CPC classification number: G01J1/44 ,  G01J1/10 ,  G01J1/1626 ,  H04N5/2351

Abstract: An automatic light measuring device for an image pickup device includes a pair of line sensors suitable for an automatic focusing adjustment and disposed on a semiconductor chip at positions spaced apart by a predetermined distances, an integration time controller for generating an integration control signal for controlling the charge accumulation by incident light by detecting the amount of charges accumulated in the line sensors, a first exposure amount detector for calculating the intensity of incident light from the integration control signal, a second exposure amount detector inclusive of photoelectric conversion elements formed on the semiconductor chip, for detecting the amount of incident light, a pair of lenses mounted above the pair of line sensors for focusing the image of substantially the same subject within the central area of the field of view, and an optical system for applying light within the area broader than the central area of the field of view to the surface of the semiconductor chip inclusive of the photoelectric conversion elements. The photoelectric conversion elements are disposed between the pair of line sensors. The optical system may be made of an acrylic rod, light focusing fibers, retrofocus lens, or the like.

Abstract translation: 一种用于图像拾取装置的自动光测量装置包括一对适合于自动聚焦调节的线传感器，并且在间隔开预定距离的位置处设置在半导体芯片上，积分时间控制器用于产生用于控制 通过检测在线传感器中累积的电荷量的入射光的电荷积累，用于从积分控制信号计算入射光强度的第一曝光量检测器，包括形成在半导体芯片上的光电转换元件的第二曝光量检测器 ，用于检测入射光量，安装在一对线传感器上方的一对透镜，用于将基本相同的被摄体的图像聚焦在视场的中心区域内，以及用于在该区域内施加光的光学系统 比中央地区的视野到了表面 包括光电转换元件的半导体芯片。 光电转换元件设置在一对线传感器之间。 光学系统可以由丙烯酸棒，聚光纤维，后焦距透镜等制成。