Dual beam multichannel spectrophotometer with a unique logarithmic data
converter
    52.
    发明授权
    Dual beam multichannel spectrophotometer with a unique logarithmic data converter 失效
    双光束多通道分光光度计具有独特的对数数据转换器

    公开(公告)号:US4848904A

    公开(公告)日:1989-07-18

    申请号:US156285

    申请日:1988-02-16

    Abstract: The present invention relates to an improved dual beam multichannel spectrophotomer employing a simple and novel optical system in combination with photodiode arrays and a unique logrithmic data converter to convert light signals to absorbance. In particular, the optical system utilizes optical elements in a novel arrangement to direct a pair of equivalent sample and reference beams in an essentially parallel formation respectively through a sample and reference cell and to focus and direct the emergent sample and reference beams to a single flat horizontally ruled grating which disperses each of the sample and reference beams respectively onto a pair of vertically disposed photodiode arrays whereby the light signals are converted into absorbance units (AU) by an unique logarithmic data converter. The spectrophotometer is highly accurate, has very low drift, less than 2.times.10.sup.-4 AU/.degree.C., and very low noise, less than .+-.2.times.10.sup.-5 AU. The dual beam multichannel spectrophotomer is particularly suitable for use in high pressure liquid chromatography to record the absorbance spectrum of the samples as they are being eluted from the chromatographic column.

    Apparatus for evaluating the quality of rice grains
    53.
    发明授权
    Apparatus for evaluating the quality of rice grains 失效
    评估米粒质量的仪器

    公开(公告)号:US4752689A

    公开(公告)日:1988-06-21

    申请号:US24139

    申请日:1987-03-10

    Inventor: Toshihiko Satake

    Abstract: This invention relates to an apparatus for evaluating the quality of rice grains. The apparatus comprises a near infrared spectrometer having a band-pass filter and detectors for detecting the intensity of reflected light from the sample rice; a control device having a memory for storing various values and a calculator for performing various calculations; indicating device for displaying or printing the various calculated values; and a sample case for being filled with the sample rice and being disposed at the measuring portion within the near infrared spectrometer. The apparatus is capable of measuring the content percentages of pre-selected constituent or constituents, such as, of protein, either amylose or amylopectin and moisture of the rice grains, calculating a quality evaluation value of the sample rice based on the measured and calculated values and powers established for the preselected constituents, and displaying the calculated evaluation value of the sample rice.

    Abstract translation: 本发明涉及一种评价稻谷品质的装置。 该装置包括具有带通滤光器的近红外光谱仪和用于检测来自样品米的反射光的强度的检测器; 具有用于存储各种值的存储器的控制装置和用于执行各种计算的计算器; 用于显示或打印各种计算值的指示装置; 以及用于填充样品米并设置在近红外光谱仪内的测量部分的样品盒。 该装置能够测量预先选择的成分或成分,例如蛋白质,直链淀粉或支链淀粉和水稻的含量百分比,基于测量和计算值计算样品水稻的质量评估值 以及为预选成分建立的权力,并显示计算的样品水稻的评估值。

    Microspectrofluorimeter
    54.
    发明授权
    Microspectrofluorimeter 失效
    显微荧光仪

    公开(公告)号:US4744667A

    公开(公告)日:1988-05-17

    申请号:US900407

    申请日:1986-08-26

    Abstract: An accessory is provided to convert a conventional microscope to a microspectrofluorimeter. The accessory includes a filter disc having bandpass filters separated by opaque segments. The filter disc is rapidly and continuously rotated to move the filter sequentially into the optical path between a wideband light source and a microscope sample. Photon counting of radiation from the sample is synchronized to the position of the filters during rotation by means of synchronization marks on the filter disc. The same accessory may be positioned between the sample and a detector to detect emitted light of different frequencies.

    Abstract translation: 提供附件以将常规显微镜转换成微型荧光计。 附件包括具有由不透明段分隔开的带通滤光片的滤光片。 过滤盘快速连续旋转,将滤光片顺序移动到宽带光源和显微镜样品之间的光路中。 通过滤光片上的同步标记,来自样品的辐射的光子计数在旋转期间与滤光片的位置同步。 相同的附件可以位于样品和检测器之间,以检测不同频率的发射光。

    Infrared gas analyzer with automatic zero adjustment
    55.
    发明授权
    Infrared gas analyzer with automatic zero adjustment 失效
    红外气体分析仪具有自动调零功能

    公开(公告)号:US4687934A

    公开(公告)日:1987-08-18

    申请号:US818342

    申请日:1986-01-10

    Abstract: Automatic zeroing apparatus zeroes an infrared gas analyzer automatically upon the occurrence of preselected conditions to indicate zero in the absence of absorption of infrared radiation by a gas mixture being analyzed. The gas analyzer has a sample cell for containing a gas mixture to be analyzed. Infrared radiation directed through the sample cell is detected at a preselected wavelength to produce a detection signal. A signal processor outputs a signal systematically related to the difference between the detection signal and a reference signal. For zeroing the sample cell is filled with gas substantially nonabsorbent of infrared radiation at the respective characteristic wavelength. A comparator produces an error signal when the output signal differs from zero. A gain control automatically controls the signal level of the detection signal to reduce the output signal substantially to zero with the nonabsorbent gas filling the sample cell. The preselected conditions may include the passage of a predetermined time and a temperature drift beyond a predetermined limit.

    Abstract translation: 自动归零装置在发生预选条件时自动归零红外气体分析仪,以便在被正在分析的气体混合物不吸收红外辐射时指示为零。 气体分析仪具有用于容纳要分析的气体混合物的样品池。 以预选的波长检测引导通过样品池的红外辐射,以产生检测信号。 信号处理器输出与检测信号和参考信号之间的差异系统地相关的信号。 为了归零,样品池中填充有相应特征波长的基本上不吸收红外辐射的气体。 当输出信号与零不同时,比较器产生一个误差信号。 增益控制器自动控制检测信号的信号电平,使填充样品池的非吸收气体将输出信号基本上降至零。 预选条件可以包括经过预定时间和温度漂移超出预定极限。

    Apparatus and method for infrared optical electronic qualitative
analysis of a fluid independent of the temperature thereof
    56.
    发明授权
    Apparatus and method for infrared optical electronic qualitative analysis of a fluid independent of the temperature thereof 失效
    独立于其温度的流体的红外光电子定性分析的装置和方法

    公开(公告)号:US4649711A

    公开(公告)日:1987-03-17

    申请号:US771911

    申请日:1985-09-03

    CPC classification number: G01N33/2888 G01N21/3577 G01N2201/126

    Abstract: An apparatus and method is provided for infrared qualitative analysis of a fluid independent of the temperature of the fluid. A first signal is generated in response to detected infrared energy passing through the fluid, and a second datum signal is provided for comparison with the first signal, wherein the second signal indicates a non-radiating state. The energy difference between the two signals is provided to a microprocessor control system for computing the fluid quality as a function of the energy difference independent of the temperature of the fluid.

    Abstract translation: 提供了一种用于独立于流体温度的流体的红外定性分析的装置和方法。 响应于检测到的通过流体的红外能量产生第一信号,并且提供第二数据信号用于与第一信号进行比较,其中第二信号指示非辐射状态。 两个信号之间的能量差被提供给微处理器控制系统,用于根据流体的温度独立地计算作为能量差的函数的流体质量。

    Auto-focussing LIBS system
    57.
    发明授权

    公开(公告)号:US12117401B2

    公开(公告)日:2024-10-15

    申请号:US18455983

    申请日:2023-08-25

    Abstract: A LIBS analysis system comprises a focusing lens arrangement having a focal plane; a laser for propagating a laser beam through the focusing lens arrangement to be focused at the focal plane; a detector for generating an output that is proportional to an intensity of incident electromagnetic radiation that is incident on the detector; a translation mechanism configured to cause a relative movement of the sample holder and the focusing lens arrangement to vary a position of the focal plane along the optical path with respect to the sample holder; and a controller configured to automatically control the translation mechanism to cause the relative movement of the sample holder and the focusing lens arrangement to achieve an optimum position at which the focal plane and an analysis region of the upper surface intersecting the optical path are at or are close to coincidence.

    Method and Apparatus for Optimizing a Measurement Pattern on a Wafer

    公开(公告)号:US20240328960A1

    公开(公告)日:2024-10-03

    申请号:US18608169

    申请日:2024-03-18

    Inventor: Peter Ebersbach

    CPC classification number: G01N21/9501 G01N2201/126

    Abstract: A method for optimizing a measurement pattern of measurement points for a semiconductor wafer includes (i) obtaining a plurality of measured values with associated measurement points and timestamps, (ii) partitioning the semiconductor wafer into zones, wherein the zones are characterized in that measured values whose measurement positions are within the respective zone have the same characteristic, (iii) determining a variation of the measured values for each of the zones along a predetermined time period, the timestamps of which are within the predetermined time window, and (iv) defining the measurement pattern, wherein, depending on the variations, a measurement point density is defined for each of the zones, in particular a higher measurement point density is selected in the zones with higher variation along the time.

    METHOD AND DEVICE FOR DETECTING LOCAL DEFECTS ON A REFLECTIVE SURFACE

    公开(公告)号:US20240319105A1

    公开(公告)日:2024-09-26

    申请号:US18577922

    申请日:2022-09-09

    Inventor: Klaus VEIT

    Abstract: A method for detecting local defects on a reflective surface with a device having at least one pattern for reflection on the reflective surface, at least one camera and a data processing unit. The pattern has at least one substantially linear light-dark transition, the positioning and orientation of the camera are known, the camera captures the pattern reflected on the surface and generates image data of the reflected pattern which are transmitted by the camera to the data processing unit, and the data processing unit determines local defects on the surface on the basis of an evaluation of at least one property of the at least one light-dark transition in the image data of the reflected pattern. Also a device and a computer program.

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