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    Ion guide
    61.
    发明授权
    Ion guide 有权

    公开(公告)号：US10699889B2

    公开(公告)日：2020-06-30

    申请号：US16301428

    申请日：2017-05-15

    Applicant: MICROMASS UK LIMITED

    Inventor： Stephen Patrick Slater ,  John Iveson ,  Oliver John Malpas ,  Bharat Chande ,  David Gordon

    IPC: H01J49/06 ,  H01J49/02

    Abstract: Disclosed herein is an ion guide comprising a plurality of axially stacked plates, wherein at least some or all of said plates comprise: a first electrically conductive portion; and a second electrically conductive portion, wherein the second electrically conductive portion is electrically isolated from the first electrically conductive portion, the first and second electrically conductive portions being shaped and arranged relative to each other so as to define an opening through which ions are axially transmitted in use; wherein, in use, a first AC or RF voltage is applied to the first electrically conductive portion and a second AC or RF voltage is applied to the second electrically conductive portion in order to confine ions radially within said opening. The first and second electrically conductive portions (1, 2) may be separately formed and interleaved within the ion guide to define the plates. Alternatively the first (41, 43) and second (42, 44) electrically conductive portions may be printed onto a common substrate (4).

    Automated beam check
    62.
    发明授权
    Automated beam check 有权

    公开(公告)号：US10325764B2

    公开(公告)日：2019-06-18

    申请号：US15837016

    申请日：2017-12-11

    Applicant: Micromass UK Limited

    Inventor： David Gordon ,  Daniel James Kenny ,  Howard Read ,  Kate Whyatt

    IPC: H01J49/00 ,  H01J49/10

    Abstract: A method of automatically performing a routine to check the operational state of a mass spectrometer is disclosed wherein the method is performed automatically as a start-up routine upon switching ON the mass spectrometer. The method comprises automatically generating a vacuum within one or more vacuum chambers of a mass spectrometer and automatically generating first ions using an internal ion source, wherein the internal ion source is located within a vacuum chamber of the mass spectrometer or is located within a chamber downstream from an atmospheric pressure interface, and detecting at least some of the first ions or second ions derived from the first ions. The method further comprises automatically determining whether or not the mass spectrometer is in a correct operational state.

    Miniature ion source of fixed geometry
    63.
    发明授权
    Miniature ion source of fixed geometry 有权

    公开(公告)号：US10236171B2

    公开(公告)日：2019-03-19

    申请号：US15022396

    申请日：2014-09-17

    Applicant: Micromass UK Limited

    Inventor： Stevan Bajic ,  David Gordon ,  Daniel James Kenny ,  Richard Barrington Moulds ,  Stephen O'Brien ,  Ian Trivett ,  Kate Whyatt

    IPC: H01J49/10 ,  H01J49/16 ,  H01J49/00 ,  H01J49/04

    Abstract: A mass spectrometer is disclosed comprising an atmospheric pressure interface comprising a gas cone having an inlet aperture, wherein the gas cone has a first longitudinal axis arranged along an x-axis and an Electrospray ion source comprising a first capillary tube having an outlet and having a second longitudinal axis and a second capillary tube which surrounds the first capillary tube. The mass spectrometer further comprises a desolvation gas supply tube and a first device arranged and adapted to supply an analyte liquid via the first capillary tube so that the liquid exits the outlet of the first capillary tube at a flow rate >200 μL/min. The mass spectrometer further comprises a second device arranged and adapted to supply a nebuliser gas via the second capillary tube at a flow rate in the range 80-150 L/hr, wherein an outlet of the first capillary tube is arranged at a distance x mm along the x-axis as measured from the centre of the gas cone inlet aperture, a distance y mm along a y-axis as measured from the centre of the gas cone inlet aperture and a distance z mm along a z-axis as measured from the centre of the gas cone inlet aperture. The x-axis, the y-axis and the z-axis are mutually orthogonal. The desolvation gas supply tube surrounds the second capillary tube and the mass spectrometer further comprises a third device arranged and adapted to supply a desolvation gas via the desolvation gas supply tube at a flow rate in the range 400-1200 L/hr, a heater arranged and adapted to heat the desolvation gas to a temperature ≥100° C. and a fourth device arranged and adapted to supply a cone gas to the gas cone at a flow rate in the range 40-80 L/hr and wherein x is in the range 2.0-5.0 mm and wherein the ratio z/x is in the range 1-5:1.

    Automated Beam Check
    66.
    发明申请
    Automated Beam Check 有权
    自动光束检查

    公开(公告)号：US20160300702A1

    公开(公告)日：2016-10-13

    申请号：US15022444

    申请日：2014-09-17

    Applicant: MICROMASS UK LIMITED

    Inventor： David Gordon ,  Daniel James Kenny ,  Howard Read ,  Kate Whyatt

    IPC: H01J49/00 ,  H01J49/10

    CPC classification number: H01J49/0009 ,  H01J49/0031 ,  H01J49/10

    Abstract: A method of automatically performing a routine to check the operational state of a mass spectrometer is disclosed wherein the method is performed automatically as a start-up routine upon switching ON the mass spectrometer. The method comprises automatically generating a vacuum within one or more vacuum chambers of a mass spectrometer and automatically generating first ions using an internal ion source, wherein the internal ion source is located within a vacuum chamber of the mass spectrometer or is located within a chamber downstream from an atmospheric pressure interface, and detecting at least some of the first ions or second ions derived from the first ions. The method further comprises automatically determining whether or not the mass spectrometer is in a correct operational state.

    Abstract translation: 公开了一种自动执行程序以检查质谱仪的操作状态的方法，其中该方法在接通质谱仪时作为启动程序自动进行。 该方法包括在质谱仪的一个或多个真空室内自动产生真空并使用内部离子源自动产生第一离子，其中内部离子源位于质谱仪的真空室内或位于腔室下游 并且检测从第一离子衍生的至少一些第一离子或第二离子。 该方法还包括自动确定质谱仪是否处于正确的操作状态。

    High Frequency Voltage Supply Control Method for Multipole or Monopole Analysers
    67.
    发明申请
    High Frequency Voltage Supply Control Method for Multipole or Monopole Analysers 审中-公开
    用于多极或单极分析仪的高频电源控制方法

    公开(公告)号：US20160293393A1

    公开(公告)日：2016-10-06

    申请号：US15022705

    申请日：2014-09-17

    Applicant: MICROMASS UK LIMITED

    Inventor： David Gordon ,  Richard Barrington Moulds ,  Kenneth Russell Worthington

    IPC: H01J49/00 ,  H01J49/42

    CPC classification number: H01J49/0036 ,  H01J49/0031 ,  H01J49/022 ,  H01J49/4215 ,  H01J49/422 ,  H01J49/4275

    Abstract: A voltage supply system for supplying an RF voltage to an RF resonant load comprising an ion-optical component of a mass spectrometer is disclosed. The system comprises a Direct Digital Synthesiser (“DDS”) arranged and adapted to output an RF voltage. The voltage supply system is arranged and adapted: (i) to vary the frequency of the RF voltage output by the Direct Digital Synthesiser, (ii) to determine a first resonant frequency of the RF resonant load comprising the ion-optical component, and (iii) to determine whether or not the generation of an RF voltage at the first resonant frequency by the Direct Digital Synthesiser would also result in the generation of a spur frequency close to the first resonant frequency. If it is determined that a spur frequency would be generated close to the first resonant frequency then the voltage supply system is further arranged and adapted: (iv) to consult a look-up table comprising one or more preferred frequencies, and (v) to direct the Direct Digital Synthesiser to generate an RF voltage at a second frequency which corresponds with one of the preferred frequencies from the look-up table, wherein the second frequency is different to said first resonant frequency.

    Abstract translation: 公开了一种用于向包括质谱仪的离子光学部件的RF谐振负载提供RF电压的电压供应系统。 该系统包括布置并适于输出RF电压的直接数字合成器（“DDS”）。 电压供应系统被布置和适应：（i）改变由直接数字合成器输出的RF电压的频率，（ii）确定包括离子光学部件的RF谐振负载的第一谐振频率和（ iii）确定直接数字合成器在第一谐振频率下的RF电压的产生是否也将导致接近于第一谐振频率的杂散频率的产生。 如果确定将产生接近第一共振频率的杂散频率，则电压供应系统被进一步布置和适配：（iv）查阅包括一个或多个优选频率的查找表，以及（v）至 指导直接数字合成器以产生与来自查找表的优选频率之一相对应的第二频率的RF电压，其中第二频率不同于所述第一谐振频率。

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