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    Time-of-flight mass spectrometry device and analysis method
    1.
    发明授权
    Time-of-flight mass spectrometry device and analysis method 有权

    公开(公告)号：US12087569B2

    公开(公告)日：2024-09-10

    申请号：US17768747

    申请日：2020-08-17

    Applicant: SHIMADZU CORPORATION

    Inventor： Takuro Kishida ,  Yasushi Aoki ,  Toshitaka Kawai

    IPC: H01J49/40 ,  H01J49/02

    CPC classification number: H01J49/40 ,  H01J49/022

    Abstract: A time-of-flight mass spectrometry device includes an electrode to which a DC high voltage is applied in order to form an ion flight space and a high voltage power supply device that applies the high voltage to the electrode. The high voltage power supply device includes a high voltage generating circuit that generates the high voltage, and a voltage control circuit that is selectively set to a convergence responsiveness priority mode in which the high voltage generating circuit is controlled such that the high voltage has first convergence responsiveness and first stability or a stability priority mode in which the high voltage generating circuit is controlled such that the high voltage has second convergence responsiveness that is lower than the first convergence responsiveness and second stability that is higher than the first stability.

    Mass Spectrometry Methods And Systems For High Pressure Charge State Control And/Or Fragmentation
    4.
    发明公开
    Mass Spectrometry Methods And Systems For High Pressure Charge State Control And/Or Fragmentation 审中-公开

    公开(公告)号：US20240162022A1

    公开(公告)日：2024-05-16

    申请号：US18283109

    申请日：2022-03-24

    Applicant: DH Technologies Development Pte. Ltd.

    Inventor： Yves LE BLANC

    IPC: H01J49/00 ,  H01J49/02 ,  H01J49/06 ,  H01J49/24

    CPC classification number: H01J49/0045 ,  H01J49/022 ,  H01J49/063 ,  H01J49/24

    Abstract: Systems and methods described herein provide for charge state control of multiply-charged anions in a front end, high pressure ion guide. In some example aspects, a mass spectrometer system is provided comprising a first vacuum chamber (121) maintained at a pressure above about 500 mTorr. At least one ion guide (106) is disposed within the first vacuum chamber, the at least one ion guide comprising a plurality of rods extending along a central longitudinal axis. A controller (193) is configured to adjust an amplitude of an RF voltage signal provided to the plurality of rods so as to alternatively operate the ion guide in a first mode of operation with a lower amplitude of the RF voltage signal so as to reduce the likelihood of charge reduction by electron detachment so as to substantially maintain the isotopic distribution of the ions during transmission of ions through the ion guide, and a second mode of operation with a higher amplitude of the RF voltage signal so as to increase the likelihood of electron detachment from ions being transmitted therethrough.

    ION ANALYZER
    8.
    发明公开
    ION ANALYZER 审中-公开

    公开(公告)号：US20230197427A1

    公开(公告)日：2023-06-22

    申请号：US17918375

    申请日：2020-04-17

    Applicant: SHIMADZU CORPORATION

    Inventor： Yuta MIYAZAKI ,  Shiro MIZUTANI ,  Wataru FUKUI

    IPC: H01J49/02 ,  H01J49/16

    CPC classification number: H01J49/022 ,  H01J49/167

    Abstract: An ion analyzer 2 including: a power feeding circuit 26 in which a power supply connection part 261, a first electrode connection part 262, a first resistance element 263, a second electrode connection part 264, a second resistance element 265, and a grounding part are provided in series; a power supply P connected to the power supply connection part 261 and configured to output both a DC positive voltage and a DC negative voltage; a first voltage supply electrode 23 connected to the first electrode connection part 262; and a second voltage supply electrode 24 connected to the second electrode connection part 264. In particular, it can be suitably used as a device for applying a voltage to a push electrode 23 and a convergence electrode 24 disposed in an ionization chamber 20 of a mass spectrometer including an ESI source 21.

    MASS SPECTROMETRY DEVICE CONTROL METHOD, MASS SPECTROMETRY SYSTEM, AND VOLTAGE CONTROL DEVICE
    9.
    发明公开
    MASS SPECTROMETRY DEVICE CONTROL METHOD, MASS SPECTROMETRY SYSTEM, AND VOLTAGE CONTROL DEVICE 审中-公开

    公开(公告)号：US20230170198A1

    公开(公告)日：2023-06-01

    申请号：US17922755

    申请日：2021-03-23

    Applicant: Hitachi High-Tech Corporation

    Inventor： Masuyuki SUGIYAMA ,  Hideki HASEGAWA ,  Yuki NAGAYA ,  Yuichiro HASHIMOTO ,  Hiroyuki YASUDA

    IPC: H01J49/02 ,  H01J49/06 ,  H01J49/42

    CPC classification number: H01J49/022 ,  H01J49/062 ,  H01J49/4215

    Abstract: A mass spectrometer includes an ion source, an ion guide, a quadrupole mass filter, a detector, DC and RF power sources, and a voltage control device for controlling an acceleration voltage by controlling the power source. The voltage controller controls the acceleration voltage such that it is increased as the mass-to-charge ratio of ions to be measured is increased within a control region. The control region is surrounded, having one coordinate axis representing the mass-to-charge ratio of the ions passing the ion guide and another axis representing the acceleration voltage applied to the ion guide, by a line representing a lower limit of a stable region where the ions pass the ion guide stably, a line representing an ion mobility of the ions, an upper side representing an upper limit of the acceleration voltage, and a lower side representing a value at which the acceleration voltage is zero.

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