PHOTOELECTRIC SENSOR
    62.
    发明申请

    公开(公告)号:US20180267202A1

    公开(公告)日:2018-09-20

    申请号:US15842895

    申请日:2017-12-15

    Abstract: A photoelectric sensor capable of preventing a malfunction caused by mutual interference is provided. The photoelectric sensor includes: a light projecting unit that repetitively emits a set of pulse light, which follows a projected light pattern in which a light projecting period is made different by a fixed time, as signal light; a light receiving element that receives the signal light; and a light receiving controller that distinguishes a light incident state and a light blocked state based on a received light signal from the light receiving element. The light projecting unit has a first pattern having the light projecting period increased by a fixed time and a second pattern having the light projecting period reduced by a fixed time as the projected light pattern, and in the first and second patterns, a pulse indicating a shortest period is included in the light projecting period other than the shortest period.

    PHOTOCELL COVER AND METHOD OF USE
    65.
    发明申请

    公开(公告)号:US20180180467A1

    公开(公告)日:2018-06-28

    申请号:US15389890

    申请日:2016-12-23

    Inventor: Ricardo Ordonez

    CPC classification number: F21V23/0464 G01J1/0228 G01J1/0271 G01J1/0403

    Abstract: A photocell cover, including a jacket that defines a jacket cavity and a jacket opening, that is operable to be used by the user at any time of day and in any level of ambient light. The invention achieves this object by providing a photocell cover to cover a photocell and its housing, blocking any ambient light from reaching the photocell, in order to provide an environment in which the photocell can be tested. The jacket cavity and jacket opening receive a housing of a photocell and simulate a low level of ambient light in the area surrounding the photocell in order to test the functionality of the photocell. The method of using the photocell cover allows the user to test the photocell during any time of day or night, including from a ground level position.

    Method for testing retinal implant
    66.
    发明申请

    公开(公告)号:US20180143071A1

    公开(公告)日:2018-05-24

    申请号:US15815330

    申请日:2017-11-16

    Abstract: The present invention relates to a method for testing a retinal implant. After an implantable device for interfacing with retinal cells is provided, an external stimulus is applied to the implantable device so that the implantable device transmits a first pulse to a processing device through a wireless interface. When a conversion unit is controlled to gradually decrease an output voltage until the implantable device outputs an output voltage lower than a reference voltage, the implantable device transmits a signal different from the first pulse to the processing device through the wireless interface. The processing device determines a current value of a pixel unit according to a time difference between the first pulse and the signal.

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