Abstract:
A focal plane array electromagnetic radiation detector includes an array of micro-electromagnetic resonant detector cells. Each micro-electromagnetic resonant detector cell may include an ultra-small resonant structure for receiving an electromagnetic wave and adapted to angularly modulate a charged particle beam in response to receiving an electromagnetic wave. Each micro-electromagnetic detector cell may include a detector portion that measures the angular modulation of the charged particle beam. The ultra-small resonant structure is designed to angularly modulate the charged particle beam according to a characteristic of the received electromagnetic wave.
Abstract:
A fluorescence spectrophotometer system may be implemented in scanning fluorescence polarization detection applications. A wavelength and area scanning fluorescence spectrophotometer system may include a light source, an excitation double monochromator, an excitation/emission light transfer module, an emission double monochromator, a high speed timer-counter circuit board, a precision positioning apparatus for positioning a sample relative to the focal plane of the excitation light, and polarizing filters at the excitation side and the emission side. The system may be operative to analyze more than one fluorescent compound in the sample; additionally or alternatively, the system enables analysis of samples from selected ones of a plurality of samples.
Abstract:
A hand-held, self-contained, battery-powered test instrument for analyzing composition of a sample includes an exciter for exciting at least a portion of the sample, a compact cross-dispersed spectrometer for receiving an optical signal from the excited portion of the sample and a processor for processing spectral data about the optical signal from the spectrometer. The exciter may include a spark generator and a counter electrode, a laser or other device for generating the optical signal from the sample portion. The spectrometer has a wavelength range broad enough to enable the test instrument to detect and determine relative quantities of carbon, phosphorous, sulfur, manganese, silicon, iron and other elements necessary to identify common alloys. The spectrometer includes a structural member made of a light-weight material having a small coefficient of thermal expansion (CTE). The spectrometer is dimensionally stable over a range of expected ambient temperatures, without controlling the temperature of the spectrometer.
Abstract:
The present invention relates to photometers wherein light signals on different wavelengths are directed to samples and a light scattered from or penetrated through the sample is measured with a photodetector. Method provides a required filtered light signal for a photometer (4). The method comprises providing a source of white light by a pulsed flash light source (7) and filtering the light signal for providing signals on different wavelengths by using multiple filters (6) arranged on a perimeter of a rotary filter disk (5). At least one filtered light signal is led to at least one photometer (4). The filter disk (5) Is rotated continuously for passing successive filters (6) over the path of light from the flash light source (7) to the photometer (4) and the flash light source (7) is triggered when a filter (6) providing the required wavelength of light is on the path of light from the flash light source (7) to the photometer (4).
Abstract:
The light is filtered by a two- or three-band optical device integrated with two- and three-band mixing method so that only the light in the wavelength range of the pass bands can pass through this optical device and reach the optical sensor for the opto-electronic sensing application, or human eyes for the visual instrument application, or the surface of target object for the illumination application. The color difference and/or chromaticness difference can be enhanced by this method. And the target identification or object classification can be implemented by this method in terms of color attributes. With this method, two- and/or three-band ratio criteria widely used in remote sensing and machine vision applications can be calculated in terms of color attributes, and two- and/or three-band multi-spectral imaging can be acquired so that the complicated and expensive two and three band multi-spectral imaging system can be replaced by this kind of sensing device.
Abstract:
A fluorescence spectrophotometer system may be implemented in scanning fluorescence polarization detection applications. A wavelength and area scanning fluorescence spectrophotometer system may include a light source, an excitation double monochromator, an excitation/emission light transfer module, an emission double monochromator, a high speed timer-counter circuit board, a precision positioning apparatus for positioning a sample relative to the focal plane of the excitation light, and polarizing filters at the excitation side and the emission side. The system may be operative to analyze more than one fluorescent compound in the sample; additionally or alternatively, the system enables analysis of samples from selected ones of a plurality of samples.
Abstract:
A real-time bulk material analyzing system is disclosed for analyzing the elemental characteristics of bulk material passing by the system on a moving conveyor belt. An exemplary embodiment includes a source of illumination emitting white light for exciting bulk material to be analyzed, and a hyperspectral imaging spectrometer for capturing spectral reflectance from bulk material excited by the illumination source. A non-hazardous source of excitation can be used, which allows the bulk material to pass unobstructed and undisturbed through the detector array.
Abstract:
A real-time bulk material analyzing system is disclosed for analyzing the elemental characteristics of bulk material passing by the system on a moving conveyor belt. An exemplary embodiment includes a source of illumination emitting white light for exciting bulk material to be analyzed, and a hyperspectral imaging spectrometer for capturing spectral reflectance from bulk material excited by the illumination source. A non-hazardous source of excitation can be used, which allows the bulk material to pass unobstructed and undisturbed through the detector array.
Abstract:
The present invention provides an economically feasible robust spatial heterodyne spectroscopy (SHS) interferometer. A first type prior art monolithic SHS interferometer is exceedingly expensive, whereas a second type of prior art SHS interferometer is extremely large and has many components, which need to be tuned. The present invention is much less expensive than the first type of prior art SHS interferometer and is much smaller that the second type of prior art SHS interferometer.
Abstract:
An optical filter includes a dielectric waveguide layer, supporting waveguide modes at specific wavelengths and receiving incident light, a corrugated film layer, composed of one of a metal and a semiconductor and positioned adjacent to a second surface of the waveguide layer and a sensor layer, wherein the sensor layer is capable of absorbing optical energy and generating a corresponding electrical signal. The metal film layer supports a plurality of plasmons, the plurality of plasmons producing a first field and is excited by a transverse mode of the waveguide modes at a wavelength interval. The first field penetrates the sensor layer and the sensor layer generates an electrical signal corresponding to an intensity of received incident light within the wavelength interval.