Stray radiation compensation
    61.
    发明授权
    Stray radiation compensation 失效
    散射辐射补偿

    公开(公告)号:US5128549A

    公开(公告)日:1992-07-07

    申请号:US502359

    申请日:1990-03-30

    Applicant: Wilbur I. Kaye

    Inventor: Wilbur I. Kaye

    CPC classification number: G01J3/2803 G01J3/28 G01N2201/064

    Abstract: A method of measuring and compensating stray light in absorbance analysis that use a multiple element array detector wherein one or more of the elements of the diode array are utilized to detect stray radiation in the absence of primary radiation including higher order diffracted radiation. In one aspect, the atmosphere is used to filter all primary radiation below a particular wavelength so that one or more array elements corresponding to detection below such wavelength can be dedicated to the detection of only stray radiation. Detection of higher order diffractions can be prevented by dividing the total spectrum into intervals and detecting these intervals in sequence. In another aspect, a diode array is designed to include additional elements along one side of the array outside the exposure of the primary radiation for the sole purpose of detecting stray radiation.

    Stray-light suppressor for Littrow spectroscope
    62.
    发明授权
    Stray-light suppressor for Littrow spectroscope 失效
    Littrow光谱仪的杂散光抑制器

    公开(公告)号:US4717254A

    公开(公告)日:1988-01-05

    申请号:US894610

    申请日:1986-08-07

    Applicant: Toshizo Masuda

    Inventor: Toshizo Masuda

    CPC classification number: G01J3/18 G01J3/02 G01J3/0262 G01J3/22 G01N2201/064

    Abstract: In a Littrow spectroscope including a concave mirror for reflecting light from a source, a diffraction grating for further reflecting the light reflected by the mirror, the grating being made rotatable to allow the mirror to re-reflect the light therefrom, and an exit on which the light re-reflected by the mirror is focused; a stray-light suppressor in the form of a strip is disposed in front of, and horizontally in parallel with the longitudinal central axis of, the mirror. The suppressor is held in front of the mirror at a distance of (L1-L2), where L1 is the distance between the mirror and the grating and L2 is the distance between the grating and the exit. The suppressor portion upon which the stray light from the diffraction grating impinges is tapered.

    Abstract translation: 在包括用于反射来自光源的光的凹面镜的Littrow分光镜中,用于进一步反射由反射镜反射的光的衍射光栅,光栅被制成可旋转以允许反射镜从其反射光,以及出射口 镜子反射的光线集中在一起; 带状形式的杂散光抑制器设置在反射镜的纵向中心轴的前面并且与之平行。 抑制器被保持在反射镜前面(L1-L2)的距离处,其中L1是反射镜和光栅之间的距离,L2是光栅与出口之间的距离。 来自衍射光栅的杂散光撞击的抑制部分是锥形的。

    Stray light measurement and compensation
    63.
    发明授权
    Stray light measurement and compensation 失效
    杂散光测量和补偿

    公开(公告)号:US4526470A

    公开(公告)日:1985-07-02

    申请号:US355281

    申请日:1982-03-05

    Applicant: Wilbur I. Kaye

    Inventor: Wilbur I. Kaye

    CPC classification number: G01J3/28 G01J3/42 G01N2201/064

    Abstract: Methods for stray light measurement and compensation in spectrophotometers are disclosed. In one exemplary embodiment, stray light is determined as a convolution of a selected detected radiant power spectrum and a monochromator slit function. Such a stray light measurement may be made with or without the sample in an optical path between a source and detector within the spectrophotometer. When made with the sample in the optical path, the resulting stray light measurement may be used to compensate sample absorbance or transmittance measurements. In accordance with another embodiment of the present invention, sample absorbance or transmittance may be compensated in a method including measuring sample detected radiant power at a wavelength outside an interval of significant detected radiant power within which a sample measurement compensated for stray is desired.

    Abstract translation: 公开了分光光度计中杂散光测量和补偿的方法。 在一个示例性实施例中,杂散光被确定为所选择的检测到的辐射功率谱和单色仪狭缝功能的卷积。 这样的杂散光测量可以在分光光度计内的源和检测器之间的光路中或不使用样品的情况下进行。 当用光路中的样品制成时,可以使用所得到的杂散光测量来补偿样品吸光度或透射率测量。 根据本发明的另一个实施例,可以通过以下方法补偿样品吸收度或透射率,该方法包括测量在需要补偿杂散的样品测量的显着检测的辐射功率的间隔之外的波长处的检测到的辐射功率。

    Real-time spectral analysis through high-speed spectral classification

    公开(公告)号:US11913877B2

    公开(公告)日:2024-02-27

    申请号:US16640757

    申请日:2018-08-10

    Abstract: The present invention relates to an improvement in spectral analysis in spectrometry, particularly in a technique of spectral analysis by spectral classification at high speed.
    A spectral analysis device 10 comprises: a measurement unit 20 that measures a sample spectrum of a target sample 30; and an analysis unit 40 that analyses the sample spectrum, and analyses a compound contained in the target sample 30, wherein



    the analysis unit has a library that is processed with an arithmetic processing in advance, the library has a plurality of compound groups to which the compound is classified, and
    the analysis unit further comprises an analysis display part 42, the analysis display part 42 displays, in real time, the compound group to which the compound belongs during analysis of the sample spectrum as the analysis progress or analysis result.

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