Abstract:
Provided are MALDI ion sources, methods of forming ions and mass analyzer systems. In various embodiments, provided are MALDI ion sources configured to irradiate a sample on a sample surface with a pulse of laser energy at angle within 10 degrees or less of the surface normal, and a first ion optics system configured to extract sample ions in a direction within 5 degrees or less of the surface normal. In various embodiments, MALDI ion sources having substantially coaxial sample irradiation and ion extraction are provided. In various embodiments, methods are provided, which produce sample ions by MALDI and extract sample ions using an accelerating electrical field to form an ion beam, such that, the angle of the trajectory at the exit from the accelerating electrical field of sample ions substantially at the center of the ion beam is substantially independent of sample ion mass.
Abstract:
A mass spectrometer includes: an ion source; a mass separator for separating ions with respect to mass to charge ratios of the ions; an ion detector; an ion deflector including a pair of electrodes placed opposite each other across an ion optical axis, the ion deflector being placed between the ion source and the mass separator or between the mass separator and the ion detector; and a voltage generator for applying AC voltages of opposite polarities respectively to the pair of electrodes, where a frequency of the AC voltages is determined so that lighter ions are more deflected and prevented from entering the mass separator or the ion detector and heavier ions are less deflected and allowed to enter the mass separator or the ion detector. Only helium ions which are deleterious to the mass spectrometry can be efficiently eliminated while object sample ions are hardly affected. This enables a high-sensitivity and high-accuracy mass analysis of ions whose mass to charge ratios are close to that of helium ions, which until now has been difficult.
Abstract:
A TOF mass analyzer having multiple flight paths is described. The TOF mass analyzer includes a pulsed ion source that generates a packet of ions and that accelerates the packet of ions. An ion deflector directs a first group of ions from the packet of ions to a first ion path, and a second group of ions to a second ion path for each of a first and second predetermined time interval after the pulsed ion source generates the packet of ions. A first TOF mass separator separates the first group of ions according to their mass to-charge ratio and a first detector is positioned to receive the first group of ions A second TOF mass separator separates a second group of ions according to their mass to-charge ratio and a second detector is positioned to receive the second group of ions. Additional ion paths may be employed, and any type of TOF mass separator may be used in each ion path.
Abstract:
Provided are MALDI ion sources, methods of forming ions and mass analyzer systems. In various embodiments, provided are MALDI ion sources configured to irradiate a sample on a sample surface with a pulse of laser energy at angle within 10 degrees or less of the surface normal, and a first ion optics system configured to extract sample ions in a direction within 5 degrees or less of the surface normal. In various embodiments, MALDI ion sources having substantially coaxial sample irradiation and ion extraction are provided. In various embodiments, methods are provided, which produce sample ions by MALDI and extract sample ions using an accelerating electrical field to form an ion beam, such that, the angle of the trajectory at the exit from the accelerating electrical field of sample ions substantially at the center of the ion beam is substantially independent of sample ion mass.
Abstract:
A mass spectrometer has an ion source for producing sample ions. The ions pass through an ion interface, to a reaction/collision cell section. An inn-neutral decoupling device is provided between the ion interface and the reaction/collision cell section, to provide substantial separation between ions and neutral particles, whereby only ions pass on to the reaction/collision cell section. The supersonic jet entering the spectrometer can have sufficient energy to cause the plasma gases, such as argon, to overcome the pressure differential between the reaction/collision cell and an upstream section of the spectrometer so as to penetrate into the reaction/collision cell; the decoupling device prevents this. The decoupling device can have offset apertures provided by plates or rods or other comparable arrangements, or can comprise a quadrupolar electrostatic deflector, an electrostatic sector deflector or a magnetic sector deflector.
Abstract:
A technique for providing a grid for a gate such as utilized in gating a stream of ions or other particles in a spectrometer instrument. The grid of wires may, for example, be a so-called Bradbury-Nielson Gate that consists of a set of two electrically isolated sets of equally spaced wires that lie substantially in the same plane and alternate in potential. The method utilized to provide is to first fabricate a frame of an insulating substrate having a hole and depositing metal film patterns such that conductive portions are formed on either side of the hole. Conductive portions on either side form a series of terminating pads on the portion of the substrate closest to the hole and a bus bar. Grid wires are then formed by stretching a section of wire with desired constant tension across the hole and bonding the ends of the wire to a respective one of the pads on one side and bus bar on the other side. The method provides a rapid, inexpensive way to fabricate such modulating devices.
Abstract:
A mass spectrometer has an ion source for producing sample ions. The ions pass through an ion interface, to a reaction/collision cell section. An ion-neutral decoupling device is provided between the ion interface and the reaction/collision cell section, to provide substantial separation between ions and neutral particles, whereby only ions pass on to the reaction/collision cell section. The supersonic jet entering the spectrometer can have sufficient energy to cause the plasma gases, such as argon, to overcome the pressure differential between the reaction/collision cell and an upstream section of the spectrometer so as to penetrate into the reaction/collision cell; the decoupling device prevents this. The decoupling device can have offset apertures provided by plates or rods or other comparable arrangements, or can comprise a quadrupolar electrostatic deflector, an electrostatic sector deflector or a magnetic sector deflector.
Abstract:
Bradbury-Nielson gates for the modulation of beams of charged particles, particularly ion beams in mass spectrometry, have been produced with an adjustable wire spacing down to 0.075 mm or a smaller spacing. The gates are robust, they can be fabricated in less than 3 hours, and the method of production is reproducible. In time-of-flight mass spectrometers, fine wire spacing leads to improvements in mass resolution and modulation rates. Gates that were produced using this new method have been installed in a Hadamard transform time-of-flight mass spectrometer in order to demonstrate their utility.
Abstract:
A mass analysis apparatus is capable of performing a plurality of measurements in parallel by mounting a plurality of ion sources onto one mass spectrometer and speedily switching the ion sources. The mass analysis apparatus comprises a plurality of ion sources; and a deflecting means for deflecting ions from at least one ion source among the plurality of ion sources so that the ions travel toward the mass spectrometer by producing an electric field.
Abstract:
An ion-deflecting device is located between a mass spectrometer and a detector, and undesired signal sources are prevented from reaching the detector during the ion-trapping period by switching the voltage applied to the detector between the ion-trapping period and the mass-analyzing period. A first voltage is applied to the detector during an ion-trapping period while a second voltage is applied to the detector during a mass-analyzing period. An ion-deflecting device deflects ions such that they do not reach the detector during an ion-trapping period while they do reach the detector during a mass-analyzing period. This way, the life of the detector is increased.