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    Information Processing Apparatus And Information Processing Method
    61.
    发明公开
    Information Processing Apparatus And Information Processing Method 审中-公开

    公开(公告)号：US20240240985A1

    公开(公告)日：2024-07-18

    申请号：US18562137

    申请日：2022-05-27

    Applicant: Sony Group Corporation

    Inventor： Masahiro Take ,  Yuusaku Tagawa ,  Yusuke Chiba

    IPC: G01J3/46 ,  G01J3/28 ,  H04N1/60

    CPC classification number: G01J3/462 ,  G01J3/2823 ,  H04N1/6086 ,  H04N1/6088

    Abstract: An information processing apparatus includes a control unit. The control unit calculates an RGB value output by an imaging apparatus when imaging of a predetermined color is performed by using the imaging apparatus by using characteristic data related to a spectroscopic sensitivity characteristic of the imaging apparatus, photographing-side spectroscopic data, and color spectroscopic data. The control unit acquires display-side spectroscopic data related to a spectroscopic distribution characteristic of a light source in a display environment in which imaged data imaged by the imaging apparatus is displayed on a display apparatus. The control unit calculates an XYZ value when the predetermined color is displayed on the display apparatus by using the display-side spectroscopic data and the color spectroscopic data. The control unit calculates conversion information for converting the RGB value into the XYZ value.

    ON-CHIP SPECTROMETER WITH TUNABLE PHOTODETECTION LAYER
    63.
    发明公开
    ON-CHIP SPECTROMETER WITH TUNABLE PHOTODETECTION LAYER 审中-公开

    公开(公告)号：US20240213392A1

    公开(公告)日：2024-06-27

    申请号：US18557008

    申请日：2022-04-28

    Applicant: Bar-Ilan University ,  Yale University

    Inventor： Doron NAVEH ,  Fengnian XIA ,  Shaofan YUAN

    IPC: H01L31/113 ,  G01J3/28 ,  H01L31/0232 ,  H01L31/0352

    CPC classification number: H01L31/1136 ,  G01J3/28 ,  H01L31/02327 ,  H01L31/035236

    Abstract: Apparatuses and methods are provided for reconstructing a spectrum of an incident source. An example apparatus includes a photodetection layer, a voltage source, and a voltage drain. In some embodiments, the example apparatus further includes one or more gate electrodes. The photodetection layer includes one or more photodetection materials and is configured to generate a photoresponse vector in response to an incident source and/or gate electrodes. The voltage source and voltage drain are electrically connected to the photodetection layer and are configured to measure the photoresponse vector generated by the photodetection layer. The spectrum of the unknown incidence light can be reconstructed by using the photoresponse vector and the pre-measured response matrix.

    Self-calibrating spectral sensor modules
    65.
    发明授权
    Self-calibrating spectral sensor modules 有权

    公开(公告)号：US12018987B2

    公开(公告)日：2024-06-25

    申请号：US17433803

    申请日：2020-03-25

    Applicant: ams Sensors Singapore Pte. Ltd.

    Inventor： Javier Miguel Sánchez

    IPC: G01J3/45 ,  G01J3/26 ,  G01J3/28

    CPC classification number: G01J3/45 ,  G01J3/26 ,  G01J2003/2879

    Abstract: An example system includes a housing defining a cavity and an aperture, a photodetector disposed within the cavity, a voltage-tunable interferometer disposed within the cavity between the aperture and the photodetector, a first light source disposed within the cavity, and an electronic control device. The electronic control device is operable to vary an input voltage applied to the interferometer, and concurrently, cause the first light source to emit light towards the interferometer and measure light reflected from the interferometer using the photodetector. The electronic control device is also operable to determine a calibrated input voltage based on light reflected from the interferometer and measured by the photodetector. The electronic control device is also operable to apply the calibrated input voltage to the interferometer, and concurrently, obtain one or more spectral measurements using the photodetector.

    On-chip temperature-insensitive read-out
    66.
    发明授权
    On-chip temperature-insensitive read-out 有权

    公开(公告)号：US12018984B2

    公开(公告)日：2024-06-25

    申请号：US17776032

    申请日：2020-11-18

    Applicant: UNIVERSITEIT GENT ,  IMEC VZW

    Inventor： Fabio Pavanello ,  Dries Van Thourhout ,  Roeland Baets

    IPC: G01J3/28 ,  G01J3/02 ,  G01J3/12

    CPC classification number: G01J3/0294 ,  G01J3/12 ,  G01J3/28 ,  G01J2003/1213 ,  G01J2003/2879

    Abstract: A temperature compensation method for wavelength monitoring using spectrometers on photonic integrated chips and a related temperature-compensated wavelength monitoring device include an optical filter of the chip filters a source signal to provide at least one spectral reference line to a first spectrometer to detect thermal wavelength drifts thereof. At least one spectral line to be monitored is received by the same or another spectrometer of the chip to detect wavelength shifts thereof. The detected thermal drift of the reference line is compared to calibrated thermal drifts for the reference line which is associated with a calibrated thermal drift for the spectral response curve of the spectrometer receiving the spectral line to be monitored. A thermal drift rate for the response curve of the optical filter differs from a thermal drift rate for the response curve of the first spectrometer at least by an amount.

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