公开(公告)号：US10151639B2

公开(公告)日：2018-12-11

申请号：US15319204

申请日：2015-06-15

Applicant: COMMISSARIAT À L'ÉNERGIE ATOMIQUE ET AUX ÉNERGIES ALTERNATIVES

Inventor： Fabien Quere ,  Valentin Gallet ,  Gustave Pariente

IPC: G01J11/00 ,  G01J9/02 ,  G01J3/453

Abstract: A method for characterizing a light beam includes separating the light beam by a separator optic into first and second sub-beams; propagating the first and second sub-beams over first and second optics, respectively, said first and second optics being respectively arranged so that the sub-beams on leaving the optics are separated by a time delay τ; recombining the sub-beams so that they spatially interfere and form a two-dimensional interference pattern; measuring the frequency spectrum of at least part of the interference pattern; calculating the Fourier transform in the time domain of at least one spatial point of the frequency spectrum, the Fourier transform in the time domain having a time central peak and first and second time side peaks; calculating the Fourier transform in the frequency domain for one of the side peaks; calculating the spectral amplitude AR(ω) and the spatial-spectral phase φR(x,y,ω) for the Fourier transform in the frequency domain.

公开(公告)号：US10132686B1

公开(公告)日：2018-11-20

申请号：US15262158

申请日：2016-09-12

Applicant: Industrial Cooperation Foundation Chonbuk National University ,  Board of Regents, The University of Texas System

Inventor： Daesuk Kim ,  Robert Magnusson

IPC: G01J3/453 ,  G01J3/02

Abstract: A spectroscopic device is disclosed. The spectroscopic device can include a beam collimation structure with a white light source. The beam collimation structure can also include a lens configured to generate a collimated light beam. The spectroscopic device can also include a polarization modulation structure. The polarization modulation structure can convert the collimated light beam into a common path light beam. The common path light beam can include a delayed component and a polarized component. The spectroscopic device can include a dual spectrum sensing structure. The dual spectrum sensing structure can sense a normalized spectral Stokes vector in real time speed.

公开(公告)号：US10120134B2

公开(公告)日：2018-11-06

申请号：US15047205

申请日：2016-02-18

Applicant: Si-Ware Systems

Inventor： Bassam Saadany ,  Yasser M. Sabry ,  Mostafa Medhat ,  Bassem Mortada ,  Muhammed Nagi ,  Mohamed Sadek ,  Yasseen Nada ,  Khaled Hassan

IPC: G02B6/12 ,  G02B6/136 ,  G02B6/36 ,  G01B9/02 ,  B81C1/00 ,  G01J3/453 ,  G01J3/02

Abstract: A micro-optical bench device is fabricated by a process that provides control over one or more properties of the micro-optical bench device and/or one or more properties of optical surfaces in the micro-optical bench device. The process includes etching a substrate to form a permanent structure including optical elements and a temporary structure. The shape of the temporary structure and gaps between the temporary structure and permanent structure facilitate control of a property of the micro-optical bench and/or optical surfaces therein. The process further includes removing the temporary structure from an optical path of the micro-optical bench device.

公开(公告)号：US20180299252A1

公开(公告)日：2018-10-18

申请号：US16013664

申请日：2018-06-20

Applicant: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.

Inventor： Yoel Arieli ,  Yoel Cohen

IPC: G01B9/02 ,  G01J3/02 ,  G01J3/453 ,  G01J3/447 ,  G01N21/31

CPC classification number: G01B9/02091 ,  G01B9/02019 ,  G01J3/0208 ,  G01J3/0224 ,  G01J3/447 ,  G01J3/453 ,  G01N21/31 ,  G01N2201/0636 ,  G01N2201/0683

Abstract: Apparatus and methods are described including a line spectrometer that receives a point of light. The line spectrometer includes a first optical element, and a second optical element configured to convert the point of light to a line of light and to direct the line of light toward the first optical element. The first optical element defines first and second surfaces, a distance between the first and second surface varying as a function of distance along the first optical element, the first optical element thereby being configured to generate first and second reflected lines of light that reflect respectively from the first and second surfaces. A detector array receives the first and second lines of light, and generates an interferogram in response thereto. A computer processor determines a spectrum of the point of light, by analyzing the interferogram. Other applications are also described.

公开(公告)号：US20180296097A1

公开(公告)日：2018-10-18

申请号：US16015737

申请日：2018-06-22

Applicant: OMNI MEDSCI, INC.

Inventor： Mohammed N. ISLAM

IPC: A61B5/00 ,  G01J3/28 ,  A61B5/145 ,  A61B5/1455 ,  G01N21/39 ,  G06F19/00 ,  G01N21/88 ,  G16H40/67 ,  G01J3/02 ,  G01J3/10 ,  G01J3/14 ,  G01N33/02 ,  G01N21/359 ,  G01N21/3563 ,  G01N21/35 ,  G01N33/49 ,  G01N33/44 ,  G01N33/15 ,  G01J3/453 ,  G01J3/42 ,  G01J3/18 ,  G01J3/12 ,  G01M3/38 ,  G01N21/85 ,  G01N21/95 ,  H01S3/00 ,  H01S3/30 ,  H01S3/067

CPC classification number: A61B5/0088 ,  A61B5/0013 ,  A61B5/0022 ,  A61B5/0075 ,  A61B5/0086 ,  A61B5/14532 ,  A61B5/14546 ,  A61B5/1455 ,  A61B5/4547 ,  A61B5/6801 ,  A61B5/7257 ,  A61B5/7405 ,  A61B5/742 ,  A61B2562/0233 ,  A61B2562/0238 ,  A61B2562/146 ,  A61B2576/02 ,  G01J3/0218 ,  G01J3/108 ,  G01J3/14 ,  G01J3/1838 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/42 ,  G01J3/453 ,  G01J2003/104 ,  G01J2003/1208 ,  G01J2003/2826 ,  G01M3/38 ,  G01N21/35 ,  G01N21/3563 ,  G01N21/359 ,  G01N21/39 ,  G01N21/85 ,  G01N21/88 ,  G01N21/9508 ,  G01N33/02 ,  G01N33/025 ,  G01N33/15 ,  G01N33/442 ,  G01N33/49 ,  G01N2021/3595 ,  G01N2021/399 ,  G01N2201/061 ,  G01N2201/06113 ,  G01N2201/062 ,  G01N2201/08 ,  G01N2201/12 ,  G01N2201/129 ,  G06F19/00 ,  G16H40/67 ,  H01S3/0092 ,  H01S3/06758 ,  H01S3/302 ,  Y02A90/26

Abstract: A measurement system includes a light source having semiconductor sources, a multiplexer, and one or more fused silica fibers configured to form an output optical beam having one or more optical wavelengths modulated at a modulation frequency. A light beam set-up includes a monochromator forming a filtered optical beam. A measurement apparatus delivers the filtered optical beam to a sample. A receiver receives a spectroscopy output beam generated from the sample by the filtered optical beam. The receiver is configured to use a lock-in technique that detects the modulation frequency, and to generate first and second signals responsive to light received while the light source is off and on, respectively. The measurement system improves a signal-to-noise ratio of the spectroscopy output beam by differencing the first and second signals. The receiver processes the spectroscopy output beam using chemometrics or multivariate analysis to permit identification of materials within the sample.

公开(公告)号：US10041835B2

公开(公告)日：2018-08-07

申请号：US15536871

申请日：2015-12-18

Applicant: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE—CNRS ,  Institut d'Optique Graduate School ,  Observatoire de Paris

Inventor： Andrea Bertoldi ,  Ralf Kohlhaas ,  Arnaud Landragin ,  Philippe Luc Bouyer

IPC: G01J3/453 ,  G04F5/14 ,  G01V7/06

Abstract: Coherent spectroscopic methods are described, to measure the total phase difference during an extended interrogation interval between the signal delivered by a local oscillator (10) and that given by a quantum system (QS). According to one or more embodiments, the method may comprise reading out at the end of successive interrogation sub-intervals (Ti) intermediate error signals corresponding to the approximate phase difference (φ) between the phase of the LO signal and that of the quantum system, using coherence preserving measurements; shifting at the end of each interrogation sub-intervals (Ti) the phase of the local oscillator signal, by a known correction value (φ(i)FB) so as to avoid that the phase difference approaches the limit of the inversion region; reading out a final phase difference (φf) between the phase of the prestabilized oscillator signal and that of the quantum system using a precise measurement with no restriction on the destruction; reconstructing a total phase difference over the extended interrogation interval, as the sum of the final phase difference (φf) and the opposite of all the applied phase corrections figure (I).

公开(公告)号：US10006809B2

公开(公告)日：2018-06-26

申请号：US15429321

申请日：2017-02-10

Applicant: Massachusetts Institute of Technology

Inventor： Juejun Hu ,  Tian Gu ,  Hongtao Lin ,  Derek Matthew Kita ,  Anuradha M. Agarwal

IPC: G01J5/02 ,  G01J3/453 ,  G01J3/02 ,  G02F1/313 ,  G02F1/31

CPC classification number: G01J3/4531 ,  G01J3/0218 ,  G02F1/313 ,  G02F1/3136 ,  G02F2001/311

Abstract: A spectrometer includes an interferometer having a first interference arm and a second interference arm to produce interference patterns from incident light. At least one of the interference arms includes a series of cascaded optical switches connected by two (or more) waveguides of different lengths. Each optical switch directs the incident light into one waveguide or another, thereby changing the optical path length difference between the first interference arm and the second interference arm. This approach can be extended to multi-mode incident light by placing parallel interferometers together, each of which performs spectroscopy of one single mode in the multi-mode incident light. To maintain the compactness of the spectrometer, adjacent interferometers can share one interference arm.

公开(公告)号：US20180149465A1

公开(公告)日：2018-05-31

申请号：US15657385

申请日：2017-07-24

Applicant: Jongmin LEE ,  Juno LEE ,  Jaehwan LEE ,  Hyowook BAE

Inventor： Jongmin LEE ,  Juno LEE ,  Jaehwan LEE ,  Hyowook BAE

IPC: G01B9/02 ,  G01J3/453 ,  G01J3/06 ,  G01J3/02 ,  G01N21/35

CPC classification number: G01B9/02051 ,  G01J3/0286 ,  G01J3/06 ,  G01J3/4535 ,  G01N21/35 ,  G01N2021/3595

Abstract: The present invention relates to a housing of a Michelson interferometer that may facilitate optical alignment of a plurality of optical components by applying a two-part structured housing to the Michelson interferometer. The present invention may provide a Michelson interferometer housing system including a first housing including a first surface on which a fixed mirror is installed, a second surface perpendicular to the first surface, and a first diagonal surface on which a beam splitter assembly to which light is incident from the outside is installed, the first diagonal surface being formed at 45 degrees with respect to the second surface; and a second housing including a third surface on which a movable mirror is installed, a fourth surface perpendicular to the third surface, and a second diagonal surface corresponding to the first diagonal surface, wherein the first and second housings are combined such that the first and second diagonal surfaces face each other to allow the light entering from the outside to be divided through the beam splitter assembly and incident to the fixed mirror and the movable mirror.

公开(公告)号：US09976903B2

公开(公告)日：2018-05-22

申请号：US15293219

申请日：2016-10-13

Applicant: Fuji Electric Co., Ltd.

Inventor： Masanori Oto

IPC: G01J3/45 ,  G01B9/02 ,  G01J3/453 ,  G01J3/447 ,  G01J3/02

CPC classification number: G01J3/453 ,  G01J3/0208 ,  G01J3/0224 ,  G01J3/447 ,  G01J3/4531

Abstract: A spectrometer includes a beam splitter that receives incident light rays and splits each of the incident light rays into first and second spatially displaced, linearly polarized light rays that respectively have first and second polarization directions orthogonal to each other; an optical member that receives the split incident light rays from the beam splitter and optically converts the split incident light rays into a plurality of light beams that are respectively guided to mutually differing locations so as to generate interference fringes in the respective locations, each of the plurality of light beams including a component of the first linearly polarized light rays and a component of the second linearly polarized light rays; and a detector that detects the interference fringes respectively generated by the plurality of light beams.

公开(公告)号：US20180080824A1

公开(公告)日：2018-03-22

申请号：US15607087

申请日：2017-05-26

Applicant: University of Hawaii

Inventor： Paul Lucey

IPC: G01J3/26 ,  G01J3/14 ,  G01J3/453

Abstract: A spatial Fourier transform spectrometer is disclosed. The Fourier transform spectrometer includes a Fabry-Perot interferometer with first and second optical surfaces. The gap between the first and second optical surfaces spatially varies in a direction that is orthogonal to the optical axis of the Fourier transform spectrometer. The Fabry-Perot interferometer creates an interference pattern from input light. An image of the interference pattern is captured by a detector, which is communicatively coupled to a processor. The processor is configured to process the interference pattern image to determine information about the spectral content of the input light.