X-ray generation from a super-critical field

    公开(公告)号:US10172223B2

    公开(公告)日:2019-01-01

    申请号:US15387433

    申请日:2016-12-21

    Inventor: Steven D. Hansen

    Abstract: Described herein are methods and systems relating to an x-ray generation system. In some embodiments, the system includes an electron beam acceleration region that generates an electron beam and accelerates electrons in the beam and a radiation generation region that (i) receives the electron beam and (ii) generates an electric field having an energy of greater than about 10E7 V/m without electrical breakdown of vacuum gaps. The electric field is configured to decelerate electrons in the electron beam sufficiently to generate x-ray energy.

    X-ray apparatus with deflectable electron beam

    公开(公告)号:US10049850B2

    公开(公告)日:2018-08-14

    申请号:US14841726

    申请日:2015-09-01

    Abstract: An x-ray apparatus (1), has an electron beam source (2), a target (4), onto which the electron beam (3) is directed to form a focal spot (5; 5a, 5b) on the target (4), x-ray optics (6) for collecting x-rays emitted from the focal spot (5; 5a, 5b) to form an x-ray beam (8) and a sample position (9) at which the x-ray beam (8) is directed. The x-ray apparatus (1) further includes an electrostatic or electromagnetic electron beam deflection device (10) suitable for moving the focal spot (5; 5a, 5b) on the target (4). The extension of the focal spot (5; 5a, 5b) in any direction (x, y, z) is at least a factor of 1.5 smaller than the extension of the target (4). An x-ray apparatus is thereby provided with simplified alignment of the x-ray optics with respect to a microfocus x-ray source.

    Computed Tomography
    65.
    发明申请
    Computed Tomography 审中-公开

    公开(公告)号:US20180180560A1

    公开(公告)日:2018-06-28

    申请号:US15391356

    申请日:2016-12-27

    CPC classification number: G01N23/046 G01N2223/309 G01N2223/419 G01N2223/501

    Abstract: Apparatus for computed tomography is described that is also suitable for X-ray diffraction. The computed tomography measurement uses a line focus 8 and passes the X-rays from the line focus through a perpendicular slit 22 and then through a sample onto a two dimensional detector. A plurality of images are taken, each with the sample rotated about a rotation axis 14 by a different amount, and combined to create a computed tomography image.

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