PHOTOELECTRIC CONVERTING MODULE
    71.
    发明申请
    PHOTOELECTRIC CONVERTING MODULE 有权
    光电转换模块

    公开(公告)号:US20150185071A1

    公开(公告)日:2015-07-02

    申请号:US14587147

    申请日:2014-12-31

    Inventor: CHIH-CHEN LAI

    Abstract: A photoelectric converting module includes a circuit board, at least one light emitting/receiving unit and an optical coupler both mounted on the circuit board. Each light emitting/receiving unit includes a light emitter and a light receiver, the light emitter and the light receiver each include at least one positioning projection. The optical coupler includes positioning parts to engage with the positioning projections for aligning the optical coupler with the light emitting/receiving unit precisely.

    Abstract translation: 光电转换模块包括安装在电路板上的电路板,至少一个发光/接收单元和光耦合器。 每个发光/接收单元包括光发射器和光接收器,光发射器和光接收器各自包括至少一个定位突起。 光耦合器包括定位部件,以与定位突起接合,用于将光耦合器与发光/接收单元精确对准。

    GUIDE STAR GENERATION
    74.
    发明申请
    GUIDE STAR GENERATION 有权
    指南生成

    公开(公告)号:US20150085255A1

    公开(公告)日:2015-03-26

    申请号:US14396301

    申请日:2013-04-17

    Applicant: PROFUNDUS AB

    Inventor: Jorgen Thaung

    Abstract: An optical system (120) for detecting optical aberrations of light from an object (101), the optical system comprising: a reference light-source (102) providing collimated reference light; an optical element (212) configured to focus at least one collimated light beam incident on the optical element (212) to a plurality of focal points in a conjugate object plane (214), the optical element (212) being arranged in an optical path between the reference light-source (102) and the object (101) for transmitting a plurality of reference light beams towards the object (101); and a wavefront sensor (112) configured to detect a property indicative of an optical aberration of light incident on the wavefront sensor; wherein the optical element (212) is further arranged to transmit a plurality of reflected guide star light beams resulting from reflection of the reference light beams at the object (101) towards the wavefront sensor (112).

    Abstract translation: 一种用于检测来自物体(101)的光的光学像差的光学系统(120),所述光学系统包括:提供准直参考光的参考光源(102) 光学元件(212),被配置为将入射在所述光学元件(212)上的至少一个准直光束聚焦到共轭物体平面(214)中的多个焦点,所述光学元件(212)布置在光路 在所述参考光源(102)和所述物体(101)之间,用于将多个参考光束朝向所述物体(101)传输; 以及波前传感器(112),被配置为检测指示入射在所述波前传感器上的光的光学像差的特性; 其中所述光学元件(212)还被布置成透射由所述对象(101)上的所述参考光束向所述波前传感器(112)反射而产生的多个反射的引导星形光束。

    Optical system with off-axis packaged illuminator
    75.
    发明授权
    Optical system with off-axis packaged illuminator 有权
    带离轴封装照明器的光学系统

    公开(公告)号:US08937764B2

    公开(公告)日:2015-01-20

    申请号:US13554511

    申请日:2012-07-20

    Abstract: A dual-function optical system including a secondary optical path incorporated, off-axis, within a primary optical path of the system and sharing a single aperture and at least some of the optical components with the primary optical path. In one example, an optical system includes an optical telescope including a plurality of mirrors configured to receive and direct first light rays through an entrance aperture of the optical system along a primary optical path, a detector positioned behind the optical telescope in the primary optical path and configured to receive the first light rays from the optical telescope, and an illuminator positioned behind the optical telescope and configured to produce second light rays and to direct the second light rays to the optical telescope, the optical telescope being further configured to transmit the second light rays along a secondary optical path through the entrance aperture of the optical system.

    Abstract translation: 一种双功能光学系统,包括在系统的主光路内并入离轴的二次光路,并且共享单个孔径以及具有主光路的至少一些光学部件。 在一个示例中,光学系统包括光学望远镜,该光学望远镜包括多个反射镜,其配置成沿着主要光学路径接收和引导通过光学系统的入射孔的第一光线,位于主光路中的光学望远镜后面的探测器 并配置成接收来自光学望远镜的第一光线以及位于光学望远镜后面并被配置为产生第二光线并将第二光线引导到光学望远镜的照明器,该光学望远镜还被配置为传送第二光线 沿着光学系统的入射孔沿着次级光路的光线。

    Optical system intended to measure BRDF, BSDF and BTDF
    76.
    发明申请
    Optical system intended to measure BRDF, BSDF and BTDF 审中-公开
    用于测量BRDF,BSDF和BTDF的光学系统

    公开(公告)号:US20140375797A1

    公开(公告)日:2014-12-25

    申请号:US14375798

    申请日:2013-01-21

    Abstract: The optical system (1) is intended to measure the bidirectional reflectance and/or transmittance distribution function BRDF, BTDF and BSDF of a surface (10) of at least a portion of an object (7), the system comprising successively: an aplanatic lens (2) having an opening angle, the absolute value of which is comprised between 45° and a value strictly lower than 90°, a converging field lens (3) downstream of the plane P, an image pickup lens (4), the field angle of which is higher than or equal to the convergence angle of the scattered light beams emerging from the field lens, and a video sensor (5), the aplanatic lens (2), the converging field lens (3), the image pickup lens (4) and the video sensor (5) being arranged so as to allow a conjugation C1 between the surface (10) and the entrance pupil of the image pickup lens (4) and a conjugation C2 between an intensity pattern and the video sensor (5).

    Abstract translation: 光学系统(1)旨在测量物体(7)的至少一部分的表面(10)的双向反射率和/或透射率分布函数BRDF,BTDF和BSDF,该系统包括:平行透镜 (2)具有绝对值为45°和严格低于90°的开度角,平面P下游的会聚场透镜(3),摄像透镜(4),场 其角度高于或等于从场透镜出射的散射光束的会聚角,以及视频传感器(5),平视透镜(2),会聚场透镜(3),图像拾取透镜 (4)和视频传感器(5)被布置成允许图像拾取透镜(4)的表面(10)和入射光瞳之间的共轭C1和强度图案与视频传感器( 5)。

    Apparatus for focus beam analysis of high power lasers
    79.
    发明授权
    Apparatus for focus beam analysis of high power lasers 有权
    高功率激光器聚焦光束分析装置

    公开(公告)号:US08848179B2

    公开(公告)日:2014-09-30

    申请号:US14263397

    申请日:2014-04-28

    Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.

    Abstract translation: 一种在线激光束腰分析仪系统包括光学棱镜,该棱镜从用于处理透镜的激光加工聚焦透镜或保护性碎片屏蔽件拾取第二表面反射的一部分,并将该聚焦光引导到像素化检测器。 这可以通过焊接,切割,钻孔,划线或标记来处理聚焦激光束的实时监控,而不会中断该过程。

Patent Agency Ranking