Detection optical system and scanning microscope
    80.
    发明授权
    Detection optical system and scanning microscope 有权
    检测光学系统和扫描显微镜

    公开(公告)号:US08885162B2

    公开(公告)日:2014-11-11

    申请号:US13669634

    申请日:2012-11-06

    Inventor: Masaharu Tomioka

    Abstract: Provided is a detection optical system that is provided with a dispersed-light detection function and that can increase the amount of detected light by enhancing the diffraction efficiency. A detection optical system is employed which includes a transmissive VPH diffraction grating that disperses fluorescence from a specimen into a plurality of wavelength bands; a rotating mechanism that rotates the VPH diffraction grating about an axial line that is perpendicular to an incident optical axis of the fluorescence from the specimen and an emission optical axis from the VPH diffraction grating; a light detection portion that detects the fluorescence from the specimen that has been dispersed by the VPH diffraction grating; and a correcting portion that corrects an incident position on the light detection portion in accordance with a displacement of the optical axis caused by the rotation of the VPH diffraction grating in synchronization with the rotating mechanism.

    Abstract translation: 提供了一种具有分散光检测功能并且可以通过提高衍射效率来增加检测光量的检测光学系统。 使用检测光学系统,其包括将来自样本的荧光分散到多个波长带中的透射VPH衍射光栅; 围绕垂直于来自样本的荧光的入射光轴的轴线和来自VPH衍射光栅的发射光轴旋转VPH衍射光栅的旋转机构; 光检测部,其检测由所述VPH衍射光栅分散的所述样本的荧光; 以及校正部,其根据与旋转机构同步的VPH衍射光栅的旋转引起的光轴的位移校正光检测部上的入射位置。

Patent Agency Ranking