公开(公告)号：US20180321140A1

公开(公告)日：2018-11-08

申请号：US15588853

申请日：2017-05-08

Applicant: SIEMENS ENERGY, INC.

Inventor： DUSTIN C. BOUDIN ,  ANAND A. KULKARNI

IPC: G01N21/35 ,  G01M15/14 ,  G01J5/00 ,  G01J5/08 ,  G01N21/88

CPC classification number: G01N21/35 ,  G01J5/0088 ,  G01J5/0896 ,  G01M15/14 ,  G01N21/8851 ,  G01N25/72 ,  G01N2201/06113

Abstract: A non-destructive method for condition assessment of a turbine component is provided. The method includes providing a laser generating a light pulse that heats the turbine component. An infrared image is then captured of the heated turbine component. An analysis of the turbine component for a particular characteristic of the turbine component may then be done. A system for the non-destructive condition assessment of a turbine component is also provided.

公开(公告)号：US20180286044A1

公开(公告)日：2018-10-04

申请号：US15928818

申请日：2018-03-22

Applicant: The Board of Trustees of the University of IIIinois

Inventor： Stephen A. Boppart ,  Haohua Tu ,  Sixian You ,  Yuan Liu

IPC: G06T7/00 ,  G01N33/483 ,  G06F19/24 ,  G01N21/65 ,  G01N21/64

CPC classification number: G06T7/0014 ,  G01N15/1456 ,  G01N21/636 ,  G01N21/6486 ,  G01N21/65 ,  G01N33/483 ,  G01N2015/1006 ,  G01N2015/144 ,  G01N2021/653 ,  G01N2201/06113 ,  G06T2207/10064 ,  G06T2207/20081 ,  G06T2207/30024 ,  G06T2207/30096 ,  G16B40/00

Abstract: Methods for label-free characterization of untagged molecules within a biological sample in-situ. The untagged molecules may be constituent of extracellular vesicles, and are excited in the biological sample with at least one wavelength band of light derived from a single stream of optical pulses. Light emitted by the untagged molecules by SHG, THG, 2PAF and 3PAF processes is detected. Separate measures of the biological sample corresponding to light emitted by the untagged molecules in each of the SHG, THG, 2PAF and 3PAF processes are derived. On that basis, normal extracellular vesicles may be differentiated from extracellular vesicles associated with a tumor on the basis of a specified signature of characteristics of images of SHG, THG, 2PAF and 3PAF processes.

公开(公告)号：US20180275051A1

公开(公告)日：2018-09-27

申请号：US15936181

申请日：2018-03-26

Applicant: Colorado School of Mines ,  Kaia Corp.

Inventor： Yusuf Akin Koksal ,  Necati Umit Kaya ,  Xiaolong Yin ,  Erdal Ozkan

IPC: G01N21/45 ,  G01L11/02 ,  G01N21/41 ,  G01N33/28

CPC classification number: G01N21/45 ,  G01L5/161 ,  G01L11/02 ,  G01N21/4133 ,  G01N33/2823 ,  G01N2201/06113

Abstract: A system and method of non-intrusively measuring characteristics of a fluid in a substrate are provided. The fluid is located in a fluid channel in a substrate, and an electromagnetic radiation source emits an electromagnetic beam toward the fluid and the substrate such that a first part of the beam reflects off a first surface of the substrate and a second part of the beam travels through the fluid and reflects off a second surface of the substrate. A sensor detects the resulting interference pattern produced by the two parts of the beam. Changes in fringes of the interference pattern, such as shifting positions or intensities, relates to a change in the refractive index of the fluid. Since a change in refractive index relates to the density and pressure of the fluid, the changes in interference patterns can be used to discern changes in characteristics in the fluid such as pressure.

公开(公告)号：US10082657B2

公开(公告)日：2018-09-25

申请号：US15623848

申请日：2017-06-15

Applicant: The United States of America as represented by the Secretary of the Navy

Inventor： Brett J Hamilton ,  David S Stoker

IPC: G01N21/00 ,  G02B21/02 ,  G02B21/00 ,  G02B21/30 ,  G01N1/44 ,  G01N21/95 ,  G01N21/64 ,  G01N33/483 ,  G02B21/18

CPC classification number: G02B21/02 ,  G01N1/44 ,  G01N21/6458 ,  G01N21/9501 ,  G01N33/4833 ,  G01N2201/06113 ,  G02B21/0032 ,  G02B21/0048 ,  G02B21/0064 ,  G02B21/008 ,  G02B21/18 ,  G02B21/30

Abstract: Dual magnification systems and apparatuses for testing and viewing a single objective in a scanning optical microscope and methods of using the systems and apparatuses are provided. Two optical paths allow two wavelengths of light to be magnified to separate magnification levels such that a lower magnification optical path can be used to examine a target area while a higher magnification optical path can be used to examine a subset of the target area and elicit test sample responses to localize a condition of interest.

公开(公告)号：US20180252643A1

公开(公告)日：2018-09-06

申请号：US15912919

申请日：2018-03-06

Applicant: RENISHAW PLC

Inventor： Robert James Brown ,  Ruth Alice Lawson

IPC: G01N21/63 ,  G01N21/65 ,  G02B7/09 ,  G02B7/34

CPC classification number: G01N21/63 ,  G01N21/64 ,  G01N21/65 ,  G01N2201/06113 ,  G01N2201/068 ,  G02B7/09 ,  G02B7/34

Abstract: An auto-focus system suitable for a spectroscopy system uses the same illumination beam as the exciting light for spectroscopy. This is focused to a spot or line focus on the sample. An image of the spot or line focus is directed to a detector via one or more pupils located eccentrically of the optical axis, so that the focus condition is indicated by displacement of the image on the detector. The spot or line focus on the sample provides contrast in the image to enable auto-focusing without the need to observe contrast over an area of the sample. A method of scanning the surface of a sample is also described, in which a topographical map of the sample is built in a pre-scan with an objective lens having a long working distance. This enables selection of an objective with a shorter working distance for a subsequent scan.

公开(公告)号：US10051854B2

公开(公告)日：2018-08-21

申请号：US15468855

申请日：2017-03-24

Applicant: Palo Alto Research Center Incorporated

Inventor： Timothy David Stowe ,  Patrick Yasuo Maeda ,  Tim Curley

IPC: A01M21/04 ,  A01D34/835 ,  A01D34/01 ,  G01N21/84 ,  G01S17/89 ,  G06K9/62 ,  A01D101/00

CPC classification number: A01M21/046 ,  A01D34/015 ,  A01D34/835 ,  A01D2101/00 ,  A01M21/00 ,  G01N21/29 ,  G01N21/84 ,  G01N2021/8466 ,  G01N2201/06113 ,  G01S17/89 ,  G06K9/6267

Abstract: Embodiments of an apparatus and methods can removing unwanted plants or weeds from an area such as an agricultural plot or lawn. The apparatus includes a three-dimensional imager configured to capture plant images and locate plants; an image processor configured to distinguish between wanted and unwanted plants based upon the captured plant images; at least one laser device configured to emit a laser beam having power sufficient to damage the unwanted plants; a guidance system configured to direct at least one laser beam toward the unwanted plant; and a chassis configured to support the three-dimensional imager, the laser device, and the guidance system. The chassis is configured to be moved across the area.

公开(公告)号：US10036707B2

公开(公告)日：2018-07-31

申请号：US14576752

申请日：2014-12-19

Applicant: Nuctech Company Limited ,  Tsinghua University

Inventor： Ziran Zhao ,  Li Zhang ,  Yingying Geng ,  Hongqiu Wang ,  Yumin Yi

IPC: G01N21/65 ,  G01J3/28 ,  G01N21/87 ,  G01J3/44

CPC classification number: G01N21/65 ,  G01J3/28 ,  G01J3/44 ,  G01J3/4412 ,  G01N21/87 ,  G01N2201/06113 ,  G01N2201/12

Abstract: Embodiments of the present invention provide jewel and jade identification method and apparatus. The method comprises the steps: (a) placing a sample to be detected over a light transmission hole formed on a carrying surface of an object table and emitting, by an optical probe disposed below the carrying surface, an exciting light onto the sample through the light transmission hole and then collecting a Raman scattered light from the sample by the optical probe. (b) acquiring a Raman spectrum curve of the sample from the collected Raman scattered light from the sample; and (c) comparing the Raman spectrum curve with a reference Raman spectrum library for jewels and jades to identify the sample. The method and apparatus may achieve effective, convenient and accurate inspections of the jewels and jades.

公开(公告)号：US10031089B2

公开(公告)日：2018-07-24

申请号：US15023254

申请日：2014-05-30

Applicant: NIPPON STEEL & SUMIKIN MATERIALS CO., LTD.

Inventor： Kiyoshi Kojima ,  Masashi Nakabayashi ,  Kota Shimomura ,  Yukio Nagahata

IPC: G01N21/95 ,  G01N21/65 ,  G01L1/24 ,  C30B23/00 ,  C30B29/36 ,  C30B33/00 ,  H01L21/66

CPC classification number: G01N21/9505 ,  C30B23/00 ,  C30B29/36 ,  C30B33/00 ,  G01L1/24 ,  G01N21/65 ,  G01N2201/06113 ,  H01L22/12

Abstract: Provided are a method of evaluating an internal stress of a silicon carbide (SiC) single crystal wafer and a method of predicting warpage of the SiC single crystal wafer after completion of polishing by evaluating the internal stress of the wafer. Wavenumber shift amounts of Raman-scattered light are measured at two points within a surface of the SiC single crystal wafer, and the internal stress is evaluated through use of a difference between the wavenumber shift amounts. Also provided is a method of predicting warpage of a silicon carbide single crystal wafer in advance, the silicon carbide single crystal wafer being produced by sublimation-recrystallization method, the method including predicting warpage of a SiC single crystal wafer through use of the evaluation indicator.

公开(公告)号：US10025077B2

公开(公告)日：2018-07-17

申请号：US15334462

申请日：2016-10-26

Applicant: Chun Kuang Optics Corp.

Inventor： Hsin-Chieh Huang ,  Cheng-Yu Huang ,  Shun Wang ,  Shun-Wen Teng

IPC: G02B17/00 ,  G02B17/08 ,  G01N21/41

CPC classification number: G02B17/086 ,  G01N21/4133 ,  G01N2021/4153 ,  G01N2201/06113 ,  G01N2201/062 ,  G01N2201/068 ,  G02B17/0864

Abstract: A device for measuring solution concentration includes housing, a catadioptric structure, an electromagnetic radiation emitter and an electromagnetic radiation detector. The housing is formed with a detecting part for receiving a solution to be detected. The catadioptric structure is received in the housing, and includes a ray entrance portion, a first total internal reflection part, a second total internal reflection part and a ray exit portion. An accommodation part corresponds to the detecting part. The emitter is disposed at one side of the ray entrance portion, and a ray sequentially passes the ray entrance portion, the detecting part, the solution to be detected, and the first total internal reflection part. Then, the ray is totally internally reflected and converged to the second total internal reflection part, and is reflected again. Finally, the ray passes the ray exit portion and is received by the detector.

公开(公告)号：US10024799B2

公开(公告)日：2018-07-17

申请号：US15122170

申请日：2015-02-13

Applicant: INDIAN INSTITUTE OF SCIENCE

Inventor： Siva Umapathy ,  Sanchita Sil ,  Gagan Dhal ,  Freek Ariese

IPC: G01J3/44 ,  G01N21/65 ,  G01B11/00 ,  G01J3/02

CPC classification number: G01N21/65 ,  G01B11/00 ,  G01J3/0221 ,  G01J3/027 ,  G01J3/0289 ,  G01J3/44 ,  G01J3/4412 ,  G01N21/4795 ,  G01N2201/0221 ,  G01N2201/06113 ,  G01N2201/0826 ,  G01N2201/0833

Abstract: The invention provides a method for chemical signature resolved detection of a concealed object within a system. The method includes irradiating the system at a plurality of positions with aplurality of electromagnetic radiation of specific wavelength; capturing a certain component of the scattered electromagnetic radiation from the object at a plurality of locations along various 3D planes around the system; obtaining a plurality of profiles from the captured component of the scattered electromagnetic radiation; filtering the profiles to obtain a chemical signature specific to the object; and resolving the chemical signatures to detect the concealed object, wherein, the step of detection includes determination of the shape, size and location of the object.