Abstract:
An infrared light sensor chip comprises a substrate (2), an infrared light sensor (9), which has a base electrode (10) that is in direct contact with one side (8) of the substrate (2) and which is used to attach the infrared light sensor (9) to the substrate (2), and a resistance thermometer (13), which has a resistance path (14) in direct contact with the side (8) of the substrate (2) adjacent to the infrared light sensor (9) and configured to measure the temperature of the substrate (2) via the resistance thermometer (13). The resistance path (14) is made of the same material of which the base electrode (10) is made.
Abstract:
The invention relates to a microsystem (1) comprising a substrate (12), a bottom electrode (3) arranged on the substrate (12), a ferroelectric layer (4) arranged on the bottom electrode (3), a top electrode (5) arranged on the ferroelectric layer (4) and an isolation layer (6) that is electrically isolating, that is arranged on the top electrode (5), that extends from the top electrode (5) to the substrate (12) so that the isolation layer (6) covers the bottom electrode (3), the ferroelectric layer (4) and the substrate (12) in a region around the complete circumference of the bottom electrode (3), and the isolation layer (6) has the shape of a ring that confines in its centre a through hole (11) that is arranged in the region of the top electrode (5).
Abstract:
A skin measuring device for spectroscopic measurement of the skin of a body part is provided. The skin measuring device has a press-on frame with a window and a flat face. The skin measuring device has an ATR infrared spectrometer which includes an ATR crystal that is secured to the press-on frame and that has a sample stage which is arranged in the window and faces in the same direction as the flat face of the press-on frame. An encircling means surrounds the body part and thereby supports the skin measuring device on the body part. The surface of the flat face of the press-on frame is pressed against the skin of the body pan by the encircling means in a comfortably wearable manner when the skin measuring device is worn such that the sample stage is in contact with the skin for spectroscopic measurement by the ATR spectrometer.
Abstract:
An ATR infrared spectrometer for analyzing a chemical composition of a sample is provided including an elongated ATR crystal and having an entrance face, a longitudinal axis, a width, first and second longitudinal ends and an infrared light detector line with infrared-light-detecting regions. A first overall extent of all of the infrared-light-detecting regions corresponds to the width of ATR crystal. An infrared light emitter line has infrared-light-emitting regions and is arranged directly adjacent to the entrance face of the elongated ATR crystal. A sample is arranged adjacent to the ATR crystal between the infrared light emitter line and the infrared light detector line. Infrared light is emitted by the infrared light emitter line to directly enter said ATR crystal via said entrance face. The light is guided in the ATR crystal to said infrared light detector line thereby undergoing total internal reflection and thereby interacting with said sample.
Abstract:
A method for producing a micro system, said method comprising: providing a substrate (2) made of aluminum oxide; producing a thin film (6) on the substrate (2) by depositing lead zirconate titanate onto the substrate (2) with a thermal deposition method such that the lead zirconate titanate in the thin film (6) is self-polarized and is present predominantly in the rhombohedral phase; and cooling down the substrate (2) together with the thin film (6).
Abstract:
The invention relates to an ATR spectrometer for analysing the chemical composition of a sample, wherein the ATR spectrometer (1) comprises an ATR crystal (2), at least one infrared light source (5) being arranged on the entry surface (3), a line array (6) of infrared light detectors, at least one single infrared light detector (7), wherein the at least one infrared light source (5) is adapted to emit infrared light that enters the ATR crystal and is guided to the infrared light detectors under total internal reflection and under interaction with the sample being arranged immediately adjacent to the ATR crystal, a wavelength dispersive element (8) being arranged in the path of the infrared light so—that the line array is adapted to measure a spectrum of the infrared light, and a wavelength filter (9) being arranged in the path of the infrared light to the single infrared light detector, wherein at least one of the infrared light detectors is chosen to be a chosen infrared light detector for a signal correction, and the ATR spectrometer is adapted to use the electrical signal of the chosen infrared light detectors to correct the electrical signals of all the other infrared light detectors.
Abstract:
The invention relates to an ATR spectrometer for analysing the chemical composition of a sample, wherein the ATR spectrometer (1) comprises an ATR crystal (2), at least one infrared light source (5) being arranged on the entry surface (3), a line array (6) of infrared light detectors, at least one single infrared light detector (7), wherein the at least one infrared light source (5) is adapted to emit infrared light that enters the ATR crystal and is guided to the infrared light detectors under total internal reflection and under interaction with the sample being arranged immediately adjacent to the ATR crystal, a wavelength dispersive element (8) being arranged in the path of the infrared light so—that the line array is adapted to measure a spectrum of the infrared light, and a wavelength filter (9) being arranged in the path of the infrared light to the single infrared light detector, wherein at least one of the infrared light detectors is chosen to be a chosen infrared light detector for a signal correction, and the ATR spectrometer is adapted to use the electrical signal of the chosen infrared light detectors to correct the electrical signals of all the other infrared light detectors.
Abstract:
An ATR infrared spectrometer for analyzing a chemical composition of a sample is provided including an elongated ATR crystal and having an entrance face, a longitudinal axis, a width, first and second longitudinal ends and an infrared light detector line with infrared-light-detecting regions. A first overall extent of all of the infrared-light-detecting regions corresponds to the width of ATR crystal. An infrared light emitter line has infrared-light-emitting regions and is arranged directly adjacent to the entrance face of the elongated ATR crystal. A sample is arranged adjacent to the ATR crystal between the infrared light emitter line and the infrared light detector line. Infrared light is emitted by the infrared light emitter line to directly enter said ATR crystal via said entrance face. The light is guided in the ATR crystal to said infrared light detector line thereby undergoing total internal reflection and thereby interacting with said sample.
Abstract:
A switch operating device (100) configured to operate a switch (103) with four possible types (111 to 114) of non-tactile translational gestures performed with a heat emitting part (115). A gesture sensor (1) is adapted to detect heat emitted by the part while performing one of the translational gesture types. Four pixels (21 to 24) are arranged next to each other and output a signal (51 to 54) per pixel, wherein the signal has a signal deflection (58) corresponding to the temporal intensity curve of the heat detected by the thin film of the corresponding pixel. A signal processing unit (101) determines the performance of the translational gesture types from the temporal succession of the signal deflections (58). An actuator (104) is controlled by the signal processing unit and operates the switch when one of the translational gesture types is determined.
Abstract:
A sensor system for detecting motion in a predefined direction of motion (30) of an infrared light source (29) has at least one pair of infrared light sensors (4, 5; 36, 37), which are arranged side by side with respect to the direction of motion (30) and, thus, define a sensor coverage zone (17) determined by the distance between distal ends (16) (with respect to the direction of motion) of the infrared light sensors. During exposure to the infrared light source, the sensors provide electrical signals, the charge signs of which are opposite each other, for detecting the motion of the infrared light source (29). The sensor system (1) has a window (7) positioned between the infrared light source (29) and the sensors such that the infrared light of the infrared light source (29) radiates onto the sensors. The sensors are arranged behind the window and are adjusted relative to the width (41) of the window to extend in the direction of motion such that, beyond a predetermined limit distance (20) away from the window, each of the sensors has a full illumination zone (22, 23), which defines the locations from which the infrared light source (29) fully illuminates only one of the sensors (4, 36 or 5, 37). The full illumination zones (22, 23) do not spatially overlap beyond the limit distance (20); and the window width (41) is smaller than the sensor coverage zone (17) in the direction of motion (30).