FLIP CHIP STRUCTURE AND CIRCUIT BOARD THEREOF

    公开(公告)号:US20250157970A1

    公开(公告)日:2025-05-15

    申请号:US18932755

    申请日:2024-10-31

    Abstract: A flip chip structure includes a circuit board and a chip. The circuit board includes first inner leads and second inner leads, each of the first inner leads has a first bonding portion, each of the second inner leads has a second bonding portion and a connecting segment. An included angle exists between the second bonding portion and the connecting segment, and an included angle exists between center lines of the first and second bonding portions. The chip includes first bumps and second bumps, and an included angle exists between center lines of the first and second bumps. Each of the first bumps is bonded to the first bonding portion, and each of the second bumps is bonded to the second bonding portion and the connecting segment to avoid bonding shift between the inner leads and the bumps or lessen bonding shift.

    FLEXIBLE CIRCUIT BOARD
    3.
    发明申请

    公开(公告)号:US20250159801A1

    公开(公告)日:2025-05-15

    申请号:US18910291

    申请日:2024-10-09

    Abstract: A flexible circuit board includes a flexible substrate, a first circuit and a second circuit. The first circuit is provided on a first area defined on the top surface and includes a first input terminal and a first output terminal. The first input terminal is adjacent to a bottom side of the top surface and the first output terminal is adjacent to a top side of the top surface. The second circuit is provided on a second area defined on the top surface and includes a second input terminal and a second output terminal. The second input terminal is adjacent to the top side of the top surface and the second output terminal is adjacent to the bottom side of the top surface.

    FLEXIBLE CIRCUIT BOARD
    4.
    发明申请

    公开(公告)号:US20250071889A1

    公开(公告)日:2025-02-27

    申请号:US18789994

    申请日:2024-07-31

    Abstract: A flexible circuit board includes a flexible substrate, a chip, a first test area, first test pads and a circuit layer connected to the chip and the first test pads. A working area and a non-working area are defined on an upper surface of the flexible substrate. The chip is disposed on the working area, the first test area is located within the non-working area and between a third edge and the working area, the first test pads are arranged on the first test area. Flexible circuit boards with different sizes can have the first test area with the same size and can be tested using a probe card with the same specification to lower testing cost.

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