公开(公告)号：US10969319B2

公开(公告)日：2021-04-06

申请号：US16041623

申请日：2018-07-20

Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION

Inventor： Ryusuke Hirose ,  Hideyuki Akiyama ,  Noriaki Sakai

IPC: G01N5/04 ,  G01N25/20

Abstract: The apparatus for mass analysis includes: a heating unit heating a sample containing a first substance and a second substance having different gasification temperatures to evolve gas components; a heating control unit controlling the heating unit to heat the sample at a first temperature point at which gas of the first substance is evolved and gas of the second substance is not evolved, until reaching a first time point, whereafter the heating unit is controlled to heat the sample until reaching a second temperature point at which gas of the second substance is evolved; and an analysis control unit performing mass analysis under a first measurement condition assigned to the first substance until reaching the first time point at the first temperature point, and performing mass analysis under a second measurement condition assigned to the second substance at the second temperature point.

公开(公告)号：US11646188B2

公开(公告)日：2023-05-09

申请号：US16041683

申请日：2018-07-20

Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION

Inventor： Ryusuke Hirose ,  Hideyuki Akiyama ,  Noriaki Sakai ,  Masafumi Watanabe

IPC: H01J49/04 ,  H01J49/00 ,  G01N33/00 ,  G01N33/44

CPC classification number: H01J49/0422 ,  G01N33/0021 ,  H01J49/0031 ,  G01N33/442

Abstract: Disclosed is an apparatus and method for analyzing an evolved gas, wherein the precision of detection of a gas component is improved without enlarging the apparatus. The apparatus includes a gas component evolving unit, a detection member for detecting the gas component, and a mixed gas channel for allowing a mixed gas containing the gas component and carrier gas to flow therethrough, and further includes a branch channel branched from the mixed gas channel, an inert gas channel for allowing an inert gas to flow therethrough, a first flow rate regulator for adjusting the flow rate of the carrier gas, a second flow rate regulator for adjusting the flow rate of the inert gas, and a flow rate control unit for controlling the second flow rate regulator such that the flow rate of the mixed gas guided to the detection member is a predetermined value.

公开(公告)号：US09612214B2

公开(公告)日：2017-04-04

申请号：US14735393

申请日：2015-06-10

Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION

Inventor： Haruo Takahashi ,  Ryusuke Hirose ,  Isao Yagi ,  Toshiyuki Takahara

IPC: G01N23/223 ,  G01N35/00 ,  G21K1/06

CPC classification number: G01N23/223 ,  G01N35/00693 ,  G21K1/067

Abstract: An X-ray fluorescence analyzer includes: a measurement device having: an X-ray source that emits an X-ray; an irradiation area restricting member that restricts an area of a measurement sample to be irradiated with the X-ray as a primary X-ray; and a detector that detects a secondary X-ray generated from the measurement sample. The analyzer further includes: a sample stage that holds and moves the measurement sample between a measurement position at which the measurement sample is irradiated with the primary X-ray to detect the secondary X-ray by the detector and a first retracted position at which the measurement sample is retracted from the measurement position; and a calibration sample moving mechanism that holds a calibration sample for calibrating the measurement device and moves the calibration sample between the measurement position and a second retracted position at which the calibration sample is retracted from the measurement position.

公开(公告)号：US09721749B2

公开(公告)日：2017-08-01

申请号：US14837745

申请日：2015-08-27

Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION

Inventor： Ryusuke Hirose ,  Haruo Takahashi

IPC: G01N23/223 ,  H01J35/06 ,  H01J35/08 ,  H05G1/02 ,  H01J35/16

CPC classification number: H01J35/16 ,  G01N23/223 ,  H01J35/06 ,  H01J35/08 ,  H05G1/02

Abstract: The present invention provides an X-ray generator including an X-ray tube 2 radiating primary X-rays X1 to a specimen S, a housing 3 accommodating the X-ray tube 2, an X-ray radiation area controller 4 limiting the radiation area of the primary X-rays X1 from the X-ray tube 2 to the specimen S, and a device holder 5 holding the X-ray radiation area controller 4 with respect to the housing 3. The X-ray tube includes a case 6, an electron ray source 7 generating electron rays, and a target unit 8 having a base fixed to the case and receiving electron rays through a protruding free end. The device holder has a fixed-base 5a fixed to the housing, directly under the base of the target unit, and a supporting extension 5b extending from the fixed-base in the protrusion direction of the target unit and supporting the X-ray radiation area controller.

公开(公告)号：US09658175B2

公开(公告)日：2017-05-23

申请号：US14662906

申请日：2015-03-19

Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION

Inventor： Ryusuke Hirose

IPC: G01N23/223

CPC classification number: G01N23/223 ,  G01N2223/076 ,  G01N2223/323

Abstract: An X-ray analyzer is provided with: a sample stage on which a sample is disposed; an X-ray source configured to irradiate the sample with a primary X-ray at a first angle; a detector configured to detect a secondary X-ray generated from the sample; a position adjustment mechanism configured to adjust a relative position between the sample stage and the primary X-ray; a first light source configured to emit a first light beam at a second angle toward a focal position of the primary X-ray or toward a predetermined position; and a second light source configured to emit a second light beam at a third angle toward the focal position or toward the predetermined position, wherein the first light beam and the second light beam are configured to have visibility sufficient for enabling visual distinction.

公开(公告)号：US09410906B2

公开(公告)日：2016-08-09

申请号：US14221535

申请日：2014-03-21

Applicant: Hitachi High-Tech Science Corporation

Inventor： Ryusuke Hirose ,  Haruo Takahashi ,  Yoshiki Matoba ,  Koichi Tamura

IPC: G01N23/223 ,  H05G1/02

CPC classification number: G01N23/223 ,  G01N2223/076 ,  G01N2223/31 ,  H05G1/025

Abstract: An X-ray fluorescence spectrometer includes: an X-ray source which irradiates a sample with primary X-rays; a light condensing device which condenses the primary X-rays to reduce an irradiation area on the sample; a detector which detects fluorescent X-rays produced from the sample irradiated with the primary X-rays; a housing which accommodates the X-ray source and the light condensing device; a temperature sensor which is disposed in at least one of the X-ray source and the periphery of the X-ray source; at least one external-air fan which is disposed on the housing, and which can exchange internal air with external air; and a control section which drives the external-air fan based on temperature information detected by the temperature sensor, to adjust the ambient temperature around the X-ray source to a constant temperature.

Abstract translation: X射线荧光光谱仪包括：用X射线照射样品的X射线源; 聚光装置，其冷凝初级X射线以减少样品上的照射面积; 检测器，其检测由所述主X射线照射的样品产生的荧光X射线; 容纳X射线源和聚光装置的壳体; 温度传感器，其设置在所述X射线源和所述X射线源的周围中的至少一个中; 至少一个外部空气风扇，其设置在壳体上，并且可以与外部空气交换内部空气; 以及控制部，其基于由所述温度传感器检测出的温度信息来驱动所述外部风扇，以将所述X射线源周围的环境温度调整为恒定温度。

公开(公告)号：US20140294145A1

公开(公告)日：2014-10-02

申请号：US14221535

申请日：2014-03-21

Applicant: Hitachi High-Tech Science Corporation

Inventor： Ryusuke Hirose ,  Haruo Takahashi ,  Yoshiki Matoba ,  Koichi Tamura

IPC: G01N23/223

CPC classification number: G01N23/223 ,  G01N2223/076 ,  G01N2223/31 ,  H05G1/025

Abstract: An X-ray fluorescence spectrometer includes: an X-ray source which irradiates a sample with primary X-rays; a light condensing device which condenses the primary X-rays to reduce an irradiation area on the sample; a detector which detects fluorescent X-rays produced from the sample irradiated with the primary X-rays; a housing which accommodates the X-ray source and the light condensing device; a temperature sensor which is disposed in at least one of the X-ray source and the periphery of the X-ray source; at least one external-air fan which is disposed on the housing, and which can exchange internal air with external air; and a control section which drives the external-air fan based on temperature information detected by the temperature sensor, to adjust the ambient temperature around the X-ray source to a constant temperature.

Abstract translation: X射线荧光光谱仪包括：用X射线照射样品的X射线源; 聚光装置，其冷凝初级X射线以减少样品上的照射面积; 检测器，其检测由所述主X射线照射的样品产生的荧光X射线; 容纳X射线源和聚光装置的壳体; 温度传感器，其设置在所述X射线源和所述X射线源的周围中的至少一个中; 至少一个外部空气风扇，其设置在壳体上，并且可以与外部空气交换内部空气; 以及控制部，其基于由所述温度传感器检测出的温度信息来驱动所述外部风扇，以将所述X射线源周围的环境温度调整为恒定温度。